Laser Diode Reliability Burn-In / Life-Test System
58602 - Chroma ATE Inc.
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
Test System
Topics
- Laser Diode
- Source Measurement Units
- Source Measure Units
- Burn-In
- Diode
- Lasers
- Life Test
- Reliability
- Temperature Controllers
- Component
- VCSEL
- Arrays
- Control
- Controllers
- Density
- Developers
- Development
- Interfaces
- Life
- Measurement
- Modulation
- Modulators
- Modules
- Optoelectronic
- Photodiode
- Photon
- Photonics
- Silicon
- SMU
- Sources
- Systems
- Temperature
- Test
- Testing
