Filter Results By:
Products
Applications
Manufacturers
Transmission Electron Microscopy
-
product
Sputter Coater & Freeze Fracture Solutions
To obtain high-quality images of samples with scanning (SEM) or transmission electron microscopy (TEM), your samples need to be conductive to avoid charging. If a sample does not have a high enough conductivity, then you can quickly cover it with a conductive layer using the method of sputter coating. Also, a carbon or e-beam evaporator coating can be used. Such coatings protect the sample, allow enhancing of the EM image contrast, or can act as a TEM-grid support film for small scale samples.
-
product
NVIDIA GPU And Intel® Xeon® AI Computing Platform For Autonomous Drive Applications
AVA-3510
The AVA-3510 Series is powered by an Intel® Xeon® E processor coupled with workstation-grade Intel®C246 chipset to support up to 64 GB ECC DDR4 memory. The system incorporates one 2.5" SSD 256G for easy installation as optional accessories for fast read/write performance.
-
product
Scanning Electron Microscopy
SEM
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
-
product
Integrated AI-ADAS ECU And Cameras For Large Commercial Vehicle
ADM-TJ30
The integrated AI-ADAS ECU is connected to 8 cameras and powered by the vision-AI algorithm. It can detect and classify different kinds of vehicles/ pedestrians/ two-wheeler riders/ lane marking and other objects to perform multiple ADAS functions.
-
product
Optical Microscopy
Rocky Mountain Laboratories, Inc.
Optical microscopy from 1X to 1000X is achieved with a variety of microscopes. Images can be formed in bright field, dark field, and differential interference contrast (DIC or ‘Nomarski’) modes. Optical microscopy anlaysis is often used before any other techniques to document samples. Color and morphology are important clues in materials identification.
-
product
Microscopy Software
Our modular software platforms enable you to acquire, process and analyze images in multiple dimensions and over various timepoints
-
product
X-ray Microscopy
Xradia Family
✔ Characterize the properties and behaviors of your materials non-destructively.✔ Reveal details of microstructures in three dimensions (3D).✔ Develop and confirm models or visualize structural details.✔ Achieve high contrast and submicron resolution imaging even for relatively large samples.
-
product
Transmission Electron Microscope
TEM
Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
-
product
X-ray Microscopy
ZEISS Xradia Ultra
Synchrotron X-ray nanotomography enables non-destructive 3D imaging at the nanoscale but you have to apply for very limited beamtime. What if you didn’t have to wait for synchrotron time anymore? Imagine if you had synchrotron capabilities in your own lab. With the ZEISS Xradia Ultra family, you have 3D non-destructive X-ray microscopes (XRM) at hand that deliver nano-scaled resolution with synchrotron-like quality. Choose between two models: both ZEISS Xradia 810 Ultra and ZEISS Xradia 800 Ultra are tailored to gain optimum image quality for your most frequently-used applications.
-
product
Atomic Force Microscopy
Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
-
product
Microscopy Software Suite/IC Diagnostics
Crystal Vision
Crystal Vision Microscopy suites are transforming the world of IC Diagnostics and failure analysis. Intuitive software allows user friendliness and enables the breadth of analytical disciplines available. Realtime imaging from both Topside and Backside, allows for maximum productivity.
-
product
Single Molecule Microscopy
Nano-scale precision motion and stability are cornerstones of research grade microscopes for single molecule imaging. Mad City Labs has developed modular microscopes that ease integration of optical components and assist users with developing and adapting instrumentation for their own application requirements. Contact our single molecule microscopy application development team to discuss the right products for your application.
-
product
Microscopy Image Analysis Software
analySIS FIVE
The image analysis software "analySIS FIVE" is designed for users of industrial microscopes compatible with digital cameras for microscopes. Users can select from 5 types depending on their required functions, such as "measurement," "database," "report creation," and "particle analysis."
