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- Pickering Interfaces Inc.
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Modular Breakout System 78-Pin D-type Plugin Module
95-200-001
The 95-200-001 Plugin Breakout Module is designed to be fitted to a PXI 40-200 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Modulation Distortion For E5081A Up To 20 GHz
S960704B
The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
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Optical Signal Test Set
OST
The Optical Signal Test Set (OSTS) combines a state of the art optical power meter, a variable attenuator, and a high stability laser source. The unit is able to measure optical signals below -100dBm with 0.001dB resolution at a fraction of the size, power, and cost of competing solutions. Other features include data logging, programmable filtering, and auto calibration. Its small shielded ruggedized package, USB/power interface, and low cost make this unit perfect for lab use or for integration into larger systems.
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MMIs for Test and System Integration
Laying out a custom PCB is too time consuming and costly for most rush projects. Pulse Research Lab has developed Mini Modular Instruments ™ to provide cost effective solutions to the most common engineering challenges.
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Automated Testing for SAP
Autonomous Testing℠ for SAP
Designed for your SAP environment, Panaya Test Center is an integrated end-to-end testing platform, covering the entire functional testing spectrum including Unit Testing, System Integration Testing, Regression and UAT.
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Advanced Diagnostics for ScanExpress™ JET JTAG Embedded Test Solutions
ScanExpress JET Advanced Solutions
ScanExpress JET advanced diagnostics add additional diagnostic resolution with fully automated analysis translating functional test results to down to the net and pin level, even with BGA packages.The seamless integration with ScanExpress JET and ScanExpress Runner as well as the ability to output ScanExpress Viewer fault reports for PCB visualization make ScanExpress JET Advanced Diagnostics a must-have tool for any JTAG test system.
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PXIe CW Source, 1 MHz to 3 GHz or 6 GHz
M9380A
Save floor space with a compact, modular analog signal generator Provides Keysight quality and performance for local oscillator (LO) substitution, interference and component test Minimize need for external amplification with output power of +18 dBm across the frequency range Reduce test time with easy integration into your high-speed automated test system
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Analog Bus Extension for PXI
ABex
The ABex (Analog Bus Extension for PXI) is an exceptional test platform that extends to accelerate productivity, development throughput and time to market. Applicable in various industries and technological fields, this platform covers complex test challenges anywhere on the production line.Due to its flexible system architecture with an analog bus backplane and terminal modules, the platform allows the integration of technology specific extensions and extremely short system set up times which result in a reduction of total system costs.
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Boundary-Scan DIMM Socket Tester
ScanDIMM
Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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DC Power Supply
62000H
Chroma Systems Solutions, Inc.
Chroma’s new 62000H Series of programmable DC Power Supplies offer many unique advantages for telecom, automated test system & integration, industrial, battery charge & simulation for hybrid cars and solar panel simulation. These advantages include a high power density of 15KW in 3U, precision readback of output current and voltage, output trigger signals, as well as the ability to create complex DC transients waveforms to test device behavior to spikes, drops, and other voltage deviations. For high power applications, parallel up to 10 units for up to 150kW.
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Application-Specific Test Systems & Components
Ease system integration with Keysight System products and services. You can be sure you´re getting outstanding system-ready instruments, open software, and PC-standard I/O that give you the freedom to choose the best tools for your test, and the assurance that they´ll work together, every time.
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Signal Integration Systems
Avenue
The Avenue system includes modules for video up/down conversion, audio embedding, synchronization, conversion, routing, noise reduction, protection switches, test signal generators and more. Avenue signal processing modules are used worldwide in broadcast, mobile, satellite, cable, worship and post production facilities. Avenue is a tray-based signal integration system housed in a 1RU or 3RU frame. Any combination of 1.5 Gb/s HD, 3 Gb/s HD, SD, MPEG, analog video and audio processing modules can be used together in the same frame.
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FaithTech FTLP Series 100W/180W Portable Programmable DC Power Supply
FaithTech FTLP Series
Shenzhen FaithTech Technology Co., Ltd.
