Probing
See Also: Probers, Probing Stations, Nano Probes
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Product
Probing, Monitoring & Setting
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Marposs offers solutions and equipment that make your machine tool an instrument of unprecedented precision, productivity and reliability. Touch probes and laser-based tool setters hold the cutting process accuracy in check. Our balancing actuators and many dedicated sensors guarantee that your machine tool's functional processes never deviate from their specified set points.
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Product
Vacuum Probing Systems
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Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the Vacuum Probing System. All key modules are interchangeable and upgradeable.
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Product
Probing Solutions
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High Power Pulse Instruments GmbH
Probing Solutions and Probe Arms by HPPI GmbH
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Product
Probing Machines
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Probing machine is a wafer transfer and positioning device used for testing the electrical characteristics of chips formed on wafers. This wafer test is used to sort out good and defective chips.
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Product
Portable Manual Probing Station
Model W4.0 x L6.5
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This portable manual probing station is designed for a versatile, comfortable, and accurate operation on up to 4.0” wafers or 4.0” X 6.5” printed circuit board assemblies. This turn-key, manually operated probing station, model W4.0 x L6.5, is part of the D-COAX commitment to the test and measurement and PCB fabrication industries.
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Product
Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
Probing Solutions
ES62X-CMPS
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The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.
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Product
Probing Adaptors
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Accessories primarily enable the connection between an industry standard logic analyzer footprint (D-Max, Mictor, P6860, etc) and an instrument probe. For example, a connection between a D-Max footprint and the digital channels of an MSO (Mixes Signal Oscilloscope). They can also enable the interconnect of a probe to a different industry standard footprint. Adding flying leads to a probe designed for a mictor footprint and a probe tester are also some of the accessories that are available.
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Product
AC/DC Current Probe, 50 MHz, 15A
1147B
Battery Probe
The 1147B is ideal for capturing transient current signals such as those found in motor controllers, switching power supplies, inverters and current amplifiers driving inductive loads.
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Product
Battery Probes
Battery Probe
*Charging *Connecting *Docking Station for *Medical- IOT - Communication
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Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1T-10-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Light 0.75 (21.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-25I40-2
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Elevated 2.67 (76.00) - 7.00 (198.00) Bead Probe
BTP-72F-7
Bead Target Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3J
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1Z1-8-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1V-7
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
AC / DC Current Probe, 2 MHz, 500 Arms
N2780B
Battery Probe
The N2780B current probe is an accurate and reliable solution for measuring AC and DC currents. Using a hybrid technology that includes a Hall effect sensor and an AC current transformer, the probe provides accurate measurement of DC or AC currents up to 500 Arms continuous.
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Product
Standard 2.00 (57.00) - 4.00 (113.00) General Purpose Probe
P2757G-2W1S
General Purpose Probe
Current Rating (Amps): 20Average DC Resistance lower than (mOhm): 10Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,210Overall Length (mm): 30.73Overall Length Remark: Tip 2C: 1140 mil (28.96 mm) Tip 1W: 1205 mil (30.61 mm) Tip 2W: 1205 mil (30.61 mm)
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Product
Standard 0.62 (18.00) - 5.40 (153.00) Probe
LFRE-39H-5.4
ICT/FCT Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 50,000Overall Length (mil): 1,437Overall Length (mm): 36.50
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Product
High 1.80 (51.00) - 12.60 (357.00) Switch Probe
TSP138-FK300-3
Switch Probe
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 138Test Center (mm): 3.50Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,760Overall Length (mm): 44.70Switch Point (mil): 67Switch Point (mm): 1.70
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Standard 2.20 (62.00) - 4.80 (136.00) General Purpose Probe
EPA-4A
General Purpose Probe
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type D, Ø0.80mm, 155gf
K100-D080155-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style D, Tip Diameter Ø0.80mm, Spring force 155gf, Steel with Gold Plating.
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Product
High 2.84 (81.00) - 8.00 (227.00) Bead Probe
BTP-25HF-8
Bead Target Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 2.20 (62.00) - 4.80 (136.00) General Purpose Probe
EPA-4D
General Purpose Probe
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-1Z-10
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
TSP157 Switch Probes
Switch Probe
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 157Test Center (mm): 3.99Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 984Overall Length (mm): 25.00Switch Point (mil): 67Switch Point (mm): 1.70
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Product
Alternate 1.30 (37.00) - 4.50 (128.00) General Purpose Probe
HPA-1L-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1T1-4
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High 4.00 (113.00) - 6.70 (190.00) General Purpose Probe
P2250-9-8
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,453Overall Length (mm): 36.91Rec. Mounting Hole Size (mil): 126Rec. Mounting Hole Size (mm): 3.20Recommended Drill Size: #30 or 3.20 mm
