Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Electro-Stimulation Equipment Testing System
STIMU-600
Test device for functional testing of electrical stimulation devices.
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Electricity Meter Test Equipment
The Reference Standard RS is precision standard meter in single- and three-phase version for electrical power and energy measurement. It is designed to meet all requirements put on a reference standard in a single- and three-phase electricity meter testing and calibration systems. The Reference Standard can be set to any true or artificial mode of operation in three phase system and is capable to evaluate individual quantities in any phase
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Protocol Test System
USB Explorer 260
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
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Inline test system for FCT, ICT, ISP and Boundary Scan for Automated Operation
LEON InLine
High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
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PXI-2532B, 512-Crosspoint PXI Matrix Switch Module
782383-01
512-Crosspoint PXI Matrix Switch Module—The PXI‑2532B is a high-density PXI matrix switch module built to serve high‑channel‑count automated test systems. Featuring compact reed relays with switching speeds up to 2,000 cycles/s, the PXI‑2532B can be configured in more than 10 matrix topologies by using different terminal block accessories. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
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CombiVolt™ 1 Voltage/Continuity Tester
DL6780
Testing of AC/ DC voltages from 12 to 690 V AC/DC Continuity testing with optical and acoustic indication Automatic switching between voltage and continuity Phase rotation test system Single pole phase indication Fully compliant with GS38 Fully operational voltage indication even when batteries are discharged Will not trip any RCD when testing across Live and Earth Single pole detection when L2 probe connected above 100V
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PXI 5W Programmable Resistor Module, 2-Channel, 2Ω to 52.4kΩ
40-252-033
The 40-252-033 is a programmable resistor module with 2 channels which can be set between 2Ω and 52.4kΩ with 1Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Power-Switching Test System
High Voltage Switching Test System
The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.
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Brake Test Systems
Worldwide, high-speed transport is getting more important. Only through continued improvement and expansion of braking systems, will suppliers all around the world provide a solid foundation for safe traffic. HORIBA has been successfully making brake test stands for more than 90 years.
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Instrument Transformer & Switchgear Testing
Our stationary and mobile instrument transformer test systems are used to test current and voltage instrument transformers. Among other things, accuracy testing, demagnetization and insulation testing are possible.
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HALT Test Service
HALT, Highly Accelerated Life Test is a system design validation tool for maximum robustness verification. In a step stress approach a system under functional test and operational conditions is check for functional and destruct limits.
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Series Brake Testers
H585
H585 Series Brake Testers give maintenance operators flightline measurement of brake system pressures and differentials for a variety of aircraft. All models minimize fluid loss and maintain hydraulic system integrity by incorporating purging and bleeding (forward or back) as routine operations in hydraulic system testing.
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PXI Precision Resistor Module 9-Channel, 2 to 102k
40-297-034
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PCI / PMC / CompactPCI Test System
PCITS
The CPCI850 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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PXI Versatile Multiplexer, Solid State, 350mA, 60V
40-681A-001
The 40-681A-001 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 350mA current and 60V voltage handling. The 40-681A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
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PXI 5W Programmable Resistor Module, 2-Channel, 1.5Ω to 3.55kΩ
40-252-023
The 40-252-023 is a programmable resistor module with 2 channels which can be set between 1.5Ω and 3.55kΩ with 1Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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High-Density PXI Large Matrix Modules up to 1 Amp - BRIC
Pickering's high-density PXI large matrix BRICs offer current handling up to 1 Amp and select models are supported by our Diagnostic Test Tools, Built-In-Relay-Self-Test (BIRST) and eBIRST Switching System Test Tools, these tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.
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Test System
Tessy
TESSY automates the whole unit test cycle including regression testing for your embedded software in C/C++ on different target systems. As an easy-to-install and easy to operate testing tool TESSY guides you through the unit test workflow from the project setup through the test design and execution to the result analysis and reporting. TESSY takes additionally care of the complete test organization as well as the test management, including requirements, coverage measurement, and traceability.
