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X-ray Photoelectron Spectrometers
determine the atomic composition of a surface.
- Applied Rigaku Technologies, Inc
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Process EDXRF Spectrometer
NEX LS
Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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Scanning XPS/HAXPES Microprobe
PHI Quantes
The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
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Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
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X-Ray Photoelectron Spectrometer
AXIS Supra
AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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UltraScan VIS Spectrophotometer
Hunter Associates Laboratory, Inc.
The UltraScan VIS easily measures both reflected and transmitted color as well as transmission haze and meets CIE, ASTM and USP guidelines for accurate color measurement. UltraScan VIS uses diffuse/8° geometry with automated specular component inclusion/exclusion. For transmission measurement, the use of a robust CIE-conforming sphere instrument (TTRAN Total Transmission mode) effectively negates the effects of minor scattering typically found in transparent samples.
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ColorFlex EZ Citrus Spectrophotometer
Hunter Associates Laboratory, Inc.
The ColorFlex EZ Citrus measures Citrus Number, Citrus Redness and Citrus Yellowness. These indices were primarily intended to score orange juice concentrate, but in practice have also been used for grapefruit and lemon juices. In addition to the citrus values, the instrument can also measure in terms of the Hunter Lab scale as well as other widely used color scales. Thus the system can also be used to measure the reflected color of virtually any opaque or semi-opaque liquid.
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Portable Raman Spectrometer System
IndiRAM Portable Series
IndiRAMTM Portable Series Raman Spectrometer system is one of its kind for quick screening of the samples with high throughput. The system can be customized based on application and requirement.
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Raman Spectrometer System
IndiRAM EDU Series
TechnoS Instruments is proud to introduce IndiRAM TM EDU Series Raman Spectrometer system which is ideal research tool for science faculty or UG/PG students to have a hands-on practical experience of Raman Spectroscopy and Spectrometer during their masters
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ColorFlex EZ Tomato Spectrophotometer
Hunter Associates Laboratory, Inc.
ColorFlex EZ Tomato is specifically designed to measure tomato color in its every processed form – paste/purée, sauce, ketchup, juice, as well as fresh tomatoes. Tomato color scales provided in firmware include: Tomato Paste Score (TPS), Tomato Sauce Score (TSS), Tomato Catsup Score (TCS), Tomato Juice Score (TJS), a/b ratio, Fresh Tomato Color Index (FTCI) & Lycopene index.
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Agera Spectrophotometer
Hunter Associates Laboratory, Inc.
With its 0º/45ºc circumferential geometry, 60-degree gloss meter, UV-controllable LED illumination and 5-megapixel camera, Agera makes positioning samples and measuring color as simple as a snapshot. A single measurement captures and stores the image while it analyzes color, fluorescence, and gloss. Even large samples are no problem with the largest fixed-point contact area of measurement in the industry.
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IndiRAM CTR With Quantum Characterizer
The IndiRAM CTR Raman/PL system with Quantum Emitter Microscope is a multi-purpose system capable of performing Quantum Emitter Characterization, Raman, Photoluminescence as well as Optical Emission Spectroscopy. The system consists of a Pulse Laser along with a single photon counting module (SPCM), a Pulse Synchronization unit, Motorized Scanning stage and a research grade microscope (Upright or Inverted) for TCSPC measurements. Along with these, it also contains a High throughput Spectrometer with a TE Cooled CCD and an optics box assembly to perform Raman/PL and OES Spectroscopy and Microscopy. obtained after the multiple set of experiments gives the lifetime function.
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Imaging X-Ray Photoelectron Spectrometer
AXIS Supra+
X-ray photoelectron spectroscopy (XPS) is unique in providing quantitative elemental and chemical state information from the uppermost 10 nm of a materials surface. The AXIS Supra+ (also known as Kratos Ultra 2+ in Japan) is a market leading X-ray photoelectron spectrometer combining state-of-the-art spectroscopic and imaging capabilities with the highest level of automation currently available. Unrivalled large area spectroscopic performance allows photoelectron spectra to be acquired from all types of materials including metals, semi-conductors and insulators. Fast, high spatial resolution XPS imaging reveals the lateral distribution of surface chemistry and aids further characterisation with selected small area analysis.
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Raman Spectrometer
IndiRAM CTR Series
CTR series Raman Spectrometer is a state-of-the-art Raman Spectrometer with an unmatched capability to identify a broad range of materials, as well as to quantify material concentrations at femto-molar level. The system comprises of one or more laser sources, an imaging spectrometer, TE cooled (-10oC / -60oC) CCD camera, an optical magnifying lens with a spatial resolution < 1µm. The CTR series Raman Spectrometer offers unparalleled sensitivity and resolution, making it ideal for nanoscale analysis and intricate molecular investigations. Easy to use, Microsoft Windows-based control and data processing software enables the user to comfortably operate the spectrometer.
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Vista Spectrophotometer
Hunter Associates Laboratory, Inc.
Determining the purity of raw materials ensures both safety and quality. Hunterlab’s Vista is the right instrumentation for quantifying the color range and meeting standards and regulations. Vista captures both visible-range transmission color, as well as haze with a single measurement, and exports data with ease in minutes.
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Raman Spectrometer System
IndiRAM CTR Mini Series
IndiRAMTMCTR-mini Series Raman Spectrometer system is one of the best solution for carrying out reaction-monitoring or insitu analysis of the samples as it is a compact system capable of moving oform one place to another but at the same time maintaining high resolution and SNR
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Digital Spectrometer
Pixie-Net
The Pixie-Net is a multi-channel digital spectrometer for radiation detectors in desktop format with integrated processor, networking and USB resources.
