Total Reflection X-ray Fluorescence
-
product
X-Ray Inspection
X-ray inspection systems are used wherever defects need to be detected by non-destructive means. The spectrum of use is broad and ranges from quality controls for complex assemblies, to the testing of materials for cracks and air inclusions, to foreign matter inclusions and shape deviations. The trend toward miniaturization, higher packing densities, and the relocation of components to the interior of the assembly require precise X-ray inspections that detect hidden defects quickly and reliably. X-ray systems from Viscom are used for the inspection of series assemblies as well as sampling and prototype controls. They take care of typical inspection tasks in concealed areas such as void controls, THT filling level measurements, and HIP inspections. At the same time, the systems reliably determine defect features such as coplanarity and polarity – at high inspection speeds and in a cost-effective way.
-
product
Reflectance Standards
Diffuse reflectance calibration standards in white or different grey levels. Traceable calibration for the wavelength range from 250 nm to 2450 nm.
-
-
product
Desktop Fluorescence Microscope
Nanoimager
The complete package for super-resolution microscopy
-
product
Reflection Probes
Reflection probes are used to obtain spectral information of diffuse or specular materials. The light from a light source is sent through six illumination fibers to the sample, and the reflection is measured by a 7th fiber in the center of the reflection probe tip. Discover our reflection probes below.
-
product
X-Ray Detectors
With the need to always reduce the inspection time to the strict minimum, the NDT world is slowly reducing its dependency on films and jumping straight into the Digital Radiography (DR) revolution. While saving tremendous amount of time and money not developing films, digital radiography also enables you to edit, record and send your inspections to whomever, whenever and wherever you want.
-
product
Fluorescence Multiphoton Microscopy
Ultima Investigator™
As the most streamlined model of Bruker''s Ultima family of multiphoton microscopes, Ultima Investigator™ features a base system specifically optimized for in vivo studies and is designed for add-on flexibility with a host of specialized options. Ultima Investigator''s high-resolution, high-speed, high-sensitivity deep imaging provides the ultimate value for smaller labs and additional imaging bandwidth in larger labs.
-
product
X-Ray Flaw Detectors
XXQ/XXG/XXGH Series
XXQ series are suitable for the material directional of thin iron plate, aluminum, rubber and so on, may get very good picture quality and clarity.
-
product
Wavelength Dispersive X-ray Fluorescence Spectroscopy
Wavelength Dispersive X-ray Fluorescence Spectroscopy
-
product
Tube-Above Wavelength Dispersive X-ray Fluorescence Spectrometer
ZSX Primus IV
As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Guidance supports you in all aspects of measurement and data analysis. Can accurate analysis only be performed by experts ? No — that is in the past. ZSX Guidance software, with the built-in XRF expertise and know-how of skilled experts, takes care of sophisticated settings. Operators simply input basic information about samples, analysis components and standard composition. Measured lines with the least overlap, optimum backgrounds and correction parameters (including line overlaps) are automatically set with aid of qualitative spectra.
-
product
Cabinet X-ray System
XPERT 80- L
Kubtec's XPERT 80-L, for large area imaging, is a multi-purpose cabinet x-ray system bringing high quality medical-grade imaging and ease of use to applications in scientific research, pathology and industry. A small focal spot with an x-ray source of up to 130 kV offers brighter images with higher contrast for visibility of the smallest details and most subtle variations in density. Optional sources are available for micro-focus and soft x-ray applications.
-
-
product
Scanning X-Ray Detectors
Shad-o-Scan
Shad-o-Scan is a family of scanning X-ray detectors specifically designed for the challenging requirements of high-performance industrial and scientific X-ray applications. Industry-leading TDI CCD performance enables the ultimate sensitivity and highest resolution in the industry, and ensures long detector lifetime in even the harshest radiation environments.
-
product
X-Ray Inspection System
MXI Quadra 5
Quadra™ 5 is the X-ray inspection system of choice for sub micron applications such as PCB and semiconductor package inspection, counterfeit component screening and finished goods quality control.
-
product
Total Stations
Zoom40 Series
The Zoom40 manual total station, with its high resolution color and touch display, gives you the flexibility to run X-PAD, Field Genius, SurvCE, or any custom windows CE software.