FTLP series is a kind of programmable Portable bench DC power supply, with the widest output range, which allows engineers to test more program requirements with just one device. To be exact, the FTLP series provides full power all the way down to 25% of the rated output voltage. The FTLP series is equipped with RS232 and RS485 as standard interfaces that are essential for system integration, you can also choose USB or LAN interface as your add-on interface. The series supports SCPI and MODBUS-RTU protocol, which is convenient for all kinds of test platform. The FTLP series DC power supply can be widely used in battery chargers, high-voltage ultra-high-speed diodes, electrolytic capacitors, electromechanical control fields, and ATE test systems, etc.
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Medium-power DC Electronic Load (900W~6000W)
FT6400A Series
Shenzhen FaithTech Technology Co., Ltd.
The FT6400A series has modular design, with strong adaptability, high reliability and high maintainability. Mainly used in power electronics testing fields such as power batteries, medium and high power DC power supplies, DC generators, etc. The FT6400A electronic load not only provides OCP, OVP, OPP, OTP, RVP but also provides Von and Voff functions and programmable protection functions for the device under test. These features can greatly improve the reliability of the product, and it is a reliable product for engineering test and automatic test system integration.
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Wide Range High Voltage Programmable DC Power Supply
N3600 Series
Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.
N3600 series is developed based on NGI's years of experience in testing for battery fluctuation simulation test, battery charger, high voltage diode, electrolytic capacitor, electromechanical control, ATE test system, etc. It is a high-voltage wide-range programmable DC power supply. According to different test environments in the fields of lab test, system integration test, and mass production line, NGI has made a number of optimization designs based on the international advanced technology. N3600 series is a market leader in similar products in terms of reliability, maintainability and safety.
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Systems Integration & Test
Watring Technologies, Inc. is an experienced, diversified high technology company proficient in total system integration services including test & evaluation, custom tooling design, and automated hardware validation and verification. We give customers access to a sole- source, multi-disciplinary staff of specialists offering turn-key solutions.
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Packaging Manufacturing
KLA’s extensive portfolio of packaging solutions accelerates the manufacturing process for outsourced semiconductor assembly and test (OSAT) providers, device manufacturers and foundries for a wide range of packaging applications. Innovations in advanced packaging, such as 2.5D/3D IC integration using through silicon vias (TSVs), wafer-level chip scale packaging (WLCSP), fan-out wafer-level packaging (FOWLP) and heterogeneous integration as well as a wide range of IC substrates create new and evolving process requirements. KLA offers systems for packaging inspection, metrology, die sorting and data analytics focused on meeting quality standards and increasing yield before and after singulation. SPTS provides a broad range of etch and deposition process solutions for advanced packaging applications. Orbotech offers a portfolio of technologies that includes automated optical inspection (AOI), automated optical shaping (AOS), direct imaging (DI), UV laser drilling, inkjet/additive printing and software solutions to ensure manufacture of the highest quality of IC substrates.
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6TL22 Off-Line Testing Platform
H71002200
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Fully Automatic Colorimeter
DRK103C
Shandong Drick Instruments Co., Ltd.
(1)5 inch TFT color LCD touch screen, the operation is more humanized, new users can be mastered in a short period of time using the method.(2)Simulation of D65 lighting lighting, using CIE1964 complementary color system and CIE1976 (L*a*b*) color space color difference formula.(3)The motherboard brand new design, using the latest technology, CPU uses 32 bits ARM processor,improve the processing speed, the calculated data is more accurate and rapid electromechanical integration design, abandon cumbersome testing process of the artificial hand wheel is rotated, the real implementation of the test program, a determination of the accurate and efficient.(4)Using d/o lighting and observation geometry, diffuse ball diameter 150mm, diameter of the testing hole is 25mm.(5) A light absorber, eliminate the effect of specular reflection.(6)Add printer and imported thermal printer, without the use of ink and color, no noise when working, fast printing speed.(7) Reference sample can be physical, but also for data,? Can store up to ten only memory reference information.(8) Has the memory function, even if the long-term shutdown loss of power, memory zeroing, calibration, standard sample and a reference sample values of the useful information is not lost.(9) Equipped with a standard RS232 interface, can communicate with computer software.
