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product
3U CompactPCI Serial Intel® Xeon® W Processor Blade
cPCI-A3535 Series
- Intel® Xeon® W-11555MRE 6-Core processor- Max. 64GB DDR4-3200 by 2x SODIMMs- 80GB 3D Nand flash SSD in SLC mode- USB 3.2, USB-C and RJ-45 iAMT front panel service ports- 2x M12 2.5GbE front panel ports for on train use
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Semiconductor
Package FunctionSMV(2.9mm*2.8mm) AND GateUSV(2.0mm*2.1mm) NAND GateFM8(5.0mm*4.5mm) NOR GateSM8(2.9mm*4.0mm) OR GateUS8(2.0mm*3.1mm) INVERTER
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SSD
M.2 SSD (MLC)
Innodisk M.2 (S42) 3ME4 is characterized by L3 architecture with the latest SATA III (6.0GHz) Marvell NAND controller. Innodisk’s exclusive L3 architecture is L2 architecture multiplied LDPC (Low-Density Parity Check). L2 (Long Life) architecture is a 4K mapping algorithm that reduces WAF and features a real-time wear-leveling algorithm to provide high performance and prolong lifespan with exceptional reliability.
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MO300 MSATA3 RunCore Embedded SATA3 “Elite Series” SSD
RunCore Innovation Technology Co. Ltd.
MO300 mSATA3 utilizes high-performance SATAIII SSD controller and NAND flash, with or with no DRAM buffer to support power failure mechanism. This series SSD compliant with Serial ATA Revision 2.6/3.1 specification, compatible with 6.0Gbps, 3.0Gbps and 1.5Gbps interface rate and support Native Command Queuing (NCQ) up to 32 commands. As a standard SATA drive, it can support mainstream OS, such as Windows/Linux/Unix/Solaris/ Mac OS and so on.
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Half Slim SATA3 RunCore Embedded SATA3 “Elite Series”
RunCore Innovation Technology Co. Ltd.
Half Slim SATA3 utilizes high-performance SATAIII SSD controller and NAND flash, with or with no DRAM buffer to support power failure mechanism. This series SSD compliant with Serial ATA Revision 2.6/3.1 specification, compatible with 6.0Gbps, 3.0Gbps and 1.5Gbps interface rate and support Native Command Queuing (NCQ) up to 32 commands. As a standard SATA drive, it can support mainstream OS, such as Windows/Linux/Unix/Solaris/ Mac OS and so on.
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Logic Gates
Analog Devices logic gate products offer logic functions such as AND, NAND, OR, and NOR, and include both –3.3 V and +3.3 V single supply options. Our products feature low power consumption, fast rise and fall times, differential and single-ended operation, and support high data rates up to 45 Gbps in an RoHS compliant package.
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Nand Flash Tester
NplusT
NplusT was created in December 2002 by Tams Kerekes' 20-years experience in the field of electrical semiconductors and reliability testing.The company started with the sales representation of semiconductor equipment and consumable suppliers. In the meantime, qualified engineering services, linked to the represented products, were provided in Europe.In 2003 NplusT started to market "RIFLE", the non-volatile memory engineering tester, and related services. In a few years, this product has become a reference platform for many memory makers.In 2005 Liliom Laboratories, a Hungarian software development company, merged into NplusT. Thanks to this operation, the company became leader in the test data collection and processing segment.From 2008 a dominant portion of NplusTs turn-over derived from licensing software products. Today almost every European along with several Far East semicon companies license our software products and make use of qualified engineering services.From 2011, NplusT provides turn-key solutions for device testing and characterization, including hardware, software and support.
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Multibus Ethernet Card
MS 1750
- Processor: LPC3250 processor with ARM 9 core running at 266 MHz- SDRAM Memory: DDR2 256 MB (scalable to 512 MB)- Flash Memory: NAND flash 512 MB- Display & Graphics: Programmable color LCD controller supports up to a TFT interface- Touch screen: Integrated touch screen controller- Network Support: 10/100 Base-T Ethernet PHY- PC Interface: One USB 2.0 high-speed On-the-Go interface- Multibus Interface- Serial Interfaces: Up to four external UARTs- CAN 2.0B controller- Three I2C ports- Three SPI ports- GPIO: Programmable I/O depending on peripheral requirements
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Optical Fiber Type Hot Phosphoric Acid Concentration Monitor
CS-620F
In 3D NAND manufacturing process, dozens of layers of SiO2 and SiN are deposited, and the SiN layer is selectively removed using hot phos.In this process, the desired etching rate can be achieved by controlling the concentration and temperature of the chemical solution.Previous products have difficulty to measure high temperature chemicals, but the CS-620F is able to measure at high temperatures up to 170 C degrees.
