Bare Board Test
SMT and PCB check prior to being populated with components.
See Also: Bare board, Bare Board Testers
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VLF Insulation Testing
VLF testing uses very low frequencies as part of an AC cable maintenance routine. VLF testers are smaller and more practical than AC testers but output the same amount of power as a 50 Hz mains device. This combination of size and power makes Very Low Frequency cable testing perfect for testing longer sections of cable and apparatus
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Solar Radiation Testing
Solar radiation on materials can cause cosmetic deterioration with the fading or oxidation of plastic. This oxidation can make components start to fade and weaken. The heating effects of the sun can cause plastic, vinyl and/or metal components to shift or distort, causing operational interruption, shorts and false control inputs. The most significant effect is discoloration that cheapens the look of any quality product. These effects can be accentuated when combined with temperature and humidity.
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Relay And Protection Testing
As the first protection relay test set manufacturer in China, PONOVO has been always offering reliable protection relay testing equipment for customer for more than 20 years. More than 20,000 relay test kits has been supplied to users in China and other countries, including 6-phase, 3-phase, single phase relay test sets, capable of testing all kinds of protection relays, from electromagnetic relays, solid state, numerical, microcomputer relays and digital relays based on IEC61850 as well as other testings, such as, energy meter, transducer, etc. With various models with different specifications, users can definitely choose the model suitable for their testings.
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12 Bit Waveform Digitizer Board
ATS9371
With on-FPGA FFT signal processing and data throughput as fast as 6.8 GB/s (6800 MB/s), ATS9371 is an ideal solution for many applications, including next generation OCT, radar, ultrasonics, spectrometry and RF signal recording.
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High-Speed Digital Testing
Silicon Turnkey Solution, Inc.
High-speed devices create significant challenges for functional testing, for example, the need for high-bandwidth interfacing to maintain signal integrity at multi-gigabits per second data rates and the ability to measure high-speed bit error rate and jitter. STS brings extensive experience in high-speed functional testing for commercial, military and aerospace devices to meet the most stringent customer requirements. Our highly integrated testing laboratory and efficient workflow are designed with one goal in mind: to shorten time-to-market and enhance our customers’ ability to compete.
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In-Line Isolator Single Stage 1310nm Bare Fiber 250μm Without Connector
IL-S-31-25-05-OO-3422
Guilin GLsun Science and Tech Group Co., LTD
Center Wavelength 1310 nm PDL ＜0.1 dBPMD 0.25 ps Dimension Φ3.4×22 mmOperating Temperature -5 to +70°C Storage Temperature -40 to +85°C
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Test Data Management
Tequra Analytics
Tequra Analytics is a test data management and analysis solution for advanced manufacturing organisations. By using the tools provided by Tequra Analytics an extensive insight into manufacturing can be gained, enabling actions to be taken to improve quality and streamline processes. ATML Results - Industry standard format for automated test. CSV Output - Machine readable, open in spreadsheet software. PDF Reports.
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HIRF Testing
High Intensity Radiated Fields (HIRF) testing simulates high RF peak pulsed and average fields typical of radar environments and is integral to the certification of flight essential avionics systems. L3 Cincinnati Electronics (L3 CE) can perform HIRF testing from 400 MHz to 18 GHz (with traditional average field testing from 10 kHz to 40 GHz).
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SparkFun MicroMod WiFi Function Board
ESP32
The SparkFun MicroMod ESP32 Function Board adds additional wireless options to MicroMod Processor Boards that do not have that capability. This special function board acts as a coprocessor that takes advantage of Espressif's ESP32 WROOM to add WiFi and Bluetooth® to your applications.
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Instrument Test Unit
Instrument Test Unit For Advanced Inertial Sensors (INTU) is used for testing and evaluation of Ring Laser Gyro (used in GSLV/PSLV launch vehicles), that detects the angular displacement during rotation. The INTU receives displacement signals from the sensor (RLG) to evaluate the sensor characteristics and also generates signals required towards initiating the action of the sensor.
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Environmental Testing
Our multi-million dollar inventory of Environmental, Measuring, and Test equipment allows us to offer our customers expedited testing services and rapid turn-around to meet their urgent requirements.
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Cable and Network Testing
Network technicians, Network Managers, and System Installers need their twisted pair cabling system to reliably support Ethernet applications up to 10GBASE-T. Efficiently solving network connectivity problems, installing PoE devices, and managing network move, adds, and changes is essential in today’s fast-paced IoT centric environment. Fluke Networks Cable + Network Testers enable users to build and maintain their connected infrastructure.
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VXI Register-based Interface Board
VXI Register Interface mates with user's PCB to form a B or C-size module.
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V2X Test Tools
Validate and verify your V2X application with our Mx-Drive Mobility Simulator. Use the Mx-DSRC Compliance tester for USDOT certification.
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Thunderbolt V-600 Board 4-Slot
The 6U VME Thunderbolt boards provide optimal performance and reliability. The Thunderbolt V-600, configured with one Compute Module of four MPC7410 processors, provides 16 GFLOPS of computational performance per 6U VME slot. Data is transferred throughout the Thunderbolt over the SKYchannel Packet Bus. Data moves transparently through the SKYchannel P2 interface to other boards in a SKYchannel chassis.
