Filter Results By:
Products
Applications
Manufacturers
-
product
Optical Scanning Systems
that feature high scanning speed and accuracy. Our non-contact 3D scanners are ideal for 3D digitization of physical models, quality control and reverse engineering.
-
product
Scanning Probe Microscopes
SpectraView 2500
* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force
-
product
Scanning Probe Microscope
SPM-9700HT
Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
-
product
NTSC PATTERN GENERATOR
PG-38
Model PG-38 NTSC Pattern Generator can be use to quickly and easily troubleshoot, test, and align NTSC television. Features a wide selection of popular video patterns including Color Bars, Crosshatch, Dot, Staircase, Circle, Center Cross, Window, and Raster for accurate and comprehensive TV troubleshooting and testing. Supports both progressive and interlace scanning system. Composite video and S-Video output. RF video output on Channel 3 with 1KHz audio tone for audio troubleshooting. User friendly interface for easy operation.
-
product
Atomic Force Microscope
Flex-Mount
Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM.
-
product
Sensors
NanoFocus Probe
Scan of 3D topography of high accurate featuresVery high point densitySuitable to perform non-contact roughness measurementsHigh flexibility using a range of different front lenses
-
product
Ultra-High Vacuum
KP Technology offer a range of Kelvin Probes that work under ultra-high vacuum conditions, choose from single-point or scanning probes to add to your existing vacuum chamber, customize the UHV corner cube or consider the newest addition to the range, the Ф4 ultra-high vacuum scanning Kelvin Probe system.
-
product
Wafer Inspection System
AutoWafer Pro™
AutoWafer pro is our most advanced ultrasonic equipment for detecting defects in bonded wafers in a production environment, providing fast, high-resolution scanning of 200mm and 300mm bonded wafers.
-
product
acA1440-73gc, Color GigE Vision, 1.6 MP, 73 FPS Area Scan Camera
787059-01
The acA1440-73gc is a Color Basler Ace GigE Vision Camera with a 1.6 MP resolution and a maximum image acquisition speed of 73 frames per second. The acA1440-73gc uses a IMX273 sensor and is quality tested and calibrated for high performance and reliability. This camera can be used with NI hardware and software to build machine vision systems.
-
product
Galvo-Resonant Scan Head and Controller
Our LSK-GR08(/M) Galvo-Resonant Scanner contains one resonant scan mirror and one galvo scan mirror that deflect an incident laser beam in X and Y, respectively. Identical to the galvo-resonant scanner used in our Bergamo® II multiphoton microscopes and complete Cerna®-based confocal systems, the 8 kHz resonant frequency of the resonant scan mirror enables much higher-speed scans than a galvo-galvo system. In our Bergamo system, the scanner can achieve 30 fps at 512 x 512 pixels image resolution.
-
product
Ambient Pressure Photoemission Spectroscopy With Nitrogen Environment
The APS04-N2-RH incorporates a tuneable deep ultra-violet (UV) source outputting 3.4 - 7.0 eV, for absolute work function and highest occupied molecular orbital (HOMO) measurements, a surface photovoltage spectroscopy (SPS) module outputting 400 - 1000 nm for Voc and Eg measurements, together with a 50 x 50 mm scanning area for planar relative work function measurements (Fermi level).
-
product
Single-sensor Color Area Scan Cameras
JAI provides a wide selection of single-sensor color area scan cameras with resolutions ranging from VGA to 20 megapixels. Cameras are built around state-of-the-art sensor technology including the latest CMOS global shutter imagers, as well as some with traditional CCDs.
-
product
Tone And Probe Kit
#TP150
Make cable tracing easy with Platinum Tools’ Tone and Probe Set. With its steady tone, push-to-scan button and a clear loudspeaker, quickly trace and identify cable locations on jacks or through walls. Wire bundles are easily penetrated with the tapered probe tip and the probe volume is controlled with a thumbwheel. With common send and […]
-
product
Polarization Lambda Scan Software License
N7700100C
Enables polarization-dependent swept-wavelength multichannel measurements with the PAS LS engine and PAS IL/PDL engine, as well as measurements without varying polarization with the PAS LS engine and PAS FSIL engine.
-
product
Multi-Network Cable Tester
3PK-NT007N
Multi-network cable tester is specified to quickly test by auto scanning the wires continuity, miss-wiring and polarization in your network cables, thin Ethernet (BNC)/10 Base-T (UTP/STP)/356A/ TIA-568A/TIA-568B/Token Ring. By using the attached remote terminator, you can easily test the cable whatever before or after the cables installed. It also allows you to test the ground of shielded twisted pairs cables.
