Pattern Generators
Produces volumes of a binary stream to test digital elements.
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Pattern Generators
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A Pattern Generator outputs digital data and is used to stimulate circuits. The data can be from user files, previously captured data or from the data creation wizard (editor) in the software. All of our Pattern Generators (digital word generators) are also Logic Analyzers and are controlled with easy-to-use Windows software. Some or all of the outputs are bi-directional and can be used to capture data.
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Product
Pattern Generators
PG311P Series
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The MicroImage PG311 series of pattern generators are for applications to display custom designed patterns on screen. The PG311 units will overlay the pattern or patterns on top of the video signal provided to the input of the device. The PG311 can be factory programmed with one unique pattern.
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Pattern Generators
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Active Technologies Data Pattern Generators offer a complete and unique portfolio of instruments to address a wide range of applications starting from Digital Logic and Semiconductors characterization, Aerospace & Defense compliance testing, Mixed Signal Systems testing to Signal Integrity experiments.
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16-channel, 1GHz, 1Mb/ch USB Logic Analyzer Plus 8-Channel Pattern Generator
LA-Gold-16
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A maximum sampling rate of 1 GHz is available on all channels. The LA-Gold-16 has a large data buffer of 1 Mega samples per channel for sampling rates of up to 500 MHz on all 16 channels. The large buffer allows long capture times at high sampling rates. The digital logger function is for capturing very slow varying signals, e.g. room temperature.
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Digital Waveform Acquisition, Digital I/O, Pattern Generators
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Digital I/O cards, pattern or pulse generators and digital data acquisition cards are all focused on digital signals. Input and output signals have two logic levels called low state (0) and high state (1). The electrical representation of these logical levels depends on the logic family and the supported I/O standard.
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Light Shaping
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VirtualLab Fusion supports light shaping by freeform surfaces, diffractive beam splitters and pattern generators, diffusers, and general arrays of micro-optical components, including, but not limited to, micro-lens arrays.
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Economical Solution for Test Requiring Fewer Instrumentation Modules.
OPTOWARE-S200 (FOTS-Bench Top Series)
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•LD Driver, EDFA, ASE Broadband Source, 1X4 Optical Switch•Variable Optical Attenuator, Wavelength Meter•SOA Driver, SLED Driver, Pump LD Driver•Pattern Generator & BERT, SFP Transceiver Driver•4Channel Optical Return Loss Meter (Light Source & Power Meter)
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Single Channel Error Rate Tester
Basic Bert
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Already as a single channel BERT the PARALLEX® system offers full functionality for testing high speed components. PRBS and user pattern generation and error detection for 2..13Gbit/s.
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CMOS/CCD Production Test System
System 1828
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The basic system consists of a 225 MHz pattern generator, 10 clock drivers, 6 DC biases, 1-4 channels of 10 MHz 14 bit analog data acquisition and/or 1-4 channels of digital acquisition. Additional options can be added to customize the system to meet your requirements.
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Pattern Generators
PG314P Series
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The MicroImage PG314 series of pattern generators are for applications to display custom designed patterns on screen. The PG314 units will overlay the pattern or patterns on top of the video signal provided to the input of the device. While the PG311 can be factory programmed with only one unique pattern, the PG314 can hold up to four patterns and switch between them.
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Pattern Generators
PG311N Series
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The MicroImage PG311 series of pattern generators are for applications to display custom designed patterns on screen. The PG311 units will overlay the pattern or patterns on top of the video signal provided to the input of the device. The PG311 can be factory programmed with one unique pattern.
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Test Pattern Generator Software
ScanExpress TPG
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To deliver a product meeting the highest standards of quality and reliability, design engineers and test engineers alike must maintain test capabilities throughout the entire product life cycle, from prototype to manufacturing. Automation in test generation is essential to ensure that tests keep up with the rapid development of modern products.The ScanExpress TPG™ Intelligent Test Pattern Generator Software provides a highly advanced, automated boundary-scan test design environment—perfect for quick and efficient creation of complete boundary-scan tests for all IEEE-1149.1 and IEEE-1149.6 compliant circuit boards.
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Pump Laser Diode Driver
S-110
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•LD Driver, EDFA, ASE Broadband Source, 1X4 Optical Switch•Variable Optical Attenuator, Wavelength Meter•SOA Driver, SLED Driver, Pump LD Driver•Pattern Generator & BERT, SFP Transceiver Driver•4Channel Optical Return Loss Meter (Light Source & Power Meter)
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Bit Error Test & Arbitrary Waveform Generation
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SHF Communication Technologies AG
SHF’s Bit Pattern Generators (BPG) or Pulse Pattern Generators (PPG), Error Analyzers (EA) and remote heads form a Bit Error Ratio Tester (BERT) suite, which supports a vast number of different applications including high speed Ethernet rates like 100GbE, 200GbE, 400GbE and 1TbE. When it comes to signal generation an Arbitrary Waveform Generator (AWG) is the all-in-one device suitable for every purpose in Telecommunication, Optics, Medicine, Radar, Physics or even Quantum Computing.
