Flash Device
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IEC61588 Mandrel Test Device
CX-KD13
Shenzhen Chuangxin Instruments Co., Ltd.
This Mandrel Test Device conforms to IEC60588-1 Fig6 and IEC60065 Fig14--16.The test shall be performed by fixing the specimens of thin sheets on a mandrel made of nickel plated steel or brass with smooth surface finish.
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Portable Radioisotope Identification Devices (RIIDs)
ORTEC Detective Family Hand-Held Radioisotope Identifiers (HHRIIDS or RIIDS) have been in the front line of operations to interdict the illicit trafficking of nuclear materials worldwide, ORTEC RIIDS are used every day.
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FPGA-Based Ultra-Fast Flash Programmer
XJFlash
XJFlash is an FPGA-based advanced and innovative method that uses JTAG for high-speed in-system programming (ISP) of flash memories – all serial and parallel flash devices are supported. The most common use of XJFlash is programming the SPI/QSPI NOR flash used to configure an FPGA.
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Portable Gas Measurement Devices
Teledyne Gas & Flame Detection
Looking for portable gas leak detectors to protect your staff? Teledyne Gas and Flame Detection measuring devices meet all your requirements.
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RF Device Tester
RF ITS
Sterner's automated test management system, combined with integrated RF technology modules, provides full functionality, including: Apply power to the device under test (DUT). Read and write blocks of data to set up and validate product EEPROM using a hard-wired communications interface. Scan transmitting devices or traveller barcodes and write the information to the DUT (the "sign-up process"). Inject an RF signal of known frequency and power level to test receiver sensitivity.
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Clock Distribution Devices
Analog Devices offers ultralow jitter clock distribution products that fan out given signals for wireless infrastructure, instrumentation, broadband, ATE, and other applications demanding subpicosecond performance. Our clock products are ideal for clocking high performance analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). ADI clock ICs integrate PLL cores, dividers, phase offset, skew adjust, and clock drivers in small chip scale packages.
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Integration of Flash / Controller Programming
Flash or microcontroller programming can be integrated in a wide variety of ways, depending on the type and scope of the application.
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Stand Alone Test Device
The ENGMATEC Smart Contact Cell works with goods carriers that move above and below each other. This enables the test objects to be fed in and removed in parallel, which significantly reduces handling times.
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Battery Test device
ATGB 1200
The ATGB 1200 is a battery tester for all standard battery technologies aimed at quality assurance, production and product development. Advantages of the ATGB: Creation of customized test sequences. Generation of load curves and peaks. Temperature measurement at the battery
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Flash Memory In-System Programming File Generation
ScanExpress Flash Generator
ScanExpress Flash Generator is a tool to quickly create Flash programming files for use with ScanExpress™ software. The application operates as a standalone utility or integrates into ScanExpress TPG for creation and reuse of boundary-scan test files for in-system programming (ISP).ScanExpress Flash Generator combines a board Netlist, scan chain description, and BSDL files to automatically create Flash Programming Information (FPI) files. These files include all information necessary for ScanExpress Runner™ or ScanExpress Programmer™ execution systems to perform read, write, erase, and verify operations—in-system using high performance Corelis hardware.
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1 Channel 100 MHz Flash ADC
NIMbox ADNN
NIMbox ADNN - 1 channel 100 MHz flash ADC with 3 programmable TTL I/O ports, 4 LE discriminators and 10 NIM or TTL I/O ports
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Microfluidic Device Manufacturing Solutions
We provide production automation solutions for microfluidic device manufacturing with precise liquid dispensing. We offer solutions for your POC test, molecular and immunodiagnostics and microfluidic devices manufacturing.
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DC High-Voltage Test Device
PGK 80
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PGK 80. The portable, one-piece PGK 80 high-voltage test device for generating negative DC voltage up to 80 kV is primarily used for onsite testing of paper-insulated mass-impregnated cables in the medium-voltage network. The high voltage is generated through a high-voltage transformer with secondary voltage-multiplier. The internal operating frequency of 20 kHz enables the smallest of device dimensions.* Continuous adjustable output voltage* The voltage measurement is done directly at the high voltage output* Timer of 1-30 min* Sensitive current measurement for recording the smallest of insulation currents with 6-time range switch, decadal
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Flash Photolysis Spectrometer
Vernier Software & Technology, LLC
The Vernier Flash Photolysis Spectrometer is a simple, user-friendly device for demonstrating the fundamental principles of chemical kinetics and photochemistry to undergraduate chemistry students.
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Charge-Coupled Devices ("CCD") Cameras
Improve limits of detection and quantification. The camera generates large amounts of data, but handles it smoothly via the new super speed USB 3.0 interface.
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Passive Devices
Passive Devices by Senko - attenuators, fused products, optical switches, plc splitter series, routing, WDM series, and more
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PCI-8532, 1-Port, DeviceNet Interface Device
781062-01
The PCI‑8532 is a high-speed DeviceNet Interface for developing applications with the NI‑Industrial Communications for DeviceNet driver. DeviceNet is based on the controller area network (CAN) physical layer and increases strength and interconnectivity by specifying various parameters, such as the required cable length, connectors, and baud rates. The DeviceNet specifications are managed by OVDA, Inc. You can program the PCI‑8532 to add high-performance master/scanner or slave capabilities to DeviceNet networks.
