System Integrators
incorporation of all integral elements, orchestrated.
See Also: System Integration, Systems, ATE Integrators
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Process Systems And Integration
For 50 years, Anton Paar has been pushing the limits in process sensor technologies, providing superior products in the fields of density, viscosity, O2, CO2, and refractive index measurement for a wide range of industries, including the beverage, chemical and petroleum industries. Now Anton Paar extends its product portfolio by offering complete process engineering solutions.
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Integrated Safety Unit For ATOS
ISU-R
Raytech Integrated Safety Unit is a useful device when creating rack mounted transformer observing systems. It supplies Raytech devices with fused electrical power, manages external Interlocks and provides a single interface for an external warning lamp. The whole system can be turned on and off with a single mains switch.
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Integrated Development Environment
All Cosmic C Cross Compilers for Windows include IDEA - Cosmic's own integrated development environment which is preconfigured for the the compiler it comes with. IDEA is designed specifically for developing embedded applications with Cosmic compilers. IDEA integrates an editor, project manager, graphical smart build/make facility, program analyzer, link file generator, documentation manager and ZAP debugger into one easy to use environment running under Windows Windows 7, XP and compatible. IDEA includes the following features:
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Vacuum Interrupter Pressure Integrity Test Set
Low Drift Current is measured by applying magnetic field.
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Integrating Spheres
All our spheres can be coupled to our high performance spectroradiometer systems for UV-visible-IR spectral power distribution measurements yielding full colour information including colour rendering indices, chromaticity co-ordinates, colour temperature, etc. Alternatively precision photometric detectors can be fitted for direct total lumen output measurements.
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Wafer Chip Inspection System
7940
Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.
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Integrating Spheres
Artifex Engineering GmbH & Co. KG
We offer integrating spheres made from a special polymer suitable for the wavelength range 250nm – 2.5 µm. For longer wavelengths in the range 700nm – 20 µm, a gold coating on a rough, metallic surface is used. Since lasers in this spectral range are usually also high power, we use solid copper as a thermally conductive substrate material. By choosing the size of the integrating sphere, the overall sensitivity of the system can be adjusted. In addition, the detector is independent of inhomogeneities in power density and polarization. The detector is also independent of the incidence location and angle of the laser radiation.
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Calibrated, Integral Isolator Noise Sources
Calibrated, Integral Isolator Noise Sources by Pasternack
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RF Solution Integrated Handler
3240-Q
The Chroma 3240-Q is a unique and innovative handler with integration of RF/Wireless isolation chamber.
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Integration Spheres
Offers a wide range of integration spheres (0.25m to 3 m diameter) and spectrometer options, application-specific modules as well.
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Signal Integrity Test Products
RoBAT RCI
*TDR & TDT, Measurement Capabilities*Impedance, Skew, Backdrill measurements*Automated Optical Inspection*DC Electrical Test*Now available with 4 heads*24 port (1 port per channel) TDR/TDT unit*Future capabilities – Fully automated VNA test (4 port S-Parameter Measurement)
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Integrated Optical Modulation Analyzer
N4392A
The new Keysight N4392A is an ultra-compact, portable fully integrated optical modulation analyzer with a 15'' laptop-size screen. It is optimized for daily R&D work and designed for the most affordable performance verification in manufacturing and component test for 40/100G components, modules and systems. It is the first optical modulation analyzer that provides built-in performance verification and recalibration, extending the factory recalibration cycles significantly.
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EMI Filters And Application-Specific Integrated Products (ASIP)
An electromagnetic interference (EMI) filter is used in electronic circuits to improve system immunity against unwanted external electromagnetic signals from neighboring circuits and to avoid emitting radiation (“noise”) that may disturb the same nearby circuits by canceling unwanted frequencies.
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Integrated Analyzer Systems
For over half a century, ABB has developed, manufactured, supplied and installed analytical instruments for the laboratory, process, environmental, steam and power industries.
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High-Precision Battery Tester with Integrated Chamber
Arbin's High-Precision Battery Tester (HPS) offers a turn-key solution with state-of-the-art technology, ensuring unmatched accuracy and precision.
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LED Lighting Test Instrument Integrating Sphere
CX-I.5S
Shenzhen Chuangxin Instruments Co., Ltd.
Measure Luminous Flux, Luminous efficacy, radiant power, Spectral Power Distribution, Chromaticity Coordinate, Correlated Color Temperature, Peak Wavelength, Dominant Wavelength, Spectral Half Width, Color Rendering Index, Colorimetric Purity, red ratio, Standard deviation of color matching(SDCM), voltage, current, power, power factor, harmonics, and etc. It meets the requirements of CIE standards.
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Series Gated Integrators and Boxcar Averagers
SR200
Stanford Research Systems, Inc.
