Probing
See Also: Probers, Probing Stations, Nano Probes
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Product
Differential Probe / Paired ProbeTOP
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*1 Measured at 23°C environment connected to PS-02/PS-03 power supply(optional)*2 Broadband Noise, Bandwidth 30 MHz*3 Referred of output*4 Must be met to achieve best performance and avoid Damage to the Probe*5 Parts#890-880-104 : Twinholder M6 and 890-880-112 : Pair of Rail Clip Connectors 4mm are optional.
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Product
Logic Probes
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Logic probes are used to analyze the logic states (high/true: logic 1 or low/false: logic 0) of digital signals. To verify and debug today’s high-speed, low-voltage digital signals, you need logic probes that can accurately acquire signals from a wide variety of electronic designs, while protecting signal fidelity. Tektronix logic analyzer probes contain a variety of connectivity options that are engineered to ensure that signal acquisition is a true reflection of your design's performance. Compare and learn more about Tektronix logic analyzer probe solutions below.
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Product
Microwave Testing
50A
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The GGB Industries, Inc., MODEL 50A probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 50A achieves an insertion loss of less than 1.0 db and a return loss of greater than 18 db through 50 GHz.
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Product
Standard 1.50 (43.00) - 4.00 (114.00) Bead Probe
BTP-25HL-4
Bead Target Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 3.00 (85.00) - 5.70 (162.00) General Purpose Probe
P2664G-1C2S
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 10Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 114Full Travel (mm): 2.90Recommended Travel (mil): 84Recommended Travel (mm): 2.13Overall Length (mil): 895Overall Length (mm): 22.73Overall Length Remark: Tip 1C: 845 mil (21.46 mm) Tip 2R: 935 mil (23.75 mm)
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Product
Probe
Net-EXP
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The NET-EXP Probe is an expandable probe that can be purchased with an initial amount of bandwidth of as little as 0.5 Gbps and expanded up to 5 Gbps by merely additional software license.
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Product
Frequency Shaped Isotropic Electric Probes
PI-SH-FCC, PI-SH-ICNIRP
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An isotropic electric field probe with shaped frequency response meeting the ICNIRP or FCC RF safety standards for occupational and general public exposure limits (see the specified frequency ranges below). Meter readings are shown in % of the STD – standard reference level, eliminating the need to know the source frequency. Probe output is proportional to RF power density in the whole specified power range, producing the correct RF power measurements in single and multi-signal environments, typically present at multiple antenna sites.
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Product
Scanners
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Our 3D scanners are equipped with a probe, which means that there is no need to disconnect your scanner when changing from scanning to probing and vace versa. the flexability of our scanners saves time and ensures reliable 3D measurements.
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Product
Current Probes
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Any one of several techniques used to measure electric current. The measurement of current ranges from picoamps to tens of thousands of amperes.
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Product
High 2.90 (82.20) - 12.60 (357.00) Switch Probe
TSP100-F180-3
Switch Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Product
Global Standard Model For 4 Point Probe Sheet Resistance Automatic Measurement System
RT-3000/RG-1000F
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*Fully automatic system for large sizes of flat panel with glass loading robot*Tester self-test function, Measurement position correction function, wide measurement range*Min. 0.1 mm meas. resolution and user programmable test pattern*Host (CIM) communication and 2-D/3-D Mapping software
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Product
Standard 0.66 (18.70) - 4.50 (128.00) Battery Probe
CP-2TB-4
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 39Full Travel (mm): 1.00Recommended Travel (mil): 30Recommended Travel (mm): 0.75Overall Length (mil): 158Overall Length (mm): 4.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Product
Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25A-10
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Temperature Probe Meter
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Temperature probes are devices used to measure temperature using contact-style sensing methods. These methods infer temperature by using probes to measure changes in a temperature-sensitive characteristic (such as voltage difference or resistance).
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Solar Cell Testers
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Solar Cell Testers are integrated systems incorporating Solar Simulator and I-V Measurement systems. PET offers Standard and Advance IV Measurement software. PET Cell Testers are capable of measuring a diverse range of solar cell parameters such as Isc,Voc, Imax,Vmax, Pmax, FF, Rsh, Rs and η cell conversion efficiency, complete light and dark I-V curves. All that needs to be done to test a cell is to load the cell, make electrical probes contact and press “Measure” icon on the I-V Measurement System software. The software will automatically open the Solar Simulator shutter, perform the test and close the shutter after the test is complete. The design is modular in nature and can be easily upgraded. Some options can added at a later time.