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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1TB NAND SATA Drive
XMC-554C
Curtiss-Wright Defense Solutions
The XMC-554C is a rugged, high performance, reliable and power-efficient NAND flash solid state drive (SSD) solution. The XMC-554C does not have any moving parts, providing significantly lower power consumption and an order of magnitude improvement in reliability in environments with vibration and contaminants, compared to traditional rotating hard disk drives (HDD).
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RunCore Embedded PATA “Elite Series” SSD
2.5"PATA/IDE SSD
RunCore Innovation Technology Co. Ltd.
2.5” PATA SSD incorporates advanced flash controller and NAND flash memory technology to deliver a state-of-the-art, non-volatile mass storage device. It supports capacity from 32GB to 128GB. 2.5” PATA Plus SSD contains the cache size of up to 64MB with maximum transfer rate as high as 95MB/s. Furthermore, its characteristics of low power consumption and anti-vibration are obvious.
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SSD
MSATA SSD (iSLC) 3IE4 Series
Innodisk mSATA 3IE4 is SATA III 6.0 Gb/s flash-based disk, which adopts the latest Marvell NAND controller with Innodisk’s exclusive L³ FW architecture. The upgraded L³ FW architecture, combining Innodik signature 4K mapping algorithm L² FW architecture with powerful LDPC technology, makes 3IE4 series have outstanding high IOPS, better data integrity, and extended lifespan by reducing the occurrence of bad block numbers. Built-in thermal sensor and iData Guard ensure data integrity and reliability of mSATA 3IE4 for industrial applications.
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SD Card
SD Card v.3.0 / eMMC v.4.51 IP Family
Designed for embedded applications that require high performance, small form factor, and high storage capacity, eMMC provides the support for embedded mass storage memory on embedded host systems. The eMMC protocol simplifies the access to NAND flash memories (such as MLC) to the host by hiding the functional differences among suppliers. Compliant to the latest JEDEC eMMC specifications, Arasan’s eMMC IP supports power-on-booting without the upper level software driver. The explicit sleep mode allows the host to instruct the controller to directly enter the sleep mode. The interface supports interface voltage of either 1.8V or 3.3V.
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Magnum VUx for NAND Protocol Test Enhancement
Magnum VUx
Teradyne’s Magnum VUx system is a flexible, superset test platform for all NAND and MCP products, both cutting edge UFS 3.0, uMCP, and PCIe Gen 4 mobile and automotive devices, as well as SSD NAND ONFI and Toggle, and legacy NAND products such as UFS 2.1, PCIe Gen 3, e.MMC, and eMCP.
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Controller IP
ONFI – NAND
Continuous leadership in standards development and extensive customer adoption of previous versions ensures that Arasan has the knowledge and expertise to deliver compliant products with superior customer support. Extensive experience and compliance testing with all versions of ONFI specifications make the choice of Arasan ONFI NAND flash controller the lowest risk approach to implementation of ONFI enabled products. Arasan’s development engineering team provides direct support to customers ensuring that the highest level of knowledge is immediately available to the customer thus reducing problem resolution time.
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SSD
MSATA SSD (MLC) 3ME4 Series
Innodisk mSATA 3ME4 is SATA III 6.0 Gb/s flash based disk, which adopts latest Marvell NAND controller with Innodisk’s exclusive L³ FW architecture. The upgraded L³ FW architecture, combining Innodisk signature 4K mapping algorithm L² FW architecture with powerful LDPC technology, makes 3ME4 series have outstanding high IOPS, better data integrity and extended lifespan through reducing the bad block number happening. Built-in thermal sensor, and iData Guard ensure data integrity and reliability of mSATA 3ME4 for industrial applications.
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NAND Controller IP
ONFI
Arasan is the leading supplier of mobile storage IP and its products are used by most first tier memory suppliers. Arasan's deep experience with NAND flash memory interfaces and mobile storage standards began in 2001 when it joined the SD Association and shipped industry first SD card IP in 2003. Arasan is a current member of ONFI and JEDEC.
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ONFi
Open Nand Flash Interface (ONFi) specify a unique package & I/O configurations. This catalog covers the variations within the ONFi specifications.
