VLSI Test System
3380P - Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
Specifications
| Product Type | Test System |
|---|---|
| No other specifications are available. | |
