EV Test Systems
See Also: Electric Vehicle Test Systems, EV Testers
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Emissions Test System
PC-114
Perform Radiated & Conducted EMI pre-compliance testing at your facility up to 1 GHz. Com-Power PC-114 EMI emissions test system is a ideal solution performing pre-compliance EMC testing from 9 kHz - 1 GHz.. It has essential equipment needed for radiated and conducted EMI emissions measurements. The system includes a spectrum analyzer, antennas, near field probes, a preamplifier, LISN and a non conductive antenna tripod. Pre-compliance testing in EMC is a commonly used term not easy to define. In general, it implies testing done prior to formal testing for legal compliance. Formal legal compliance is performed at a facility designed and equipped with test instrumentation that is fully compliant with the applicable EMC standards. Such facility and instrumentation is capital intensive and can be expensive even to rent and not easily available. Compliance testing is performed per exacting requirements of the Standards and other reference documents adhering to the test methods and last detail. In addition, the test facility may require to be accredited by an accreditation body such as NVLAP, A2LA. Often it is desirable to know prior to compliance testing at such facility, whether a product is close to compliance and also how close. Pre-compliance testing is specially useful for specifications such as FCC, Part 15, EN 55022 or EN 55011 (CISPR 22 or CISPR11). Pre-compliance testing usually means using the full compliance methods but making a few educated compromises in use of site or equipment to reduce costs and testing time. Here are some benefits of pre-compliance testing.
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Protective Relay Test System
MTS-5100
The MTS-5100 is the only all-in-one relay test set with a direct front panel interface for all functions, without exception!
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Tire and Wheel Testing Systems
Advanced Telemetrics International
Tire and Wheel Testing Systems can be custom designed and manufactured for practically any application. The inductively powered system is used to wirelessly measure tire pressure and temperature during testing.
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EMC Test Systems
The sum of EMC is not necessarily equal to its parts; any modular electronic device from a complete aircraft down to a mobile phone needs to meet EMC requirements for the device itself, even if all the individual modules are compliant. For the enormous range of types of modular device requiring EMC test, R&S offers extremely flexible and scalable EMC test systems; practically as modular as the devices under test.
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Automated Gage Measurement System
AGMS
Our Automated Gage Measurement System for Sand Screen (AGMS) provides accurate and repeatable optical measurements for all wire-wrapped gaps along the full screenlength. This inspection machine enables oil field sand screen manufacturers to meet the measurement requirements of API Spec 19S1 and ISO 17824:2009.
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Imaging Gauge Software Test System
The IMAGING GAUGETM quality analysis system was developed by APPLIED IMAGE to address the growing need to standardize the evaluation of camera image quality. The system includes a Test Chart manufactured using our ACCUedge® technology, along with unique Image Analysis Software, used together to analyze the quality of the imaging system, and then provide a summary report on the various image quality metrics. Our goal is to provide a simple to use, unique image analysis system, that can be utilized by R&D, scientists, system integrators, technicians and field operators to evaluate the camera quality or imaging system.
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Conducted Immunity Test System
Conducted RF immunity tests acc. to IEC/EN61000-4-6 and BCI tests acc. to ISO 11452-4 and MIL-STD 461 CS 114 Signal generator,RF-power amplifier, RF-power meter and directional coupler (optional) in one 19”-caseStand-alone operation possible with optional available netbookControl-software includedMost important parameters are shown on an integrated displayAutomatic EUT-monitoringOperation via USB port of a PC or NotebookComplete range of CDNs available
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Supported Test Systems
TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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Automatic Transformer Test System
TH2840NX
Changzhou Tonghui Electronic Co., Ltd.
