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Silicon
atomic number 14 tetravalent metalloid chemical element.
- Applied Rigaku Technologies, Inc
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Low cost EDXRF Elemental Analyzer
NEX QC+ QuantEZ
Applied Rigaku Technologies, Inc
As a premium low-cost benchtop EDXRF elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, and slurries. The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability, along with multiple automated X-ray tube filters, provides a wide range of XRF applications’ versatility and low limits-of-detection (LOD).
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Contactless Wafer Gauge for Resistivity, Thickness
MX 60x
The MX60x series measure Resistivity or Sheet Resistance of silicon and other materials.
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Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Pressure Sensors
ESCP-MIS1 Sensor
ES Systems has developed a series of medium isolated pressure sensors suitable for applications with harsh environmental conditions where resistance to corrosive fluids or gases is required. Each sensor integrates a MEMS capacitive pressure sensor die, and a CMOS ASIC for the signal conditioning. The MEMS pressure sensor dies are underpinned by ES’s innovative microfabrication process for silicon capacitive sensors.
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XYZ Color Sensor
AS7261
Calibrated XYZ color sensor provides complete, integrated platform for handheld color analyzers, color calibration and mobile analysis devices. Tri-stimulus XYZ realized by silicon interference filters. UART or I²C slave digital Interface. 16-bit ADC with digital access. Programmable LED drivers. 20-pin LGA package 4.5mm x 4.7mm x 2.5mm, with built-in aperture. Compact true-color sensing. Applications; Color/CCT sensing, Fluid or reagent analysis, Color point comparison, Display calibration.
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PIN Diodes
PIN photodiodes convert light to current – without a bias voltage having to be applied. Silicon is commonly used as an inexpensive detector material in the Vis range. For higher demands, InGaAs is used; it covers the widest spectral range from the Vis to the NIR. We offer silicon carbide as a “solar-blind” detector specifically for the UV range.
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RZ Family of 64-Bit & 32-Bit Arm-Based High-End MPUs
RZ/G
RZ/G Series MPUs extends the capabilities of RZ/A Series to deliver high-end performance for graphics, multi-stream video, and embedded vision thanks to features like camera input, 3D graphics accelerators, Full HD video codec, and GbE. Renesas also offers the RZ/G Linux platform, which is a user-friendly software development environment for customers who wish to lower the barriers and cost of Linux adoption and maintenance. The RZ/G Linux Platform enables super-long-term Civil Infrastructure (CIP) Linux support in an industrial grade verified Linux package, which complements Renesas’ high quality silicon.
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Digitizer
743 Family
The 743 is the Switched Capacitor Digitizer family, based on the SAMLONG chip and developed in collaboration with CEA/IRFU, with a good compromise between high sampling frequency (3.2GS/s) and channel density. It can record very fast signals from scintillators coupled to PMTs, Silicon Photomultipliers, APD, Diamond detectors and others, and save them with high efficiency and precision for advanced timing analysis.
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Silicon O/C Content Tester
OCT-2000
Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
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PMT Pressure Solutions
AMETEK Sensors, Test & Calibration
PMTs pressure transducers and transmitters are some of the most long term stable units on the market, due to our solid state silicon piezoresistive sensing element. Standard, intrinsically safe, and explosion proof transducers and transmitters are available in off-the-shelf models for quick delivery, or custom configurations.
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5G 256-Element Active Antenna Innovator’s Kit
AWA-0134
The AWA-0134 is an active array for 5G wireless applications developed using planar antenna technology resulting in a very low profile, lightweight unit. The surface mount assembled antenna board is based on Anokiwave’s AWMF-0108 Silicon Quad Core IC and demonstrates the performance achievable using low power silicon integration and efficient antenna layout and design. Using the AWMF-0108, the antenna provides +60dBmi (1000 W) of EIRP. The electronic 2D beam steering is achieved using analog RF beam forming, with independent phase and gain control in both Tx and Rx operating modes. The AWA-0134 antenna leads the way in showing how 5G coverage can be rolled out by network operators using the mmW bands, with low power footprint and high energy efficiency, while meeting key operating specifications for data rate, latency, coverage, and reliability.
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Ka-Band Silicon 5G Quad Core IC
AWMF-0108
The AWMF-0108 is a highly integrated silicon quad core IC intended for 5G phased array applications. The device supports four Tx/Rx radiating elements, includes 5 bit phase and 5 bit gain control for analog RF beam steering, and operates in half duplex fashion to enable a single antenna to support both Tx and Rx operation. The device provides 26 dB gain and +9 dBm output power during transmit mode and 28 dB coherent gain, 5.0 dB NF, and -28 dBm IIP3 during receive mode. Additional features include gain compensation over temperature, temperature reporting, Tx power telemetry, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8 V supply, and is packaged in a 48 lead 6x6 mm QFN for easy installation in planar phased array antennas.
