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- Kreon Technologies
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Scanners
Our 3D scanners are equipped with a probe, which means that there is no need to disconnect your scanner when changing from scanning to probing and vace versa. the flexability of our scanners saves time and ensures reliable 3D measurements.
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3D Scanning Reverse Engineering Services
Reverse engineering is oftentimes a catch-all term used for many design and engineering applications. But trust us, there is so much more to this category for the uses of our 3D scanners, portable CMMs and laser trackers. Also, reverse engineering tends to imply that the 3D scanning will be used solely for product design, when in fact it can be used to address many other engineering functions such as:
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Laser Scanning FLIM Microscopes
DCS-120 laser scanner: Compact - Flexible - Precise. As technology leader in equipment and techniques for single photon counting, Becker & Hickl offers the DCS-120 systems that are complete laser scanning microscopes for fluorescence lifetime imaging (FLIM) since 2007. The systems use bh’s multi-dimensional TCSPC FLIM technology in combination with fast laser scanning and confocal detection or multi-photon excitation.
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Near-Field Scanning Optical Microscope Platform
MoScan-F
MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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Scanning Electron Microscopy
SEM
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Ultraschallmikroskop And Scanning Acoustic Microscopes
Microtronic Microelectronic Vertriebs GmbH
mage quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.Sonix has been the innovation leader since 1986. Today, the ECHO line of scanning acoustic microscopes sets the standard for package inspection speed and image quality, to help you keep pace with new packaging materials and difficult form factors. The ECHO platform will remain at the forefront as we continue to add features and enhance performance for years to come.
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High-efficiency Fiber Stretcher
PZ2
The PZ2 provides the most extensive stretch of our stretcher product family. It is a fiber wound piezoelectric element for use in a wide range of optical interferometric measurement and sensing system applications. Typical uses include open loop demodulation, sensor simulation, white-light scanning interferometry and large angle modulation of interferometric phase. The PZ2 is ideal for use in OCT [Optical Coherence Tomography] and OCDR [Optical Coherence Domain Reflectometry] applications requiring scattering or boundary definition measurements.
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Scanning Electron Microscope
Verios G4 XHR SEM
The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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NTSC PATTERN GENERATOR
PG-28
Model PG-28 NTSC Pattern Generator can be use to quickly and easily troubleshoot, test, and align NTSC television. Features a wide selection of popular video patterns including Color Bars, Crosshatch, Dot, Staircase, Circle, Center Cross, Window, and Raster for accurate and comprehensive TV troubleshooting and testing. Supports both progressive and interlace scanning system. Composite video and S-Video output. 1KHz audio tone for audio troubleshooting.
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Laser Scanners
RTC360ScannersDelivering outstanding range, speed and highest quality 3D data, Leica Geosystems laser scanners are the perfect partner for any tasks in 3D laser scanning.
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Brinell Optical Scanning System
B.O.S.S.
Newage Testing Instruments, Inc.
The B.O.S.S. brinell optical scanning system measures your brinell impressions faster, more accurately and more consistently. And it improves your quality control with advanced data acquisition and analysis capabilities, including the ability to save your high-resolution image of our impression to file.
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Scanning Probe Microscopy
SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Coordinate Measuring Machines
FlatScope
Perfect for the measurement of larger 2D profiles (e.g.),films, circuit boards, laser cut and stamped parts large and smallMachine design with the image processing sensor under the glass plate, eliminates time-consuming focusing as the workpiece is always in the correct distance to the opticsIn raster scanning mode the machine also quickly captures the selected measurement range completelyAll geometric features are then evaluated automatically in the imageQuick dimensional measurements in the scanned image and automatic gaging with ToleranceFit® comparisons
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Imaging Camera for Dynamic FLIM Studies at Real Time Video Rates
FLIMera
The HORIBA FLIMera camera is a new concept in FLIM technology. It is a wide field imaging camera, rather than a confocal point scanning system, with the intrinsic benefit of being able to study FLIM dynamics at video rates with a simple camera technology.
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Radar Systems
A radar system utilizing electronic-computer techniques whereby raw data is used to track an assigned target, compute target velocity, and predict its future position without interfering with the scanning rate.
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Vector Network Analyzer Automation Suite
ZNrun
For a facility manager the yardstick for optimization could be maximizing the daily production yield, while for a test-engineer it might mean being able to easily define a test setup and have it loaded on each device in the factory in seconds. A tester might be interested in seeing only the result of the measurements, after having started it by scanning a barcode, while quality managers might find it convenient to be able to download real-time yield statistics on their way to the factory. The R&S®ZNrun software suite was designed with optimization in mind and acknowledges these re-quirements by offering each party the possibility to expedite their workflows as much as possible.
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AWS Probes For Ultrasonic Weld Seam Testing (ASTM)
SONOSCAN R
The robust ultrasonic probes with BNC connector allow a fast scanning over comparatively large areas with high precision and repeatability. Both our own and third-party wedges can be attached to our probes. . Thanks to the different types of wedges various material tests can be performed.
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Autonomous Pulsed Doppler Wind LiDAR System
Galion
The Galion LiDAR, distributed by SgurrEnergy, has been optimised for collecting data for wind power applications. The all-sky scanning capability enables many more data collection opportunities than VAD scanning alone.
