Semiconductor Test
prevails upon the DUT to demonstrate It's fulfillment of test requirements.
See Also: ATE
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Semiconductor Packaging System
Inspects the quality of finished cells by measuring the gap between the battery electrode laminate and aluminum can.
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Ethernet and Fibre Channel Test Platform
SierraNet M1288
The SierraNet M1288 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M1288 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M1288 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Atlas DCA Pro Advanced Semiconductor Analyser
DCA75
The DCA75 is a great instrument for identifying and testing a wide variety of semiconductor components. Just connect any way round! The DCA75 will perform the following:*Display component type (such as N-CH MOSFET, darlington transistor etc).*Display component pinout (such as drain, source, gate etc).*Display detailed parameter measurement.*Plot characteristics curves on your PC.
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Metrology Solutions for Semiconductors
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition.
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Semiconductor Functional Verification Tools
Trek5
Breker’s solutions enable test reuse across simulation, emulation, prototyping and actual silicon, eliminating redundant effort across the development flow. The Breker “Trek” suite solves challenges across the functional verification process for large, complex semiconductors.
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Semiconductor Switching Systems
Keithley 700 Series
The high speeds and low currents of semiconductor devices demand high quality, high performance switching of I-V and C-V signals. We offer switching solutions for both semiconductor R&D and production test applications with mainframes that can support up to 2,880 channels and a family of matrix cards designed specifically for semiconductor applications.
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Test Fixture, Axial And Radial
16047A
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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2-Module ICT System, I317x Series 6
E9902G
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Conformance Test System
TS-RRM
The R&S®TS-RRM 5G and LTE test system is a test solution for running 5G NR and LTE inter-RAT RRM test cases for certification of wireless devices.It is a fully automated conformance test system for running validated RRM conformance test cases. In addition to the RRM test cases required by GCF/PTCRB, the R&S®TS-RRM also supports carrier acceptance specific RRM tests.
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Semiconductor Assembly
With the know-how that we have cultivated over many years in the semiconductor manufacturing process, we respond to the diverse needs of our customers regardless of prototype production and mass production.
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Impact Series Power Discrete Semiconductor Tester
The Impact Series Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.
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Programmable Parametric Tester For Discrete Semiconductors
IST-8800
IST Information Scan Technology, Inc.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
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RSE Wireless EMC Spurious Emission
TS8996
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Meters For Contact Angle And Surface Tension + Semiconductor Technology, Micro Scriber
SURFTENS HL Automatic
Optik Elektronik Gerätetechnik GmbH
Fully automatic contact angle meter for silicon wafers up to 12 inch The contact angle measuring system SURFTENS HL automatic is designed for use in semiconductor industry and research, in particular for process control of wafer coating and in the photolithographic process.
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Spread Resistance For Slanting Polished Sample Of Semiconductor By Tow Kinematically-mounted Probe Contacting .
SRS-2010
*Resitivity map along with depth direction, thickness of epitaxial , depth of PN junctin and carier density profiles
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Compound Semiconductor
Scientific Computing International
Semiconductors that are made from two or more elements.
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Test Fixture and Test Programing
Landrex Technologies Co., Ltd.
Test Fixture and Test Programing
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Conformance Test System
TS8980
The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
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Prototyping & Test Consulting Services Solutions
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Semiconductor ATE Systems
Our testers allow for the high-volume production of electronics that touch people’s lives in communication, safety, entertainment, and much more.
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Compound Semiconductors
GaAs and InP substrates
Sumitomo Electric Industries, Ltd.
GaAs substrates (compound semiconductors) are used for smartphone power amplifiers and switches, LEDs (illumination, decoration, indicators), and solar cells. InP substrates are used for optical communication modules, etc.
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Semiconductor Material Evaluation Equipment
Equipment for evaluating semiconductor materials using various measuring methods is available.
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BMS Manufacturing Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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SAP Testing
ZenQ SAP Testing Services are on-demand, providing the best testing solution for identifying application errors before they make their way into production. Enterprises normally face challenges in analyzing SAP test requirements, handling compatibility issues while configuring, customizing and integrating different modules. We help our clients ease these testing challenges by having test accelerators to bring down cost overheads.
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Material Testing
*Abrasion Testing*Adhesion Testing*Brittleness Temp.*Bursting Strength*Coating Testing*Coefficient of Friction*Compression Testing*Compression Set*Dart Drop Testing*Density Determination*Fatigue Testing*Fiberboard Testing*Flammability Testing*Flexural Testing*Foam Testing*Hardness Testing*Heat Deflection*Hydrostatic Testing*Impact Testing*Life Cycle Testing*Melt Index Testing*Plastic Testing*Ply Separation*Resin Content*Rubber Testing*Shear Strength Testing*Stress Crack Testing*Tear Testing*Temperature Testing*Tensile/Elongation*UV Exposure*Water Absorption*Wood Testing
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Pressure Testing
All metal, plastic, and composite parts intended to contain liquids or gases under pressure are required to undergo stringent pressure testing procedures to meet qualification standards.
