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- Pickering Interfaces Inc.
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Surface Mount Reed Relays from Pickering Electronics
Pickering Electronics Surface Mount Reed Relays contain the highest quality instrumentation grade reed switches making them suitable for the most demanding applications and are suitable for infra-red or vapor phase reflow soldering.
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Process RF Analyzer
IMPS-4400
The Sensortech Instant Moisture Profiling System (IMPS-4400) is a non-contact RF moisture profiling system for board manufacturers to improve and optimize production processes and meet quality standards, reduce energy costs, increase productivity, and generate revenue. The IMPS-4400 utilizes radio frequency antennas to analyze board moisture characteristics below the surface, which is critical information to ensure consistent quality of finished boards.
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Ocean Observer III
Teledyne Marine RD Instruments
Since 1997 Teledyne RD Instruments has been providing ADCPs that have proven in the field they can profile beyond 1000 m from research vessels traveling at speeds >15 knots and from offshore oil and gas platforms during exploration work. That same technology has now allowed us to create the Ocean Observer III 38 kHz ADCP. We have combined our field-proven 38 kHz phased array ADCP transducer with our field-proven electronics into a single package that is capable of profiling >1000m. This design makes it ideal to be mounted from an oil platform, over the side of a vessel, and in surface buoys.
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3D Optical Surface Profiler
NewView™ 9000
The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped, and stepped. All measurements are nondestructive, fast, and require no sample preparation.
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XPS/ESCA Service
X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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*High-Power Beam Profiling
Beam analysis of high-powered industrial lasers have always proved to be difficult because of the power levels (affecting the power densities) that these lasers operate at. Yet, the measurement of these lasers are critical for their success because of thermal effects which are more of a factor at these higher powers. These high-power performance measurement products have proven to be solutions for laser users who operate and maintain these high-powered lasers
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Plasma Profiling TOFMS
PP-TOFMS
Plasma Profiling TOFMS addresses the needs of materials scientists across a wide range of application areas. PP-TOFMS provides fast elemental depth distribution of any inorganic material. The speed and ease of use of PP-TOFMS permit to reduce optimization time of growth processes as many research scientists strive to reduce the time from discovery to applications of new materials.The simultaneous full coverage of TOFMS available for each point of depth permits the detection of non suspected contamination. This is key for failure analysis and optimization of thin film processes that tend to no longer be based on ultra-high grade methods (i.e. ink jet printing…).
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Multi-Functional Optical Profiling system
7505-01
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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Multibeam Profiling Software
MB-DataLogger
Teledyne BlueView's MB-DataLogger software provides a powerful tool for multibeam profiling applications. From mission setup to data playback, review, and export, MB-DataLogger gives users full end-to-end mission support. Set up data collection parameters (sonar head range, ping rate, filename identifiers, etc.) for a SmartCore-enabled system prior to deployment, then review bathymetric profiles in a 2D or 3D waterfall display with or without navigation correction post mission. When regions of interest are identified, export batches of data files to georeferenced point clouds to be imported by third-party applications. MB-DataLogger is the software Swiss army knife for your BlueView multibeam profiling system.
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Surface Analysis
Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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Surface Analysis
A UHV surface analysis system for thin film depth profilingMeasures the surface composition of the first few nanometers and/or micrometers depth of solid samples.
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Entry Level Beam Profiling
BeamMic®
BeamMic is simplified set of measurement tools for the entry level beam analysis user. The camera-based beam profiling system consists of a camera and analysis software. Often times, this system will need to be used with beam attenuation or beam sizing accessories, depending on your laser application. BeamMic includes a complete set of high-accuracy measurements, and features a rich graphical interface. For the laser technician, this entry-level software will easily help you quickly become familiar with the many benefits of beam profiling.
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Surface Roughness
Surface Roughness: these consist of a stylus attached to an arm which moves over the surface to record and measure the roughness over a specified distance, recording peak-to-valley average.
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Surface Profile
Surface profile: The degree of profile on the surface affects a coating’s overall performance and determines aspects such as adhesion, coverage and overall volume of coatings used. If the profile is too large the amount of coating required increases, otherwise there is a danger that the peaks remain uncoated - allowing rust spots to occur. If the profile is too small there may be an insufficient key for adequate adhesion.
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Wideband Pulse Profiling Sensors
LadyBug wideband Power Sensors feed power waveform samples into high speed A/D converters. The measured power is processed and then delivered as required by the user. These sensors are capable of delivering everything from basic power, to time domain scope-like profiles of the modulated waveform, such as the pulse shown at right. Multiple time gated measurements, crest factor, pulse power, and statistical measurements are all possible with these sensors.
