Langer EMV-Technik GmbH
Langer EMV-Technik GmbH is a medium-sized electro-technical company which is active in the field of electromagnetic compatibility-related
- +1 888 687 5 687
+49 (0) 351 430093-0 - +49 (0) 351 430093-22
- mail@langer-emv.de
- sales@langer-emv.de
- Nöthnitzer Hang 31
Bannewitz, D-01728
Germany
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Product
Micro probes 1 MHz up to 1 GHz
MFA 02 set
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The two in the set included micro probes are used to measure low-frequency magnetic fields up to 1 GHz, e.g. at signal conductors (150µm), SMD componets (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the BT 706 Bias tee. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee to a spectrum analyzer or an oscilloscope. The MFA 02 set delivery of Langer EMV-Technik GmbH includes correction lines. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.
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Product
Measurement Technology for the Development Stage
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EMC tools for relative measurements of interference emission of assemblies and devices.
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Product
Measuring and Calibration Stations
PCB
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Is used to measure electric and magnetic fields of an ESD generator
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Product
Near Field Micro Probes ICR HH H Field
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The measuring coil is horizontally located in the probe head. The near field micro probes are operated with a positioning system (Langer Scanner).
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Product
Near Field Micro Probe Sets
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The near field probe is designed for a high-resolution measurement of electrical near fields.
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Product
Scanner Probe
RFS set
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The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly.
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Product
Near-Field Probes 100 kHz up to 50 MHz
LF1 set
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The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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Product
IC EMC Analysis
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We carry out standard measurements according to BISS/IEC and analysis of the interference immunity and interference emissions of ICs during development.With the targeted EMC analysis, we uncover weak points in the ICs so that the IC developer can use them to develop improvements for the product
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Product
Immunity
RF coupling
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is used for the conducted measurement of the immunity according to IEC 62132-4.
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Product
Near Field Probes 30 MHz up to 3 GHz
RF1 set
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The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Product
Measurement Technology for Teaching and Training
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Is particulary suitable for training and further education. With the disturbance emission model, a variety of different experiments which improves one`s understanding of electromagnetic processes in modern electronic engineering are possible. The coupling mechanisms of disturbance emissions are visualized from their sources to the antenna. The impacts of EMC measures are then easier to understand.At VM 251 the electromagnetic d
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Product
Burst Detectors
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The Burst detector monitors interference threshold exceedances at cable-and line bundles. It selectively detects conducted disturbances, which would influence the monitored device.
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Product
Near Field Microprobe E-field 7 MHz to 3 GHz
ICR E150
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The near field microprobe is used to measure electric fields at extremely high resolution and sensitivity. The optimal distance to the object being measured is < 1 mm. Due to its small probe head dimension, the probe has to be moved by a manual or automatic positioning system, e.g. Langer-Scanner.
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Product
Near Field Probes 30 MHz up to 3 GHz
RF2 set
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The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Product
Optical Signal Transmission
Analog
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Used for oscillographing analog signals under EFT/EDS/RF interference.