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PAL Standard Pattern Generator
PG315P
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The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
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ATPG with Embedded Compression
TestKompress
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TestKompress is an automatic test pattern generation (ATPG) tool that provides the highest quality scan test with the absolute lowest test cost. TestKompress has an industry-proven ATPG engine that applies effective fault models to your entire logic design. Manufacturing test costs are held in check by an award-winning test pattern compression technique called Embedded Deterministic Test (EDT).
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PC-based logic analyser
Annie-USB
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A top-quality 8-channel PC-based logic analyser with probably the highest specifications in its class, this Janatek product is excellent value for money. It captures data at a maximum rate of 500MHz, has a buffer depth of up to 1 Meg samples per channel, and incorporates an 8-bit pattern generator to aid debugging.
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Video Signal Generator
MSPG-8000
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The MSPG-8000 is a high performance slot type multi video test pattern generator. You can add-on any type signal generator such as HDMI, Displayport, DVI, Analog, Component, S-Video, CVBS, SCART, and audio, up to 8 slots.
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Standard Pattern Generator Board
BL-PG315-01
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The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
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Pulse Generator Applications
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Quantum Composers offers a diverse family of pulse generators, or pattern generators, test equipment used to produce pulses, or rectangular waves, at an adjustable repetition rate, pulse width, amplitude, polarity, rise time and delay.
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PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Gesture, Color Sensors & Proximity Detection
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The gesture product family performs advanced gesture detection, proximity detection, digital Ambient Light Sensing (ALS) and color sensing (red, green, blue and clear). It also implements optical pattern generation for barcode transmission and remote controls. The gesture sensor modules provide a highly integrated solution offering five essential functions to enable a touchless interface and to optimize the end user experience of communications and consumer electronics equipment. Gesture detection uses four directional photodiodes to sense IR energy emitted from the integrated LED, converting the measurements of reflected IR light into information about physical
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NTSC PATTERN GENERATOR
PG-28
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Model PG-28 NTSC Pattern Generator can be use to quickly and easily troubleshoot, test, and align NTSC television. Features a wide selection of popular video patterns including Color Bars, Crosshatch, Dot, Staircase, Circle, Center Cross, Window, and Raster for accurate and comprehensive TV troubleshooting and testing. Supports both progressive and interlace scanning system. Composite video and S-Video output. 1KHz audio tone for audio troubleshooting.
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Color Pattern Generator
CG-971
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Analog video signal/Audio signal output. Conformity with NTSC,PAL,PAL-M and TNSC-4.43. Selectable sync level. Available for various and output patterns by system file* Each staircase level in step pattern settable by voltage. Natural image and Monoscope pattern output. Max. 24 pattern installation. Auto sequence mode. GP-IB, RS-232C, and Digital IF (TTL) for remote control. Half rack size of 19 inch EIA 2U.
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Pulse Pattern Generator, 3.35 GHz, dual-channel
81134A
Pulse Generator
When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. On top of that, it allows to generate application-specific signal levels like pre- and de-emphasis (PCI Express) or squelch (Serial ATA). The Keysight 81134A lets you test your DUT instead of the pulse or data source!
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Display Color Analyzer
Model 7123
Analyzer
Luminance and chromaticity measurement of Color Display0.005 cd/m2low luminance measurement (A712301)Wide luminance range: 0.0001 to 25,000 cd/m2 (A712301) 0.01 to 200,000 cd/m2 (A712302)High accuracy measurementMaximum 9 display modes: xyY, TΔuvY, u’ v’ Y, RGB, XYZ, Contrast, ProgramAble to control Video Pattern Generator and UUT (Unit Under Test)Built-in contrast measurement function to calculate the contrast ratio directlyEquipped with programmable test items that can complete the planned tests with one single buttonSupport USB flash disk that can copy the test procedures to other station for useJudgment function embedded to judge the test result automatically with one single buttonCalibration period setting and reminding functionMemory for storing 100 channels of standard color data and calibration dataBuilt-in flat display calibration data LCD-D65 & LED-D65* to be applied for chromaticity measurement instantlyOptional display white balance alignment system can be used to integrate all optical test stations to one single station
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NRZ Bit Error Rate Tester
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Shenzhen Golight Technology Co.,Ltd
BERT integrates pulse pattern generator(PPG) and high sensitivity error detector(ED) to achieve the error rate measurement of data transmission in high speed communication. BERT can support multi-channel output and input and output polarity upset. It provides a best solution for the automated production test of the high speed optical transceiver.
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Remote Intelligent Pod
ScanTAP
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The test patterns generated by the PCI-1149.1/Turbo controller are distributed to the target system either directly through ScanTAP 4 and ScanTAP-8 pods. The ScanTAP-4 and ScanTAP-8 pods can apply test vectors and/or ISP patterns to target boards with a variety of JTAG chain topologies. In the simplest case, the ScanTAP-4 and ScanTAP-8 will provide the interface between the PCI-1149.1/Turbo controller and a target system consisting of a single JTAG Test Access Port (TAP). This would be the case where the target system consists of one JTAG chain and its single associated TAP.
