X-ray Photoelectron Spectrometers
determine the atomic composition of a surface.
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Product
Software - Productivity and comfort for your spectrometer
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Instrument Systems Optische Messtechnik GmbH
Instrument Systems offers different software packages for controlling the spectrometer and analyzing measuring results. Design and development of software at Instrument Systems focuses on easy operation and exceptional functionality. This ensures a high level of productivity in the deployment of measuring systems.
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Product
Digital Cabinet X-ray System
XPERT 80
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Kubtec's XPERT 80 brings high quality imaging and ease of use to science and research. The XPERT 80's compact self-contained cabinet, with a high resolution x-ray source, provides the sharpest images for every application. Optional sources are also available for micro-focus and soft x-ray applications.
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Multi-Channel Spectrometers
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Do you need more precise measurements over a broad range? Or multiple measurements performed at the same moment for process control purposes? Our AvaSpec multi-channel spectrometers fulfill your every need. You can select the right option from our range of detectors, and choose different slits and gratings: anything is possible.
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X-Ray Detectors
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Sydor Technologies is committed to innovating x-ray detector technology—as we have done for over a decade—developing complex measurement solutions and commercializing emerging technologies for world-class laboratories. We’re committed to innovating cutting-edge technology to improve the accuracy, resolution, and ultrafast speeds of x-ray detectors to enable complex measurements.
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Electrodeless Z-Pinch™Soft X-Ray (SXR) Source
EQ-10SXR
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Is a compact, easy-to-use, reliable and cost-effective SXR light source system, based on Energetiq’s unique Electrodeless Z-pinch™ technology using Nitrogen gas.
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Miniature Spectrometers
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Ultra compact fiber-coupled instruments for portable applications in the 180 - 1700 nm range.
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X-ray Non-Destructive Testing (NDT) System
DynamIx HR / Series 5
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High precision 12-bit 50µm reading allows inspection of minute image details. Wide dynamic range resulting in wide allowance of X-ray exposure value.
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X-Ray Beam Monitors
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When standard products just aren’t good enough—or the measurement technology does not yet exist—Sydor Technologies develops technology to enable these complex imaging measurements. Just as we’ve developed next-generation streak cameras and x-ray detectors to meet novel, emerging requirements in national laboratories, we’re doing the same with x-ray beam monitors.
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Environmental Water Research Optical Spectrometer for Colored Dissolved Organic Matter (CDOM)
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Not just a scanning fluorometer for EEMs, but a much faster and better A-TEEM spectrometer for colored dissolved organic matter (CDOM)The HORIBA Aqualog is a unique optical spectrometer that is the gold standard in environmental water research around the world for the study of color dissolved organic matter (CDOM).
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Product
TAPPIR Femtosecond Transient Absorption Pump-Probe Infrared Spectrometer
TAPPIR
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A femtosecond difference frequency generator (DFG) is installed inside the TAPPIR optical unit for the tunable probe of transient absorption within 3 mm - 11 mm. DFG is pumped with signal and idler waves delivered together from an external optical parametric amplifier.
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Handheld Raman Spectrometer
NanoRam® – BWT-840000341
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The NanoRam is a state-of-the-art handheld Raman instrument for nondestructive identification and verification of materials such as APIs, excipients, intermediates, & finished products. Compact and agile, the NanoRam can be used by non-technical users to rapidly identify samples in the lab, warehouse, loading dock or field, helping to eliminate quarantine areas and expedite materials through the manufacturing lifecycle. Utilizing Raman technology, non-contact analysis can be performed through transparent containers, all while maintaining the volume and integrity of the sample.
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3D X-ray hybrid inspection system
YSi-X
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Ideal for 100% inspection of onboard automotive products and many other items by 3D X-rays acquire layered of target. X-ray, optical, infrared, and laser height measurement as standard equipment; hybrid and high reliability with multiple inspection modes.
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Product
X-Ray Inspection
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X-ray inspection systems are used wherever defects need to be detected by non-destructive means. The spectrum of use is broad and ranges from quality controls for complex assemblies, to the testing of materials for cracks and air inclusions, to foreign matter inclusions and shape deviations. The trend toward miniaturization, higher packing densities, and the relocation of components to the interior of the assembly require precise X-ray inspections that detect hidden defects quickly and reliably. X-ray systems from Viscom are used for the inspection of series assemblies as well as sampling and prototype controls. They take care of typical inspection tasks in concealed areas such as void controls, THT filling level measurements, and HIP inspections. At the same time, the systems reliably determine defect features such as coplanarity and polarity – at high inspection speeds and in a cost-effective way.
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High Performance Raman Spectrometer
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Combining volume phase holographic (VPH) grating, wavelength optimized optics and deep-cooled CCD camera, Zolix is proud to present stateof-the-art Omni-iSpecT Raman spectrograph. It solves two essential problems concerned with Raman spectroscopy, speed and sensitivity. VPH spectrograph allows you to have faster acquisition and better S/N ratio, it is ideal for low light Raman applications such as remote detection, ultra fast Raman mapping etc, its lens-based design delivers minimum distortion at focal plane and ensures best image quality, which gives you high resolution and large spectral range simultaneously, also perfect image quality is ideal for multi-channel applications without cross-talking. The Omni-iSpecT's rugged and compact design make an ideal module for in-the-field and industrial applications; It is still suitable for academic research with research-grade performance; The Omni-iSpecT also provides the SDK file for secondary development.
