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Stator Test
See Also: Stator
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Stator Test Systems
Automation Technology's STS-3800 has become the "gold standard" in Stator Testing Equipment. The STS-3800 is packed with standard features and like all of ATI's 3800 Series Test Systems, it is backed by the industry leading two-year limited warranty. The STS-3800 offers the most comprehensive testing of stators and fields available.
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Automotive Engine Tester
QCM-2A
Changzhou Chanlon Electronic Technology Co., Ltd.
This tester is applied to integrated test varieties of automobile motor, wiper motor, window lifting motor, oil pump motor etc. Its LCD shows all technical data which obtained by industrial control computer, which check and verify the quality of testing stators.
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Motor Testers
Changzhou Chanlon Electronic Technology Co., Ltd.
This machine is applied to test steel casing motor such as pump, fan, air-condition motor, mower, paper shredder and refrigerator etc. Its LCD shows all technical data which obtained by industrial control computer, which check and verify the quality of testing stator.
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Stator Wedge Analysis
Loose stator wedges can lead to coil vibration and erosion of stator insulation. Iris Power stator wedge tightness testing provides a consistent and quantitative means of identifying the location and severity of loose stator wedges in order to plan rewedging or other necessary repairs.
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Motor Quality Control Test Systems
SKF Condition Monitoring Center
These rack-style motor quality control units are rugged, field-proven systems for testing stators and armatures in high-volume manufacturing environments. They combine the most common electrical tests into an efficient automated solution.
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Stator Testers
Changzhou Chanlon Electronic Technology Co., Ltd.
This machine is applied to test varieties of iron stator like pump motor, air-conditioning motor, washing machine motor, paper shredder motor, servo motor and stepper motor etc. Its LCD shows all technical data which obtained by industrial control computer, which check and verify the quality of testing stator.
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Vacuum Tester
QCT-2A
Changzhou Chanlon Electronic Technology Co., Ltd.
This machine is applied to vacuum cleaner type motor. Its LCD shows all technical data which obtained by industrial control computer, which check and verify the quality of testing stator.
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Stator Testing System for EV Motor
EVT531
Shanghai Dean Electrical Co., Ltd
To meet the standard test projects requirement of the international companiesTo control and analysis the programs will reduce the human careless and misjudgmentEasy to edit environment and easy to learnIt can test multiple sets of DUTs simultaneouslyWhen there are several DUTs are tested, it could identify the undesirable sets individuallyThe Impulse/Surge with waveform comparison is a non-destructive analysisPolarity testMaximum saved files will be up to 100 setsIt provides the password functionSpeeding test could save time and improve efficiencyChinese and English pages can be arbitrarily switched
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Stator & Coil Testing
Electronic Systems of Wisconsin, Inc.
ESW Stator Test Systems come fully equipped with the latest industry features. The on-screen display in our testers allows the operator to visually see the part lead hook-up to the tooling connections. Our software makes it easier to read, track, and record your stator test information. While performing tests, you can watch the testing throughout the process in real time. You can view various wave-forms for surge or magnetic field, which can be displayed real-time and printed if desired. The software logs all test results, so that you do not have to worry about losing important information. ESW designs the tooling to be simple to connect the part. We work closely with you to define and implement your customized testing needs. The videos and slideshow below show some of our Stator Testers.
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Motor Stator Test System
Chroma 1920
Chroma Systems Solutions, Inc.
For electrical safety and quality testing functions of motor stator coils
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Automatic Production Tester for Electric Motor Stators
MTC 3
The fully automatic MTC3 stator testers test your windings reliably and quickly for possible insulation faults via our patented surge voltage test.After connecting the test object completely the test is performed with an automatic switching of the connections and the test methods. The MTC3 evaluates each test step. At the end of the complete test process it provides a clear and reproducible GO or NO GO-statement.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Audio and Acoustic Functional Test Solution
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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NI's Electrical Functional Test Solution
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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NTS Platform
Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
