EHF
extremely High Frequency in the range of 30 to 300 gigahertz.
See Also: Extremely High Frequency, Millimeter Wave
-
Product
Switch Probes (Normally Open (NO)) H887KB
1001758
-
The Switch Probes (Normally open (NO)) H887KB is a highly reliable and efficient component ideal for various applications requiring precise measurements. Measuring a total length of 23.50 mm and an outer diameter of 3.50 mm, this product has been designed for versatility and ease of integration into existing systems. Its minimal collar height of just 0.20 mm enhances its compatibility, making it suitable for intricate setups where space is limited. The H887KB is a crucial part of the H887 family, featuring advanced technical capabilities that ensure excellent performance in demand-sensitive environments.
-
Product
10-Zone SMT Reflow Oven
CR10000
-
10 fully controlled upper and lower convection heating zones allow the CR10000 SMT reflow oven to provide you with a thermal accuracy of ±1˚C. Manncorp’s low-velocity, low-turbulence air flow options produce an even ΔT of ±2°C across PCB assemblies out to 22” (570 mm) wide edge-to-edge backed by throughput that can still keep pace with your high-volume production needs.
-
Product
Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe
LFRE-25J-12
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1T1-10-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2-228X (Small IF) / 230540
-
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
-
Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1H-INS-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Basic Contact Probes (138 Mil) F77312B230G150
1001520
-
The Basic Contact Probes (138 mil) model F77312B230G150, with MPN/SKU 1001520, is designed for high-performance applications requiring precision and reliability. These probes can operate in temperature ranges from -45°C to +80°C, making them suitable for various environments. The 3.50 mm (138 mil) pitch enhances their versatility in electronic applications, ensuring a reliable connection even under demanding conditions.
-
Product
Basic Contact Probes (75 Mil) H075WW19-7.6
1010836
-
The Basic Contact Probes (75 mil) H075WW19-7.6 are designed to ensure reliable electrical connections in a variety of applications. With a precision pitch of 1.90 mm (75 mil), these probes offer an optimized design for performance in electronic testing environments. Featuring a continuous current rating of 4.00 A, they are capable of handling substantial loads while ensuring minimal signal loss. The probes are equipped with a flux-proof connection type, specifically a wire wrap, making them suitable for use in environments where moisture resistance is critical.
-
Product
Basic Threaded Probes F73306S230L300
1007961
-
The F73306S230L300 is part of our Basic Threaded Probes family, specifically designed for high precision in electronic and mechanical applications. Incorporating notable features from the original website description, these probes offer reliable performance where accuracy is crucial. They are durable and versatile, functioning optimally within a temperature range of -45°C to +100°C, making them suitable for various environments. With a pitch of 4.00 mm, they ensure efficient connectivity in compact spaces.
-
Product
Measuring Benches
-
• Modern design and Bluetooth® transmission integrated• The bench tables are designed to check dimensions up to 50 mm (depends on model)• These bench tables can be equipped with different kind of tables to fit your needs as well as with several types of anvils of any shapes• A ball bearing, an adjustable and reversible measuring force, as well as many other features and accessories make these tables a must for your workshop or your inspection room• Adjustable measuring force
-
Product
Basic Contact Probes (50 Mil) F05038S050L200
1000339
-
The Basic Contact Probes (50 mil) F05038S050L200 are engineered for high-performance applications, providing reliable connectivity and precision in a compact design. Designed for a wide operational temperature range of -45°C to +80°C, these probes are ideal for various environments, making them suitable for critical electronic testing and connections. The probes exhibit a remarkable continuous current capability of up to 3 A, ensuring effective performance even under demanding conditions. Their nominal travel of 4.30 mm allows for precise contact engagement, while the maximum travel of 6.40 mm ensures versatility in application.
