Total Reflection X-ray Fluorescence
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Product
X-Ray Photoelectron Spectrometer
AXIS Supra
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AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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Product
MIPI Soundwire Total IP Solutions
Soundwire
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Soundwire is suited for small, cost-sensitive audio peripherals such as modern digital class-D amplifiers and digital microphones. The Total MIPI SoundWire IP Solution from Arasan enables early adopters the fastest path to adoption of this new standard by offering a comprehensive IP package that includes the Verilog RTL source code for Master and Slave, fully validated for compliance with the standard, a comprehensive test environment with a compliance suite for verification of the IP package, a SoundWire Hardware Development Kit (“HDK”) for FPGA prototyping, a SoundWire protocol analyzer and a complete SoundWire software stack.
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Product
Omniblock Integrated X-Ray Systems
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Omniblock® X-ray generators from Excelitas Technologies integrate the high-voltage source and X-ray tube into one consolidated housing. This design configuration eliminates the high-voltage cables and connectors reducing cost while improving system design flexibility and streamlining integration. They are specifically designed for generating X-rays in static or rotating applications using proven designs of up to 180 kV and 2.4 kW. Typical applications for Omniblock X-ray generators include baggage screening, medical imaging, food inspection, industrial analysis and many other cost-sensitive and space-constrained X-ray applications.
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Product
Total Halogen and Sulfur Analyzer
XPLORER-TX/TS*
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The XPLORER-TX/TS is a microcoulometric combustion analyzer for the analysis of total halogens and total sulfur. The small footprint allows it to blend into every laboratory environment, whether it is in R & D, refinery, chemical, or petroleum applications. This next generation analyzer surpasses all others in its class in performance. It is robust, precise and ideal for harsh testing environments.
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Product
Fluorescence Microscopes
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PicoQuant offers different solutions for time-resolved confocal microscopy. The available systems include single molecule sensitive microscopes with picosecond temporal resolution and super-resolution imaging capabilities as well as upgrade kits for laser scanning microscopes of all major manufacturers that enable time-resolved applications.
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Product
Large-Area CMOS X-Ray Detector
Rad-icon
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Teledyne DALSA’s Rad-icon product family of large-area digital x-ray cameras offers users a high-speed, high-performance x-ray imaging detector with a fast, reliable PC interface (either GigE or CameraLink) for easy integration.
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Product
Integrating Spheres For Reflection, Transmission And Absorption
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Integrating spheres and accessories optimized for the measurement of reflection, transmission, absorption and photoluminescence.
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Product
X-ray Diffraction and Elemental Analysis
D2 PHASER
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The D2 PHASER is the most compact and fastest, all-in-one crystalline phase analysis tool available on the market. It is mobile and easy to install with only the need for standard electrical power. The D2 PHASER is therefore ideal for laboratory or on-location operation, in other words, it is a true Plug'n Analyze system.
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Product
X5 Pack X-Ray Inspection
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Designed to be integrated into line with built-in automatic reject and available in 300, 500 and 600 mm belt width models, the X5 Pack is perfect for a variety of unpackaged and packaged products.
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Product
Reflective Memory
VME-5565
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The VME-5565 Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board can be configured with either 64 Mbyte or 128 Mbyte of onboard SDRAM. The local SDRAM provides fast Read access times to stored data.
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Product
In-Line X-ray Inspection System
X-eye 6200
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Automatically in-line inspect Solder joint defects of PCBA, and other defects on Hidden Components.Able to judge Good/NG fast with inspection speed of 1sec/FOV and the program can set ROIs conveniently.Performing X-ray inspection in various production site, integrated with other manufacturing equipements.
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Product
Waterproof High Range Total Dissolved Solids Pen (TDS)
T76
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The Milwaukee T76 Waterproof High Range Total Dissolved Solids (TDS) Pen is designed for, aquariums, aquaculture, education, pools, water conditioning and many other applications. The T76 helps you make sure that your fish have the right TDS balance to help them stay healthy. TDS also help keep filters up-to-date and clean for water filtration or pools. Keep TDS in your target range to help your achieve better results.
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Product
Inspection System for high-power precise 3D X-ray CT
X-eye PCT225
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Inspection System for 3D X-ray CT able to analyze defected area precisely by precise movement of axis with high polished Anti-vibration table. High-power X-ray Tube of max. 450kV and large area Flat Panel Detector of max.16 inches can be installed depending on the sample. Customized 3D CT equipment is available with selecting main parts by customers depends on their needs for size and material.
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Product
Automated X-ray Inspection (AXI)
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Automated X-ray inspection (AXI) is a testing approach based on the same principles as automated optical inspection (AOI). Instead of cameras, X-rays are used to automatically inspect features.
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Product
Fluorescence Microscopes
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Bruker’s suite of fluorescence microscopy systems provides a full range of solutions for life science researchers. Our multiphoton imaging systems provide the imaging depth, speed and resolution required for intravital imaging applications in neuroscience, oncology and immunology. Our confocal systems enable cell biologists to study function and structure using live-cell imaging in cell cultures and invertebrate model organisms at speeds and durations previously not possible. Bruker’s super-resolution microscopes are setting new standards with quantitative single molecule localization which allows for the direct investigation of the molecular positions and distribution of proteins within the cellular environment. Our latest addition, Luxendo light-sheet microscopes, are revolutionizing long-term studies in developmental biology and investigation of dynamic processes in cell culture and small animal models.