-
product
X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
-
product
Compact, Portable Fluorescence Microscope
*Very compact fluorescence microscope*Detects organisms expressing GFP or other fluorophores*Perfect for sample triage, education and outreach
-
product
Total Energy System
5000
The electric vehicle (EV) charging market is rapidly expanding, with more and more people switching to electric cars. As the demand for EV charging stations increases, so does the amount of energy that is being exchanged. This energy exchange market is already massive, with charging peaks reaching into the megawatts of energy. With this amount of energy comes a significant amount of revenue, which requires the most accurate billing possible. That’s where TESCO’s Catalog No. 5000 – Total Energy System comes in. The Catalog No. 5000 is a double duo system that enables the testing and accuracy verification of Electric Vehicle Service Equipment (EVSE) and Field Test Equipment for testing EVSE’s in the field. This system is a dual-purpose DC and AC System and includes both a 100A AC (ACT-100) Test System and a 200A DC Test System (DCT-200).
-
product
Illuminate Reflective Test Charts
iQ-Chart Box
Image Engineering GmbH & Co. KG
The iQ-Chart Box makes it possible to illuminate reflective test charts quickly and homogeneously. It is the compact solution for providing optimal conditions for the image quality testing of cameras and cell phones. Whether measuring resolution or color reproduction, all reflective test charts that we offer in the A460size can be used. Chart changing is carried out quickly and easily by means of a movable carriage. The lighting systems in the iQ-Chart Box are precisely aligned and fixed; the test charts are always optimally and homogeneously illuminated.
-
product
Gloss & Reflectance
Visual appearance can determine a person’s perception of a product. Colour and Gloss are two key parameters that are used to define a product’s overall quality. Perception is subjective, but Elcometer’s range of gloss meters, DOI meters and colour assessment equipment can quantify appearance measurement. The ability of a surface to reflect light without scattering is known as gloss. Using a gloss meter, gloss is measured by directing a constant intensity light beam at a fixed angle to the test surface and then by monitoring the amount of reflected light at the same angle. Different surfaces require different reflective angles.
-
product
X-Ray Inspection System
MXI Ruby XL
Designed for the largest PCBs, Ruby XL allows 96 x 67 cm (37.9” x 26.4”) areas to be inspected non-destructively, with feature resolution up to 0.5 µm.
-
-
product
X-Ray Inspection System
TruView™ Fusion
The quality of your products is paramount to the success of your business. The TruView™ Fusion X-ray Inspection System allows you to "see inside" your products without destroying them, enabling unprecedented understanding of your manufacturing process. The TruView™ Fusion X-ray is the right solution if you are looking for a radiography system to inspect medical devices, printed circuit boards, electronic components, and mechanical parts.
-
product
Total Hydrocarbon Analyzer
Model 4030
Teledyne Analytical Instruments
The Model 4030 uses a field proven FID detector in a heated chamber. The chamber is heated to a high temperature to meet US EPA requirements for VOC emissions monitoring.
-
product
Total Nitrogen Unit For TOC-L Series
TNM-L
Perform simultaneous TOC and TN measurements. *720 °C catalytic thermal decomposition/chemiluminescence methods are adopted for TN measurement. There is no interference from metallic ions or bromine in sea water.*Measurements over a wide range with a detection limit of 5 μg/L for TOC-LCH to an upper limit of 10,000 mg/L.
-
product
Dispersive X-ray Fluorescence Spectrometer
SPECTRO MIDEX
SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
-
product
X-ray Fluorescence Sulfur-in-Oil Analyzers
SLFA-2100/2800
The SLFA-2100/2800 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
-
product
X-Ray Photoelectron Spectrometer
AXIS Supra
AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
-
product
Anritsu X-ray Inspection Systems
Choosing the best inspection system is critical to meeting the ever-stricter food quality standards of the world’s leading poultry and meat processors. That’s why Cantrell•Gainco is an authorized distributor for Anritsu X-ray detection equipment, a leading technological powerhouse in the industry.
-
product
Hybrid Diffuse Reflectance Spectrometer
Poly602™
Solar Light has developed the fastest performing DRS instruments on the market, keeping product research, formulation and clinical testing in mind. HDRSplus™ software is designed specifically for a clinical testing laboratory environment and simplifies all HDRS calculations.
