EV Test Systems
See Also: Electric Vehicle Test Systems, EV Testers
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Vibration Test System
3-axis
This small 3-axis vibration test system has been developed in response to many customers' request for ?gcompact and easy to handle & use h multi-axis VTSs without sacrificing performances, featured by its small installation area of W900mm by D850mm, relatively quiet due to employment of small fans insterad of bolower(s), a displacement of 25mmp-p for each axis and max. transient acceleration of over 98m/s2<10G>*,
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Three-phase Fully Automatic Test System
TS41
Calmet Smart Calibration Devices
The Calmet TS41 test system consists of a three-phase reference meter of accuracy class 0.02% (or 0.04%) and an integrated three-phase current and voltage source up to 3x120A/600V. It makes possible automatic testing of electricity meters in meter test stations
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Mission Management Systems
Installed on a variety of platforms, the HeliC3om™, Advanced C4I and Mission Management System, is combat proven and developed by active pilots whose first-hand combat experience is incorporated into all facets of the system. Our technology keeps all elements updated in real time with inputs from networked C4I sources. Pilots and crew easily receive and transmit video and data to/from all forces while updating maneuver, air, and naval units.
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Low Voltage Burn-in and Test System
Max 450
For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in
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Acoustic Testing
Our acoustic testing experience includes acoustic qualification and evaluating sound pressure levels. We utilize microphones, pressure trans-ducers, and an acoustic intensity meter to record acoustic measurements.
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Industrial UPS Systems
Our static uninterruptible power supply systems (UPS systems) correspond to the VFI-SS-11 classification according to IEC 62040-3.
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Automated Testing System
PV-LIT
Thermographic solutions ensure high quality of solar cells and modules.Usable for all types of solar cells and modules (silicon-based or thin-layered)Testing in laboratory and in-line in the course of the manufacturing processTesting of various solar cells and modules through contact and non-contact measurementCell-specific system configuration and determination of test criteria and kind of defects
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Data Acquisition Systems
Encore Electronics manufactures a wide range of analog signal conditioning equipment, including strain gage and pressure amplifiers, frequency-to-voltage converters, thermocouple isolation amplifiers and anti-aliasing filters.
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FPGA Test System
DO-254/CTS
DO-254/CTS™ is a fully customized hardware and software platform that augments target board testing to increase verification coverage by test and satisfy the verification objectives of DO-254/ED-80. The target design runs at-speed in the target device mounted on the custom daughter board. The simulation testbench is used as test vectors to enable requirements-based testing with 100% FPGA pin-level controllability and visibility necessary to implement normal range and abnormal range tests. The FPGA testing results are captured at-speed and displayed using a simulator waveform viewer for advanced analysis and documentation.
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Probe Systems
These flexible probe stations are designed for the ever-changing test configurations required in a engineering lab. Combined with durable probes or your own high-speed probes, PacketMicro probe stations are the most cost-effective probing solutions in the industry.
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Tool Support Systems
New AIMCO FRLs--the supply of clean, dry air is essential to the operation of pneumatic tools. Ensure longer life with proper maintenance for your valuable tools. Ask about our extended warranty on Uryu tools.
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Universal Test System
LS6601A
LS6601A Universal Test System is based on LXI bus, primarily used for functional electronic product or system verification, test parameters. Because the system design is based on LXI bus structure, so its addition to general characteristics of versatility, scalability, but the architecture of the system more flexible, the test system is not limited to one or more cabinets, but may be needed test network and multiple LS6601A and can be easily grouped into one or more of the ground test system, depending on the test mechanism, form a powerful set of test, control, simulation, simulation, data management as one; distributed in different places .
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In Vivo Systems
To achieve low minimum detectable activities with count times as fast as one minute.
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Current-Voltage Measurement System
Sciencetech''s IV Testers are electrical current-voltage measurement systems used to characterize photovoltaic cell performance. This current-voltage tester works by sampling various current versus voltage combinations of the photovoltaic cell with a variable impedence load.This IV Test system can measure electrical power from photovoltaic cells up to 20W. The voltage envelope is limited to 20V and the current to 1A. A higher power version, up to 60W, is available. In general, the limitation on this model is the 1A current limit: if your solar cell generates more than 1A, we recommend upgrading to the 60W version.
