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- Valhalla Scientific Inc.
product
Rugged Igniter Tester
4314 KV
Model 4314 KV is a 4-wire ohmmeter designed to use low test currents for its measurement. Additional circuitry proprietary to Valhalla Scientific is used to ensure that test current levels do not exceed the specified “fail-safe current” even in a worst-case component failure situation.
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Downloading Multifunction Tester
ET4500
The new ET4500 tester carries out all the tests needed to verify the safety of electrical installations in domestic, commercial and industrial wiring installations in accordance with the latest regulations.
can be used to carry out 3 wire earth testing and has on board memory to store and download all installation test results for documentation.
Everything about the new ET Series has been designed to save time and make testing easier.Fast, reliable high current and non-trip loop testing comes as standard together with a high level of input protection and a CAT IV safety rating .Supplied with a full range of accessories.
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Solderability Tester
LBT210
Microtronic Microelectronic Vertriebs GmbH
Microtronic's LBT-210 solderability tester has software that offers statistical information such as mean value, standard deviation, etc. A camera option offers video of the test cycle and storage in memory with the appropriate test measurements and data. Additionally, it has the feature to test under nitrogen. This function can be switched on in the software. An enclosure that is flooded with nitrogen lowers and rises with the device under test.
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Handheld Metal Hardness Tester
TIME®5330
Beijing TIME High Technology Ltd.
Handheld Metal Hardness Tester TIME®5330 is loaded with 4.3 inch LCD screen and a large memory of 2000 groups of data. Built-in conversion table enables you to read HB value directly if D/DC impact devices are installed.
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Turns Ratio Testers
TRT Standard Series
When it comes to choosing a transformer turns ratio tester, TRT Standard series offers some of the most advanced instruments with LCD display out in the market. Each model measures transformer excitation current and phase shift performs automatic vector group detection and magnetic balance on three-phase transformers and three-phase autotransformers. Furthermore, they have a built-in true three-phase power source. Because of that, TRT Standard instruments can test transformers with special configurations, such as phase-shifting, rectifier, arc-furnace, traction transformers, etc.The instruments can output test voltages from 1 V AC to 250 V AC, depending on the chosen model. High test voltage of 250 V AC provides more accurate turns ratio testing compared to other turns ratio testers on the market and extremely low test voltage of 1 V AC enables turns ratio verification of current transformers.TRT Standard series consists of:TRT03 Models (TRT03A, TRT03B, TRT03C) – single-phase voltage up to 100 VTRT3x Models (TRT30A, TRT30B, TRT30C, TRT33A, TRT33B, TRT33C) – single and true three-phase voltage up to 100 VTRT63 Models (TRT63A, TRT63B, TRT63C) – single and true three-phase voltage up to 250 VMore about models differences can be found under the downloads tab, in brochures and comparison sheets.A user can create test templates using the DV Win software and store them in the PC’s memory for later use when in the field.TRT Standard series models have a built-in tap changer control unit. Consequently, it enables remote control of an on-load tap changer (OLTC) directly from the tester. In order to make the most out of this feature, the DV-Win software can be programmed to do everything automatically – running turns ratio tests, changing OLTC tap positions and saving results. This option, especially in combination with test templates, significantly facilitates and shortens the turns ratio testing time.
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Audio Cable Testers
AudioJog Pro 3
Audio cable tester with SINGLE & DOUBLE ended testing, memory and intermittent fault detection .
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Memory Module Testers
The module tester tests the modules in which the final tested components are assembled together. This test is also one of the most important factors to guarantee the quality of the products. DDR, DDR2, DDR3, FBDIMM,
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Cable Testers
CableJoG 64
CableJoG 64 can test up to 64 individual connections of all manufacturers of connectors. This simple test instrument stores up to 55 separate connection configurations. Each cable that is tested is compared with the configuration stored in the cable testers memory to produce a pass/fail indication of each pin connection.
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Memory Test Systems
T5503HS2
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Megohmmeter Insulation Tester
AMIC-30
The AMIC-30 insulation tester is a small portable meter designed to measure insulation resistance in electrical and telecommunications installations, cables, motors, transformers and other equipment. The test voltage can be programmed in steps from 10 V to 1000 V. The instrument can measure both insulation resistance over a wide range (0,1kΩ...100GΩ), and insulation leakage current, capacitance and other parameters. All test results can be stored in the internal memory and sent to a computer via the included wireless USB receiver. The meters are supplied with rechargeable Ni-Cd batteries.
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Folding Tester
DRK111B
Shandong Drick Instruments Co., Ltd.
DRK111B Folding Tester is designed according to relevant standards and adopts modern mechanical philosophy and computer processing technology. It has LCD display function, various parameters setting function, conversion, adjust, memory, printing, and other functions.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Optical Power Meter & VFL
TM263
◇ Self Calibration◇ Set the Auto Off◇ Wavelength Memory function after turn off the tester◇ High Accuracy, high ,High sensitivity, high linearity◇ Stable VFL Output◇ USB Charge port◇ FC,SC Connector◇ 18650Li-ion Battery◇ Lower power consumption design, long standby time◇ Rubber Out shell, increased the protective properties for field work
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Wire Harness Tester
NX Pro
The Dynalab NX Pro Wire Harness Tester is a low-cost, feature-packed, stand-alone continuity tester with a maximum capability of 512 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to "decide" which operation to perform next. The NX Pro Tester has 1.3Mb memory capacity for program storage and is compatible with Printers, Scanners, and all other Dynalab NX System accessories.
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Hi-Pot Tester
DU3315A/3316A
Delta United Instrument Co., Ltd.
