Flash Memory
retains data absent of power. Also known as: Flash Device
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Product
Memory Burn-In Tester
H5620/H5620ES
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H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
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Product
Memory Test System
T5801
Test System
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
Reflective Memory Node Card
PMC-5565PIORC
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The PMC-5565PIORC Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM.The local SDRAM provides fast Read access times to stored data.
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Memory Interface Chips
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Providing memory bandwidth and capacity to unleash the power of multicore processors
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Product
Memory Test Systems
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ICs that record and retain data are called memory devices. Our memory test systems are optimized for volume production of memory semiconductors, a market where low-mix high-volume production is the norm, and feature industry-best parallelism (the ability to test a large number of semiconductors at the same time).
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Product
Open Cup Flash Point Testers
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Open cup flash point tester, Cleveland open cup flash point tester, automatic Cleveland open cup flash point tester, Automatic COC flash & fire point tester
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Product
Flash SATA Disk /SATAIII SLC, MLC
FSA Series
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Axiomteks FSA (Flash SATA Disk) series is a high performance 2.5 flash disk and fully compatible with SATAIII standard which make it an ideal replacement for conventional SATA HDD without any driver or system modification. This 2.5 SATAIII flash disk is provided with huge capacities up to 512GB to meet diverse needs of data storage. With the features of high capacity storage, data integrity, anti-vibration and low powerconsumption, the FSA series is surely a solid solution for expanding an industrial computers memory.
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Product
DRAM SO-DIMM DDR4 Memory
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Improve performance up to 50% (compared to SO-DDR3.) with Advantech! We offer industrial grade SO-DDR4 2666/2400/2133 memory with 30μ" gold plating connector (260 pin) featuring 1.2v low operating voltage with faster burst accesses.
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Product
Closed Cup Flash Point Testers
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Labodam closed-cup flash point testers are compact, stand-alone solutions which determine the low temperature operability in diesel fuel, biodiesel, blends and gas oils. They are designed as per Test Methods for Flash Point of Petroleum Products (Pensky-Martens Closed Cup Methods).
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Product
CXL Memory
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SQRAM launches next-gen CXL 2.0 Memory Expansion, offering high-speed, low-latency performance to meet the needs of large AI training and HPC clusters.
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Product
Timing, Logic & Memory
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Offering an extensive portfolio of products for programmable clocks, clock generation and distribution, standard logic and memory (Flash, EEPROM and SRAM) across various applications.
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Product
Flash Point
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At which temperatures will your sample burn, ignite, or cause fire? How are your flammable liquids composed, and what are their properties? Volatility is directly related to a substance‘s flash point temperature (flammability). Anton Paar’s flash point testing equipment safely and easily determines the values you require for the processing, storage, transportation, and classification of dangerous liquids.
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Product
4k/HD Frame Memory Board
GG-170
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The successor to the popular GG-167-HD/4K, this is an uncompressed HD/4K video input and output compliant frame memory board.
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Product
Arc Flash Software
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ETAP ArcSafety provides electrical engineers with an all-in-one solution for performing AC and DC arc flash analysis on low, medium, and high voltage systems. With unrivaled tools for arc flash analysis, risk assessment, and mitigation, this software enables engineers to ensure safety and minimize risks in electrical systems.
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Product
High-Speed Memory Test Solution
UltraFLEX-M
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The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
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Product
Programmable Read Only Memory (PROM)
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Is a Static Random Access Memory. The pinout is the JEDEC 28 pin, 8-bit wide standard, which allows easy memory board layouts which accommodate a variety of industry standard ROM, PROM,EPROM, EEPROM and RAMs.
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Product
Flash Solar Simulators
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Sciencetech manufactures a range of flash solar simulatorsSee the Flash Solar Simulator Overview to compare products across different product lines.
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Product
DDR4 Pro Memory Test Adapter
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This memory test adapter for the RAMCHECK LX includes an extraordinarily rugged test socket for many thousands of insertion/removal cycles.
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Product
Reflective Memory Hub
ACC-5595
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The ACC-5595 is a managed hub designed to operate with our 5565 family of Reflective Memory real-time network products. The Reflective Memory hub can automatically bypass ports when it detects a loss of signal or the loss of valid synchronization patterns, allowing the other nodes in the network to remain operational.
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Product
Memory
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Renesas offers MIL-STD-883-compliant CMOS random access memory (RAM) and CMOS programmable read-only memory (PROM) devices that are that are qualified to QML Class Q military standards.
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Product
Parallel Memory Test Solution
Magnum2
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Teradyne’s Magnum 2 test system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices.
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Product
SO-DIMM DDR2 Memory
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Enable better electrical performance and speed (compared to SO-DDR) with Advantech. We offers industrial grade SO-DDR2 800/667 memory with 30μ" gold plating connector (200 pin), featuring 1.8v operating voltage and better bandwidth.
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Product
Flash Programming for Functional Test Systems
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Flash programming stations allow you to offload flash programming from functional test systems, increasing test throughput while improving capital utilization. Circuit Check flash programmer fixtures support multiple programmer types and multiple I/O configurations.
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Product
Flash Vs. Scan
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A LiDAR system can observe the complete field of view (FOV) at once, called Flash systems. Flash typically works well for short to mid-range (0-100m), and by capturing the complete scene at once also objects with high relative speeds can be detected properly. Another implementation is to focus on a subset of the FOV, consequentially look at the next subsets, until the complete FOV is covered, called Scanning. Scanning can focus the light on the subset instead of the full FOV, and therefore can do object detection at a longer range compared to Flash.
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Product
Universal Flash Storage
UFS
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Universal Flash Storage (UFS) is a JEDEC standard for high performance mobile storage devices suitable for next generation data storage. The UFS is also adopted by MIPI as a data transfer standard designed for mobile systems. Most UFS applications require large storage capacity for data and boot code. Applications include mobile phones, tablets, DSC, PMP, MP3, and other applications requiring mass storage, boot storage, XiP or external cards. The UFS standard is a simple, but high-performance, serial interface that efficiently moves data between a host processor and mass storage devices. USF transfers follow the SCSI model, but with a subset of SCSI commands.The Arasan UFS IP family consists of Host controller IP, Device controller IP, and MPHY.
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Product
Memory Tester
RAMCHECK LX DDR3
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Quickly test DDR3 DIMM and SO-DIMM memory. In just seconds, RAMCHECK LX will perform a thorough test of the module and provide complete identification. Also tests expensive LRDIMM modules.
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Product
Memory Burn-in Tester
B6700 Series
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B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
