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Precise 3D Profilometry
µscan
Using the NanoFocus µscan technology, you can measure up to 100 times faster than with conventional probe systems. Various µscan sensors are available for the different application areas. The optical profilometers of the µscan series are suitable for the fast scanning of surface profiles with precision in the low nanometer range.
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Photon Counting PMT Detection System
For spectroscopy and microscopy experiments in the UV/Vis/NIR region of the spectrum, a photomultiplier tube (PMT) is the ideal detector for quantitative low light level measurements. A PMT is extremely sensitive, with very wide dynamic range so it can also measure high levels of light. PMT’s are also very fast so rapid changes in optical signals can be reliably monitored. As a practical matter, PMTs are durable, long-lived, and economical.HORIBA provides a simple, self contained PMT housing that operates in either analog or photon counting modes with the flick of a switch. This ambient PMT housing is ideal for standard side-on PMTs that are used from 185 to 900 nanometers. It has a very low dark count for a non-cooled PMT housing providing a dark count of only ~ 50 to 500 counts per second (cps) depending on the PMT selected.
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Analytical Services
Atomic Force Microscopy (AFM) allows for sub nanometer resolution imaging of surface topography and is able to quantify surface roughness at the angstrom scale. Our team can give you highly accurate measurements such as surface topography, dopant distribution, magnetic domain features, and a wide variety of other sample properties to give you the information you need to do great work.Park can provide measurements in the following areas:● Topography (surface roughness, grain size, step height, etc.)● Mechanical Properties (stiffness, etc.)● Electrical properties (capacitance, conductivity, etc.)● Thermal properties ● Magnetic properties These properties can be measured in air or liquid, depending on your needs.
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Surface Analysis
A UHV surface analysis system for thin film depth profilingMeasures the surface composition of the first few nanometers and/or micrometers depth of solid samples.
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AFM for Large Samples
NaniteAFM
The unparalleled small footprint of the NaniteAFM scan head and its highprecision/quick lock mounting system make it the ideal atomic force microscopefor integration into automated industrial environments. With a resolution below one nanometer, the NaniteAFM is capable of detecting and visualizing even the smallest surface structures.
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Optical Tweezers
PicoTweezers
Single or dual beam optical tweezers system based on an inverted microscope • 3D real-time video-based force measurements with sub-pN resolution • Huge free space above optical trap for all kinds of sample chambers and carriers • Manipulate and navigate trapped objects with nanometer precision • Easily extendable to fluorescence, STED, Raman spectroscopy, TIRF, or CLS.
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Particle & Molecular Size/Charge Analyzers
Zetasizer Range
Instruments in the Zetasizer range are used to measure particle and molecular size from less than a nanometer to several microns using dynamic light scattering; zeta potential and electrophoretic mobility using electrophoretic light scattering; and molecular weight using static light scattering. The Zetasizer system is available in a range of variants, including the new Zetasizer Pro and Ultra. These two new systems offer unprecedented ease-of-use and flexibility, along with empowering user guidance and novel measurement techniques such as MADLS® and Particle Concentration.
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CMAS Analyzers and Field Monitors
Backed by at least one of the 8 corrosion sensor patents wholly owned by Corr Instruments, our nanoCorr analyzers and field monitors are widely used for online and real-time localized and general corrosion monitoring. These ultra-high precision instruments measure extremely low currents in the pico-ampere levels, which can be translated into a corrosion rate as low as a few nanometers per year, in some applications (PDF). Our analyzers and monitors are based on the patented coupled multielectrode array sensor (CMAS) technology which measures the flow of electrons from corroding electrodes to one or more cathodes.
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Nanoindentation Testing in the Micrometer RangeFISCHERSCOPE
FISCHERSCOPE® HM2000
Nanoindentation for professionals. Reliable hardness measuring instrument for determining properties such as indentation hardness and the depth-dependent elastic indenter modulus – and all of that in the nanometer range.
