X-ray Photoelectron Spectrometers
determine the atomic composition of a surface.
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Product
Solid-State Battery X-Ray & CT Test Cell
STM1
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Solid-state battery test cell designed for monochromatic X-ray and CT imaging, featuring an X-ray-transparent structure for non-destructive electrochemical and structural characterization.
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Product
Nuclear Magnetic Resonance Spectrometer
NMR
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NMR is an abbreviation for Nuclear Magnetic Resonance. An NMR instrument allows the molecular structure of a material to be analyzed by observing and measuring the interaction of nuclear spins when placed in a powerful magnetic field.For the analysis of molecular structure at the atomic level, electron microscopes and X-ray diffraction instruments can also be used, but the advantages of NMR are that sample measurements are non-destructive and there is less sample preparation required.Fields of application include bio, foods, and chemistry, as well as new fields such as battery films and organic EL, which are improving and developing at remarkable speed. NMR has become an indispensable analysis tool in cutting-edge science and technology fields.
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Product
X-Ray Inspection System
MXI Ruby XL
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Designed for the largest PCBs, Ruby XL allows 96 x 67 cm (37.9” x 26.4”) areas to be inspected non-destructively, with feature resolution up to 0.5 µm.
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Product
X-ray and CT inspection System
UX20
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Due to the transformation to electric mobility, foundries are increasingly producing larger and more complex components. With its exceptional inspection envelope and the smart Geminy software, the UX20 facilitates fast and precise inspections of cast parts and helps increase overall production efficiency.
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Product
X-ray inspection system for BLU, LED Long bar products
X-eye 9000LED
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X-ray Tube100kV / 200uAMin. Resolution5µmTable Size1,500mm X 500 mmDetectorFlat Panel Detector (High sensitivity)Dimension3,620(W) x 1,065(D) x 1,590(H)mm / 850kg
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Product
Inspection System for high-power precise 3D X-ray CT
X-eye PCT225
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Inspection System for 3D X-ray CT able to analyze defected area precisely by precise movement of axis with high polished Anti-vibration table. High-power X-ray Tube of max. 450kV and large area Flat Panel Detector of max.16 inches can be installed depending on the sample. Customized 3D CT equipment is available with selecting main parts by customers depends on their needs for size and material.
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Product
Portable X-Ray Systems Bundle
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Discover our complete range of portable X-ray systems for NDT inspections.Fully developed in-house, these packages combine a detector, an X-ray generator, and Sherlock NDT, a state-of-the-art and user-friendly NDT inspection software.
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Product
X-ray Inspection System
RTX-113HV
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Precision X-ray Inspection for BGAs, QFNs, LEDs, sensors, medical devices, and other packaged devices.
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Product
Probe Raman Spectrometers
RMP-500 Series
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Compact, high resolution (f200) Raman optical system that is rugged enough to be moved to a site for sample measurement. This high quality optical bench is used with fiber-optic probes for remote in-situ measurement
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Product
Nano-focus X-ray Inspection System
X-eye NF120
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Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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Product
X-Ray Inspection System
MXI Quadra 5
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Quadra™ 5 is the X-ray inspection system of choice for sub micron applications such as PCB and semiconductor package inspection, counterfeit component screening and finished goods quality control.
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Product
Small Footprint NIR Spectrometer
PGS Series
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ZEISS PGS modules with a spectral coverage of 960 - 2200 nm are among the market leading NIR spectrometers, providing a small footprint, highest throughput and excellent SNR. Special TE-cooled/uncooled InGaAs detectors ensure lowest noise conditions.
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Product
Xray Food Inspection
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FlexXray has developed leading, certified technology and processes to use advanced x-ray technology to inspect products specifically for food companies. Although they look like a TSA line at the airport, our systems are highly customized machines and processes built specifically to find contaminants like metal, glass, wood, stone, plastic, and rubber in food products of all types. What we do is find needles in haystacks – but the needles we find are even smaller than needles in a haystack. In fact, FlexXray can find contaminants down to 0.8mm or smaller.
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Product
StarLine Spectrometers
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The AvaSpec StarLine series of instruments is comprised of high-performance spectrometers that exceed the demands of most general spectroscopy applications. This instrument line offers a wide array of solutions for various uses while providing excellent price-to-performance ratios.
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Product
ICP-MS spectrometers (ICP MASS)
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SPECTRO Analytical Instruments GmbH
SPECTRO MS is a double-focusing sector field ICP MS (ICP mass spectrometer) based on a Mattauch-Herzog geometry with a newly developed ion optic and pioneering detector technology. It is the only ICP MS instrument available on the market today that is capable of simultaneously measuring the complete mass range used for inorganic mass spectrometry from 6Li to 238U with a permanent ion beam going to the detector.
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Product
Miniature Spectrometer
MSP1000
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The MSP1000 miniature spectrometer (MiniSpec) is a compact, fibre-coupled spectrometer suitable for common laboratory tasks. By using the latest manufacturing techniques, we are now able to provide the system for a cost of less than £1000.