-
Product
Low-power, High-performance FPGA
iCE40 LP/HX
-
*Available in three series with LUTs ranging from 384 to 7680: Low power (LP) and high performance (HX)*Integrated hard I2C and SPI cores that enable flexible device configuration through SPI*Match your preferred display to your application processor with interfaces such as RGB, 7:1 LVDS and MIPI DPI/DBI*Multi-source your image sensors by implementing flexible bridges supporting common interfaces such as HiSPi, subLVDS, LVDS and Parallel LVCMOS*Up to 128 kbits sysMEM™ Embedded Block RAM*Industry’s broadest range of 0.35 mm - 0.40 mm pitch BGAs fit in space-constrained applications
-
Product
Basic Threaded Probes (F731) F73106B180G250
1001422
-
The Basic Threaded Probes (F731) F73106B180G250 is a specialized probe designed for precision applications in various environments. With a temperature range of -45°C to +100°C, this probe is well-suited for both extreme cold and moderately warm settings, ensuring durability and reliability in performance. The design features a pitch of 2.40 mm (94 mil), ideal for applications requiring exact measurements and stability.
-
Product
Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25I35-10
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Basic Threaded Probes F73111B065G500H
1030384
-
The Basic Threaded Probes (F731) F73111B065G500H model is an advanced contact probe designed to meet rigorous operational demands. This product combines exceptional reliability and precision for various applications, boasting a robust design that can withstand extreme temperatures from -45°C to +200°C. With a pitch of 2.40 mm, the F73111B065G500H delivers accurate performance, ensuring that it meets the expectations required in critical environments.
-
Product
Standard 3.74 (106.00) - 14.35 (407.00) High Frequency Probe
K-50L-QG-75
High Frequency Probe
Nominal Impedance (Ohms): 50Bandwidth @ -1dB (GHz): 12.00Return Loss @ -20dB (GHz): 3.00Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 1,575Overall Length (mm): 40.00
-
Product
Pivotal Tool FEWZ-075E65
1000747
-
The FEWZ-075E65 is a pivotal tool that falls under the category of receptacles, specifically designed for precision operations in various technical applications. With a total length of 86.50 mm, this model combines compact design with robust functionality, making it an ideal choice for professionals seeking reliable and efficient tools in their workflows. Its unique order code, 1000747, allows for easy identification and procurement, ensuring that users can confidently select this product for their specific needs.
-
Product
Alternate 2.54 (72.00) - 6.20 (176.00) General Purpose Probe
HPA-52B-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 250,000Overall Length (mil): 629Overall Length (mm): 15.98
-
Product
Basic Contact Probes (75 Mil)
1014301
-
The Basic Contact Probes (75 mil) represent a robust solution tailored for diverse applications requiring precision and reliability. With a pitch of 75 mil (1.90 mm) and a temperature range from -45°C to +80°C, these probes are designed to maintain performance under varying environmental conditions. The inclusion of high-quality materials such as steel for the plunger and bronze for the barrel, both finished with plating to enhance durability, ensures long-lasting functionality, making them suitable for both industrial and laboratory use.
-
Product
Step Probes (F733SP) F73316B0062G300SP
1000969
-
The Step Probes F733SP (Order code: 1000969) are designed for reliability in challenging environments, capable of withstanding temperatures ranging from -45°C to +100°C. These precision instruments feature a compact design with a total length of 28.80 mm and a projection height of 10.80 mm. The probes utilize a beryllium copper tip with a gold plating, ensuring superior conductivity and longevity. Designed with a nominal travel of 4.00 mm and a maximum travel of 5.00 mm, these probes enable accurate measurements with a pointing accuracy of +/- 0.10 mm, making them ideal for various technical applications.In addition to the outstanding mechanical specifications, the F733SP Step Probes deliver significant electrical performance with a continuous current capacity of 10.00 A and a typical contact resistance of just 25.00 mOhm. The materials used include a brass barrel plated with gold and a spring made from spring steel with silver plating, providing both durability and increased performance. For optimal use, compatible tools and accessories such as the FEWZ-774E0 receptacle tool and multiple tool options for the probe are available, ensuring that all user needs are met effectively.