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PXI Thermocouple Simulators
Our PXI Millivolt Thermocouple Simulator modules provide 32, 24, 16 or 8 channels of accurate low sources. They are ideal for the simulation of thermocouples and can be used for sensor emulation in ECU testing. The channels can be operated with one of three voltage ranges covering most thermocouple types. We can also supply connection solutions allowing the easy integration of the Thermocouple Simulator into your test system.
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Bus Analyzers & Exercisers
Corelis offers several bus analyzer products to satisfy different technical needs and price points. Corelis bus analyzers and exercisers offer analysis, test, debug, and validation capabilities for product development, system integration, and manufacturing of digital boards and systems. All of our bus analyzers are PC-based and come with software that runs on Microsoft Windows 7, Windows 8/8.1 and Windows 10.
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Systems Integration for Circuit Card Assembly
Teledyne Advanced Electronic Solutions integrates CCAs and other sub-assemblies, cables and fabricated parts into system modules shipped directly to customers for integration into their products.- Box Build: custom built to order system solutions- High complexity box assemblies and subsystems- High frequency RF box assemblies and subsystems- Full functional RF testing up to 26 GHz (K band)- Multi-level systems integration – build and test modules and CCAs and integrate into higher level assemblies- Custom cell design for customer subsystems- Special bonding processes including thermal management and vibration- Robust torque and FOD control programs- System level testing including functional, vibration and thermal- Complex harness fabrication and integration- Fiber-Optic and RF waveguide integration and testing- Large system capacity in excess of 200 lbs.- Configure to order – Integrate different options, firmware, configurations, etc across a single order as required
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Multifunction Switch / Measure Unit, Modules
34980A Series
The Keysight 34980A multifunction switch / measure mainframe and modules provide functionality that is easy to set up and use. The 34980A helps you lower your cost of test and accelerate your test system integration and development.
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ATE Integration
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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Digital Test Instrumentation
Di-Series™
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
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LabVIEW And TestStand Solutions
As a National Instruments Alliance Member, AB Controls offers turn-key solutions based on LabVIEW and TestStand products. Our relationship with LabVIEW goes far back. Our familiarity with LabVIEW and National Instruments DAQ products plus our experience in system integration makes us the perfect candidate for your next LabVIEW project. Here are some of the past solutions we have provided. Advantages of automated test systems are innumerous.
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6TL36 Plus In-line Test Handler w/Bypass
EA923
- Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE
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Engineering Services
Analysis, Integration & Design, Inc.
Simulation SystemsAutomatic Test Systems (ATS)Data Acquisition & Control SystemsCommunications SystemsAIDI provides complete system development, produces software applications, facilitates integration, and provides deployment support. We integrate with customer needs and requirements to provide entire solutions or work within existing processes to reinforce teams and efforts already underway. We listen and deliver.
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4-TAP PXI Express JTAG Controller
PXIe-1149.1/4E
The PXIe-1149.1/4E is a highperformance, multi-feature boundaryscan controller for multi-TAP and concurrent JTAG test and in-system programming. Featuring a high-speed PXI Express (PXIe) interface with four independent and configurable Test Access Ports (TAPs) along with direct serial programming capability, the PXIe- 1149.1/4E enables of boundary-scan integration with PXIe systems.
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Blackbodies & Extended Area Sources
The Infinity Series of blackbody radiation sources and extended area sources combine leading edge technology with features that support the expanding test requirements of the latest high performance sensors. SBIR designs the most stable, uniform, accurate and highly emissive blackbodies available. SBIR now offers VANTABLACK®S-IR as an optional coating, providing the E-O test community an unprecedented flat plate source emisisivty. SBIR continues to offer blackbody systems that provide the test community with unequaled performance, reliability and ease of integration into test systems. Our blackbody family includes six different varieties to choose from. The Infinity line offers four types of precision blackbody systems and our extended area sources offer two additional types of precision blackbodies to support all levels of IR testing.