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X-ray Fluorescence Spectroscopy (XRF) Services
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Work we''ve done: Coating identification, Measuring lead levels in paint and solder, Elemental comparison of two metal ingots, Restriction of Hazardous Substance (RoHS) testing.
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NIRLine Spectrometers
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Instruments in our AvaSpec NIRLine are high-performance, near-infrared spectrometers that are optimized for the demands of measuring long wavelengths. This line provides leading-edge performance for dispersive NIR instruments with a toroidal focusing mirror and dynamic dark correction for enhanced stability.
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FTIR Spectrometers
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FTIR spectroscopy is used to quickly and definitively identify compounds such as compounded plastics, blends, fillers, paints, rubbers, coatings, resins, and adhesives. It can be applied across all phases of the product lifecycle including design, manufacture, and failure analysis.
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Product
Scanning Mobility Particle Sizer Spectrometer
3938
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TSI''s newest Scanning Mobility Particle Sizer SMPS™ spectrometer is widely used as the standard for measuring airborne particle size distributions. This system is also routinely used to make accurate nanoparticle size measurements of particles suspended in liquids. The National Institute of Standards and Technology (NIST) uses a TSI DMA to size 60 nm and 100 nm standard size reference materials.
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Product
Ultra-Broadband Spectrometer
SPECTRE
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It is an innovative spectrometer, capable of measuring ultra-broadband spectra, from the VIS to the MID-IR spectral region. It is based on a novel technology that combines fast acquisition times and high spectral resolution with extremely broad spectral coverage.
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Product
NMR and MRI Spectrometer Consoles
Kea
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Significantly improves performance and extends the frequency range of our signature NMR spectrometer line.
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Raman Spectrometer
Spec 64
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The fiber coupled high speed Raman spectrometer is optimized for maximum light throughput and high speed spectrum acquisition. Connected to an AFM or a scanning stage, high speed Raman imaging is possible due to an integration time down to 10 ms per spectrum. The spectrometer can be operated with a separate software as stand-alone device or synchronized via the Anfatec AFM software.
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XRF Spectrometers
Epsilon Range
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The Epsilon range of X-ray fluorescence XRF analyzers are an ideal analytical solution. They are capable of simple element identification and quantification up to more sophisticated analysis. They are easy to operate, compact and X-ray safe instruments without the need for additional chemicals or operating gasses. Considerable savings in time and cost are two of the many benefits XRF can bring compared to alternative analytical techniques.
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Portable Mass Spectrometers
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BaySpec’s portable and compact mass spectrometers bring the laboratory to the samples for answers in real-time. Designed for in-field use, BaySpec’s Portability™ and Continuity™ portable mass spectrometers require minimal maintenance, no consumables or sample preparation, and can be fully operated by those with no scientific background or instrumentation experience. Compatible with almost any atmospheric real-time ionization sources, BaySpec’s Portability™ and Continuity™ mass spectrometers can acquire measurement acquisitions of vapors, liquids, and solid samples to fulfill nearly every application need.
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Small-Angle X-Ray Scattering (SAXS) Products
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Small-Angle X-Ray Scattering (SAXS) Products from Rigaku
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X-ray Diffraction and Elemental Analysis
D8 ADVANCE
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The intelligent beam path components of the D8 ADVANCE with DAVINCI design provide true plug'n play functionality requiring minimum or even no user intervention. Featuring automatic and tool-free switching of the diffraction geometry without the need for complex adjustments, the D8 ADVANCE with DAVINCI design broadens the analytical capabilities for a wide community of X-ray diffraction users.
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CAS-200 Compact Array Spectrometer
CAS-200
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Hangzhou Everfine Photo-E-Info Co., LTD
CAS-200 can quickly and accurately measure the spectral power distribution in the range of 380nm ~ 780nm, mainly measuring: the relative spectral power distribution, chromaticity coordinate, color temperature, color rendering index, color tolerance, peak wavelength, FWHM, luminous flux (with integrating sphere) of traditional lamps/light sources, single LED, LED modules and other electric light sources.
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Multispectra, Multifiber, Multichannel Imaging spectrometer with 8-16-32 Simultaneous UV-NIR Spectra
PoliSpectra® M116 MultiTrack Spectrometer
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HORIBA designs and manufactures a large range of custom OEM fiber-coupled, multi-spectra spectrometers capable of simultaneous measurement of up to 32 fiber channels and sequential measurement up to 96. Utilizing a concentric imaging spectrometer with a broadband spectral range and a customized fiber bundle, the HORIBA OEM multifiber spectrometers provide excellent imaging quality with minimum crosstalk.
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Microscope Photoluminescence Spectrometer
Flex One
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Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
