Cohu, Inc.

Product

Semiconductor Testers

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Cohu, Inc.

Cohu, Inc.

Designing and manufacturing scalable Automated Test Equipment (ATE) targeted at testing SOC, MCU, RF PA/FEM, Sensors/MEMS and Power and Analog devices

Product

Gravity Test Handlers

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Cohu, Inc.

Cohu, Inc.

Extremely small to very large packages, very wide temperature range, high throughput octal site and quad site testing.

Product

Test Contactor

MiCon

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Cohu, Inc.

MiCon - Cohu, Inc.

The MiCon™ Test Contactor is spring pin footprint compatible supporting advanced temperature requirements as well as advanced power/current requirements. The footprint compatibility allows for easy and cost-efficient conversion from spring pin setups. The fully decoupled load board side of the spring ensure no degradation of the load board pad.MiCon features a single piece design, which ensures a long lifespan, low and stable contact resistance, high current carrying capability and an extended temperature range. The MiCon allows for testing at full specification values. The extended operating range accommodates device lead trim and form variability such as device alignment accuracy and device lead coplanarity.

Product

Turret Test And Scan Handlers

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Cohu, Inc.

Cohu, Inc.

Turret platforms for semiconductor test, inspection and packaging.

Product

MEMS Pressure Test

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Cohu, Inc.

Cohu, Inc.

Cohu‘s well established pressure test equipment are providing high volume final test solutions for all pressure sensor markets.

Product

MEMS Optical Sensor Test

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Cohu, Inc.

Cohu, Inc.

For optical sensor test Cohu offers a variety of solutions being driven by requirements for tri-temp, parallelism and stimulus spacing. Customized optical stimulus units are integrated into Cohu’s test handling systems. For light detector test, we implement different types of light sources, such as infrared, ambient- and colored light. We offer different solutions for 3D image sensors combining emitter and receiver tests of LiDAR, Time of Flight and Structured Light devices.

Product

Semiconductor Test Platform

PAx

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Cohu, Inc.

PAx - Cohu, Inc.

PAx semiconductor test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next-generation wireless standards.

Product

MEMS Microphone Test

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Cohu, Inc.

Cohu, Inc.

The market is driving the need for improved voice recognition for security, automobile infotainment control, VoIP, accurate language translation, voice-activated consumer devices and high precision hearing aids. The latest next-generation microphones require highly accurate precision testing with SNR tests up to 78 dB with high parallelism, high UPH, in a high volume production environment.

Product

Configurable OSAT Friendly Pick-and-Place Handler

Delta Eclipse

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Cohu, Inc.

Delta Eclipse - Cohu, Inc.

Eclipse delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors.  The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 UPH.

Product

Test Contactor/Probe Head

cBoa

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Cohu, Inc.

cBoa - Cohu, Inc.

cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.

Product

Test Contactor/Probe Head

Mercury

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Cohu, Inc.

Mercury - Cohu, Inc.

Mercury™ test probes and contactors are excellent spring probes for the laboratory though they were designed with the robust qualities needed for high-volume production test. Their unique design ensures excellent plating quality for low, consistent resistance, long life, and high-test yields.Mercury probes are available with minimum pitches of 0.3 mm, 0.4 mm, 0.5 mm, and 0.8 mm, to provide the best performance at any device pitch. Mercury probes have bandwidths of up to 22 GHz, and can carry over 3 Amps of current. The Mercury is an excellent choice for any test application.

Product

Kelvin Test Contactor

cCompact

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Cohu, Inc.

cCompact - Cohu, Inc.

cCompact™ test contactor offers a reduced site-to-site pitch concept enables high parallel test for power applications on strip test and pick and place handler platforms.Featuring compact Kelvin footprint with outstanding CRES stability by Denmark pin material. Automotive temperature range -60°C to +175°C. Integrated Socket Air-distribution.

Product

Test Handlers

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Cohu, Inc.

Cohu, Inc.

Cohu has 50+ years of semiconductor test expertise designing and manufacturing pick-and-place, gravity feed, test-in-strip handlers, MEMS test cells, and turret-based test handling and back-end finishing equipment for ICs, LEDs and discrete components.Our test handlers support a variety of package sizes and device types, including automotive, mobile, power, micro-electromechanical systems (MEMS) and microcontrollers, among others.

Product

High Parallel Tri-Temp Pick-and-Place Handler

Delta MATRiX

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Cohu, Inc.

Delta MATRiX - Cohu, Inc.

Cohu’s MATRiX handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.

Product

High-Throughput Film Frame Handler

MCT FH-1200

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Cohu, Inc.

MCT FH-1200 - Cohu, Inc.

FH-1200™ film frame test handler is designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages. The FH-1200 enables high parallelism testing of post-saw IC devices at ambient temperature. It can accommodate 200 mm and 300 mm wafer rings and custom shapes onto which multiple strips can be mounted. No change kits are required regardless of package size (if same frame is used).