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Universal Programmer Superpro 6100N
Until now,Support 401 IC manufacturer, 103004 pcs devices and keeps growing.Features:Supports 87454 types of devices from 305 IC manufacturers (by 3/15/2013) and keeps growing.Supports EPROM、Paged EPROM、Parallel and Serial EEPROM、FPGA、PROM、FLASH(NOR & NAND)、BPROM、NVRAM、SPLD、CPLD、EPLD、Firmware HUB、Microcontroller、MCU；Supports devices with Vcc as low as 1.2V. Socket Adaptors available for DIP、SDIP、PLCC、JLCC、PGA、LGA、SOIC、SOJ、SOT、QFP、TQFP、PQFP、VQFP、MQFP、LQFP、TSOP、SOP、TSOPII、PSOP、SSOP、TSSOP、SON、EBGA、FBGA、FTBGA、VFBGA、μBGA、CSP、SCSP、QFN、HVQFN etc.High programming speed.Built with 144 universal pin-drivers. Universal adaptors are available for varies packages up to 144 pins. Quick new device support. Popular NAND FLASH Platform supported including Samsung (XSR1.0/1.6), QualComm, HYNIX（HIFFS）, MTK(Solution V1.1), ICERA (v1.0/2.0), ST （7162、7141等）, AMLOGIC(IF2/0), REALTEK, PICOCHIP, DataLight ( Flash FX Pro), Marvell(310/303/920/935…), BroadCom, ZTE, Intel (CE4100)，UBI, LEADCORE(L1809OG), MSATR etc. Customer-specific NAND solution available.PC hosted mode and stand-alone dual modes. Under PC hosted mode the programmer is controlled by a PC via USB2.0 (high speed) to program a chip. Under stand-alone mode the programmer is controlled via a 6-KEY keypad and a 20 character by 4 line LCD display. A CF card is used to store the project files.User can operate multiple units to construct a concurrent multiprogramming system thank for the stand-alone mode. IC manufacturer approved programming algorithms are used for high reliability.Testing functions for logic devices.Advanced and powerful software functions.Production mode starts chip operation at the moment the chip is inserted in the socket properly.Project function simplifies processes such as device selection, file loading, device configuration setting, program option, and batch file setting into one touch step.Password can be set for project files and production volume controlBatch command combines device operations like program, verify, security into a single command at any sequence.Dynamic buffer makes it possible that each chip is programmed with different data file. Applications including serial number, MAC address etc.Log file is useful for quality tracking.Many safety mechanisms are built including self-diagnosis, wrong chip placement detection, poor-pin-contacting detection, ID checking, over-current and over-voltage protection etc.Windows XP/Vista/Win7/ Win8/Win10 compatibility.
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SSD
M.2 SSD (iSLC)
Innodisk M.2 (S42) 3IE4 is characterized by L3 architecture with the latest SATA III (6.0GHz) Marvell NAND controller. Innodisk’s exclusive L3 architecture is L2 architecture multiplied LDPC (Low-Density Parity Check). L2 (Long Life) architecture is a 4K mapping algorithm that reduces WAF and features a real-time wear-leveling algorithm to provide high performance and prolong lifespan with exceptional reliability.
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Universal Automated Programming System
4900
The 4900 is powered by the newest BPM 9th generation technology, which delivers the fastest programming speeds in the industry for MCU’s, eMMC HS400, NAND, NOR and Serial Flash devices. BPM 9th generation technology produces 200 MHz signals, allowing each byte of data to transfer in up to 2.5 ns. Up to 9 times faster than competing programmers. 3D Vision option inspects BGA, CSP, QFP, TSOP, SOIC and J-Lead devices for coplanarity, bent lead, pitch, width, diameter, standoff and XY errors.
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Production PCB Combinational Tester
The PT100Pro combines ARM Functional Test, Analog Test and Boundary Scan in one platform for testing up to 32 PCBs at a time. The PT100 Pro solves the test challenges and cost requirements of testing small, high-volume PCBs used in the home, mobile, entertainment, automotive and embedded markets. PCBs in these markets are cost sensitive yet require high volume, high fault coverage on leading edge technologies such as WiFi, DDR Memory, USB, Bluetooth, Nand Flash, MPEG decoders, Power Management Units, and MMC/Smart Cards interfaces.
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DCU Gateway Solutions
Signals & Systems India Private Limited
SANDS DCU is an ideal gateway solution for the Energy Management System (EnMS). It provides connectivity to the cloud apart from data collection, local data storage. DCU is based on ARM Cortex-A5 processor having 512MB of DDR2 memory and expandable NAND Flash memory upto 2GB. Edge / Sensor data can be stored locally using the on-board SD card option. The cloud interface is LTE with 2G/3G fall back.
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Memory Test System
T5221
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Protocol Analyzer
BusFinder
*PC-based, 64 channels*USB 3.0 interface, 12V power adaptor*32Gb total memory*Protocol Analyzer：eMMC5.1, NAND Flash, SD3.0, SD 4.0 (UHS-II)*Logic Analyzer：eMMC5.1, NAND Flash, SD3.0, Serial Flash, SPI NAND, SPI*Each protocol has its own probe for easier connection, higher capture quality*Two sets of voltage detects to detects voltage changes