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Product
Compact Photon Counting X-Ray Detector
HyPix-3000
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Rigaku’s HyPix-3000 is a next-generation two-dimensional semiconductor detector designed specifically to meet the needs of the home lab diffractionist. One of the HyPix-3000’s unique features is its large active area of approximately 3000 mm² with a small pixel size of 100 μm², resulting in a detector with high spatial resolution. In addition, the HyPix-3000 is a single photon counting X-ray detector with a high count rate of greater than 10⁶ cps/pixel, a fast readout speed and essentially no noise.
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Product
Gamma Spectrometer
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Quaesta now offers two gamma spectrometer products which have many of the features in our neutron detection products such as data logging, computer interface and software. These devices include standard crystal scintillators such as Nal and Csl.
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Product
A Compact X-ray Inspection System, The MedaScope™ Desktop
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A compact X-ray machine weighing only 55 pounds, the MedaScope Desktop is easy to carry and can be set up rapidly. Glenbrook’s MedaScope Desktop is a portable, compact manual system for real-time, magnified x-ray screening of packaged devices including medical devices, electronics, and cables.
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Product
Large-Area CMOS X-Ray Detector
Rad-icon
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Teledyne DALSA’s Rad-icon product family of large-area digital x-ray cameras offers users a high-speed, high-performance x-ray imaging detector with a fast, reliable PC interface (either GigE or CameraLink) for easy integration.
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Product
Field Portable NIR Spectrometers For Mineral Identification And Analysis In Mining Exploration
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With Spectral Evolution field portable NIR spectrometers and EZ-ID mineral identification software, geologists can measure and identify minerals within seconds and cover more ground than by using traditional methods. They can identify different mineral phases, create mineral alteration maps and more accurately identify mineral pathfinders for vectoring to ore deposits. Spectral Evolution's field portable, battery-operated oreXpress, oreXplorer and oreXpert ultra-high resolution NIR spectrometers are designed for mineral identification in mining exploration. The oreXpress, oreXplorer and oreXpert provide quick payback with faster, more accurate mineral identification in exploration for gold, silver, diamonds, iron, nickel, copper, uranium, aluminum - in the field, core shack, or in the lab, and provide:
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Product
High-power Benchtop Sequential WDXRF Spectrometer
Supermini200
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Elemental analysis of solids, liquids, powders, alloys and thin films. The new Supermini200 has improved software capabilities as well as a better footprint. As the world''s only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku Supermini200 uniquely delivers low cost-of-ownership (COO) with high resolution and lower limits-of-detection (LLD)..
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Product
X-ray Fluorescence
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XRF is an elemental analysis technique with unique capabilities including (1) highly accurate determinations for major elements and (2) a broad elemental survey of the sample composition without standards. For example, XRF is used in analysis of rocks and metals with an accuracy of ~0.1% of the major elements.
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Product
X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-20
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The SLFA-20 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
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Product
X-Ray Inspection System
MX1
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Manncorp’s new MX1 is a high-performance x-ray inspection system designed for real time imaging of multilayer PCBs and dense metal BGAs, μBGAs, and chip scale packages. Its high voltage (80kV), computer-controlled x-ray tube and 35 μm focal spot provide the power necessary for detection of a variety of defects including bridging, voids, and missing balls. The MX1’s standard camera features continuous zoom magnification from 4X to 50X and variable angle viewing up to 45°, and an upgrade to the x-ray tube can boost magnification to 225X.
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Product
Constant Potential Generator Metal Ceramic X-Ray Tube 30 to 300 kV
CP300C
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The CP300C is the first panoramic x-ray generator of the CPSeries product range. Equipped with a metal-ceramic tube, the CP300C is a light (less than 30kg) and powerful generator (300 kV), able to penetrate up to 52mm of steel in 10 minutes, making it the best power-to-weight ratio in the world.The efficiency of the CP300C is also maximum thanks to its real 100% duty cycle that allows longer exposure time (> one hour).A full range of accessories is available (holding bars, tripod…) and even a 60°x40° lead diaphragm to convert the CP300C into a directional unit.
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Product
Small Spot Advanced EDXRF Spectrometer
NEX DE VS
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Applied Rigaku Technologies, Inc
Specially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility, and ease-of-use of the NEX DE VS adds to its broad appeal for an ever-expanding range of applications, including exploration, research, RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX DE VS is the reliable choice for routine elemental analysis.
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Product
TEL-X-Ometer X-ray System
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X-ray experiments can include radiography, x-ray fluorescence, and x-ray diffraction. All can be performed with the TEL-X-Ometer, a compact x-ray source designed for student use. Take a look at the TEL-X-Ometer and accessories today.
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Product
Total Reflection X-ray Fluorescence (TXRF) Services
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A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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Product
Proton Induced X-ray Emission (PIXE)
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Elemental Analysis Incorporated, utilizing Proton Induced X-ray Emission (PIXE), provides a non-destructive, simultaneous analysis for the 72 inorganic elements from Sodium through Uranium on the Periodic Table for solid, liquid, and thin film (i.e. aerosol filter) samples. The PIXE technique offers the advantage of analysis, without the necessity for time consuming digestion, thereby minimizing the potential for error resulting from sample preparation.
