IC
circuitry in a chip.
See Also: Integrated Circuit, Chip, Digital IC Testers, IC Test, IC Clips, IC Probes
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IC Testing System
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Is a system for giving electrical signals to a semiconductor device to compare output signals against expected values for the purpose of testing if the device works as specified in its design specifications.
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IC Test Services
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With knowledge gathered from decades of supporting Tier 1 and emerging industry leaders, Amkor understands test solutions must address advanced technology, quality, performance and cost of test. We offer full turnkey solutions including wafer processing, advanced bump, wafer probe, assembly, final test, system-level test, burn-in and end-of-line services.
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IC Design & Verification
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Mentor Graphics provides best-in-class products for IC design. Calibre for physical verification, extraction, resolution enhancement and mask data preparation, ADVance MS for analog/mixed-signal simulation and an integrated tool flow for custom IC design
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Kelvin IC Clip Lead
16089C
Accessory Kit
Measure odd-shaped components that you cannot measure using conventional fixtures
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Triple IC Optic Node
OX 733
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Converts even weak Optic Signals to a high quality RF Signal. LED BAR Optic Level Display has been provided for ease of system maintenance. They are best suitable for Analog as well as Digital transmission to maintain BER, MER Characteristics. Green Tecnology incorporated - Aluminium Housing for maximum heat dissipation.- Frequency 40 ~ 1000 MHz- Optical Wavelength : 1290 ~ 1600 nm- Flatness ±0.75 dB- LED Bar Display for Optic Signal Level- High C/N, CSO & CTB Characteristics- Inward Extruded Aluminium Channels for Maximum Heat Dissipation- High Voltage Surge Protection- -13 dBm Sensitivity- RF O/P at 0 dBm : 113 dBµV
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IC Test Clips
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Low-profile fine-pitch chips, desnely populated boards, or vertical boards, Pomona test clips connect you with confidence.
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Handheld Compact Professional IC Tester
LinearMaster
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The ABI LinearMaster Compact Professional is a low-cost, hand-held out-of-circuit IC tester. The LinearMaster is designed for testing analogue ICs with up to 16 pins through a ZIF socket (see ChipMaster for digital devices). A range of adapters is also available for SOIC and PLCC devices.
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Ka-Band Silicon SATCOM Tx Quad Core IC
AWMF-0109
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The AWMF-0109 is a highly integrated silicon quad core chip intended for satellite communications transmit applications. The device supports four dual polarization radiating elements with full programmable polarization flexibility. The device provides 22 dB of gain per channel with an output power of +12 dBm per element per polarization. Additional features include gain compensation over temperature, temperature reporting, and Tx output power telemetry. The chip features ESD protection on all pins, operates from a +1.8 V supply, and is packaged in a 48 lead 6x6 mm QFN for easy installation in planar phased array antennas.
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IC Side Channel Analysis
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These probes allow you to couple fast, transient magnetic field, E-field, and current pulses into ICs.
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PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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IC-3172, 1.80 GHz Intel Core i5 Dual-Core Processor, 4-GigE Port, 2-USB 3.0 Port Industrial Controller
784228-01
Controller
The IC‑3172 is a high-performance, fanless industrial controller for developers who require a high level of processing power and connectivity for automation and control applications in extreme environments. The IC‑3172 provides connectivity for communication and synchronization to EtherCAT and Ethernet CompactRIO chassis, EtherCAT motion drives, GigE Vision and USB3 Vision cameras, and other automation equipment. In addition, this controller has onboard isolated, TTL, and differential digital I/O, so it can perform synchronization and control tasks without additional tethered I/O.
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IC Product Testing & Analysis Services
Integrated Service Technology
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Integrated Service Technology Inc.
iST (Integrated Service Technology Inc.) is a leading lab-service company, specializing in the development of IC product testing & analysis, failure analysis, debugging, reliability test, material analysis. Apart from developing testing technologies for the upstream IC design and semiconductor industries, iST also expanded to provide a full-spectrum of services for the mid and downstream companies in the electronics industry.
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Small IC Adapter for ZD Differential Probe Qty 2
PACC-ZD006
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Small IC adapter for ZD differential probeQty 2
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Analogue IC Tester
SYSTEM 8 (AICT)
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The SYSTEM 8 Analogue IC Tester is the answer to testing analogue devices. The key feature of the AICT is its ability to functionally test all common analogue ICs and discrete devices in circuit. It is also capable of testing all types of analogue and digital components by means of the well-known, power off V-I test technique. For users requiring only the latter function, please select the Analogue Test Station section.
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Linear IC Tester
570A
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The Model 570A Analog IC Tester's built-in test library includes all common Analog ICs including op-amps, comparators, voltage regulators, voltage references, analog switches & multiplexes, opto-isolators & couplers, and audio ICs.
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IC Card Meters
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Shenzhen Star Instrument Co., Ltd.