Real-time Open Check of the alarm and signal output of no contact signal3 in 1 tester with AC, DC, IR functions ( IR function is optional for DU3316 only)ARC Detction:DU3315A /DU3316A Standard function40 x 4 LCD text displayFast cut-off time : 0.4ms5 sets of memory, 3 steps for each memory
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0-5KV Digital Hi-pot Tester 0-5KV
7110
Shenzhen Chuangxin Instruments Co., Ltd.
Programmable AC/DC withstand voltage tester Feature: Small volume, light weight Easy to operate, has keyboard lock function Provide 5 groups memory setting, each group has four kinds of work mode
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CT Ratio/Burden Tester
1047
TESCO’s new CT Ratio/Burden Tester (Catalog No. 1047) is a lightweight, portable and highly accurate in-service test set to assist in finding lost revenue by testing the accuracy of your meter circuits. The Tester can help determine if there are installations errors, loose connections, incorrect ratios, resistance buildup, open CT’s, or manufacturers defects. The CT Ratio/Burden Tester measures and displays the primary and secondary current of the CT under test, and the ratio of the currents. All test data is stored in the internal memory and easily uploaded to a PC.
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RAMCHECK LX DDR4 Memory Tester
INN-8686-DDR4
The RAMCHECK LX DDR4 quickly and accurately tests and identifies DDR4 DIMMs for servers and desktops, as well as laptop SODIMMs.
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Hardness Testers
Guangzhou Amittari Instruments Co.Ltd
Memory Foam Hardness Tester AS-120MF, special for memory foam hardness measurement.(memory foam is also known as slow rebound sponge, space zero pressure, space foam, TEMPUR material, low rebound sponge material, viscoelastic, used in high velocity ofaerospace, aviation, equipment, high-end consumer goods.)
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SD Host Tester / SD / EMMC Analyzer / SD Card Tester
SGDK320A (SD Host Tester)
SGDK320A (SD Host Tester) is a product that has the functions of SD emulator (SD Emulator), host tester (Host Tester), SD analyzer (SD Analyzer), and eMMC analyzer (eMMC Analyzer). Supports SD Memory Card Physical Layer Specification Version 3.01. It covers the test contents of Test Specification Ver3.00 and Supplement Note. Supports SDR104 and eMMC ver4.41 (analyzer).
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Memory Tester
RAMCHECK LX DDR3
Quickly test DDR3 DIMM and SO-DIMM memory. In just seconds, RAMCHECK LX will perform a thorough test of the module and provide complete identification. Also tests expensive LRDIMM modules.
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Leakage Current Tester
TOS3200
The Leakage Current Tester TOS3200 is designed to perform leakage current (touch current and protective conductor current) tests on general electrical equipment but not medical electrical equipment.It enables you to conduct tests that conform to the requirements of the applicable IEC, UL, JIS, and other standards, as well as the Electrical Appliance and Material Safety Law. The memory in the main unit stores the 51 types of test conditions laid down in the IEC/JIS standards for information technology equipment, household electrical appliances, audio, video electronic apparatus, luminaires, motor-operated electric tools, and electrical equipment for measurement and control and in the Electrical Appliance and Material Safety Law, thereby enabling you to conduct standard tests with simple panel operation.
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Crush Tester 350
DRK113
Shandong Drick Instruments Co., Ltd.
DRK113 Crush Tester 350 is a high accuracy and intelligent instrument, designed according relevant standards. The advanced components, mating parts and micro-computer are logical structured, to ensure the property and appearance. The instrument have parameter testing, adjusting, LCD digital display, memory, printing function.
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Semiconductor Memory Tester
T5851
Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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Nand Flash Tester
NplusT
NplusT was created in December 2002 by Tams Kerekes' 20-years experience in the field of electrical semiconductors and reliability testing.The company started with the sales representation of semiconductor equipment and consumable suppliers. In the meantime, qualified engineering services, linked to the represented products, were provided in Europe.In 2003 NplusT started to market "RIFLE", the non-volatile memory engineering tester, and related services. In a few years, this product has become a reference platform for many memory makers.In 2005 Liliom Laboratories, a Hungarian software development company, merged into NplusT. Thanks to this operation, the company became leader in the test data collection and processing segment.From 2008 a dominant portion of NplusTs turn-over derived from licensing software products. Today almost every European along with several Far East semicon companies license our software products and make use of qualified engineering services.From 2011, NplusT provides turn-key solutions for device testing and characterization, including hardware, software and support.
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Test Adapter
Ramcheck 100
This addition to the RAMCHECK memory tester provides needed support for testing of SDRAM and standard EDO/FPM DRAM 100-pin SO DIMM modules at an affordable price.
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Auditor Torque Cube
ATC Series
The Auditor Torque Cube (ATC) is a compact, versatile desktop tester and provides a multitude of capabilities. The ATC is designed to test hand or power tools with the following: Peak, first peak and track modes. Multiple engineering units. Manual and auto clear function. Multiple frequency response settings. Bi-directional use and accuracy. Accuracy is better than 1% of indicated reading top 90% of range. Serial data output. Memory 999 data samples. Battery and/or mains powered.
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Component Testers
After a wafer is tested through front-end test and back-end test, the component tester tests this final component or package assuring its quality for the semiconductor makers. DDR, DDR2, DDR3 memory component testers.
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Memory Tester
RAMCHECK
RAMCHECK is our most advanced memory tester and is the latest in our product line. Highly modular and user friendly, it redefines the capabilities of an affordable and portable ram checker.
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MIT Folding Tester
DRK111A
Shandong Drick Instruments Co., Ltd.
DRK111A MIT folding tester is designed according to relevant standards and adopts modern mechanical philosophy and computer processing technology. It has LCD display function, various parameters setting function, conversion, adjust, memory, printing and other functions.
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Single Event Effects Test System
SEE-RAD
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.
