Chroma ATE Inc.
A world leading supplier of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and test & automation turnkey solutions marketed globally under the brand name "Chroma".
- +886-3-327-9999
- +886-3-327-8898
- info@chromaate.com
- 88 Wenmao Road
Guishan District
Taoyuan City, 333001
Taiwan, Province of China
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Product
Programmable DC Electronic Load - (Economical)
63200E Series
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The 63200E series are high power DC loads that include a choice of three operating voltages, 150V, 600V and 1,200V, with power levels from 2kW to 24kW and up to 2,000A in a single unit. Power levels can increase up to 240kW when multiple units are paralleled.These high power loads are designed for testing a wide range of EV products including DC charging stations, car battery discharge, on board charger power components, and other power electronics components. With its high power capabilities, parallel control and dynamic synchronization functions make this load ideal for automotive batteries, fuel cells and more. The 63200E load's master/slave control application enables units with the samevoltage specification to be used in parallel and synchronized dynamically to meet the power testing requirements. In addition, a 255-set data storage function has been built-in for recall of the stored settings at any time. When used in automated testing, the save and recall functions can save a great deal of time.
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Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
HCU/DC-DC Converter ATS
8900
DC Converter
Low power testSleep mode current testInput overvoltage limit testLine regulation testEfficiency testLoad regulation testOutput ripple voltage testDC-DC load testOvercurrent testPower doen and isolation test
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Product
High Precision Source Measure Unit (SMU) - Hybrid Compatible PXI, 100ks/S Programming/Measurement Speed
52400 series
Source Measure Unit
Hybrid Compatible PXIFour quadrant operationHigh source/measurement resolution (multiple ranges)Low output noiseHigh programming/measurement speed (100k s/S) & slew rateOptional measurement logDIO bitsOutput profiling by hardware sequencerProgrammable output resistanceFloating & Guarding output16 Control Bandwidth SelectionMaster / Slave operationDriver with LabView/LabWindows & C/C# APISoftpanel GUI
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Product
Multi-Channel Hipot Tester
19020
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The hipot test is one of the major test items in electrical safety testing. All electrical components and products including transformers, capacitors, power supplies, chargers and home appliances require hipot testing.
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Product
Digital Power Meter
Power Meter
Digital Power Meter is designed for single-phase measurements of AC power signals and related parameters common to most electronic products. Instead of traditional analog measurement circuits, the 66200 uses state-of-the-art DSP digitizing technology.
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Product
VCORE Power Test
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To support the heavy computing loads required by AI technologies, system servers must rely on high performance CPUs and GPUs capable of complex, real-time processing. These processors are powered by VCORE power supplies, embedded DC/DC converters, or voltage regulator modules (VRMs).
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Product
RF ATE Tester
ADIVIC MP5800/MP5806
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MP5800 seamlessly upgrades your existing Chroma 3380, 3650 to RF ready ATE test solution, user friendly debug tools, IOT turnkey test solution.
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Product
Passive Component ATS
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Test and packing speeds from 80ppm to1,800ppmStandard functions - Inductance/quality factor test - Winding resistance test - Polarity testOptional functions - Layer short test - Insulation resistance test - Bias current testCircular vibrating plate design feeds inductors steadily and rapidlyIndex disc design eliminates dropped inductorsFour-wire measurement test socket designAutomatic discharge mechanism when feeding errors occurEach test station has an independent NG (No Good) product collection boxTest without packaging function provided, good products gathered in bulk collection boxExclusive data collection software designed for monitoring product quality in real timeReserved stations for number spraying and automatic optical inspectionSwitchable Chinese/English/Japanese operating interfaceEquipment is fast, stable and safe
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Product
Ultra-High Stability DC Power Supply
62075H-30N
DC Power Supply
The 62075H-30N output power has maximum 7.5kW/30V/250A power module designed with 4U height that can be connected easily as master or slave with three units to 22.5kW/30V/750A in parallel or two units to 15kW/60V/250A in series and operated as a standalone unit via system bus. The 62075H-30N provides stable DC output cur rent sour ce and powe r for pre c i s ion measurement. It offers an advanced 250A/30V ultra high-stable ±10 ppm (current stability ±1.25 mA) with high eciency and high power factor in compliance with energy savings. In addition it has a 20 bit digital control with bright vacuum fluorescent display readout.
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Product
Octal Test Site Handler
3180
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The Chroma 3180 is a productive pick & place system for high-volume multi-site IC testing.
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Product
Battery Pack Power HIL Testbed
8610
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Chroma ATE launches the 8610 Battery Pack Power HIL Testbed for testing battery systems and components of new energy vehicles, incl. the battery module, battery management system, and cooling/heating system. Various hardware options are available for integration, such as a DC power supply, battery charge/discharge system, digital meter, Hi-Pot tester, and short-circuit and overvoltage protection devices.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
Wafer Chip Inspection System
7940
System
Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.
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Product
Cobra Temperature Forcing System for ATE/SLT Test Applications
31000R
System
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.






















