Product

Vacuum Probing Systems

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SemiProbe

SemiProbe

Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the  Vacuum Probing System. All key modules are interchangeable and upgradeable.

Product

Probing Adaptors

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Nexus Technology, Inc.

Nexus Technology, Inc.

Accessories primarily enable the connection between an industry standard logic analyzer footprint (D-Max, Mictor, P6860, etc) and an instrument probe. For example, a connection between a D-Max footprint and the digital channels of an MSO (Mixes Signal Oscilloscope). They can also enable the interconnect of a probe to a different industry standard footprint. Adding flying leads to a probe designed for a mictor footprint and a probe tester are also some of the accessories that are available.

Product

Probing Solutions

ES62X-CMPS

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ESDEMC Technology LLC

ES62X-CMPS - ESDEMC Technology LLC

The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.

Product

Probing Machines

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Tokyo Seimitsu Co., Ltd.

Tokyo Seimitsu Co., Ltd.

Probing machine is a wafer transfer and positioning device used for testing the electrical characteristics of chips formed on wafers. This wafer test is used to sort out good and defective chips.

Product

Topside Probing In-Circuit Test Fixtures

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Circuit Check, Inc.

Circuit Check, Inc.

Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.Today’s fifth generation Pneumatic drive supports as many as 8,000 test probes with centerline spacing to 25mil, and contacting test pads as small as 0.014″.

Product

New Probing Projects

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American Probe & Technologies, Inc.

American Probe & Technologies, Inc.

The Soon to be released, 740-EPC Series of coaxial probe holder that has an embedded PC card to allow active and passive components to be integrated within the probe design. This Series can be customized by allowing with customer to order unique PC boards for specific probing applications.

Product

Probing Solutions

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High Power Pulse Instruments GmbH

High Power Pulse Instruments GmbH

Probing Solutions and Probe Arms by HPPI GmbH

Product

Portable Manual Probing Station

Model W4.0 x L6.5

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D-COAX, Inc.

Model W4.0 x L6.5 - D-COAX, Inc.

This portable manual probing station is designed for a versatile, comfortable, and accurate operation on up to 4.0” wafers or 4.0” X 6.5” printed circuit board assemblies. This turn-key, manually operated probing station, model W4.0 x L6.5, is part of the D-COAX commitment to the test and measurement and PCB fabrication industries.

Product

Robotic Probing of Circuit Cards

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BCO, Inc.

BCO, Inc.

System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.

Product

Stack Probing Sensor

L722

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Wagner Electronics

L722 - Wagner Electronics

The Model L722 Stack Probing Sensor coupled with the L612 Digital Recording Moisture Meter makes it easy to reach deep into stickered units of lumber and take accurate moisture readings without the danger of broken pins. Wagner''s electromagnetic wave technology makes it possible to take multiple readings throughout an entire stack in just minutes.

Product

Basic Contact Probe F77207S200L150

1001629

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FEINMETALL GmbH

1001629 - FEINMETALL GmbH

The Basic Contact Probes (100 mil) F77207S200L150, with order code 1001629, are designed for high-performance applications, providing reliable electrical connectivity and precision. These probes, with a pitch of 100 mil (2.54 mm) and a wide temperature range from -45°C to +80°C, ensure consistent performance across various environments. Their robust construction features a nickel silver barrel and a spring steel component, which is coated in silver for enhanced durability and longevity.

Product

Probe Systems

Mini-PS4L

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SemiProbe

Mini-PS4L - SemiProbe

The mini-PS4L series of probe systems are built using a similar concept as our patented Probe System for Life (PS4L) Architecture. The base system is built on a 300 mm x 300 mm metric breadboard and that allows the user to configure the system to meet the application and budget.

Product

Basic Contact Probe Receptacle H773DS-50

1010457

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FEINMETALL GmbH

1010457 - FEINMETALL GmbH

H773DS-50 (item number 1010457) is a receptacle for the compatible Basic Contact Probe and defines its installed position in the test fixture. As a Receptacle, H773DS-50 guides and positions the matching Contact Probe; depending on the design, the Receptacle can also provide electrical connection or insulation and supports controlled probe replacement during maintenance. Relevant installation data includes pitch 3.5 mm / 138 mil, outside diameter 3.2 mm, length 5 mm. When selecting H773DS-50, the matching probe family, installation dimensions and any required connection or insulation design should be considered together.

Product

Voltage Probe

VOL-PBE

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Lisun Electronics Inc.

VOL-PBE - Lisun Electronics Inc.

• EMI Receiver equipped with voltage probe can test disturbance voltage from load terminals or control terminals

Product

K Thermocouple Penetration Probe

TP758

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Senseca

TP758 - Senseca

"K" Type thermocouple penetration probe. °C max: 400. Response time: 4 s.

Product

High Voltage Differential Probes

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Tektronix, Inc.

Tektronix, Inc.

A high voltage differential probe is used for measuring the voltage difference between two test points where neither test point is at ground.  High voltage differential probes from Tektronix can be used for signals up to 6000 V.  These probes are the best choice for making non-ground referenced, floating or isolated measurements in large part due to their common mode rejection capability. These products are designed, manufactured, and serviced by Tektronix.