The SR200 Series Boxcar Averager System is a modular instrumentation platform designed to acquire and analyze fast analog signals. The system consists of a NIM compatible mainframe and modules which can be selected to tailor a system to individual requirements. The
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Current Integrated Sources
CIS
The CIS current integrated source was designed to provide a stable alternating current source for the electricity meter test equipment, and in laboratories. The output current is isolated and independent from the mains voltage. Different CIS versions are available depending upon the values of output power and output current required.
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Microelectronics - Integrated Solutions
Teledyne e2v HiRel provides microelectronics packaging and products with a full range of packaging solutions from COTS to MIL-PRF-38534 compliant (Class H & K) qualifications. HiRel provides a one stop solution for your microelectronic assembly, evaluation, test and screening requirements. Our MCM packaging technology enable our customers to meet size, weight, power and cost (SWaPC) requirements without a sacrifice in performance. Our numerous certifications including AS9100, ISO 9001, and MIL-PRF-38534 Class H accreditation, all of which are integral factors in our company-wide initiative to deliver high-reliability microelectronic devices that meet our customers' stringent requirements. We are a DOD Trusted Source for Microelectronics Packaging, Assembly, and Test.
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Voltage Integrated Sources
VIS
The VIS voltage integrated source was designed to be used as a stable alternating voltage source for electricity meter test equipment, and in laboratories. The output voltage is isolated and independent of mains voltage. VIS is available in a variety of configurations depending on the values of output power and output voltage.
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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Integrated Function Tester for Inductance Ballast
UI2001B
• Measure input parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components. V range: 10.0~300.0V, A range: 0.010~2.000A, F range: 45~65Hz • Measure output parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components Lamp voltage range: 10.0~450.0V, Lamp current range: 0.010~2.000A • Accuracy: ± (0.4% reading+0.1% range+1 digit) • Can test every kind of curve, print both data & curve • Communication interface available for PC, running under Windows98/2000/XP/Vista
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nanoSynth® Integrated 6 GHz SMT Synthesizer
Nano Series
The SC800 nanoSynth® is a fully integrated broadband CW signal synthesizer that combines multiple PLL, DDS, and frequency dividers into a rugged and miniature 2”x1” surface mountable package. The output frequency range is 25 MHz to 6 GHz with average output power of +10 dBm. Tuning at 1 Hz resolution, the multiple PLL architecture eliminates close-in phase spurs that are associated with fractional-N PLLs. To simplify user communication with the device, an onboard microprocessor performs all necessary computations to control and set the output frequency, reducing the number and complexity of instruction registers.
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Test Solutions For Integrators
Beyond being your test equipment expert, Testek can also provide engineering design advice and guidance on building complete test solution facilities. We will work closely with your building contractor to advise on the most optimal layout configuration and to specify all facility resource requirements. For systems that may share resources, we can facilitate resource demand and management, including power management and fluid management. With a central control system, we can provide software logic to monitor these resources and route them appropriately based on demand and priority.
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Integrated Connection Technology
Compact design - Connection points for bridge combs - Solder-free circuit board contact - Plug -in connectors for interchangeable modules, such as small relays
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Systems
Walter Stauffenberg GmbH & Co. KG
Custom-design and ready-to-install hydraulic pipe, tube and hose assemblies from port to port
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System
SpecMetrix
SpecMetrix systems by Sensory Analytics were designed from the ground up to precisely measure the absolute thickness of just about any coating on any substrate. All our systems are flexible for use in virtually any manufacturing environment. They provide coating thickness data of unprecedented accuracy—helping manufacturers reduce costs by optimizing coating process control and product quality. Our systems are easily configured to measure webs, coils, flat sheets, small samples or finished parts.
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BMS Manufacturing Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Safety Compliance Test System
EN 60601
Test system for electrical safety compliance testing of medical products in accordance with EN 60601-1, 3rd edition.The system is equipped with three test fixtures which are connected in parallel order to reduce the number of setup tasks for different variants in the course of day-to-day manufacturing processes. Its purpose is to test medical products, e. g. patient monitors, which are employed at hospitals to monitor heartbeat and oxygen saturation.Based on the integrated electrical safety tester by Associated Research, in combination with an AC power source and a switching matrix, it is possible to fully automate tests like for instance AC/DC high-voltage tests, insulation resistance measurements, earth connection tests and leakage current measurements.The required occupational safety is provided by a high-voltage safety hood in accordance with EN 501191. The entire safety technology, as well as the control PC, is mounted in an aluminum-profile cart.
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Integrating Sphere Coating
SP-80
Integrating Spheres are essential tools for photometric research laboratories & lamp / luminaire manufacturers. A good internal coating is essential forintegrating spheres. It is a special water based BariumSulphate (BaSO ) white reflective paint particularly suitablefor internal coating of Integrating Spheres. It offers an almost constant reflectance in the range of 380 nm to 780 nm (visible wavelength range).