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Piezo-resistive Accelerometer
A Piezo-resistive Accelerometer has a stable structure composed on a silicon chip created by the micromachining and semiconductor production technology. A mass and a beam on which a set of the Piezo-resisters are created on the silicon chip. A set of electrical bridged is formed by such Piezo-resistive resisters to generate signals proportional to the applied acceleration.
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SparkFun FM Tuner Basic Breakout
Si4703
This breakout for the Silicon Laboratories Si4703 FM tuner chip is a little more stripped down than our FM Tuner Evaluation Board. If your project already has an amp and just needs a full-featured FM tuner, this is the board for you. Beyond being a simple FM radio, the Si4703 is also capable of detecting and processing both Radio Data Service (RDS) and Radio Broadcast Data Service (RBDS) information. The Si4703 even does a very good job of filtering and carrier detection. It also enables data such as the station ID and song name to be displayed to the user.
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Digitizer
742 Family
The 742 is the Switched Capacitor Digitizer family, based on the DRS4 chip by PSI, with the highest sampling frequency (5GS/s) and channel density. It can record very fast signals from scintillators coupled to PMTs, Silicon Photomultipliers, APD, Diamond detectors and others, and save them with high efficiency and precision for advanced timing analysis. The 742 family has an additional channel (two channels in case of VME boards) which can be used as time reference for time of fight measurements. The resolution of this kind of measurements can reach up to 50 ps.
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Universal Multichannel System up to 100V
- From 12 to 48 independently controllable High Voltage channels- 0 ÷ 100 V output voltage- Maximum Current: 1mA, 10 mA or 1 mA/100 μA (dual range board)- Individual Enable (A1510 only)- Either DB37, DB25 or SHV connectors- Available with either positive, negative or mixed polarity- Up to 20 nA / 100 pA current set / monitor resolution- Up to 2 / 0.2 mV voltage set / monitor resolution- Extreme Low ripple, down to < 3 mVpp- 3 different channel grounding- Common Ground (AGxxxx)- Common Floating Return (Axxxx)- Full Floating (A1510 only)- Independently programmable for each channel:- Output voltage- Current limit- Ramp up/down- TRIP parameter- Current generator operation in overcurrent condition- Specific design for double side silicon detector (A1510)
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Schottky Barrier Bridge Quads
SemiGen’s Silicon Schottky Diodes are designed for applications through 40Ghz. The special process technology utilizes various metal schemes to provide excellent performance of Low, Medium, and High Barrier applications. The end result is a low resistance diode with tightly controlled capacitance which allows for optimum performance. Low conversation loss and superior TSS make these diodes ideal for detector / mixer applications with frequency ranges from S band to Ka band as well as modulators, lower power limiters and high speed switches.
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SiC Diodes
ST’s silicon carbide diodes range from 600 to 1200 V – as single and dual diodes – and feature unbeatable reverse recovery characteristics and improved VF. Available in a wide variety of packages, from D²PAK to TO-247 and the insulated TO-220AB/AC, they offer great flexibility to designers looking for efficiency, robustness and fast time-to-market. ST’s SiC Schottky diodes show a significant power-loss reduction and are commonly used in hard-switching applications such as high-end-server and telecom power supplies, while also intended for solar inverters, motor drives and uninterruptible power supplies (UPS). ST’s automotive-grade 650 and 1200 V SiC diodes – AEC-Q101-qualified and PPAP capable – feature the lowest forward voltage drop (VF) on the market, for optimal efficiency in electric vehicle (EV) applications.
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Pyranometer with Silicon Photodiode
LP471SILICONPYRA
Pyranometer with silicon photodiade for GLOBAL SOLAR IRRADIANCE measurement.
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SiC MOSFETs
Bring the advantages of innovative wide bandgap materials (WBG) to your next design thanks to SiC MOSFETs. With an extended voltage range, from 650 to 2200 V, ST's silicon carbide MOSFETs offer one of the most advanced technology platforms featuring excellent switching performance combined with very low on-state resistance per area.
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NanoModeScan M² Measuring System
This scanning slit M² measurement system accurately analyzes lasers with wavelengths from UV to Far Infrared with its silicon, germanium, or pyroelectric head. It features a compact portable design, immediate results, ISO compliant measurements, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive analysis of lasers of most wavelengths.
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Intelligent Silicon Photomultiplier Tube
i-Spector family
i-Spector is a all-in-one detector and electronics instrument based on a SiPM area (18×18 mm2, 24×24 mm2 or 30×30 mm2), possibly coupled to a scintillation crystal suitable for the chosen application. The i-Spector integrates in a compact tube-like mechanics the detection stage, frontend electronics, an integrated power supply for SiPM biasing and, eventually, a digital chain to process onboard the incoming data. The i-Spector can be controlled via Ethernet and/or wireless communication based on LoRa standard.
