Filter Results By:
Products
Applications
Manufacturers
- Virginia Panel Corporation
product
Tool, Extraction, 50 Ohm Coax & Power Surface
910112112
Tool, Extraction, 50 Ohm Coax & Power Surface
-
product
XPS/ESCA Service
X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
-
product
Ocean Observer III
Teledyne Marine RD Instruments
Since 1997 Teledyne RD Instruments has been providing ADCPs that have proven in the field they can profile beyond 1000 m from research vessels traveling at speeds >15 knots and from offshore oil and gas platforms during exploration work. That same technology has now allowed us to create the Ocean Observer III 38 kHz ADCP. We have combined our field-proven 38 kHz phased array ADCP transducer with our field-proven electronics into a single package that is capable of profiling >1000m. This design makes it ideal to be mounted from an oil platform, over the side of a vessel, and in surface buoys.
-
product
3D Optical Surface Profiler
NewView™ 9000
The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped, and stepped. All measurements are nondestructive, fast, and require no sample preparation.
-
product
Process RF Analyzer
IMPS-4400
The Sensortech Instant Moisture Profiling System (IMPS-4400) is a non-contact RF moisture profiling system for board manufacturers to improve and optimize production processes and meet quality standards, reduce energy costs, increase productivity, and generate revenue. The IMPS-4400 utilizes radio frequency antennas to analyze board moisture characteristics below the surface, which is critical information to ensure consistent quality of finished boards.
-
product
Rapid Profiling
MIDAS SVP
Suitable for rapid profiling down to 6000m depth, the MIDAS SVP gives the most accurate Sound Velocity Profiles currently possible.
-
product
Plasma Profiling TOFMS
PP-TOFMS
Plasma Profiling TOFMS addresses the needs of materials scientists across a wide range of application areas. PP-TOFMS provides fast elemental depth distribution of any inorganic material. The speed and ease of use of PP-TOFMS permit to reduce optimization time of growth processes as many research scientists strive to reduce the time from discovery to applications of new materials.The simultaneous full coverage of TOFMS available for each point of depth permits the detection of non suspected contamination. This is key for failure analysis and optimization of thin film processes that tend to no longer be based on ultra-high grade methods (i.e. ink jet printing…).
-
product
Multi-Functional Optical Profiling system
7505-01
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
-
product
Entry Level Beam Profiling
BeamMic®
BeamMic is simplified set of measurement tools for the entry level beam analysis user. The camera-based beam profiling system consists of a camera and analysis software. Often times, this system will need to be used with beam attenuation or beam sizing accessories, depending on your laser application. BeamMic includes a complete set of high-accuracy measurements, and features a rich graphical interface. For the laser technician, this entry-level software will easily help you quickly become familiar with the many benefits of beam profiling.
-
product
Backplane Profiling & Inspection System
603d
A major problem in the backplane industry is detecting bent connector pin defects. The most difficult being when the pin bends underneath the shroud rather than going into the hole. Many times this defect cannot be detected electrically as the connector pin is touching the conductive annular ring of the hole, allowing electrical test to pass. Unfortunately, it is an intermittent connection and will fail later on as there is not an actual mechanical connection.
-
product
Surface Profile
Surface profile: The degree of profile on the surface affects a coating’s overall performance and determines aspects such as adhesion, coverage and overall volume of coatings used. If the profile is too large the amount of coating required increases, otherwise there is a danger that the peaks remain uncoated - allowing rust spots to occur. If the profile is too small there may be an insufficient key for adequate adhesion.
-
product
Profiling Current Meter and Wave
SeaGuardII DCP Wave
The SeaGuardII DCP Wave is a 600kHz Doppler Current Profiler able to measure directional wave parameters and currents from a bottom mounted installation.The Acoustic Wave software 5759 used by the DCPS implements unique features to improve the wave measurement accuracy by optimizing the signal to noise ratio.Maximum deployment depth is 40m in normal scatter conditions. The Profiling Current Meter and Waveis available as a self-recording instrument. It can be easily integrated into a real-time system offering reliable two-way communication.
-
product
Surface Analysis
Dimension AFP
The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
-
product
Beam Profiling
The beam propagation factor M2 is a common single parameter that charac-terizes the whole beam as it propagates through space. According to ISO standard 11146, this parameter could be defined by several measurement techniques based on beam profiling along several points of the propagating beam. The standard defines several measurement techniques, all of which are based on beam profiling measurements using devices such as cam-eras, knife edge and slits. There are two main measurement requierments - 1) Measurements of focused beams. 2) Measurements of collimated beams. Our M2 devices are capable of measurements of both laser types and due to their modular design interchangeable heads can be mounted in same M2 gear.
-
product
Surface Analysis
Innova-IRIS
This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
-
product
Surface Profilers
Taylor Hobson offers a world leading range surface form, surface finish and metrology solutions for 3D contour,ideal for the most demanding applications.
