Product

Tungsten Probe Tips

T-4 Series

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Picoprobe

T-4 Series - Picoprobe

T-4 tips are for use in most standard commercial micropositioners for probing integrated circuits, pads, or lines. Each T-4 tip uses the same 10, 22, 35, 60, or 125 micron diameter tungsten wire as our Model 12C Picoprobe, but is mounted to a 0.020 inch diameter, 2 inch long tinned copper shaft.

Product

Volt Probe & Socket Testers

Non-Contact & Socket

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Amprobe Test Tools

Non-Contact & Socket - Amprobe Test Tools

Use Amprobe non-contact volt probes to safely check circuit breakers, wall sockets and fuses for voltage presence with portable, economical tools. For sockets, choose an Amprobe socket tester, which can confirm whether GFCI breakers are properly wired.

Product

Probe Configurations

EFP Series

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MOHR Test and Measurement llc

EFP Series - MOHR Test and Measurement llc

Our probe template library lets us give you inexpensive customized probe configurations for every application. Give us your application dimensions and characteristics of the media you need to measure, and we will produce a customized solution made specifically to fit your needs.

Product

Water Quality Sensors

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Omega Engineering, Inc

Omega Engineering, Inc

Omega offers combination and differential probes for accurate measurement of pH, conductivity, ORP, and disolved oxygen. Submersible sensors for use in drums, open tanks and streams are available.

Product

Gaussmeter

DX-103

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Dexing Magnet Tech. Co., Ltd

DX-103 - Dexing Magnet Tech. Co., Ltd

DX-103 Gaussmeter is a desktop gaussmeter.Which is based on he latest progress of the the Hall Effect magnetic field measuring instrument.Adapt the high stability constant current source circuit technology to design and manufacture. Test probes adapt imported GaAs linear Hall-chip, the difference between probes is small, which can be replaced directly when it is damaged, and is an ideal AC & DC magnetic field test instrument.

Product

Magnet & Integrated Variable Temperature Sample Space With DR Insert

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Cryogenic Ltd.

Cryogenic Ltd.

Adapted MCK model DR inserted into 50 mm 1.6 K300 K VTI VTI cooling power used for condensing stage of DR Versatile solution as the magnet system can also be used with other inserts and measurement probes including He3, heated probes, rotator, VSM etc.

Product

CMOS Image Sensor

CIS

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Nidec SV Probe Pte. Ltd.

CIS - Nidec SV Probe Pte. Ltd.

CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment StabilityOur advanced CIS card, the Multiplexer™, is offered specifically for high density and high parallel applications. The Multiplexer™ is built with cantilever needles held into place on one side and shorter AC™ probes on the other which leads to a more stable electrical characterization over other CIS probe card options.Contact your Nidec SV Probe Representative so we can help you find the right CIS product for your testing needs.

Product

Extraction Tool

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WIT Co., Ltd

WIT Co., Ltd

It is a simple and convenient item that allows you to search for and replace the test probe at the same time. With needle-nose pliers, when pulling out a pin in a narrow space, excessive force was applied, which could damage the adjacent pin or widen the hole diameter. With our original pulling tool that supports the minimum pitch, you can easily pull out without damaging the adjacent pin.

Product

Short Test Pin Probe

Probe 13

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Shenzhen Chuangxin Instruments Co., Ltd.

Probe 13 - Shenzhen Chuangxin Instruments Co., Ltd.

Short Test Pin Probe 13 The model CX-13 short Test Pin Probe is used to test for accessibility of small objects and meets IEC, CSA and UL requirements.

Product

Active Air Speed Transmitters

HD2903T / HD29V3T

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Senseca

HD2903T / HD29V3T - Senseca

Active air speed transmitters for ducts. Air speed, air speed and temperature, air speed, temperature and relative humidity. Analog output 4…20mA or 0…10VDC. Several Probes type lenghts available.

Product

FEA and Strain Gauge Testing

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Circuit Check, Inc.

Circuit Check, Inc.

Circuit Check began Strain Gauge Testing in 1999 when BGA/SMT technology started replacing PTH components, reducing strain levels was a reactive post fixture fabrication process. We quickly recognized that the “reactionary” process was neither efficient nor were we capable on knowing the lowest achievable strain levels. Our engineering team came up with visual tools utilized during design to easily identify areas of excessive probe force, though still not enough data was generated to identify the lowest possible strain. Finite Element Analysis software models the PCBA and test fixture and applies the pressures from test probes and board supports and indicates the micro strain level applied to the PCBA. Using the FEA software during our design process allows our engineers to modify fixture designs to attain the lowest possible micro strain before fabrication begins.

Product

Probe Tip to BNC adapter

PP005-BNC

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Teledyne LeCroy

PP005-BNC - Teledyne LeCroy

Probe Tip to BNC adapter.

Product

Interconnect Test Leads

142-1

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Electronic Specialties Inc.

142-1 - Electronic Specialties Inc.

This 64 inch pair of test leads connects with many different testing accessories and probes. Especially those found in typical test lead kits and assortments. The ends terminate in universal size 4mm banana plugs.

Product

Probe Cards

Minitile™ with Advanced Cantilever™ technology and WedgeTile™

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Celadon

Minitile™ with Advanced Cantilever™ technology and WedgeTile™ - Celadon

Each probe is designed for wide temperature ranges and so the probe expansion characteristics are closely matched to the wafer’s expansion characteristics. This allows the user to take a fast measurement while a system is in a settling or thermal stabilization mode and helps compensate for wafer expansion.

Product

Spring Contact Probes

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Merica Technology Ltd

Merica Technology Ltd

Spring Contact Probes - Test Center: 50 - 100 milsCurrent Rating: 3 - 5 ampsContact Resistance: 30 - 50 milliohmsSpring Force: 113 - 312 gf (4-11 oz)

Product

Manual Fixture Kit

230373 – CMCSK-04-01

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Columbia Elektronik AB

230373 – CMCSK-04-01 - Columbia Elektronik AB

Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.

Product

Photometric Probes for Illuminance

LPPHOT03… Series

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Senseca

LPPHOT03… Series - Senseca

The probe LPPHOT03 measures illuminance (lux), defined as the ratio between the luminous flux (lumen) passing through a surface and the surface area (m²). The spectral response curve of a photometric probe is similar to the human eye curve, known as standard photopic curve V(λ). The difference in spectral response between LPPHOT03 and the standard photopic curve V(λ) is calculated by means of the error f’1.