Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Product
Bump Test Machine
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Labtone Test Equipment Co., LTD
Bump test systems for electrical products repeating impact testing during transportation
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Product
Fully Automatic Tensile Testing System
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This is a fully automatic tensile testing system for metals. The system is fully automated from supply of specimens, measurement of specimens, tensile testing, recovery of specimens, and data processing, and is capable of continuous nighttime testing.
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Product
Dynamic Test System
3430-SW
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The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.
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Product
PXIe-6548, 200 MHz, 32-Channel PXI Digital Waveform Instrument
781012-03
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PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Product
Motorized Force & Torque Measurement Test Stands
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Mark-10 offers a wide and unique range of motorized force measurement and torque measurement test stands. Motorized stands offer a significant advantage over manual test stands by providing constant test speed. Some models can be programmed for advanced test sequences to accommodate demanding applications. All motorized test stands carry the CE mark. A test stand is an integral part of a testing system, typically also comprising a force gauge or torque gauge, grips, software, and accessories.
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Product
In-circuit Test
i3070
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The Keysight i3070 In-Circuit Test (ICT) System embodies proven technology, enhancing test efficiency through time-tested software, hardware, and programmability. Catering to diverse PCBA sizes, it addresses applications such as IoT, 5G, automotive, and energy. Its unique design minimizes undesired effects from parasitic capacitance, enhances immunity to crosstalk, and eliminates stray signal coupling, ensuring consistent and repeatable measurements.
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Product
Test System
USB Explorer 280
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The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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Product
Modulation Distortion For E5081A Up To 20 GHz
S960704B
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The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
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Product
Test System Mainframe
ITC59000
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The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
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Product
HALT Test Service
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HALT, Highly Accelerated Life Test is a system design validation tool for maximum robustness verification. In a step stress approach a system under functional test and operational conditions is check for functional and destruct limits.
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Product
PXI 5W Programmable Resistor Module, 1-Channel, 3Ω to 11.4MΩ
40-252-053
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The 40-252-053 is a programmable resistor module with 1 channel which can be set between 3Ω and 11.4MΩ with 1Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Pulsed IV-Curve Solutions
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Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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Product
Sound Level Meter, 30 dB, 130 dB, 1.4 dB, 0.1 dB, 0 °C, 40 °C
MP780905
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Digital sound level meter with USB interface. It is perfect for sound system testing, speaker system measurement and environmental noise level monitoring. This is designed to meet the measurement requirements of safety engineers, health, industrial safety offices and sound quality control in various environments.
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Product
ESD Test System
58154 Series
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ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
Fuel Injection Tester
FIT13APB
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This basic fuel injection tester includes large and small Schrader adapters, M6-1.00 O-ring adapter, and tee manifoldIncludes everything necessary to test the following systems: American Motors; Bosch AFC, MPC European and Japanese (except CIS- use our FIT447); Chrysler Corporation; Ford Motor Company; GM (except TBI- use our FIT446)
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
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Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
Electro-Dynamic Vibration Test System (Air Cooled)
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HIACC Engineering & Services Pvt. Ltd.
The air-cooled electro-dynamic vibration test system has a wide frequency range, high reliability, easy to operate and small foot-print area. The force ranges from 1kN to 70kN, and maximum load is from 70 kg to 1000 kg. This product can be integrated with HIACC’s environmental chambers.
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Product
PXI Precision Resistor Module 3-Channel, 3 to 11.4M
40-297-153
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This PXI Precision Resistor module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
Testing Aerospace Motors
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Magtrol designed this Custom Motor Test System for the testing of various aerospace motors for both commercial and military applications.
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Product
Memory Test System
T5830/T5830ES
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Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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Product
SWB-2816, 8x46, 0.3 A, No Row Access, Reed Relay Matrix Module for SwitchBlock
781421-16
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8x46, 0.3 A, Reed Matrix Module for SwitchBlock - The SWB‑2816 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
Power device test system
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This system is suitable for DC testing of IGBT, IGBT module (1in1～7in1). Built-in hi-current switching relay circuit inside test head, it is capable ofDC testing from device itself to module. Highly accurate repeatability testing is available by high speed rise time which is suppressed its heat in hi-current
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Product
PXIe-2737, 256-Crosspoint, 4x64, 2-Wire PXI Matrix Switch Module
782835-37
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256-Crosspoint, 4x64, 2-Wire PXI Matrix Switch Module—The PXIe‑2737 is a high‐density 4x64 PXI matrix switch module designed for routing signals within automated test systems and using electromechanical relays to perform immediate switch operations. It also offers features to monitor the health of deployed systems and plan for predictive maintenance, including onboard relay count tracking, a temperature sensor, and functional and resistive relay self-tests available through the NI Switch Health Center.
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Product
Built-In Relay Self-Test Diagnostic Test Tool
BIRST
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Verification and diagnosis of complex switching operation in a test system has always been an issue. BIRST (Built-In-Relay-Self-Test) diagnostic test tool provides a quick and simple way of finding relay failures available on some of our LXI and PXI switch matrices.
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Product
Impulse Current Test Systems
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Fivestar HV Testing Equipment Co., Ltd.
Impulse current test systems are mainly used for testing transmission and distribution systems against the effects of direct or indirect lightning strokes or against electromagnetic interference effects. Primary application of impulse current test systems is the testing of surge arresters, nowadays mainly of the metal-oxide type (MOA) and surge protection devices (SPD). Now they are also widely used to test vehicles, aircrafts, and military applications.
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Product
Boundary-Scan Interactive Analyzer & Toolkit
ScanExpress JTAG Debugger
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Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
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Product
Electric Vehicle Service Equipment Test System
T4350
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With the growing demand for electric vehicles (EV), there needs to be a simple and accurate method to test EV charging systems. Test the accuracy of AC and DC voltages and currents with TESCO’s Electric Vehicle Service Equipment (EVSE) Test System TS400. The TS400 is a valuable set with complete testing capabilities and caters to every possible EVSE charging protocol in the world (AC and DC). EV charging stations are popping up all over as the sale of electric vehicles increase. Many states or counties are now mandating testing for these charging stations. TESCO’s TS400 makes testing these chargers easy! TESCO’s EVSE Test Systems test the accuracy of energy delivery using a transactional mode compatible with Handbook 44 provisions. The TS400 Test System includes a T4000 EVSE Tester and a PL4000 EV Load Emulator. Reach out to your TESCO Representative for more information!
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Product
Continuous Time Interval Analyzers
GT668PXI-15
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GuideTech’s GT668PXI-15 PXI 3U form factor, meets industrial standard chassis with an expandable platform, achieving optimal test system at low cost. High accuracy 50MHz time base with NIST traceable calibration.
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Product
Hand Adapters / Special Adaptations
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*Hand adapters*Combi adapters*Service adapters*Rigging harnesses*Hand over adapters for engine test benches*Cockpit test systems*Special test benches ...*For every adaptation job the fitting adapter - application specific, reliable, robust with threaded and spring loaded contact pins.
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Product
PXIe-6548, 200 MHz, 32-Channel PXI Digital Waveform Instrument
781012-02
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PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