-
product
Microprocessors
CAES specializes in digital hardware design for commercial and aerospace applications. Our processing solutions are ideal for spacecraft on-board computers, payload processing, nuclear power plant controllers, critical transportation systems, high-altitude avionics, medical electronics and X-ray cargo scanning.
-
product
Reference Ellipsometer for Thin Film Measurements
UVISEL Plus
The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization. FastAcq technology enables a sample measurement from 190 to 2100nm to be completed within 3 minutes, at high resolution. The possibility to continuously adjust the spectral resolution along the measurement range enables to scan a sample smarter and faster.
-
product
Probe Holders
Probe holders from ZEISS offer the possibility to use optical and tactile scanning probes on one CMM. With the articulating probe holder even complex parts can be measured with less effort.
-
product
Inline OEM High Resolution Thickness & Resistivity Module for PV / Solar Sorters
MX 152
To allow three thickness scans during belt transport at different wafer sizes, two measuring bars, one from top and one from bottom, hold 3 sensors each.
-
product
Atomic Force Microscope
NX-Hivac
Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
-
product
XJLink2-3030
The XJLink2-3030 provides convenient, integrated access to XJTAG’s powerful boundary scan test and programming tools from SPEA 3030 ICT machines.
-
product
Cover Extend Feature, GTE 10.00p
K8217B
Cover-Extend Technology (CET) extends the measurement capability of VTEP or nanoVTEP into powered testing by using the Boundary Scan output cell to test the connectors and socket signal pins. This capability extends the Boundary Scan limited access solution on non-boundary scan devices with the use of VTEP or nanoVTEP and CET signal conditioner card hardware.
-
product
LC/MS/MS Rapid Toxicology Screening System
Ver.3
This system improves the efficiency of simultaneous LC/MS/MS analysis methods by allowing the user to start analysis without time-consuming steps such as consideration of separation conditions and MS parameter optimization. Rapid simultaneous analysis methods with analysis times under 15 mins are included for 235 compounds including drugs of abuse, psychoneurotic drugs and sedatives. The system also provides optimised conditions for synchronised survey scans used in screening measurements (conditions adopted for the product ion spectrum as a threshold value for the intensity in MRM).
-
product
Framework for Soft-Error Protection
RobustScan™
RobustScan™ provides a platform for users to pick patented Configurable Soft-Error Resilience (CSER) cells or their preferred SER mitigation cells. First, Soft-Error Rate (SER) analysis is performed. Then it performs automatic robust-scan-cell and hardenedcombinational- cell selection and synthesis. Finally it generates verification testbenches for the final design. RobustScan™ can be used with scan chains inserted using third-party tools; it can be linked to third-party�s SER analysis programs and is fully compatible with SynTest�s existing DFT tools for test, debug, and diagnosis.
-
product
Special Development AFM Tips ...
AFM Cantilevers and material variations. Ultra-Short AFM Cantilevers: 1) Ultra-Short Tipless AFM Cantilevers 11 (for High Speed Scanning). Diverse (AFM related)
-
product
In-Sight Vision Systems
9000 Series
The In-Sight 9000 is a rugged, ultra-high-resolution line of standalone vision systems. With its ability to acquire and process exceptionally detailed images, the In-Sight 9000 delivers high accuracy part location, measurement, and inspection over a large area—even when mounted at longer distances. Line scan and area scan image acquisition options are available for imaging continuously moving or stationary objects. Plus, a full suite of vision tools configurable through the In-Sight EasyBuilder interface solves a wide range of applications across industries.
-
product
Scanning Kelvin Probe
Our large range of Scanning Kelvin Probes gives the user full access to 2D and 3D work function plots of samples ranging in size from 50 mm to 350 mm. With work function resolution of 1 - 3 meV, and the spatial resolution of the Probe tip diameter (0.05 mm with the SKP5050 model), the Scanning Kelvin Probe gives reliable, repeatable measurements for work function, contact potential difference and Volta potential.
-
product
Scanning & Inspection
API’s offers a range of portable measuring and laser scanning solutions together with robot or tripod mounted 3D structured light scanner.
-
product
Programming on-chip flash in your processor
XJDirect
XJDirect is an advanced and innovative method for programming the internal flash of your processor and implementing some aspects of board test through JTAG when traditional boundary scan techniques cannot be used.
-
product
Renishaw Scanning Probes
Advanced Industrial Measurement Systems
The REVO® is designed to maximize CMM throughput while maintaining high system accuracy and uses synchronized motion as well as Renscan5 measurement technology to minimize the dynamic effects of CMM motion at ultra high measurement speeds. This is achieved by letting the REVO® head do the fast demanding motion while the CMM moves in a slow linear fashion.