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Surge Arrester Testing
SCAR 10
This MOV- Metal Oxide Varistor test system is the perfect device to perform analysis and diagnostics on metal oxide arrestors. It is supplied with a special current clip-on transformer designed for the measurement of current leakage.
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Test System
ETS788
The 55/110 MHz ETS788 system boasts the same small footprint and cool quiet CMOS architecture as our ETS780 but with the new high-performance precision components of our Griffin series. This powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date. Learn why the ETS788 is the perfect cost-effective solution for higher performance in Design Verification, Production and Failure Analysis.
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Encoder | Trigger Board
ADLINK encoders and trigger boards are widely used in centralized motion controllers, supporting real-time encoder feedback as well as position comparison and high-speed trigger output functions for better motion control accuracy. Encoder and trigger cards are ideal add-on options when positioning comparison points on motion cards are insufficient. ADLINK encoder and trigger cards provide PCI/PCIe interfaces and 14 built-in comparators, providing flexible output and input modes suitable for applications with high requirements for distance measurement such as high-speed advanced scanning and automated optical inspection.
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12-bit, 100KHz, 4SE/2DIFF Isolated Analog Input Board
APCI-3001-4
4 single-ended or 2 differential inputs 12-bit resolution Optical isolation 500 V 100 kHz data transfer rate Automatic analog acquisition 8 digital I/O, 24 V, isolated, timer Trigger functions Graphical display of the measured data
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Bench-top Test Jigs
Robust, easily customised, standalone kits for testing a variety of PCB's. Basic hinged-top or cam operated pusher plate, advanced cam-operated gate with fully adjustable pusher-fingers.
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Test Leads
AL-34WB
Standard Electric Works Co., Ltd
● Wire length: 1.2m approx. Silicone insulated wire (1000mm) with wire connected to straight input plugs (130mm PVC wire), and wire for clamp (100mm PVC wire). ● Outside diameter of silicone insulated wire: 5mm Outside diameter of PVC wire: 3.5mm● Input plug color: Red•Green•Black•Blue ● Current rating: 5A● Voltage rating: 300V● Designed for Milliohm meter, Micro-ohm meter, Low resistance measurement with high current injection. ● Conductor size: 40mm maximum● Safety standard: IEC/EN 61010-031 CAT IV 300V
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GPIB Serial Interface Boards
ICS's GPIB to Serial Interface boards are designed for in-chassis applications. Select boards with transparent data transfer or boards with smart firmware that can add an IEEE-488.2 interface to any serial device
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Transformer Resistance Testing
Weshine Electric Manufacturing Co., Ltd
Transformer insulation resistance deterioration is one of the most common causes of transformer failure: a failing transformer is a costly replacement in an electrical system with the potential for a long downtime. If you fail to maintain your transformer with regular insulation resistance testing (as can be carried out by the WESHINE Transformer Ohmmeter (VS-3110 series) of transformer test equipment) then it’s likely to fail before reaching its maximum operating life.
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SAP Testing
ZenQ SAP Testing Services are on-demand, providing the best testing solution for identifying application errors before they make their way into production. Enterprises normally face challenges in analyzing SAP test requirements, handling compatibility issues while configuring, customizing and integrating different modules. We help our clients ease these testing challenges by having test accelerators to bring down cost overheads.
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Configurable 3U OpenVPX Multifunction I/O Boards
NAI offers a variety of 3U VPX solutions, including rugged I/O Boards and SBCs - designed to be combined with our smart function modules - to create a COTS-based, high-density, multifunction I/O solution for most sense and response requirements.
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In-Circuit Test Systems For Sale
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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EMC Test Systems
IEC61000
N4L are the only IEC61000 EMC test system manufacturer in the world* with an on site UKAS ISO17025 calibration laboratory offering accreditation to IEC61000-3-2, IEC61000-3-3, IEC61000-4-7 and IEC61000-4-15. Calibration and trace-ability are a vital aspect of any EMC test solution and the coverage provided through N4L’s UKAS Laboratory is comprehensive. N4L’s IEC61000-4-15 calibration procedure is particularly noteworthy as it covers the entire test protocol detailed in Annex C of IEC61000-4-15. It is commonplace for specific parameters within IEC61000-4-15 (d parameters are frequently omitted from calibration procedures) to remain untested during typical flicker calibration due to the difficulty in providing trace-ability for such measurements. All tests within the test protocol of Annex C are included within the scope of accreditation and calibration procedures at N4L.
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Test Adapters
In our specially developed MG range of linear test adapters (test fixtures), we use solid aluminium components in our mechanical construction. This is to ensure the reliability and contact accuracy of the test adapter.
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Robotic Test Automation
Robotic Test Automation provides faster delivery of test execution, rather than getting bogged down in creation, execution, and maintenance of test scripts. RTA reinvents traditional application regression testing by removing the need for test script creation and maintenance. It eliminates the excessive cost, effort, and complexity of traditional testing methods, allowing you to significantly accelerate major projects and run a regression test before every application release.