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Benchtop Small Angle X-ray Scattering (SAXS) Instrument
NANOPIX mini
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Non-destructive measurement of particle size and size distribution.Rigaku NANOPIX mini is the world’s first benchtop small angle X-ray scattering (SAXS) system that is engineered to deliver automatic nanoparticle size distribution analysis for both quality control (QC) and research and development (R&D) applications. Nanoparticle size, size distribution, and particle shape are the key pieces of information obtained from SAXS. Samples may range from solutions, suspensions or slurries to solid plastics, rubbers or polymers.
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Product
X-ray Inspection System
TruView Prime
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The TruView Prime is a fully motorized radiography system developed to meet the stringent requirements of electronics assembly and component inspection. The TruView Prime is professionaly built - something hard to find in entry level systems in the TruView Prime's price range.
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Product
Fluorescence Spectrometers
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Fluorescence spectrometer is designed for the precise measurement of excitation and emission spectra from solid or liquid samples and has found application in many fields such as chemistry, physics, biology, medicine and environmental monitoring.
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Product
Fluorescence Microscopes
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We develop epifluorescence microscopes with a single fluorescence up to 16 fluorescences in a few seconds. Realized with standard cameras or highly sensitive sensors.
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Product
Adjustable Range Reflective Photoelectric Sensor
EQ-500
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Panasonic Industrial Devices Sales Company of America
The EQ-500 Series Adjustable Range Reflective Photoelectric Sensor is a multi-voltage compact Reflective Photoelectric Sensor that can function with 24 to 240 V.AC and 12 to 240 V.DC, to operate with any power supply around the world. Background and foreground suppression (DC Types) and a long sensing range of up to 2.5m is a key characteristic of the EQ-500 Sensor. With an IP67 rating, the EQ-500 can be used in harsh environments prone to water or dust making stable sensing possible.
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Product
X-Ray Seamless Pixel Array Detector
XSPA-400 ER
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In general, X-ray diffraction measurements using a Cu X-ray source are known to have difficulty detecting trace crystalline phases because of increased background when measuring samples containing transition metals. The high energy resolution of the XSPA-400 ER supresses the fluorescent X-rays originating from the sample, thereby reducing background, enabling highly sensitive measurements of samples containing transition metals, such as iron and steel compounds and battery materials.Therefore, it achieves higher sensitivity measurements than conventional detectors.
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Product
X-ray Diffraction (XRD) Instruments
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X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze all kinds of matter—ranging from fluids, to powders and crystals. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control. Rigaku has developed a range of diffractometers, in co-operation with academic and industrial users, which provide the most technically advanced, versatile and cost-effective diffraction solutions available today.
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Product
High Performance Fluorescent X-ray (XRF) Coating Thickness Gauge
FT150 Series
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Hitachi High-Technologies Corp.
The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex silicon drift detector. The improved X-ray detection efficiency enables high throughput and high precision measurement. Furthermore, new design to secure wide space around sample position gives exellent operability.
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Product
Convergent Reflective Micro Photoelectric Sensor
PM2
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Panasonic Industrial Devices Sales Company of America
The fixed beam of focused light from the Convergent Reflective Type Micro Photoelectric PM2 Sensor enables it to precisely detect an object within a defined sensing range. With the ability to measure independently of the background, the PM2 Sensors are also able to detect dark or slightly reflective objects as well as extremely thin objects (> 0.05mm). These features, combined with its compact and robust design, make the PM2 Sensor suitable for a large number of applications.
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Product
X-ray Microscopy
ZEISS Xradia Versa
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Extremely versatile ZEISS Xradia Versa 3D X-ray microscopes (XRM) provide superior 3D image quality and data for a wide range of materials and working environments. Xradia Versa XRM feature dual-stage magnification based on synchrotron-caliber optics and revolutionary RaaD™ (Resolution at a Distance) technology for high resolution even at large working distances, a vast improvement over traditional micro-computed tomography. Non-destructive imaging preserves and extends the use of your valuable sample, enabling 4D and in situ studies.
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X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
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Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Product
Total Flux Measurement Systems
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LED’s and Luminaires must be characterized and tested for brightness and color, for production quality control and also for R&D. The Gamma Scientific Total Flux Measurement System combines our accurate Radoma Spectrometer and an integrating sphere for total flux (total power) and color measurements of LED, micro LED and Luminaires. Measurement parameters include spectrum, lumens, total power, peak and dominant wavelength, CRI, CCT, FWHM and other optical properties.
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Product
Total Energy System
5000
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The electric vehicle (EV) charging market is rapidly expanding, with more and more people switching to electric cars. As the demand for EV charging stations increases, so does the amount of energy that is being exchanged. This energy exchange market is already massive, with charging peaks reaching into the megawatts of energy. With this amount of energy comes a significant amount of revenue, which requires the most accurate billing possible. That’s where TESCO’s Catalog No. 5000 – Total Energy System comes in. The Catalog No. 5000 is a double duo system that enables the testing and accuracy verification of Electric Vehicle Service Equipment (EVSE) and Field Test Equipment for testing EVSE’s in the field. This system is a dual-purpose DC and AC System and includes both a 100A AC (ACT-100) Test System and a 200A DC Test System (DCT-200).
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Product
Total Luminous Flux Measurement System
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This system enables the total luminous flux measurement of luminous intensity distribution 2 and 4 light sources based on the measurement standards of LED lightings LM-78 and LM-79 approved by IESNA (Illuminating Engineering society of North America) .
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*Micro-fluoroscopic X-ray Inspection System
Cath-X
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The Cath-X is a bench top system employing Glenbrook’s micro-fluoroscopy technology providing highly detailed x-ray video of the critical components of the needle device. The transparent, safely shielded, view chamber permits the operator to locate the critical areas of the needle for inspection. The x-ray image can be further magnified using the electro-optical zoom feature of the Cath-X.





























