HenergySolar
A PV (photovoltaic) module and solar cell manufacturer.
- 008621-56185657
- 4006-048-365-607
- sales@henergysolar.com
- #16 GuangHua Road
TongZhou Industry Distric, Beijing
China
-
Product
Polysilicon Resistivity Tester
HS-POSRT
-
HS-POSRT polysilicon resistivity tester is an advanced resistivity tester, it has features of wide resistivity measuring range, high testing accuracy, high stability, swift body and easy operation. It is a good friend to Siemens polysilicon material producer,SH4 polysilicon material producer, UMG polysilicon material poroducer and so on
-
Product
Silicon Resistivity, PN type & Alarm Tester
HS-PSRT
-
It use Four Probe to test the resistivity and P/N type of wafers、ingots and all type of silicon materials.It can be used by Solar and Semiconductor industry.
-
Product
Silicon Phosphor and Boron Analyze system
HS-ICP-MS
-
The Silicon Phosphor and Boron Analyze system HS-ICP-MS is the best system to measure the element like P&B in silicon material, the HS-ICP-MS can detect and analyze over 75 elements.
-
Product
Non-Contact Mapping Life Time System
MWR-2S-3
-
The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
-
Product
Sapphire 3D Microscope
WDI-2000
-
The Sapphire 3D Microscope: HS-WDI-2000 was designed with high quality lighting parts and a good optical system design,can get a very clear image.with the digital camera,it can provide the image in time, widely used in LED,Solar,SEMI…
-
Product
Saw Mark Tester
SRT-301
-
SRT-301 Saw Mark Tester is used to Measure Line-mark depth of the wafer surface,it has the advantages such. As easy carried, Conveniently operated Liquid crystal display, energy conservation and so on, At the same time,it has the built-in printer and rechargeable batteries , All design are up to the standards of JIS,DIN,ISO,ANSI.
-
Product
Automatic Online Flatness and Surface Appearance System
UltraSort200
-
The UltraSort continues our 25 year tradition of providing metrology solutions to semiconductor wafer manufacturers. Designed for volume wafer production, this automated system offers superior performance in rapid, repeatable, accurate, noncontact qualification of silicon and alternative substrate wafers.
-
Product
Minority Carrier Life Time System
MWR-SIM
-
MWR-SIM Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as probe.It enables repetition and contactless of measurement and does not require specialsurface treatment before measurement or wafer cutting.
-
Product
Sapphire polariscope optic modulator
PKS-250M
-
The device is designed for determining double refraction in flat blanks and products of transparent and weakly tinted materials, and is used for quantitative assessment of double refraction value by Senarmon method with an error of not greater than 10 nm, for assessment of double refraction distribution in an object by interference tinting, for examining distribution of double refraction in an object with circularly polarized light.
-
Product
Semi-Automatic Contactless Wafer Detector
NCS-200SA
-
Semi-Automatically, non-contact measurement of wafer thickness, TTV ,bow,Point and flatness.Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.the powerful software can test all the data above within several seconds,all the design according to SEMI standard and the ASTM,make sure the data can be easily unify. the system can used for several sample size,like 75 mm, 100 mm, 125 mm, 150 mm, 200 mm
-
Product
QE System
PVE300
-
The PVE300 system is a monolithic,turnkey solution for photovoltaic material and device characterization;a key component in research, or as part of a production-line quality process.
-
Product
Super Silicon Resistivity and Type Tester
HS-3FC II
-
Super Silicon Resistivity and Type Tester is specially designed for silicon sorting，it can quickly test the silicon type, heavy-doped, resistivity and current, and can be widely used in all kinds of silicon sorting, like granular polysilicon material, break semiconduct silicon wafer, chunk material, top and tail material and so on. Furthermore, it integrates two probes, three probes and four probes. With the three probes, it could show type and heavy type simultaneously, strongly improved the sorting efficiency.
-
Product
PV Measurements System
PH-IQE200
-
PV Measurements offers to combine a Spectral Response/QE/IPCE system with an I-V system into one compact measurement system. Depending upon the configuration required for your devices,it may share a test fixture.This reduces overall system cost.
-
Product
Silicon heavy-doped Tweezer Tester
HS-MRTT
-
Mini resistivity tweezer tester is used to check heavy-dope silicon. adaptable for little granular material, little broken IC Wafer and other little silicon material. When the resistivity is lower than the set value, it will make alarm.
-
Product
Surface Quality Measurement System
SQM-500W
-
SQM-500 Surface quality Measurement system is used for the surface cleanness testing and analyze of sample. SQM provide a quantitative analysis of the cleanness of the surface, which was the first announced by us. The system can be used to non-contract detect the contamination of the surface and provide an accurate result immediately. The result can provide a powerful and real data for analyze, which is the insurance for the quality.