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X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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X-ray Fluorescence Spectrometers
Is a non-destructive analytical technique used to determine the elemental composition of materials.
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X-ray fluorescence spectrometers
SPECTRO Analytical Instruments GmbH
SPECTRO is a world leader in the manufacture of energy dispersive X-ray fluorescence spectrometers. In recent years, SPECTRO has set standards by further developing X-ray fluorescence technology to create many new fields of operation for ED-XRF spectrometers.
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ColorFlex EZ Coffee Spectrophotometer
Hunter Associates Laboratory, Inc.
The easy-to-use ColorFlex EZ Coffee is specifically built to meet and exceed your needs in measuring the color of roasted coffee grounds. It makes it easy to define the degree of roasting. Coffee color scales provided in firmware include: HunterLab Coffee Color Index (HCCI), SCAA Number & SCAA Roast Classification.
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X-ray Fluorescence Spectrometer
X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.
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Energy Dispersive X-ray Fluorescence Spectrometer
Pharmaceutical Elemental Impurities Analysis System
Control of Elemental Impurities in Pharmaceuticals In the pharmaceutical industry, the analysis of elemental impurities is necessary to ensure the safety of pharmaceuticals. In December 2014, the "Guideline for Elemental Impurities" (Q3D) was issued by the International Council for Harmonisation of Technical Requirements for Pharmaceuticals for Human Use (ICH), consisting of representatives from Europe, the U.S. and Japan. In Japan, the "Guideline for Elemental Impurities in Drug Products" (PFSB/ELD Notification 0930 #4 from the Ministry of Health, Labour and Welfare) was issued, and will be applied to new drug products submitted for approval after April 1 2017. For 24 elements categorized in Class 1 to Class 3, residual quantities in pharmaceutical drug products must be controlled within permissible limits. Although ICP-AES and ICP-MS are used for precise analysis of elemental impurities, X-ray fluorescence spectrometers can be used as an alternative analysis method. This is because they can quantitatively and qualitatively analyze a variety of elements nondestructively, and without chemical pretreatment, unlike ICP-AES and ICP-MS systems. The X-ray fluorescence spectrometry has been adopted as a general method of analysis in the U.S Pharmacopeia and the European Pharmacopoeia. (USP<735>, Ph.Eur.2.2.37)
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Spectrometers
Since spectroscopy is used for numerous applications, we have defined our products in different lines, as seen below. We offer instruments with a small form factor to integrate into other devices in the CompactLine: high-sensitivity instruments for more demanding applications in the SensLine and spectrometers especially configured for the near-infrared range in our NIRLine. The StarLine spectrometers are our most versatile instruments for general spectroscopy applications.
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X-Ray
VJ Electronix offers manual and fully automated inspection systems for applications such as PCB assembly, semiconductor packages, electromechanical assemblies, biomedical/pharmaceuticals, batteries, and more. Our systems offer a range of imaging options and simple manual or programmable operation. In addition, custom inspection systems are available tailored specifically for your production requirements. All of our products are easily integrated into the manufacturing process for fast start-up and 24/7 operation. Their versatility and ease-of-use deliver repeatable results with all levels of production staff.
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X-Ray Cameras
A range of scientific camera solutions optimized for high energy / X-Ray detection.
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Spectrometers
Compact spectrometers with versatile performance covering UV, Visible and NIR wavelengths are available for multiple applications in Research, OEM and Process solutions.
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X-Ray Inspection
X-ray inspection systems are used wherever defects need to be detected by non-destructive means. The spectrum of use is broad and ranges from quality controls for complex assemblies, to the testing of materials for cracks and air inclusions, to foreign matter inclusions and shape deviations. The trend toward miniaturization, higher packing densities, and the relocation of components to the interior of the assembly require precise X-ray inspections that detect hidden defects quickly and reliably. X-ray systems from Viscom are used for the inspection of series assemblies as well as sampling and prototype controls. They take care of typical inspection tasks in concealed areas such as void controls, THT filling level measurements, and HIP inspections. At the same time, the systems reliably determine defect features such as coplanarity and polarity – at high inspection speeds and in a cost-effective way.
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Multi-Channel X-Ray Fluorescence Spectrometer
FACTORY LAB MXF-2400
Wavelength Dispersive X-Ray Fluorescence Spectrometer The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-ray fluorescence spectrometer, which has been rated highly in the overseas market as well as in the Japanese market. The latest hardware designed to fully utilize the principle of X-ray fluorescence spectrometry and the data processing unit that uses various software programs to permit automatic management of analysis data combine to provide high analytical productivity both in R&D and production control. Up to 36 elements can be simultaneously determined by the fixed monochrometer and up to 48 elements can be determined sequentially by the optional scanning monochrometer. High analytical precision is provided even in high sensitivity analysis of a few ppm quantity level.
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XRF Spectrometers
Epsilon Range
The Epsilon range of X-ray fluorescence XRF analyzers are an ideal analytical solution. They are capable of simple element identification and quantification up to more sophisticated analysis. They are easy to operate, compact and X-ray safe instruments without the need for additional chemicals or operating gasses. Considerable savings in time and cost are two of the many benefits XRF can bring compared to alternative analytical techniques.
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Miniature Spectrometer
MSP1000
The MSP1000 miniature spectrometer (MiniSpec) is a compact, fibre-coupled spectrometer suitable for common laboratory tasks. By using the latest manufacturing techniques, we are now able to provide the system for a cost of less than £1000.