-
product
Microscopy and Automation Solutions
Opto already offers automated multifluorescence microscopes for cell analysis, inverted autofocus microscopes for motion analysis of growth processes, and high- throughput fluorescence microscopes for DNA and RNA sequencing.
-
-
product
Electronics
Electromagnetic, Signal Integrity, Thermal and Electro-Mechanical Simulation Solutions. The use of Ansys Electronics solution suite minimizes the testing costs, ensures regulatory compliance, improves reliability and drastically reduces your product development time. All this while helping you build the best-in-class and cutting-edge products. Leverage the simulation capability from Ansys to solve the most critical aspects of your designs
-
product
Transmission Control
Schweitzer Engineering Laboratories, Inc.
Transmission control systems provide flexible local control and SCADA integration for substation and line protection assets, improving your system’s reliability and efficiency.
-
product
Microscopy
Our microscopy systems business is focused on providing best-in-class performance within a modular architecture. We design and manufacture Andor products to integrate with our own and third-party software, and all leading microscopes, we also support high quality products from other manufacturers.
-
product
Fiber-Optic Transmission
Fiber optic transmission systems all use data links that work similar to the diagram shown above. Each fiber link consists of a transmitter on one end of a fiber and a receiver on the other end. Most systems operate by transmitting in one direction on one fiber and in the reverse direction on another fiber for full duplex operation. It's possible to transmit both directions on one fiber but it requires couplers to do so and fiber is less expensive than couplers. A FTTH passive optical network (PON) is one of the only systems using bidirectional transmission over a single fiber because its network architecture is based around couplers already.
-
product
Transmission Line/Cable Testing
HAOMAI Electric Test Equipment Co., Ltd.
Transmission Line/Cable Testing products by Haomai
-
product
Optical signal transmission
Bus systems
Allows for the transmission of high speed CAN signals via optical fibre cables during EMC tests or when there are great potential differences (high voltage).
-
product
Electronic Crockmeter
TF411
TESTEX Testing Equipment Systems Ltd.
Electronic Crockmeter, to determine the colour fastness of textiles to dry or wet rubbing. A pinned acrylic sample holder ensures rapid sample mounting and repeatability of results. Crockmeter Fitted with a pre-determined electronic counter for strokes up to 999,999 times.
-
product
Optical microscopy (OM)
Materials Analysis Technology Inc.
Optical microscopy is used to display the surface morphology of samples by 2D intensity contrast due to deflection and reflection of visible light shined on areas of interest. Its resolution is about half of the incident wavelength, which is ~0.2 μm for visible light (wavelength of 400-700 nm). Such resolution limits the maximum magnification to X1000, and thus optical microscopy provides preliminary inspection of sample surface structure.
-
product
Electronic Boards
Computer Gesteuerte Systeme GmbH
The relay board 8AGN is a cost-effective board of the CM series, which is also used in our load modules, for example. It can be mounted on a 35 mm DIN rail. Currents up to 1 A at 30 V are possible. The maximum wire cross-section is 0.5 mm².
-
product
Optical signal transmission
Digital
The fibre optic cable are used to transmit digital signals from the device under test under EFT/burst interference.
-
product
Electronic Loads
Flexible electronic DC loads for general purpose applications. Voltage up to 80V, current up to 80A and power up to 600 watts. CI, CR, CG, CV and CP modes, built-in transient generators. Models with USB, RS232, GPIB and LXI compliant LAN interfaces.
-
product
Transmission Line Pulse Testing
Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
-
product
Cable Transmission Tester
SIGNALTEK CT
If you install or maintain data cabling, SignalTEK CT allows you to generate PDF test reports that prove installed links run at Gigabit Ethernet transmission rates.
-
product
Electronic Units
Electronic units for field installation and mounting rack installation control the actuators. They are fed with 115 or 230 V AC. A local control panel allows for easy basic settings.
-
product
Scanning Electron Microscopy (SEM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
