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Test Programming
Consulting companies that provide/develop complete testing solutions or specific software capabilities or tools, and even end-product operation and maintenance training. Using a combination of original and generic capabilities, they save time, resources, and costs of the production company. (teradyne.com)
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Test Programming LabVIEW
With LabVIEW, National Instruments provides an industry standard for developing a test environment.Our employees have many years of experience in many areas of this development environment.
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Test Programming
Terotest offers a full test programming service for all of our Automatic Test Equipment. In many cases test programs can be generated from CAD data on the product or component under test, or from autolearn facilities within the test system. Such techniques maximise accuracy and test program fault coverage, and allow quick and easy test program generation.
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Software for the Development and Implementation of Test Programs using IEEE 1641
newWaveX Suite
We Have a unique suite of tools to support the development and implementation of test programs created using IEEE 1641 to define the signals and tests. These include the entry-level version of newWaveX (newWaveX–Lite), the development versions of newWaveX (newWaveX–SD and newWaveX–PD) and the complete integrated development environment for IEEE 1641, SigBase. These tools provide everything necessary to work with IEEE 1641, from creating simple signals through to implementing and managing a complete 1641 test environment. All of our 1641 tools are commercial off-the-shelf (COTS) items that may be used stand-alone or integrated into a complete test development environment. newWaveX products may be integrated with third party test executives and associated software.newWaveX is an intuitive user-friendly suite of products that does not require specialist training for users to acquire the skills to develop 1641 programs. Completing the IEEE 1641 User/Developer training course (which uses newWaveX Signal Development for the hands-on element), together with the associated 1 day newWaveX–SD User/Developer training course, provides complete information for the newWaveX user. Further support is provided for users of newWaveX packages under the maintenance agreements for those products.
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Microelectronic Services
Services for ASIC houses and Integrated Device Manufacturers are IC Wafer / Final Test, IC assembly, Test Program development, product engineering, Flash / EEPROM programming, characterisation / capability studies, yield enhancement, design verification and failure / yield analysis. Das Test Haus are specialists for wafer test, low power, mixed signal and eeprom test.
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XJLink2-3030
The XJLink2-3030 provides convenient, integrated access to XJTAG’s powerful boundary scan test and programming tools from SPEA 3030 ICT machines.
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Engineering Design & Development
TPSA has over 20 years of experience in Engineering Design & Software Development including:Hardware & Software DesignOTPS Acquisition SupportSystems Installation & SupportAircraft Modification/CertificationEngineering Studies & AnalysesFunctional & Systems TestingIndependent Verification & Validation (IV & V)Test Program Set EngineeringReliability & Maintainability (R&M)Engineering Drawings & DataConfiguration Data ManagementReverse EngineeringRequirements AnalysisSupport Equipment (SE)Aircraft Launch & Recovery Engineering (ALRE)Engineering Change Proposal (ECP) ReviewTechnology Insertion (TI)PDR, CDR, FAT, Techeval, OSV Support
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High Power LED Test System
Lumere-GM
Evolusys Technologies Sdn. Bhd.
Lumere GM is a LED test and measurement system for various parameters of LED light. It is a high-accuracy system with a temperature-controlled CCD, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. The Lumere GM is used in laboratory applications and in the production of high-power LEDs.
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Test Program Modules
The BRAT Test Program developed will provide functional validation of an assembly based on customer supplied documentation. This does not include hardware (e.g., Interface Test Adaptors), documentation (e.g., technical orders), travel or travel related per diem, or site verification test or installation.
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6TL10 Table Top Test Base
H71001000
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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JTAG Boundary-Scan Controllers for High-Volume Production Systems
Corelis has designed special hardware that autonomously performs concurrent (gang) testing and programming of multiple units without additional user intervention. The entire testing and programming, including on-the-fly verification of results, is done in modular and expandable hardware.