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Product
Environmental Test Probe, PH, Tenma 72-6783 PH Meter
72-6784
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The 72-6784 is a typical 0 to 14pH Probe with epoxy body, BNC connector. It is used with pH meter 72-6783 model.
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Product
Ultrasonic Flaw Detector
MFD660C
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MFD660C intelligent digital ultrasonic flaw detector, Mitech concentrated years meticulously developed premium product, has a lot of advantages like unique design, sophisticated manufacturing, convenient operation, powerful function. It had received customers' favored since its inception. It can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in workpiece’s interior swiftly and accurately without any destruction. With full digital 640X480 TFT LCD display, it can select the operating interface style and the LCD brightness according to environment. With humanizing interface design, the waveform show delicately. It can find the defects clearly in full screen. Single hand capable for holding operation, the curve making, probe calibration and other conventional operation can be completed automatically. Core processor CPU with 400M main frequency, it can complete the complex run quickly and realize intelligent defect analysis. Low power design with large capacity and high performance lithium ion battery module, it can work more than 10 hours continuously. Full English master-slave menu, emphasizing on user experience, collecting shortcut keys, digital shuttle rotary wheel, cross menu three operating ways in one body, customers with different habits can operate it freely. It supports many languages. Its waterproof, oil proof, dustproof function can achieve IP65 protection level. It is the necessary professional precision instrument for defect detection, quality control, on-line safety monitoring and life evaluation in fields of oil, chemical, metallurgy, shipbuilding, aviation, railways and so on.
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Product
Scanning Near Field Optical Microscope
SNOM
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SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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Product
IEC60068-2-75 Ik08 Spring Impact Hammer
CX-IK08
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Shenzhen Chuangxin Instruments Co., Ltd.
The spring Hammer consists of three principal parts: the body, the striking element and the release system. It's used to test the mechanical integrity of product enclosures. After applying the impact with the hammer, the product is examined with accessibility probes to determine access to shock, energy, and injury hazards. Built in exact accordance with IEC/EN, UL/CSA and other international standards.
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Product
HVAC/R Environmental Meter
FLIR EM54
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The FLIR EM54 is ideal for inspecting and troubleshooting HVAC/R ducting systems within residential, commercial, and industrial facilities. This meter can help you verify that duct inlets and outlets have the specified volumetric flow – a prerequisite to an efficient functional system. Featuring humidity, wet bulb, and dew point functions, the EM54 can measure deviations from proper relative humidity levels. Plus, the included Type-K contact temperature probe is useful to check electric motors and thermal equipment components for proper operating temperatures.
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Product
Alternate 2.14 (61.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-72I-6
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Standard 1.10 (31.00) - 3.85 (109.00) General Purpose Probe
HPA-64-10
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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Product
Analyzer Probe
Net-200
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The NET-200 B analyzer probe is an integral part of the NET-xTVMS, the real-time monitoring of IPTV services quality. Intended for locations at the core, edge, subheadend, etc., the NET-200B is designed to function autonomously for an extended period of time should communication with the NET-ESVR Enterprise Server be interrupted. The NET-200B is running under stable and safe Linux OS on server class computers, powered by AC or DC sources, with optional power redundancy.
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Scanning Probe Microscopes
SpectraView 2500
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* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force
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Product
Alternate 0.66 (19.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-62T1-6
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Stimulus Induced Fault Testing
SIFT
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SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Flaw Detector & Thickness Gauge
DFX-7
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Automatic: probe zero, probe recognition, and Temperature compensation.Measurement: Variety of modes to address a number of applications.Large data storage with multiple formats: Alpha numeric grid and sequential w/auto identifier.Windows PC interface software.2 year limited warranty.
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Product
Auto-Ranging Digital Clamp Meter
DCM401
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Expert Quality, auto and manual ranging clamp meter capable of voltage, current, resistance, diode, continuity, capacitance, frequency, duty cycle and temperature testing. Maximum jaw - opening diameter of 36mm, backlit LCD screen, auto power off and a useful inspection light. Supplied with test leads, temp probe, case and 3 x AAA batteries.
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MEP General Purpose Probes
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 25Test Center (mm): 0.635Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 750Overall Length (mm): 19.05Rec. Mounting Hole Size (mil): 20.5Rec. Mounting Hole Size (mm): 0.52Rec. Mounting Hole Remark: 20.5 to 21.5 mil / 0.52 to 0.55 mmRecommended Drill Size: #75 or 0.52 mm





