Single-phase IC card energy meter adopts dual measurements and raises the bar on tamper detection.
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IEEE-488 GPIB Device Interface IC (Chip) for the PCI-Bus
GPIB-72120
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The i72120 GPIB-Chip is the ideal solution to implement a IEEE488.2 GPIB interface for next generation PCI based instruments. The GPIB-ASIC is designed to meet all of the functional requirements for talker and listener (TL) devices as specified by the IEEE Standards 488.1-1987 and 488.2-1987. Connected between the PCI bus and the GPIB, this GPIB-IC provides high-level management of the GPIB to unburden the processor and to simplify both hardware and software design. The i72120 is fully compatible with the PCI specification and requires only the addition of bus driver/receiver components to implement a talker/listener GPIB interface.
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Photocouplers/Optocouplers IC Output
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The PS8xxx/PS9xxx series, a range of IC output type photocouplers (optocouplers), feature a high-speed response from 1Mbps to 15Mbps and a wide variety of DIP and SOP packages that can be surface mounted (SMD).
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Ice Profiler
IPS
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Estimate ice forces for design of offshore platforms and operational planningDetermine the extreme thickness of ice for pipeline installationsExamine in detail the underside of sea-iceUnderstand the dynamics and thermodynamics of the sea ice regime for scientific research.Climate change studies
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K-type Thermocouple to Digital Converter
THERMO K click
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THERMO K click carries the MCP9600 IC from Microchip. Depending on the type of probe it uses the click can measure temperatures from −200 °C to +1372 °C.
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Laser Induced Incandescence (LII)
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Soot is considered a hazardous pollutant emission and is typically a result of incomplete combustion processes, and thus is also related to combustion performance. Laser Induced Incandescence (LII) is a laser-optical measurement technique dedicated to soot diagnostics. LII can provide measurements of soot volume fraction, such as in Diesel engine exhaust, and even instantaneous images of soot distribution during formation inside a running IC engine.
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FAult Detector and OScilloscope 7 Functions in 1 Device
FADOS7F1
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Prot-Ar-Ge Industrial Project Design R&D Ltd. Co.
Usage of FADOS7F1: Determining faults of all types of electronic cards such as electronic cards of medical devices, textile and any other machines; automobile electronics; computer, monitor, TV, etc. Electronic Components Test: IC, transistor, FET, IGBT, resistor, capacitor, indicator, ect. This device is used to determine the faults at all these electronic components.
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Near Field Probes
MFA Family
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The micro probes allow detailed measurements of high-frequency magnetic fields in the layout, at the smallest SMD components(0603-0201) and at IC pins of printed circuit boards.
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Probing & Analysis Adapters
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No matter how well designed a circuit is, there is almost always a need to hook up test instruments to it to verify function, look for bugs, or baseline performance. As IC packages become smaller and pin counts grow this becomes harder and harder. probing adapters are required to alleviate this de-bug problem. Many different types of adapters fall into the test and debug category. The common feature is that they bring the signals of an IC out to a format that is easy to interface with test and analysis equipment.
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Optical Communications and Sensing
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The Analog Devices optical portfolio covers a range of technologies, such as current mirrors, translinear logarithmic amplifiers, laser diode driver ICs, and optical sensors, to provide designers the tools they need for their optical applications. Our optical portfolio supports GbE optical receivers, Fibre Channel, WDM transponders, telecommunications, and next-generation optical networks.
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Communications ICs
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Renesas' broad portfolio of communication ICs includes subscriber line interface circuits (SLICs), DSL line drivers, general purpose ringing SLICs, isolated PWM controllers, line card access switches, PABX short-loop SLICs, PLC line drivers, and serializer/deserializer (SerDes) ICs.
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Micro probes 1 MHz up to 1 GHz
MFA 02 set
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The two in the set included micro probes are used to measure low-frequency magnetic fields up to 1 GHz, e.g. at signal conductors (150µm), SMD componets (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the BT 706 Bias tee. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee to a spectrum analyzer or an oscilloscope. The MFA 02 set delivery of Langer EMV-Technik GmbH includes correction lines. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.
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IC-3120, 1.91 GHz Intel Atom Quad-Core Processor, 2-GigE Port Industrial Controller
784959-01
Controller
The IC‑3120 is a compact and rugged industrial controller that withstands the harsh environments common in automation, supervisory control, distributed control, and industrial embedded OEM applications. The IC‑3120 offers two Gigabit Ethernet ports with Power over Ethernet (PoE) technology, FPGA-based I/O capabilities, and network connectivity for distributed control applications. The advanced features include the ability to synchronize image inspection results with industrial I/O and configure hardware-timed network triggers to trigger camera acquisition, motion control, or data acquisition. You can use the advanced FPGA personality that is shipped with the system or customize the FPGA functionality using the LabVIEW FPGA Module.