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PLD Systems
Pulsed Laser Deposition
Is a versatile thin film deposition technique. A pulsed laser (~20 ns pulse width) rapidly evaporates a target material forming a thin film that retains target composition. This unique ability of stoichiometeric transfer of target composition into the film was realized first by the research team led by Dr. Venkatesan at Bell Communications Research, NJ, USA, nearly 30 years ago while depositing high temperature superconducting (YBa2Cu3O7) thin films. Since then, PLD has become the preferred deposition technique where ever thin films of complex material compositions are considered. Another unique feature of PLD is its ability for rapid prototyping of materials. The energy source (pulsed laser) being outside the deposition chamber, facilitates a large dynamic range of operating pressures (10-10 Torr to 500 Torr) during material synthesis. By controlling the deposition pressure and substrate temperature and using relatively small target sizes, a variety of atomically controlled nano-structures and interfaces can be prepared with unique functionalities.
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In-Line RF Test Platform
AR925
This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
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HIRF Testing
High Intensity Radiated Fields (HIRF) testing simulates high RF peak pulsed and average fields typical of radar environments and is integral to the certification of flight essential avionics systems. L3 Cincinnati Electronics (L3 CE) can perform HIRF testing from 400 MHz to 18 GHz (with traditional average field testing from 10 kHz to 40 GHz).
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EMC Testing
Underwriters Laboratories Inc.
Leverage our EMC expertise to avoid costly errors and accelerate time to market. Our customized testing solutions can enhance process efficiency and reduce testing cycles to help you make the most of your time and budget.
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Microwave Testing
67A
A coplanar probe with patented flexible tips, the MODEL 67A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 67A achieves an insertion loss of less than 1.1 db and a return loss of greater than 14 db through 67 GHz.
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Test Universe
Test Universe is OMICRON's comprehensive and easy-to-use testing software for the CMC device family. It allows you to combine a wealth of application-optimized test modules for creating flexible and fully automated test plans that provide you with an enormous range of functions.
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HardFiber System
IEC 61850
The HardFiber System is a KEMA tested IEC 61850 Process Bus Solution that allows the mapping of measurements made in the switchyard to protection relays located in the control house using secure communications. The HardFiber System addresses the key technical and logistic challenges affecting the labor required for substation design, construction and maintenance.
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Test System Mainframe
ITC59000
The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
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UV Penetration & Protection Test System
TF131
TESTEX Testing Equipment Systems Ltd.
UV Penetration & Protection Test System. Fabric Samples are measured in a double beam spectrophotometer with an integrated sphere. The sample is scanned over the UVA and UVB regions of the spectrum and transmitted radiation is efficiently collected by the detector within the integrating sphere. The software calculates UV penetration factors and sun protection factors from the scan data. It runs on a PC under Microsoft Windows and controls the spectrophotometer, automates the measurement process and generates a printed report. PC and printer are not included.
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SRS-200A Spectral Radiation Safety Test System
Hangzhou Everfine Photo-E-Info Co., LTD
SRS-200A is a new generation of portable photo-biological safety test and evaluation equipment. Based on the mainfunctions of the laboratory spectral radiation safety test system, the convenience and operability of test are fully considered.To some extent, the analyzer makes up for on site measurement insufficiency.
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Automated Measurement System
EVG®40NT
The EVG40 NT (stand-alone tool) and the AVM (HVM-integrated module) enable measurement of lithography relevant parameters like critical dimension, as well as bond alignment accuracy.Because of the high-measurement accuracy, it is possible to verify compliance to tight process specifications and instantly optimize integrated process parameters.
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Mobile Test Systems
The systems include A+A+A+ LED solar simulators, high-resolution electroluminescence testers and various other tests that you can easily integrate into your transport of choice or directly into a container on site.
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Comprehensive GCxGC System
Shimadzu’s Comprehensive GC-MS (GCxGC-MS) System is suited for a variety of applications, including analysis of complex matrices such as a natural products that are hard analyze by conventional GC or GC-MS, and grouping analysis based on two-dimensional chromatograph patterns.
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Resistivity Test System
RMS-1000
Accurate and powerful performance. - Possible to get much accurate resistivity value by taking 8 raw data. - Good to check ohmic contact by flowing forward and reverse current.2. We provide various sample mounting board and probe head and tips.3. We have an optional item which can measure in variable temperature. - Room Temperature ~ 300dC.
