Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Product
MEMS Optical Sensor Test
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For optical sensor test Cohu offers a variety of solutions being driven by requirements for tri-temp, parallelism and stimulus spacing. Customized optical stimulus units are integrated into Cohu’s test handling systems. For light detector test, we implement different types of light sources, such as infrared, ambient- and colored light. We offer different solutions for 3D image sensors combining emitter and receiver tests of LiDAR, Time of Flight and Structured Light devices.
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Product
PXIe CW Source, 1 MHz to 3 GHz or 6 GHz
M9380A
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Save floor space with a compact, modular analog signal generator Provides Keysight quality and performance for local oscillator (LO) substitution, interference and component test Minimize need for external amplification with output power of +18 dBm across the frequency range Reduce test time with easy integration into your high-speed automated test system
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Product
RF/Switching
SMX-6XXX (RF/Switching)
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The VTI SMX-6xxx Series of high density non-blocking RF multiplexers deliver exceptional performance and reliability in a compact single-slot configuration. Front panel connectivity is available in both SMB and PKZ formats to integrate seamlessly into new or existing test systems. Embedded virtual schematic control further simplifies setup and debugging allowing all relays to be engaged independent of application software and device drivers.The SMX-6xxx Series delivers unmatched bandwidth and isolation performance resulting in exceptional measurement integrity that is ideal for the most demanding aerospace, defense and automotive automated test equipment (ATE) applications.
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Product
Battery Formation and Testing System
BFS 2000
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BENNING Elektrotechnik und Elektronik GmbH
For many decades now, BENNING has designed and manufactured charge/discharge converters for the battery industry. These converters are used in both the production and testing processes involved in battery manufacturing and for series-testing of batteries. BENNING's BFS battery production and testing system provides a solution which makes it easier to control and monitor production and test processes which saves both time and energy. When used in power stations and rail applications (mobile version), it can be used to test and maintain a wide range of battery types.
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Test Signal Generators
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MicroImage Video Systems has a broad array of video test signal and color bar?generators designed for many applications from laboratory and testing to embedded systems. MicroImage Video Systems can design a video test signal generator for your applications. In fact, we have designed many more custom test signal generators that we offer as standard products. Small size is important and our video test signal generators start at just 1.5 inches square.
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Product
Offline In-Circuit Test Solutions
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TestStation’s offline test systems are designed for a human operator or collaborative robot for product handling. TestStation systems scale to support from 128 to 15,000 test points. Our newest Multi-Site systems double productivity per system, reducing Capex and Opex for manufacturers.
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Product
Cell Testing
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PEC offers a wide range of cell testers, starting from the 5A desktop test system (ACT0505), to our range of 50A cell testers for more standardized cycling (CT0550) and our advanced cell testers with capabilities up to 4000A (ACT0550). All systems support parallel switching for achieving higher currents.
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Product
Evaluation and Data Mining
Magpie
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LXinstruments Magpie is a user-friendly evaluation and data mining application for our test database. The data to be evaluated can be preselected via complex, easily configurable filters. Based on the selected data, it is then possible to create reports and perform statistical evaluations as well as machine capability analyses. The graphical GUI supports easy administration of the database by authorized users.The LXinstruments Magpie evaluation licenses are always linked to the data source, which would generally mean a test system. The test data generated by the test system will be marked as available for evaluation while it is stored in the database.
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Product
Seno-Con Test System
PANTHER 2K QST
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Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
Test System
LB303
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Computer Gesteuerte Systeme GmbH
The test system features the durable G12 receiver from the Virginia Panel Cooperation for the adapter interface. The LB303 is equipped with a power supply of max. 6 kW and can control up to 2 load boxes (in an external rack).
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Product
USB Type-C Test Fixture | CB26U | Cable Harness Tester
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A leader in development of PC-based cable and wire harness, continuity, resistance and hipot test systems for over 20 years, CAMI offers the CableEye suite of products complete with accessories – including “connector boards”. The selection of these test fixture boards is constantly growing and is currently numbering over 60 – most of which are populated with ‘families’ of connectors. When pre-populated boards are used, the tester GUI automatically displays a graphic of the connectors under test.
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Product
PCI High Density Pecision Resistor Card, 4-Channel, 3Ω To 6.97kΩ
50-298-130
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The 50-298-130 is a high density programmable resistor card with 4 channels which can be set between 3Ω and 6.97kΩ with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
Solar Cell I-V Characterization System
VS6825
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Industrial Vision Technology Pte Ltd.
The VS-6825A I-V test system is tailored for high-efficiency Solar cell production lines. It is able to eliminate the impact of HJT/IBC/TOPCON’s high capacitance characteristics on measurement results.