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DC High-Voltage Test Device
PGK 50
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PGK 50. The portable, one-piece PGK 50 high-voltage test device for generating negative DC voltage up to 50 kV is primarily used for onsite testing of paper-insulated mass-impregnated cables in the medium-voltage network. The high voltage is generated through a high-voltage transformer with secondary voltage-multiplier. The internal operating frequency of 20 kHz enables the smallest of device dimensions.* Continuous adjustable output voltage* The voltage measurement is done directly at the high voltage output* Timer of 1-30 min* Sensitive current measurement for recording the smallest of insulation currents with 6-time range switch, decadal
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G7 Connected Safety Devices
Our G7 product line incorporates leading incident detection and advanced location technology with 3G and satellite communications to ensure seamless monitoring. From gas detection to lone worker monitoring and evacuation management, G7 has your teams covered.
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Highest Throughput For Fragile Devices
Ismeca NY20
20-position turret platform for semiconductor test, inspection and packaging, provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity.
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Biomagnetic Devices
Electrical measurements of physiological potentials are well established in clinical diagnostics. The flow of an electrical current creates a corresponding magnetic field. Thus bioelectric activity will generate biomagnetic fields. These fields can be detected with Tristan SQUID magnetometers. For many of the classical electrical techniques such as ECG and EEG, there are corresponding magnetic techniques (magnetocardiography or MCG and magnetoencephalography or MEG). In some cases (magnetopneumography, hepatic iron store measurements, intestinal ischemia, peripheral nerve and muscle activity), there is no corresponding electrical technique and biomagnetic measurements offer unique measurement capabilities. Unlike CT or MRI imaging which yield structural information, biomagnetic measurements offer real-time functional imaging.
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Photonic Device Assembly
Although the lion’s share of photonic device assembly is still for discrete components and devices, the recent developments in photonics integration illustrate well the ensuing dramatic evolution of the photonics market. In transitioning from the use of bulky macro-systems to micro-optical components to integrated optics, the photonics sector is experiencing what has become true for the electronics market since the 1970’s.
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Discrete Device Test System
capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing.
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Rugged Aircraft Interface Devices
AB2-AID
The AB2-AID is ready to go with high-performance avionics I/O combined with valuable built-in features such as a 9-port Ethernet switch, Ethernet to serial bridge, and 8GB flash memory. All in a compact, rugged package for easier integration and longer life.
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Wired Serial Device Server
SD-300
The Silex SD-300 and SD-310AN are designed to easily connect and share RS-232 serial devices over a wired or wireless network. Industrial automation, building automation, medical devices, security access and control, point of sale devices, LED signs, bar code/label and other specialty printers, or virtually any other device with a serial port can be now be enabled with secure, robust wired or wireless network capability.
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3U VPX Flash Storage Module
Curtiss-Wright Defense Solutions
The 3U VPX (VITA 46 and 48.2) Flash Storage Module (FSM) provides high-performance, high-capacity, solid-state SATA storage with AES-256 bit encryption using an Application Specific Integrated Circuit (ASIC) that is FIPS-140-2 validated (Certification #1472). The 1" pitch conduction-cooled solid state storage device utilizes high reliability SLC NAND flash designed for the most demanding application.
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Differential And I/Q Device Measurements
S97089B
The S97089B combines source-phase control of multiple internal or external sources with frequency-offset mode, enabling simplified test of I/Q modulators/converters, differential mixers, and harmonics or amplifiers
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High-Voltage Test Device
PGK 110 HB
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PGK HB. There are hardly any other longer-lasting, more robust and cost-effective testing devices than the two-piece high-voltage test devices from the PGK HB series. They generate continuous adjustable test voltages with mains frequency or optionally DC with positive or negative polarity. The display instruments for current and voltage, the safety control unit and the regulating transformer for the voltage are integrated in the operating unit.* Testing of medium- and high-voltage cables* DC voltage testing of up to 110 kV output voltage with positive or negative polarity* AC voltage testing - up to 80 kV for switchgear, busbars and insulating elements* Easy-to-maintain 2-piece design
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Backend Test For Packaging Devices
Power MOSFETs need a lot of different tests. We understand backend test, and have over 80% of our installations used in this application, operational 24hrs every day delivering fully tested and QA approved products at throughput rates up to 20kuph. Backend test, for power devices in particular, has a diverse, but well-established list of technical demands to detect both failures and failure mechanisms.
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Pinhole Detection Devices
ElektroPhysik Dr. Steingroever GmbH & Co. KG
The coating control by means of pore testing makes use of electrical voltage in order to uncover microscopically small defects (> 20 μm) in the coating of a surface. If even a small defect can be detected during pore testing of surface coatings, urgent action is required. Minimal flaws in the coating are sufficient to cause great damage.