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UV Light Sensor
28091
The UV Light Sensor measures ambient ultraviolet intensity in the 200 to 370 nanometer range, within the solar ultraviolet UVA, UVB, and UVC light spectrum. The sensor has a built-in amplifier with adjustable levels. The UV Light Sensor may be used outdoors in a variety of applications including datalogging and closed-loop control, such as for activating watering or greenhouse vents.
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Chromatic Dispersion Emulator
CS-CDE
The ClearSpectrum™-CDE is a chromatic dispersion emulator suited for test and measurement. This 1U half 19-inch rack-mountable module is designed to emulate tens of thousands of picoseconds per nanometer in a compact unit while maintaining very low insertion loss. It is a passive, ready-to-use emulator which can be cascaded several times to achieve higher levels of dispersion.
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Nanometer Measurement
The Nano-Gauge™ is an ultra high precision, single axis, displacement measuring instrument capable of resolving dimensions down to 1.5 nanometers (0.06 microinches) over a full scale range of 25mm (1 inch). Combining ease-of-use and small physical size, the Nano-Gauge™ can be quickly adapted to a wide variety of precision measurement situations without lengthy or complex setup procedures.
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Instrumented Indentation Tester
With Anton Paar’s versatile indentation testers you can precisely determine the mechanical properties of thin films, coatings, or substrates such as hardness and elastic modulus. The instruments handle almost any type of material, whether soft, hard, brittle, or ductile. You can also conduct creep, fatigue, and stress-strain studies on surfaces in the nanometer range.
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Spectrometer
LI-180
Plant growth and reproduction are driven by photosynthetically active radiation (PAR), defined as wavelengths between 400 and 700 nanometers. This interval is often separated into three distinct “color” bands for plant research. Modifying the intensity of red, blue, green wavelengths, along with additional near-UV (380-400 nm) and far-red (700-780 nm) bands, can influence a variety of plant characteristics, such as growth rate, chemical composition, and more.
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Surface Charge and Zeta Potential
Surface analysis is a vital method for qualifying new materials in technical and biological applications. Surface charge analysis empowers users to closely monitor the surface chemistry from small particles in the nanometer range up to large wafers. Gain insights into modifications resulting from surface treatment and surface interactions with natural environments under near-ambient conditions. Get a competitive edge in optimizing existing products and developing new ones using the Anton Paar instruments which offer zeta potential measurement for a wide range of applications.
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Spectroscopic Platform
Allalin
The Allalin is a nanometer resolution spectroscopy instrument, based on a disruptive technology known as quantitative cathodoluminescence that integrates a light microscope and a scanning electron microscope (SEM) into one tool.
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Capacitive Position Sensor for Nanopositioning
MicroSense Mini
The MicroSense Mini is a compact, high resolution linear displacement sensor designed specifically for providing servo system feedback, especially for OEM applications.The MicroSense Mini is a precision linear position sensor which delivers nanometer level resolution over measurement ranges up to a millimeter.
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Deep Ultraviolet Spectrophotometer System
VUVAS-10X
A new ultraviolet spectrophotometer system for optical metrology just arrived at NASA Goddard! The VUVAS-10X spectrophotometer works best in the 90 to 160 nanometer wavelength range, also known as deep or vacuum ultraviolet (VUV) region. It uses a windowless hydrogen plasma light source and differential pump section to reach many wavelengths beyond those of conventional deuterium lamps. The source also works with other gases, or gas mixtures, for atomic spectral line emission from about 30 nanometers (double ionized Helium gas) up to the Visible light range. The new spectrophotometer system, McPherson VUVAS-10X, uses a one-meter focal length high-resolution monochromator with the special light source, scintillated detector and Model 121 goniometric sample chamber. The system is ideal for optical transmission, absorbance and specular reflectance at incident angles up to 60 degrees. This McPherson spectrophotometer system will help develop, inspect and qualify optical materials and coatings used for very high altitude and extraterrestrial space flight missions.
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Surface Measurement Instrumentts
Analyze surfaces texture with nanometer precision is already a technological challenge, but TR Scan Premium is able to perform this task with unprecedented speed! The TR Scan Premium is used in workshops and laboratories worldwide. It is completely designed and manufactured in Switzerland by TRIMOS. The TR Scan is focusing on Digital Holographic Imaging Technology. Accuracy, speed, ease of use and modular construction make it ideal for all types of surface measurements.
