Solar
energy of the sun's rays.
-
product
High Current Sensor
HCS-BTA
Vernier Software & Technology, LLC
Use the High Current Sensor in experiments that involve currents larger than 1 A, such as solar panels, hand generators, and other alternative energy projects.
-
product
PCIe Board
Solar Express 125 (SE125)
Sundance Multiprocessor Technology Ltd.
SE125 is a low profile, 8 lanes PCIe card powered by the Xilinx Zynq Utrascale+ MPSOC (XCZU7EV-2FFVC1156E / XCZU7EG/ XCZU11EG / XCZU7CG ). When XZU7EV is populated, it is capable of video decoding/encoding, up to 8K resolution, targeting Data Center video streaming applications and with 11EG it can be a network accelerator card.
-
product
Monitoring Solar Panel Strings, DC 30A, Φ10mm
CTF-30-10DC
MULTI MEASURING INSTRUMENTS Co., Ltd.
・Compact, Space-saving, Low Cost DC Current Sensors.・Split-core type, easy to apply to existing circuit.・Easy to use by unipolar +5V power supply.・High speed responsibility – less than 10μsec. 0 rated primary current.・Suitable for monitoring solar panel strings.
-
product
All-in-One Meteo Compact Station
HDMCS-200
A ready to use and easy to set up Automatic Weather Station. The AWS measures wind speed, wind direction, humidity, dew point, temperature, barometric pressure and solar radiation.
-
product
Wafer Sorter and Inspection
SolarWIS Platform
Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
-
product
Corona Effect Camera
CoroCAM 6D
The CoroCAM 6D corona effect camera is a robust, lightweight and easy to operate camera with an ultraviolet imaging system. It stands out for its innovative design and improved sensitivity, which allows for higher quality inspections. Sensitivity has been improved thanks to the blind solar filter packages and the low noise, high sensitivity detector.
-
product
Non-Contact Mapping Life Time System
MWR-2S-3
The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
-
product
Ellipsometer
T-Solar™
The T-Solar ellipsometer combines the best photovoltaic measurement technology into a single system designed specifically for textured samples. Based on the establishedM-2000 rotating compensator spectroscopic ellipsometer, the T-Solar measures hundreds of wavelength across the UV-Visible-NIR.
-
product
Solar Simulator Continuous Light
This type of solar simulator uses Xenon high pressure arc lamps as light source. These lamps have a colour temperature near 5800 K, so it is feasible to filter the light output to an excellent AM 1.5 spectrum. If a tuneability of the spectrum is required, these lamps can be combined with tungsten lamps to achieve multi-source solar simulators. These can be used to measure tandem/triple/multijunction solar cells. They also allow detailed analysis of all types of solar cells using a spectral metric (see : Publication List).
-
product
Semiconductor Large Range Type Tester
HS-PSTT
HS-PSTT large Range Type Tester is a high-grade semiconductor material Type testing equipment,has the feature that testing large range,special suitable for testing the high-Resistivity Silicon Material(contains Silicon Core, phosphorus stick, Boron stick and so on),the resistivity require range is 0.0001~19999Ω·cm, Covers all measurement requirements of various silicon material type testing at the semiconductor and solar energy level at present .









