Chroma ATE Inc.
A world leading supplier of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and test & automation turnkey solutions marketed globally under the brand name "Chroma".
- +886-3-327-9999
- +886-3-327-8898
- info@chromaate.com
- 88 Wenmao Road
Guishan District
Taoyuan City, 333001
Taiwan, Province of China
-
Product
Automatic System Function Tester
3240
-
Chroma 3240 is an innovative handler for high-volume multi-site IC testing at the system level.
-
Product
Mini LED Backlight Module Automatic Optical Test System
7661-K003
Test System
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
-
Product
LCM Tester
Model 27011
-
To meet the high accuracy and low price requirements for LCM Test device, Chroma 27011 that integrates the signal and power source provide a complete test solution for LCD Module. Its LVDS, TTL signal source fully complies with the digital signal standard, meanwhile with the 12V, 5V, 3.3V DC source output it is able to supply power to VDD, Backlight or LCM test without obtaining external power source.
-
Product
Hipot Tester
19070
-
Chroma 19070 series are the smallest Hipot Testers currently available in the world. Its super mini size is easy to carry and the large LCD display is suitable for viewing measurement results. These sophisticated hipot testers are most applicable to safety test for electronic components.
-
Product
AC and DC Electronic load
63800 series
-
The Chroma 63800 Loads can simulate load conditions under high crest factor and varying power factors with real time compensation even when the voltage waveform is distorted. This special feature provides real world simulation capability and prevents overstressing thereby giving reliable and unbiased test results. The 63800's state of the art design uses DSP technology to simulate non-linear rectified loads with its unique RLC operation mode. This mode improves stability by detecting the impedance of the UUT and dynamically adjusting the load's control bandwidth to ensure system stability. Comprehensive measurements allow users to monitor the output performance of the UUT. Additionally, voltage & current signals can be routed to an oscilloscope through analog outputs. The instrument's GPIB/RS232 interface options provide remote control & monitor for system integration. Built-in digital outputs may also be used to control external relays for short circuit (crowbar) testing.
-
Product
Wafer Level Test
-
Double sided wafer inspection system is an automatic inspection system for afterdicing wafer chip. It can do double side inspection simultaneously. The appearance defects of wafer chip are clearly conspicuous by using advanced illumination technology. Illumination and camera acquisition mode can be adjusted for various wafer process, like vertical chip or flip chip.
-
Product
Automated Optical Inspection Solutions
-
Adjustable criteria for different process application or modelFlexible algorithms programming editor for mono-crystalline and multi-crystalline silicon solar cellsMultiple interface to communicate with manufacturing equipment or information systemVarious defects inspection capability from multilayer LED lighting designFlexible design that can be easily integrated to your in-line printing system and sorting system
-
Product
Regenerative Battery Pack Test System
17040
Test System
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
-
Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
-
Product
Digital Power Meter
66203/66204
Power Sensor
Chroma 66203/66204 Power Meters are designed for multiple phase power measurement applications. The wiring mode function allows the user to take accurate power measurements for various wiring modes 1P2W/1P3W/3P3W/3P4W as well as providing accurate standard power measurements common for most electrical devices. A unique feature of the 66203/66204 is its stateof- the-art DSP digitizing technology instead of less accurate and slower traditional analog circuits. The internal 16 bits analog/digital converters with sampling rates of up to 250kHz provide both high speed and high accuracy measurements which is unprecedented within the industry for this class of power meters. The instruments include a four part display with 7-segment LED front panel readouts. Users can easily select desired parameters and readouts with a touch of a button. The 66203/66204 meters also include remote control using USB or GPIB interfaces via rear panel connections.
-
Product
DC Power Supply
DC Power Supply
DC power supplies offer many unique advantages for telecom, automated test system & integration, industrial, battery charge & simulation for hybrid cars and solar panel simulation. These advantages include high power density of 15KW in 3U, precision readback of output current and voltage, output trigger signals as well as the ability to create complex DC transient waveforms to test device behavior for spikes, drops, and other voltage deviations.
-
Product
FPD Tester Signal Module
A291800-03
Signal Module
The A291800 is an LVDS signal model that can be used with FPD Tester to provide LVDS panel standard signals and related controls for LVDS inspection.
-
Product
PXIe Programmable Device Power Supply
33020
Programmable Power Supply
High channel density with 8 channels per card 6V-12V independently programable voltage level Max. current gang feature providing max. 4A output per card






















