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Primary Current Injection Test
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Primary Current Injection Test Trolley
SCR ELEKTRONIKS have developed primary and secondary Current injection test trolley for Switchgear manufacturers for testing of ACB , MCB , MCCB. It is low Voltage high Current source with control circuitry, digital read out for test current and trip time measurement. We can select different links of CT range as per the required test Current.
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Primary Current Injection Test Set
DDG / 580
Wuhan Huatian Electric Power Automation Co., Ltd.
It is suitable for large current places in power system and laboratory.
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Primary Current Injection Test Set
T 3000
T 3000 is a primary current injection testing system designed to perform primary tests requested in substations commissioning. It allows to perform different tests and measurements on current transformers, voltage transformers, power transformers, protection relays, energy meters and transducers
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Primary Current Injection Test Set
T 2000
T 2000 is a portable current transformer test set which allows to perform many different measurements such as saturation, ratio and polarity tests and CT winding resistance test. Substation maintenance and commissioning test equipment, T 2000 is extremely appreciated by electrical engineers for its high accuracy and portability.
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Large Current 1000A Primary Current Injection Test Set
TEST-901
Beijing GFUVE Electronics Co.,Ltd.
TEST-901 primary current injection test set adopts ARM Chip to control its output process and large capacity of toroidal transformers. It is equipped with LCD display and current meter; it can show primary current value, second current value, turn ratio and the action time. Packing is used as aluminum alloy body with PC panel. TEST-901 is mainly applied to CT turn ratio testing in the power system and contact resistance test which need large current.
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Primary Injection Kit
Prima Series
Prima Series is designed for Primary Current Injection Testing of Current Transformers, Protection Relays & Circuit Breakers during their Factory Test, Commissioning and Routine Testing.
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Primary Current Injection Test Sets
Our primary current injection test sets cover from 750A through to 6000A. Available in single phase, testing applications include testing and timing of under and over current relays, circuit breakers and CT ratio testing.
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High DC Primary Current Injection Test Set
PDC15k
PDC15k High DC Primary Current Injection Test Set adopts high-frequency invert principle to realize the high DC current output capability, with very small size and light weight. PDC15k is modular designed with changeable modules and multi-functions local control software.
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Primary Current Injection Kits
During installation,testing,especially if the protective gear is connected to the power line via a current transformer it is advisable to use our Primary Injection Test Set. Keeping this in mind a wide range of Primary Current Injection Test Sets are being manufactured by "NMC”.
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Primary Current Injection Testing
KAM
This substation testing device is designed to grant high current output when needed in substation commissioning activities.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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sbRIO-9227, Non-Enclosed, 50 kS/s/ch, 5 Arms, 24-Bit, 4-Channel C Series Current Input Module
781118-01
Non-Enclosed, 50 kS/s/ch, 5 Arms, 24-Bit, 4-Channel C Series Current Input Module - The sbRIO‑9227 was designed to provide high-accuracy measurements to meet the demands of data acquisition and control applications. It includes built-in anti-aliasing filters. When used with a C Series Voltage Input Module, the sbRIO‑9227 can measure power and energy consumption for applications such as appliance and electronic device test. You can not only measure and meter current and power but also look at quality factors such as noise, frequency, and harmonics. Non-enclosed modules are designed for OEM applications.
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Audio and Acoustic Functional Test Solution
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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NI's Electrical Functional Test Solution
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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NI-9203, 200 kS/s, ±20 mA, 8-Channel C Series Current Input Module
779516-01
200 kS/s, ±20 mA, 8-Channel C Series Current Input Module - The NI‑9203 is intended for high-performance control and monitoring applications. It features programmable input ranges and variable connectivity options. To protect against signal transients, the NI‑9203 includes a channel‑to‑earth ground double‑isolation barrier (250 Vrms isolation) for safety and noise immunity.
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sbRIO-9253, Non-Enclosed, 50 kS/s/ch, 24-Bit, 8-Channel C Series Current Input Module
787433-01
Non-Enclosed, 50 kS/s/ch, 24-Bit, 8-Channel C Series Current Input Module - The sbRIO-9253 is an 8-channel analog input module for CompactRIO Single-Board Controller that provides a ±20 mA input range and 24 bits of resolution at a 50 kS/s sample rate. This module includes diagnostic functionalities to ensure nominal system operations with open-channel detection, power supply detection, and configurable thresholds. You can view the status of each channel and the power supply with eight LEDs. The sbRIO-9253 also features programmable hardware filters for your applications, such as specific Butterworth and comb filters that you can use to reduce the noise in your system.
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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NI-9266 , 8-Channel C Series Current Output Module
785046-01
8-Channel C Series Current Output Module - The NI‑9266 is ideal for interfacing and controlling industrial current-driven actuators. The module has built-in open-loop detection, which generates an interrupt in software when an open loop is detected as well as zeroing outputs to ensure safety and avoid driving actuators at system power on. The NI‑9266 includes channel‑to‑earth ground isolation for safety and noise immunity.