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Spring Fatigue Testing Machine
TPJ Series
Jinan Testing Equipment IE Corporation
Model TPJ Series Mechanical Computer Control Spring Fatigue Testing Machine is mainly used for the fatigue properties of all kinds of coil springs, disc springs, shock absorbers, and seal springs etc. The Spring Fatigue Testing Machine consists of motor, reducer on the connecting cams to drive the connecting rod and make reciprocating motion achieve the compression fatigue movement. The Spring Fatigue Testing Machine is efficient without any pollution to the environment. Equipped with different accessories, the Spring Fatigue Testing Machine can test springs of different sizes. Adopting the single-chip machine control, the Spring Fatigue Testing Machine realizes auto stop function when it reaches the preset test times. The Spring Fatigue Testing System is widely used in quality controls for spring, shock absorber production, and relevant applications.
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Energy Saving System
ECO-Vibe neo
ECO-Vibe neo has been designed for an eco-friendly vibration test system. The test conditions with a vibration test system depends on a unit under test. Generally, the exciting force required for performing a vibration test can be calculated by the product of mass (e.g. test article, jig, table, etc.) and test acceleration. But, when the required exciting force is smaller than the maximum rated exciting force of the vibration test system, the field power supply that the constant current has to be continuously provided to produce the DC magnetic field constitutes a large part of power consumption compared with the drive power for the moving element. ECO-Vibe neo can reduce the power consumption by choosing the exciting force in this case. In addition, you can enjoy a reduction merit of the running cost from the first year when the system is introduced because initial cost is zero.
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JTAG Debugger Software
JSCAN
JSCAN lets you view and control JTAG pins in real-time without having to touch your board! With a simple click of your mouse, you can set pins HIGH or LOW and observe the results right on your PC.J-SCAN works independently of any logic inside the JTAG device, you do not need any special firmware, code or logic installed. View and control pins in real-time, program FLASH memories, create test macros, for system test, easy to use graphical interface and affordable.
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Test System
ETS788XL
The 50/100 MHz ETS788XL system is the compact protable version of our ETS788. Made with the new high-performance precision components of our Griffin series, this portable powerhouse offers an optional tough road case and ready to go to any test site needed. Just pop off the covers and get started. Whether it's research, Failure Analysis, or single-event effects testing, his powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date.
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Industrial Electronics Testing for Smart Devices & More
As more and more devices are being designed with inherent intelligence and the ability to connect and communicate, the amount and complexity of electronic content is continuously increasing for our industrial customers. They need the ability to quickly and efficiently verify proper operation of these products as they flow off the production line. Circuit Check responds to these needs by offering a wide range of industrial electronics testing solutions from consulting to complete test system and software design. We also offer adaptable support solutions to ensure proper equipment operation throughout its life cycle.
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JTAG External Modules for Cluster Test
JEMIO
The JTAG External Modules JEMIO™ for Cluster test are intended to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system. For many designs, Boundary-Scan has adequate access to on-board signals, but signals that go off the board often cannot be tested by a JTAG tester. By adding JTAG access to these off-board signals, JEMIO™ modules can increase the board's JTAG test coverage, possibly reducing the need for implementing another test method or for developing alternative tests to reach the required level of test coverage.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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4 Quadrant Dynamometer Test System
Magtrol’s 4 quadrant motorized dynamometers provides expanded testing flexibility over a typical braking dynamometer. With the ability to bring the motor under test (MUT) to synchronous RPM before beginning a test, repeatability is improved. Since the motor windings are at ambient temperature before starting a ramp test, wattage is more consistent.
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Armature Test Systems
Automation Technology's ATS-3800 is at the top of the class when it comes to Armature Test Systems. The ATS-3800 is packed with standard features and like all of ATI's 3800 Series Test Systems; it is backed by ATI's industry leading two-year limited warranty. The ATS-3800 offers the most comprehensive testing of armatures available.
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PXI 2.5W Programmable Resistor Module, 1-Channel, 3Ω to 11.4MΩ
40-251-153
The 40-251-153 is a programmable resistor module with 1 channel which can be set between 3Ω and 11.4MΩ with 1Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Environmental Chambers
3119-600 Series
The Instron environmental chambers are precision thermal enclosures designed to integrate with static or dynamic test systems, enabling evaluation of material behavior under controlled non-ambient conditions. They circulate hot or cold air over specimens and grips using forced-convection to maintain stable temperatures. These chambers are available in a variety of standard sizes (or can be customized), and are compatible with extensometers, grips, and fixtures to provide a turnkey solution for temperature-dependent testing from subzero to elevated conditions.





