-
Product
Kelvin Probes H810KB
1008053
-
The H810KB, also referred to as the Kelvin Probes (F810), is a specialized device designed for precision applications in electrical measurements. Its robust construction and meticulous engineering ensure reliable performance across various scenarios. With a pitch of 2.54 mm and a continuous current rating of 3.00 A, this tool is ideally suited for applications requiring accurately gauged electrical connections and measurements.
-
Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-1L24-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Standard 1.08 (31.00) - 3.50 (99.00) General Purpose Probe
EPA-2B40
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
-
Product
µHELIX® Test Probes
Series S200, S300, S400, and S500
-
Test Probes for fine-pitch applications: CSP, BGA, SiP, SoC, flex-circuits, micro pcb, sub-mm center-to-center spacing, half mm, quarter mm spacing. Excellent for use in sockets, fixtures, and contactors for semiconductor testing and in coaxial installations.
-
Product
Fine Pitch Probes (> 500 Μm) FP510D0101B035G050L166
1001356
-
The Fine Pitch Probes FP510D0101B035G050L166 are designed with precision and reliability at the forefront, making them an essential choice for companies requiring high-performance testing solutions. Engineered with a double plunger probe design, these probes feature a pitch of 0.70 mm (28 mil), allowing for meticulous connections in tight configurations. The probes operate efficiently across a wide temperature range from -45°C to +100°C, ensuring adaptability in various environmental conditions.
-
Product
High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25Z-8
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
F10014S150P100HP
1159064
-
The F10014S150P100HP is an advanced Basic Contact Probe, specifically designed for high-performance applications across a wide temperature range. It operates effectively between -45°C and +80°C, making it suitable for various environments and ensuring reliable performance under challenging conditions. This versatile probe features a compact design with a total length of 33.30 mm and a projection height of 8.40 mm, allowing for easy integration into tight spaces. The precise pointing accuracy of ±0.08 mm ensures accurate measurements, crucial for sensitive applications.
-
Product
ME2PHF-B
101512
-
The mechanical and pneumatic version of the ME2 series can be easily and simply extended with the ME2HFK high-frequency insert, which also contains the shielded housing (dimensions of lower shielded housing: 212 x 240 mm). This means that both the ME2 and the ME2P with ME2HFK insert can test sensitive and transmitting assemblies - including those with a combination of transmitter and receiver - precisely and reliably without risking any consequences for your production. At the same time, interference with sensitive assemblies can be reliably ruled out. This is because it is particularly important for tests in the high-frequency range to reliably protect your test specimens against interference radiation from the environment.
-
Product
Light Section Sensors
-
Leuze electronic GmbH + Co. KG
Switching light section sensors are designed to perform scanning, two-dimensional object detection along a laser line. They are especially well suited for completeness monitoring or product monitoring in the case of multiple track transport. The short measurement time and the detection range from 200 to 800 mm enable an inspection of the content at a high throughput rate even with deep containers. The internal data processing offers programming and differentiation of 16 different object types, thereby conserving control capacity. Complex detection tasks can be solved with one sensor. The compact housing ensures high flexibility during installation and saves installation space.
-
Product
Basic Contact Probes (100 Mil) H100LI-7.6
1010819
-
The Basic Contact Probes (100 mil) H100LI-7.6 are engineered for precision and reliability in various electrical applications. With a total length of 30 mm, these probes feature a pitch size of 100 mil (2.54 mm), making them suitable for a wide range of connectivity tasks. The exceptional design includes a flux-proof connection type using stranded wire, ensuring stable and secure connections in demanding environments. Additionally, the probes boast an outer diameter of 1.68 mm and a press ring diameter of 1.81 mm, helping facilitate easy handling and compatibility with various tools.





