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Program Development for Multisite Test
IG-XL
Teradyne’s award winning IG-XL software transforms test program development for the FLEX, UltraFLEX and J750 family of testers. Its powerful, yet easy-to-use, graphical environment lets engineers rapidly develop fully functional test programs, cutting program development and debugging time. Designed to address multisite complexity, IG-XL can convert single site test programs to multisite automatically, speeding time to market and reducing cost of test. With IG-XL, test engineers focus on actual testing, not writing code for the tester.
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PCI Based JTAG Controller
PCI-1149.1/Turbo
The PCI-1149.1/Turbo is a powerful PCI-based JTAG/boundary-scan controller that is used for testing and in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
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IPv6 Testing and Certification
Our IPv6 testing services prove interoperability and functionality for IPv6 networks. Our testing includes coverage for IPv6 Host and Router, CE Router, IPv6 Applications and Network Protection Products. We offer ISO/IEC 17025 accredited testing for both the USGv6 and IPv6 Ready Logo test programs. In addition, customers may license our custom test tool IOL INTACT® for pretesting and internal validation.
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Protection Accessories
Testing programs can vary from team to team and company to company.That's why Doble offers a comprehensive series of accessories so you can maximize the capabilities of your Doble power system simulators.Options include amplifiers, communication devices, transducer/metering test options, distribution accessories and more.This way you can choose the accessories that make sense for your budget and business requirements.
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Calibrated Leak Standards
LeakMaster is a leader in the industry when it comes to the manufacturing of calibrated leak standards (calibrated leak orifices). Each leak standard is meticulously manufactured to a specific leak or flow rate at a predetermined pressure. The purpose of each leak standard is to teach, or calibrate a leak test program, and allow the leak test instrument to memorize the characteristics of a leaking part. These leaks are also introduced into production parts to simulate a “leaking or failed” part condition. LeakMaster supplies a calibrated leak standard with every leak test instrument, and provides recertification services for all of their leak standards
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Custom Testing Solutions
Test and MeasurementEnable increases the robustness of your test and measurement solutions, thereby reducing errors and associated costs. Data Acquisition (DAQ)Enable defines and builds custom DAQ systems for automated measurements of any process or manufactured part. Control and AutomationEngineeringEnable ensures that your processes are programmed to be safe, effective and optimized for both speed and quality. Real-Time and Mission CriticalSystemsEnable develops dependable real-time systems and Hardware in the Loop (HIL) simulations for high-speed applications. Motion ControlEnable creates software for synchronized multi-axis robotic control of velocity, position, force and action. Machine VisionEnable implements software and hardware-based solutions for precise image analysis, data extraction and vision-guided machine control. R&D Systems/Product DevelopmentEnable’s team of engineers and scientists works with you to address and solve problems containing technical challenges and uncertainties. Electronic Test SystemsEnable programs and builds software and hardware-based solutions for accurate measurements, from DC to RF. Mobile App DevelopmentEnable enhances your systems by integrating custom iOS and Android apps. Web DevelopmentEnable enhances your systems by integrating desktop and mobile web frameworks using PHP, CSS and HTML5. Database DevelopmentEnable decentralizes your data storage to be online, secure and accessible from anywhere.
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Test & Programming Software
ScanExpress
The ScanExpress Family of boundary-scan software offers a fully integrated development environment that includes boundary-scan and at-speed functional test program generation, test program execution with advanced pin level diagnostics, interactive boundary-scan debugging, and in-System Programming (ISP) of devices such as Flash memory, serial EEPROMs, CPLDd, and FPGAs.
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Open Networking
We are committed to the ever changing world of Data Communication and Storage Networks. As the industry moves forward into Open Networking, we are keeping pace. Working closely with various Open Network organizations such as the Open Compute Project (OCP) and the Open Platform for NFV (OPNFV), we are leveraging years of experience of effecting positive change in the industry and creating robust test programs to enable markets.