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Non-Destructive Subsurface Layer Profiling
NMR-Mouse one-sided NMR
The unique, powerful Profile NMR-MOUSE® probe works hand-in-hand with the Kea2 spectrometer. The Profile NMR-MOUSE is a portable, open NMR sensor equipped with a novel permanent magnet geometry that generates a flat sensitive volume parallel to the scanner surface. The system can measure *Proton density as a function of depth *T2 NMR relaxation times *T1 NMR relaxation times *Self-Diffusion coefficient of liquids
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Surface Analysis
Innova-IRIS
This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Surface Resistivity Meter
395
The ACL 395 handheld meter features sophisticated circuitry that allows for the same advantages as megohmmeters, but at an economical price. Utilizing color-coded zones, the LED scale is easy to read and evaluate. Half decades indicate where the measurement value falls within the decade giving a closer indication to actual value. Unlike other pocket-sized meters, the ACL 395 features rubber rails which provide the best possible contact.
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Color Calibration & Profiling
For both amateurs and professionals photographers, filmmakers, designers, premedia and printing operators achieving predictable results from capture to output can be a challenge. Color Perfectionists turn to X-Rite for affordable, professional, quality calibrating and profiling solutions that make sure all of your devices monitors, projectors, cameras, scanners, printers and mobile devices are speaking the same language.
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Surface Profile Gauge
123
The Elcometer 123 Surface Profile Gauge is an easy to use analogue gauge which measures the peak-to-valley height of a blast cleaned surface in a similar way to the Elcometer 224 Digital Surface Profile Gauge.
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Profiling and Coverage Analyzer Tool
Analyzer
One of the most effective debugging techniques in embedded development and testing is tracing. Tracing means recording microcontroller activity, such as Program or Data flow.
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Surface Resistance Meter
Wolfgang Warmbier GmbH & Co. KG
Starterkit for testing conductive an dissipative surfaces and electrostatic fields/surface potentials
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Profiling Software
In today's world of advanced, high quality, lead-free electronics, thermal profiling is central to successful solder process control. It can, however, be a bewildering task: many software packages are difficult to understand and use, and their output requires a degree of interpretation that assumes long experience in profiling.
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Laser Surface Velocimeter
LSV-1000
The LSV-1000 represents Polytec?s new, compact velocimeter generation for non-contact length and speed measurement of continuous goods. The sensor provides length and velocity data fast, laser-precise and reliably for control and cut-to-length applications.
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Surface Mount Device Probe
11060A
Access and accurately measure surface mount devices using this probe with a gold-plated beryllium-copper tweezer
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Surface Resistance System Kit
PRS-801RM
- Perform Point-to-Point and Resistance to Ground Measurements from 0.01 Ω to 200 Teraohms- Accuracy of ±2% from 1.00 Ω to 9.99x1010Ω- Measures in accordance with ESD TR53, ANSI/ESD S4.1, ANSI/ESD S7.1, ANSI/ESD STM97.1 and others- Constant Test voltages 10V and 100V meeting ANSI/ESD S20.20- Operates using a Rechargeable Li-ion Battery Pack- Takes Approximately 8,000 Measurements on a Single Charge (480 hours typical)- Stores up to 999 Test Values Into Memory- Compatible with Prostat Connect 2.0 for Downloading into Excel®- Charging and Download via Standard Micro USB Cable- Includes 5lb Conductive Probes and Carrying Case- Certificate of Calibration Traceable to NIST included- 2-year Limited Warranty on Main Instrument
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Smart Profiling
The average thermal profiler on the market operates like the old chart recorder migrated onto a PC. It is a passive data acquisition unit that informs the user of the PCB profile. Smart profiling goes beyond that into the realm of data intelligence. Based on your input, the profiler tells you where you are, where you want to go, and how to get there. Intelligent databases provide such information without even needing to run a manual profile! The data can be linked and shared with all authorized personnel.
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K Thermocouple Surface Probe
TP745
Surface thermocouple Type “K” probe. Tolerance according to IEC 60584-2 standard.
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Chemical Analysis + Surface Analysis
Rocky Mountain Laboratories, Inc.
An independent surface chemistry and microanalysis laboratory to serve the needs of industrial, academic, and governmental clients. Our objective – to provide real-world solutions for industries with materials and process development needs – is as fundamental to our organization today as when we began. Over the years we have strived to adapt our services to the specific needs of these clients.
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Surface Potential Measuring Instrument
In the electronic equipment assembly process, there are many items that are charged on the order of kV, such as resin molded products and films. This digital electrostatic potential measuring instrument is suitable for processes with relatively high electrostatic control voltage.The measurement range switching function makes it possible to measure from low potential measurement of electronic devices to high potential measurement of resin molded products, film / printed circuit board manufacturing, etc.
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ICP Electret Surface Microphone
130B40
Low-profile surface pressure microphone and preamp, prepolarized