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Coordinate Measuring Machines
VideoCheck® UA
Ultra Accurate multisensor coordinate measuring machine in fixed bridge designHighest accuracy due to use of low vibration precision air bearings and solid granite constructionThe VideoCheck® UA features scale resolution in the nanometer range and a special design that reduces measurement errorsCan be equipped with high-precision sensors including the high precision 3D Fiber Probe.Use of high precision telecentric lenses in a second optical beam pathModular structure guarantees customized solutions for individual applicationsIntegrated vibration isolation dampeners
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Nanopositioning Stage & Controller
PInano
Physik Instrumente GmbH & Co. KG
PInano® XY and XYZ low-profile piezo scanning stages are optimized for easy integration into high-resolution microscopes. They feature a very low profile of 20 mm (0.8") and a large aperture designed to hold Petri dishes and standard slide holders. The long travel ranges of up to 200 x 200 x 200 µm with nanometer closed-loop resolution are ideal for leading-edge microscopy and imaging applications. PInano® series piezo positioning stages are available in two versions: A) Highest Stability, Linearity and Precision with capacitive feedback sensors. B) High Precision with lower cost piezoresistive sensor feedback. Both types provide very high sensitivity and responsiveness as well as nanometer resolution. A proprietary servo controller significantly improves the motion linearity of the piezoresitive version compared to conventional piezoresistive sensor controllers.
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High Precision 3D Metrology
Ensure zero-defect quality in all product deliveries and boost customer satisfaction: ISRA’s precision metrology systems measure all object and surface properties down to the nanometer level while ensuring the shortest cycle times.
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Particle Size Analyzers
Particle systems can be complex, but measuring them doesn’t have to be! Anton Paar offers two different technologies to characterize particles from the nanometer to the millimeter range. The Litesizer series employs light-scattering technology to determine not only particle size, but also zeta potential, transmittance, molecular mass, and the refractive index of nano- and microparticles in liquid dispersions. The PSA series uses laser diffraction technology to measure the size of particles in both liquid dispersions and dry powders in the micro and millimeter range. Side by side they open up a wide range of possibilities for comprehensive particle characterization.
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High Voltage Insulation Tester Module
DP-cPCI-5586
DP-cPCI-5586 is a High Voltage Insulation Tester Module. This module facilitates single-board voltage source/measurement features with high voltage output and a nanometer. Occupying a single slot in standard cPCI rack, this module can be used for multiple point cable harness test systems with limited rack space. Applications of this board include automatic test equipment, checkout systems, force voltage measure current, and insulation test.
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Submicron Particle Imaging
FlowCam Nano
Yokogawa Fluid Imaging Technologies, Inc.
FlowCam Nano is the next-generation dynamic image analysis instrument for submicron particle imaging and sizing in real-time. FlowCam Nano extends subvisible particle analysis to detect objects between 300 nanometers and 2 micrometers - the smallest visible with light microscopy.
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hpower High Power Amplifiers
For hpower high-power actuators, high-power amplifiers are required. Together these hpower actuators and amplifier systems deliver exceptionally fast response times, superior dynamics, high force generation, and nanometer precision.
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3D Form Measurement
Ensure that components function and can be fitted correctly with efficient form monitoring. ISRA’s 3D form measurement systems capture component geometries down to the nanometer level while ensuring the shortest cycle times.
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Laser Scanning Microscope
OLS4100
The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
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Surface Analysis
Shimadzu offers a range of instruments that are ideal for all sample forms handled by customers in the fields of steel, non-ferrous metals, environment, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers. EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.
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Precision Capacitive Position Sensor
6810
Break the nanometer resolution barrier -- achieve picometer resolution with our highest resolution position sensorPrecision Position Sensor for Non Contact Displacement Measurement - Model 6810MicroSense introduces our new Model 6810 high resolution capacitive position sensor. The 6810, in combination with 6000 series probes, is a non-contact displacement measurement system intended to provide exceptionally high resolution, low noise measurements.