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DiodeTester
FECPLS500
Frothingham Electronics Corporation
The PLS500 automatic tester is designed primarily to do SURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses and THERMAL RESPONSE either in DVF (mV) or degrees per watt. All three test types may be performed in a single test program.
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Electric Vehicle Battery Cell Tester
MCV
The MCV is a low-current life cycle test system for development of primary and rechargeable batteries in various chemistries. Operating from a common microprocessor, multiple circuits in the MCV module can run individual test programs. Additionally, the MCV is designed and built for ease of maintenance and service. The modular construction means that most subassemblies, large or small, remove easily for service outside the cabinet and fast replacement.
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JTAG Test Software
JTAG Technologies software has been subject to a program of continuous development for over 20 years. The first products, launched in 1991 formed the start of our 'Classic' range of software and featured the first automatic boundary-scan test program generator (ATPG) for PCB interconnects plus associated test execution and diagnostics software. In 2006 JTAG Technologies launched it's new flagship tools platform JTAG ProVision.
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Integrated Test Facility
ITF
The ITF, located in El Segundo, California, has multiple test stations to enable parallel testing and significantly streamline program test schedules. More than 25,000 square feet are available for integration and test activities, including a 10,000-square-foot Class 10K clean room. Our facilities feature thermal vacuum chambers and test stations to support optical alignment, warm optical bench testing, and hardware integration.
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electronic Consolidated Automated Support System
eCASS
electronic Consolidated Automated Support System (eCASS) will validate that the aircraft is combat ready. eCASS is the workhorse for avionics repair across the Naval Aviation Enterprise. Through automated testing at sea and ashore, maintainers are able to return equipment to readiness status quickly and efficiently. Compatibility with legacy CASS stations preserves the Navy’s investment in more than 550 Test Program Sets supporting 750 avionic components.
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Professional ATLAS WorkStation
PAWS Developer's Studio
We can provide and fully support PAWS (Professional ATLAS WorkStation), the leading ATLAS development system used by most of the US and European military ATLAS based ATS. The PAWS suite includes full development systems as well as runtime only versions for executing previously developed TPS on an installed base of workshop systems.PAWS Developer's Studio gives you the power to compile, modify, debug, document, and simulate the operation of ATLAS test programs in a modern Windows environment. It offers the visual development capabilities prevalent in the marketplace today specifically tailored for ATLAS TPS development. A full range of the most commonly used ATLAS subsets is supported. A PAWS Toolkit can modify the ATLAS subset to meet the particular ATE (Test Station) configuration. Its output is ready to be executed on the associated debugging PAWS run time system.
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Test Software
Powerstar
What separates Intepro from all its competitors is our software, PowerStar. A hardware independent testing software, PowerStar combines LabVIEW-like test flexibility with a library of more than 100 standard drag and drop test routines that cuts development of test programs to a fraction of the time of our competitors.
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Test Fixture and Test Programing
Landrex Technologies Co., Ltd.
Test Fixture and Test Programing
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Developer's Studio for ATLAS
PAWS
PAWS Developer's Studio gives you the power to compile, modify, debug, document, and simulate the operation of ATLAS test programs in a Windows environment.
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Boundary Scan Program Development Service
No need for test fixtures. Integrates product development, production test, and device programming in one system. Test and Programming data can be reused in Production. Fast test procedure development. Reduced inventory management. Eliminates or reduces ICT usage time. Pre-production testing can begin as soon as prototype is released.
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Test Adapter
FECVF1600
Frothingham Electronics Corporation
The VF1600 Test Station is a high current forward pulser designed to be used in conjunction with our FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of much higher forward current. The VF1600 station can produce a maximum current of 1600A at up to 5V using an 8.3 mS half sine waveform at the built in test station, and THETA and DVF tests at up to 500A at 10mS pulse width. It is derated for wider pulses. For rectangular VF pulses at 300us or 1ms, it can produce up to 2000A. The station can also test all of the usual FEC200 tests in the same test program.