■ The test speed is as high as 1000 times/s (>10kHz), without relay action time ■ Test level up to 20Vrms ■ The bias voltage is built-in ±40V/±100mA/2A ■ Up to 288 test pins (only TH2840NX) ■ Industry-friendly user experience: Linux bottom layer, built-in help file
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6TL19 Off-Line Base Test Platform
H71001900
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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Portable Ruggedized Test System
BADGER
Badger systems utilize NI's CompactRIO (cRIO), Single Board RIO (sbRIO), and/or CompactDAQ (cDAQ) hardware. The Badger product line offers high speed data acquisition/control and flexibility in an industrial package. Badger chassis and instrumentation have a 50 g shock ratings and a wide -40 to 70 °C operating temperature. These systems are ideal for automotive, industrial automation, remote monitoring, field service, and advanced control applications.
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GPP-95-2 Test System Interface Probe
GPP-95-2
Overall Length (mil): 375Overall Length (mm): 9.53Rec. Mounting Hole Size (mil): 85Rec. Mounting Hole Size (mm): 2.15Recommended Drill Size: #44 or 2.15 mm
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SIP-90-4 Test System Interface Probe
SIP-90-4
Overall Length (mil): 693Overall Length (mm): 17.60Rec. Mounting Hole Size (mil): 57Rec. Mounting Hole Size (mm): 1.45Recommended Drill Size: 1,45 mm
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Measurement System For Testing & Binning Of Back-End LEDs
TP121-TH
The photometric specifications of LEDs must meet very high tolerance requirements regardless of whether they are to be used in general, automotive or other specialist lighting applications. This is often a problem since the manufacturing tolerances of LEDs can be higher than those permitted in the end-use applications. Also, LED binning by LED manufacturers in order to classify LEDs based on their tolerances is performed with flash mode testing using pulsed current flow. However, end-use applications of the LEDs often operate in constant current mode and with significant thermal effects. The sophisticated LED processing industry therefore requires measurement devices that can be used for both manufacturer-compliant pulsed mode, as well as constant current operation mode. When the LEDs are run in constant current mode, the junction temperature has significant influence on the performance and lifetime of the LED. Therefore, test systems should be able to test the LEDs at specific junction temperatures.
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Milliampere-Level Test System
Shenzhen Sinexcel RE Equipment CO., Ltd
mA class battery test system, mainly used for battery material research, high-precision test, pulse charge and discharge test, DCIR test, cycle Life test. It provides powerful testing equipment for research institutions, universities and experimental centers of battery production enterprises
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Compliance Test Systems
LMG Test Suite
ZES ZIMMER Electronic Systems GmbH
The ZES ZIMMER test system LMG Test Suite tests in accordance with the currently valid version of EN 61000-3-2/-12 or EN 61000-3-3/-11 and also supports measurements per ECE R-10.4 Annex 11 (e.g. electromagnetic compatibility of vehicles). As a manufacturer of precision power measurement technology, we are represented on the international standards committee. As a result, changes in standards are immediately incorporated into our test systems.
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VLF test system
BAUR PHG 80 portable
BAUR Prüf- und Messtechnik GmbH
Portable, high performance test generator with VLF truesinus technology. The BAUR PHG 70/80 portable VLF test systems are used for cable and cable sheath testing of medium-voltage cables of up to 50 kV and electrical equipment.* 3 voltage shapes in one device: VLF truesinus, VLF square wave and DC voltage* For medium-voltage cables of up to 50 kV operating voltage* Cable testing, fault conditioning, cable sheath testing
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Operating Software for elowerk Test Systems
TestBuilder
elowerk TestBuilder is the operating software for elowerk test systems. TestBuilder is based on the Microsoft .Net Framework and runs on Windows Vista and Windows XP. Test programs can be created by CAD data import. The comfortable graphical user interface allows a straightforward editing of test programs. Customized applications can be programmed using a programming interface.
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Test System Robotics
With the ever increasing need to provide a fast return on investment of your test solution investment, robot's are becoming more widely accepted as a means of reducing your testing costs. Not only can they be programmed for fast product test, they don't have the normal issues associated with human capital.
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Test, Automation, And System Integration
vast array of experiences in system integration, mechanical engineering, software development and turnkey test and automation solutions provide our customers with a confidence they can only find with Orbis Labs.ORBIS Labs is ISO 9001:2008 certified, is a National Instruments Alliance Partner, and has many certified LabVIEW programmers on staff.