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Product
Mechanical Shock Test System
BW-MST-E5000
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The Mechanical Shock Tower develops the kinetic energy electromagnetically. An iron core "bullet" is attracted to the magnetic core of the solenoid by the dense magnetic field that is created as current flows through the field coil of the shock tower. As the bullet is drawn into the center of the magnetic field the acceleration increases exponentially as the gap reduces to zero on impact causing the high impact shock
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Product
PCI Precision Resistor Card 18-Channel, 1Ω To 62.1Ω
50-297-011
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The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Horizontal Vibration Test Systems
G-3 Series
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This series was used for the special structure of airbearing guide of inspection for Seismic Detectors andcharacterized is large displacement and high-accuracywaveform. In addition, the use of the Windows seismicdetector controller is easy to operate it.
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Product
AXIe High Performance Embedded Controller: 2.8 GHz Quad-Core, 8 GB
M9537A
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The M9537A is a second-generation AXIe embedded controller which enables new capabilities such AXIe wide PCIe support, multiple 4K video outputs, and optional high speed disk cache. It is designed for high performance, compact AXIe systems.The embedded controller is a powerful, one-slot module that easily integrates into hybrid test systems using the GP-IB, USB, and LAN front panel interfaces. Built upon a high-performance Intel Core i7 quad-core processor with Hyper-Threading Technology, it is perfect for high-performance applications and multi-tasking environments.
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Product
Zero-distance Drop Test System
KRD40 series
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KRD40 series drop tester, mainly simulates the resistance to drop and impact of large and heavy packaging products. Its strong power system and unique sample holder facilitate easy loading and unloading of oversized and overweight items and automatically rise to the setting. After the height, the drop test is completed. It can realize the drop test of the edge, surface and angle of the sample. This equipment is mainly used to evaluate the ability of product or packaging to withstand drops during transportation and loading and unloading, so as to improve product and packaging design.
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Product
PXI-2556, 2.5 GHz, 75 Ω, Dual 4x1 PXI RF Multiplexer Switch Module
778572-56
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2.5 GHz, 75 Ω, Dual 4x1 PXI RF Multiplexer Switch Module—The PXI‑2556 is an RF signal multiplexer switch module. The multi-bank architecture of the NI PXI‑2556 makes it ideal for test systems that require parallel operations such as the stimulus/response testing of video RF devices such as tuners. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Product
Armature Testing
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Electronic Systems of Wisconsin, Inc.
ESW Armature Test Systems are equipped with the latest features the market has to offer. The on-screen display makes it easier to read, track, and record your armature information. ESW's data collection software is compatible with almost any type of system that allows the user to store the information on any software platform. Our Testers store your data, so that you never have to worry about losing important information again. We will work with you to meet your customized testing needs. Please see the videos and slideshow below to view some of our Armature Testers.
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Analog Measurement Unit
AMU05
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The AMU05 (Analog Measurement Unit 05) is the core of all our test systems. It ensures that all the measurements are performed faster, more accurately and with even greater stability.
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Product
Motor Drive Analyzer, 1 GHz, 8 Ch, 12 bits, 10 GS/s, 50 Mpts/Ch
MDA 8108HD
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Static power analysis - like a dedicated power analyzer.Dynamic power analysis – capture more information.Complete test coverage – control system, power section, motor.Comprehensive mechanical interface.Harmonics calculation option.Vector display option (THREEPHASEVECTOR).Waveform Transformations option (THREEPHASEdq0).16 Channels with OscilloSYNC™.
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Product
EMC Test Systems
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The sum of EMC is not necessarily equal to its parts; any modular electronic device from a complete aircraft down to a mobile phone needs to meet EMC requirements for the device itself, even if all the individual modules are compliant. For the enormous range of types of modular device requiring EMC test, R&S offers extremely flexible and scalable EMC test systems; practically as modular as the devices under test.
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Product
Modulation Distortion Up To 125 GHz
S930712B
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S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Targets
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Targets from group A are developed to support mostly testing infrared imaging systems understood as thermal imagers. These targets can be used also in testing visible/near infrared cameras or SWIR cameras but such application is not optimal. IR targets are mostly used in DT systems for testing thermal imagers and in MS systems for testing multi-spectral systems.
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Product
Software Update For Test Development, GTE 10.00p
K8224A
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Software Update for test development is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.
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Product
PXI High Density Precision Resistor Module, 3-Channel, 3.5Ω to 395kΩ
40-298-142
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The 40-298-142 is a high density programmable resistor module with 3 channels which can be set between 3.5Ω and 395kΩ with 0.5Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Stationary Drive Test System
ACTAS CF80
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Stationary test system for sequential final factory tests and function tests on up to 8 drives. The drive test system is operated and controlled with the ACTAS operating software. The test position is selected using the multiplex method. The test system can reproduce drive control with the aid of a logic module. This makes it possible to test any drive even if there is no control unit.
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Product
Pulsed SMU Systems
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AMCAD Engineering has created professional, industry-proven pulsing technology for both pulsed-bias load pull (Pulsed Load Pull, PLP) and 50ohm transistor test applications. Systems come equipped with a mainframe controller which includes integrated power supplies and integrated input pulser with ±25V/200mA capability. The external output pulser module (probes, pulsers) is configured for 120V/30A pulsing.
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Product
Test System
ITC57300
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The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