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Climatic Chamber
Wewon Environmental Chambers Co, Ltd.
Climatic chamber is designed to do high temperature & high humidity, high and low temperature, or temperature cycling test, Climatic chamber mainly used for quality checking and assessing their quality reliability and life test. ● The climatic chamber simulate a full range of temperature testing and humidity testing conditions.These chambers are designed for ease-of-use, reliability and performance and include many user-friendly features standard with your purchase for the best value in the industry. ● Climatic test chambers are able to provide rapid product temperature change rates and use varying levels of relative humidity to locate design problems prior to shipping your products, improving product quality and reliability. climatic chamber For conditioning of samples prior to testing. Climatic chamber also can be used for a variety of materials of high – low temperature alternating test. The test temperature, humidity, time can be programmed. Provides conditions of temperature form -70 degree to +150 degree and of humidity from 20% to 98%. ● This type climatic chamber use 16bit Industry-grade PLC, programmable controller to control the test temperature test, and recycle time, more excellent anti jamming, high reliability of the data. ● TEMI880 large color LCD touched screen temperature & humidity controller. Real-time display program running time, the number of segment, the remaining time, repeat frequency,can display experimental data, including the pre-set segment time, heating status, calendar time, etc; climatic chamber directly digital display. ● Climatic chambers apply controllable silicon step-less adjusting technology to adjust temperature and humidity test continuously and precisely, and without over heated as the PID adjusting function. ● The thermal insulation material between outside and inside for climatic chamber is high-quality ultra-fine glass fiber insulation cotton, good thermal insulation effectivity. Thermal insulation layer composed of flame fire PU + glass wool insulation (insulation thickness 10.0 cm)
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Silicon Carbide Diodes
In addition to ensuring compliance with today's most stringent energy efficiency regulations (Energy Star, 80Plus, and European Efficiency), ST's silicon-carbide diodes show four times better dynamic characteristics with 15% less forward voltage (VF) than standard silicon diodes. Silicon-carbide diodes belong to our STPOWER family.
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High Density Plasma Etching System for 200mm substrates
Model DRIE-1200-LL-ICP
Single process chamber for high rate plasma etching of 200mm wafers. Loadlocked. Stainless steel construction. Capabilities of smaller, multiple wafer throughput. Substrate materials include (but are not limited to) silicon, silicon oxynitrides, SiC, SiGe, Aluminum, and III-V compounds including GaAs, GaN, GaP, and InP. Stable plasma generation capabilities to below 1 mTorr. Five, Six, or Eight gas mass flow controllers are standard. Expanded or reduced numbers are available upon request.
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High Voltage Switching Test System
The advanced development of new technologies, such as SiC and GaN, have opened the opportunity for more efficient and higher voltage/power performance in switching and power management circuits. Their high cutoff frequencies, low on-state resistance, and very high breakdown voltages can increase power supply power handling densities approaching hundreds of watts/inch. Reliability of these new technologies and techniques is critical for realizing practical applications. While Silicon devices have a rich history of proven reliability, these newer compound semiconductor technologies are too new to have a reliability history and have not been well proven. Further, process variations, even in well-controlled lines, yield widely varying results. This has driven the need for additional testing and to burn-in devices prior to delivery.
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Silicon Phosphor and Boron Analyze system
HS-ICP-MS
The Silicon Phosphor and Boron Analyze system HS-ICP-MS is the best system to measure the element like P&B in silicon material, the HS-ICP-MS can detect and analyze over 75 elements.
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AC Hysteresis Graph Test System
DX-2012M
Automatic measurement of the dynamic magnetic hysteresis loop of oriented and non-oriented silicon steel under the condition of 50 Hz, 60 Hz, 400 Hz and 1 kHz, accurate measurement of the static magnetic characteristic parameters such as amplitude permeability μa, loss angle δ, specific total loss Ps, remanence Br and coercivity Hc. With special testing fixture, it can directly measure the iron core and stator core of the transformer.
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Generates Test Cases on ICE
TrekSoC-Si
TrekSoC-Si automatically generates self-verifying C test cases to run on the embedded processors in SoCs in in-circuit emulation (ICE), FPGA prototyping, and production silicon. This verifies your chips more quickly and more thoroughly than hand-written diagnostics or running only production code on the processors. TrekSoC-Si's generated test cases target all aspects of full-SoC verification and work in a variety of different environments. TrekSoC-Si is a companion to TrekSoC, which generates test cases for simulation and acceleration. TrekSoC-Si extends the benefits of TrekSoC into hardware platforms.