-
product
Thermal Profiling System
lt is impossible to have dependable production without quality management. The expectation is growing and customers requirements must be addressed. In most of the industries, proper monitoring of temperature with time plays an important role in the quality of products. Whether it can be painted/powder coating industries, oven manufactures, automobile industries, and many more.
-
product
CTDs: Profiling
Profiling CTDs make continuous measurements as they travel through water. When lowered over the side of a ship or integrated with an autonomous vehicle, they map a vertical column of water's characteristics. Compared to moored CTDs, profiling CTDs account for dynamic errors introduced by moving through water and sample rapidly to generate a high-resolution dataset over a short period of time. Sea-Bird Scientific profiling CTDs are:*Designed to perform under unique dynamic conditions found on moving platforms.*Pumped and ducted for constant flow to match temperature and conductivity response.*Plumbed so measurements are made on the same sample of water with a predictable delay and predictable flow effects.*Built with a rugged design for shipboard and autonomous deployments.
-
product
Surface Analysis
Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
-
product
Profiling and Coverage Analyzer Tool
Analyzer
One of the most effective debugging techniques in embedded development and testing is tracing. Tracing means recording microcontroller activity, such as Program or Data flow.
-
product
Non-Destructive Subsurface Layer Profiling
NMR-Mouse one-sided NMR
The unique, powerful Profile NMR-MOUSE® probe works hand-in-hand with the Kea2 spectrometer. The Profile NMR-MOUSE is a portable, open NMR sensor equipped with a novel permanent magnet geometry that generates a flat sensitive volume parallel to the scanner surface. The system can measure *Proton density as a function of depth *T2 NMR relaxation times *T1 NMR relaxation times *Self-Diffusion coefficient of liquids
-
product
Profiling Software
In today's world of advanced, high quality, lead-free electronics, thermal profiling is central to successful solder process control. It can, however, be a bewildering task: many software packages are difficult to understand and use, and their output requires a degree of interpretation that assumes long experience in profiling.
-
product
*High-Power Beam Profiling
Beam analysis of high-powered industrial lasers have always proved to be difficult because of the power levels (affecting the power densities) that these lasers operate at. Yet, the measurement of these lasers are critical for their success because of thermal effects which are more of a factor at these higher powers. These high-power performance measurement products have proven to be solutions for laser users who operate and maintain these high-powered lasers
-
product
Cross-Correlator Pulse Profiling Systems
Rincon
The third order cross-correlator is ideal for looking at the full range of output from amplified femtosecond laser systems. High temporal resolution over a long (close to 1 ns) window shows pulse features that are usually missed, giving the user a detailed and complete picture of the quality and stability of the output pulse parameters of their femtosecond lasersystem.
-
product
Digital Surface Resistance Meter
NEW Enclosure with Rubber Grip EdgesThinner and narrower design is easier to hold and provides protection from drops.NEW Quick Check ButtonBypasses the 15 second electrification period to allow quick spot checks.NEW Battery Compartment
-
product
Surface Insulation Resistance Testing
AutoSIR2™
One AutoSIR chassis can hold between 1 to 16 measurement cards and can monitor up to 256 x 2-point test patterns or 78 x 5-point test patterns, or 32 x 9-point test patterns at selectable intervals from minutes to days. Each channel is current limited (1 M Ω), ensuring that dendrites are preserved for failure analysis. The frequent monitoring capability provides a full picture of the electrochemical reactions taking place on a circuit assembly, and provides early trend analysis enabling tests to be curtailed, thus saving considerable test time and money.
-
product
Multibeam Profiling Module
MB-2250
The BlueView 2250 multibeam profiling module, built for the Gavia AUV by Teledyne BlueView, is derived from the company’s proven 2250 kHz MBSeries sonar. Teledyne BlueView is recognized as the leading manufacturer of integrated Multibeam Profiling sonar systems for high resolution data collection.
-
product
Surface Roughness Gauges & Testers
Surface roughness gauges are used for measuring the surface roughness of a material. GAOTek’s surface roughness gauges are reliable, high quality, and affordable instruments that provide an accurate measurement. They are an efficient and quick means for inspection or testing. Our gauges are compact, easy to carry and portable, allowing the user to work in complex conditions, and are available for sale to the United States, Canada and globally.
-
product
K Thermocouple Surface Probe
TP777
Surface thermocouple Type "K" probe. °C max: 200. Response time: 3 s.
-
-
product
Surface Mount Switches
Dow-Key® Microwave offers PCB mounted, miniature electro-mechanical microwave switches. These switches are designed with an overall size of 0.75” x 0.75” x 0.58” and weight of 0.5 ounces for test and aerospace applications where small size, reduced weight, and less power consumption are critical.