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Ultra-Wideband (UWB) Test System
IQgig-UWB
The IQgig-UWB is ideal for both R&D characterization, high-volume production, and certification. Making it the perfect platform to enable a cost-effective, seamless transition from the lab to the manufacturing floor.
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MB-OFDM Protocol Test System
WiMedia Explorer 300
The WiMedia Explorer 300 is the world's first over-the-air MB-OFDM protocol test system for WiMedia Alliance's Ultrawideband common radio platform, Wireless USB protocol and Bluetooth.
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Electronic Transformer Test System
UI2000-ET
• Input characteristics analysis 1) Measure Vrms (10-300V) Lrms (0.04-4A) W, PF, Hz, total harmonic and 0-50 component of harmonic 2) Accuracy: ± (0.4%reading + 0.1%range + 1digit) • Output characteristics analysis 1) Measure lamp voltage (1-60V) lamp current (03-20A) lamp power, crest factor and oscillatory frequency 2) Accuracy: Class 2 • It can print without compute, and provide the communication port for PC
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Radiated Immunity Test System
Beijing KeHuan Century EMC Technology Co,.LTD
Radiation Immunity Test System.
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Fiber Optic Test System
OPTOWERE-S100 (Fiber Optic Test System)
The frame of FOTS system consists of the Main control part and the Slot mounting part. The Main control part is in charge of control and interface of the system and the Slot mounting part can hold up to maximum 8 slots, which are modularized according to each function and come out in five kinds. This integrated test system is designed to help manage the test and measurement related to optical communication and component. And the modular architecture of FOTS allows for customized configuration so that the slot of LD Driver, 2 channel VOA, 1 X 4 switch, WDM EDFA and C + L – Band ASE Source can be chosen according to user’s necessities. Main control part and each function module are run by effective and multi-functioned system control program in the base of high speed remote interface, GUI display and the discriminative high speed driving of module and system. This system can provide variety manufacturing and laboratory applications such as general quality test and reliability test of optical component and optical signal transmission test through efficient linkage with other system.
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Wireless Connectivity and IoT Test System
IQxel-M4W
Suitable for the lab or manufacturing environment, the IQxel-M4W 6G is ideal for RF testing of wireless connectivity and IoT products. The platform’s flexible software supports the most prevalent wireless connectivity standards: WLAN 802.11ax (Wi-Fi 6) and legacy (802.11a/b/g/n/ac), Bluetooth® Classic and Low Energy (Bluetooth® LE) as well as Zigbee/Thread, Z-Wave, LPWAN technologies (Sigfox, LoRa) and cellular IoT technologies (NB-IoT, LTE-M, 5G) as well as navigational technologies.
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Vibration Test Systems
L.A.B.’s Vibration Test Systems help you design high quality, cost-effective products and shipping containers by accurately measuring sensitivity to vibration.
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Test Automation Platform Developer's System
KS8400A
The Keysight KS8400A Test Automation Platform (TAP) Developer's System provides powerful, flexible and extensible test sequence and test plan creation with additional capabilities that optimize your test software development and overall performance. Keysight TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher-level test executive software environments. Leveraging C# and the power of Microsoft Visual Studio, TAP is not just another programming language. It's a platform upon which you can build your test solutions, maximizing your team's productivity by using your existing software development tools and infrastructure.
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Mixed signal LSI test system
Multi-pin type model is now launched in WL27 Logic/Power mixed LSI test system.This system is suitable for multi-site test in A/D mixed device such as automotive・motor driver IC. It’s a high throughput and cost performance mixed signal LSI test system.
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Circuit Breaker Endurance Test System
Endurance testing involves operating – closing and opening – the circuit breaker repeatedly for a set number of cycles. This test is necessary to stabilize the circuit breaker mechanism and to identify “Early Infant Mortality” failures in the switchgear assembly.