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PTA 5G
Evaluate the 5G Core Network security risks, based on NRF API authorisation (OAuth 2.0) filtering scanning (from 3GPP OpenAPI definition) and SEPP PLMN security evaluation from an International or National perspective.
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Laser Scanning Systems
QFP markets manually handled and optically tracked 3D laser scanners that set new standards in the metrology measurement industry. The products are characterized by exceptional performance, ease of use and cost-effectiveness and are the perfect solution for the metrology room as well as for the production line, stand-alone or automated.
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Pre-Selectors for EMC test
These Pre-Selectors are high specification, switched band filters which track the scanning of the EMC Analyser. Control is via USB link from the Laplace EMCEngineer software supplied with SA1002 and SA3000 analysers. Installation and operation is completely automatic, and the filters will synchronise with the analyser scan without any operator intervention. A front panel switch allows manual operation if required.
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Frame Grabbers
Grablink Series
The Grablink frame grabber controls the camera scanning rate based on the signals received from a motion encoder. When the parts move faster, the acquisition line rate of the camera increases. When the parts move slower, the acquisition line rate of the camera decreases.
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Imaging Scanning Monochromator
H1034
HORIBA Scientific OEM has developed a high-throughput imaging scanning monochromator based on an aberration-corrected concave holographic grating with low stray light and high efficiency. This proprietary layout with single optics design is ideal for imaging for low-light applications. It features a 3-position external filter wheel, TTL drive electronics, 4-phase stepper motor and associated worm/gear 90:1 ratio mechanism, encoded, aligned and focused at factory.
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NanoModeScan M² Measuring System
This scanning slit M² measurement system accurately analyzes lasers with wavelengths from UV to Far Infrared with its silicon, germanium, or pyroelectric head. It features a compact portable design, immediate results, ISO compliant measurements, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive analysis of lasers of most wavelengths.
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Fourier Transform Optical Spectrum Analyzer, 600 - 1700 nm
OSA202C
Thorlabs' Optical Spectrum Analyzers (OSAs) perform highly accurate spectral measurements. Compatible with fiber-coupled and free-space light sources, these compact benchtop instruments suit a wide variety of applications, such as analyzing the spectrum of a telecom signal, resolving the Fabry-Perot modes of a gain chip, and identifying gas absorption lines. Many commonly available OSAs use grating-based monochromators, which have slow acquisition times due to the need to mechanically scan the grating and average out noise at each wavelength. Thorlabs' OSAs acquire the spectrum via a Fourier transform using a scanning Michelson interferometer in a push/pull configuration. This approach dramatically improves the acquisition time, enables a high-precision wavelength meter mode with 7 significant figures and ±1 part-per-million accuracy, and allows the included software to provide robust statistical analysis of the acquired spectra, as explained in the Design tab.
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Scan To CAD
Scanning or hard probing, large or small, we have a large arsenal of hardware & software to fit our clients’ needs. With all the reference data coming directly from the CAD model this eliminates any human error that would have come through manually entering nominal information.
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Digital Multimeter
6410 DM
Standard Electric Works Co., Ltd
● 3000 counts with a maximum display of 2999.● Angled display design helps the user to identify the reading of value easier.● Auto scanning function for AC/DC voltage, and current.● Auto ranging.● Range change function.● Continuity check.● Diode & Capacitance measurement.● Data hold function.● Low battery indication.● Over range indication.● Fuse protection.● Special hook design used to hang the meter for ease of use.
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Highly Dynamic XY Linear Motor Scanning Stage
L-731
Physik Instrumente GmbH & Co. KG
The magnetic linear direct drive is designed to provide high velocity and acceleration for inspection and microscopy. With a travel range of 205 mm square and solid velocity to 100 mm/sec, the L-731 is equipped to deliver high accuracy and smooth motion. Precision crossed roller bearings with anti-creep cage assist enable superior guiding accuracy (1.5 m straightness for loads up to 20 kg). An integrated optical reference encoder and limit switch provide further positioning control and accuracy for this compact stage with 5 nm resolution. DC servo motor versions are available on request.
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Motion Control Components
- Control of versatile robotic structures, including "yaw", "pitch" and "roll" motion capabilities- S-curve velocity profiling, based on polynomial splines and Bernstein-Bezier curves- Continuous path control in multi-segment smooth trajectories- Synchronization of multiple axes- Trajectory control with user defined velocity profiles- Kinematical modeling of open and closed loop mechanisms- Singularity consistent path planning and singularity avoidance- Optimal PID filter tuning- Automatic adjustment with respect to the surrounding equipment (cassettes, process stations, etc.)- Tilting capabilities in terms of the end-effector frame- Compensation for deflection of the end effector, the manipulated object and geometric in accuracies of the arm Scanning and Aligning Features- Wafer mapping based on through-beam or reflective sensors- Automatic detection of the planarity and the center of wafers and FPD- Non contact FPD aligning. Misalignment compensation on the fly Safety- Programmable travel limits- Position tracking error detection- Amplifier overload protection- Emergency stop
