Particle Impact Noise Detection
vibration, shock, and acoustics testing conducted to find particulate contamination.
See Also: Particle Impact Noise Detectors, PIND
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Product
Particle Impact Noise Detection (PIND) Test
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This test detects the presence of free moving particulate contaminants within sealed cavity devices. This test is specifically directed toward relays and other devices where internal mechanism noise makes rejection exclusively by threshold level impractical. This test method also may be used prior to final sealing in the manufacturing sequence as a means of eliminating loose particles from the interior of the device.
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Particle Impact Noise Detection
BW-LPD-DAQ4000
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Computer based controller with predefined MIL-STD test sequences stored (New)Create unlimited custom tests with multiple vibration frequencies and acceleration and other parameters to meet unique requirements (New)
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Product
Noise Source Test Set, 10 MHz to 26.5 GHz
N2002A
Noise Source
The N2002A noise source test set is a low cost, stand-alone instrument that, as part of a calibration system, enables fast, repeatable calibrations with minimal levels of uncertainty.
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Product
SNS Series Noise Source 10 MHz to 18 GHz (ENR 6 dB)
N4000A
Noise Source
The SNS series N4000A noise source is designed for accurately measuring devices with low noise figure, with a frequency range of 10 MHz to 18 GHz and nominal ENR 6 dB.
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Product
Ultra-Low Noise Filter, 42 V / 105 MA, 50 Ω
N1298B
Noise Filter
The N1298 Series is a collection of low noise filters for the Keysight B2960 Series 6.5-digit low noise source.
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Product
Noise Source, 10 MHz to 18 GHz, nominal ENR 6 dB
346A
Noise Source
The Keysight 346A noise source is the ideal companion to Keysight's noise figure solutions. Since it is broadband (10 MHz to 18 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty; reflections of test signals. The very small change in reflection coefficient (<0.01) from ON to OFF is designed especially for accurate characterization of input-impedance-sensitive devices (like GaAsFETs and many UHF amplifiers).
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Noise Figure Analyzer, Multi-touch, 10 MHz to 26.5 GHz
N8975B
Low-Frequency Noise Analyzer
The N8975B high performance noise figure analyzer is designed to make fast, accurate and repeatable noise figure measurements. When paired with an SNS Series noise source and U7227 Series USB preamplifier the ENR data from the SNS and USB preamplifier data automatically downloads into the N8975B.
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Noise Figure Analyzer, Multi-touch, 10 MHz to 3.6 GHz
N8973B
Low-Frequency Noise Analyzer
The N8973B high performance noise figure analyzer is designed to make fast, accurate and repeatable noise figure measurements. When paired with an SNS Series noise source and U7227 Series USB preamplifier the ENR data from the SNS and USB preamplifier data automatically downloads into the N8973B.
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Noise Source, 1 GHz up to 50 GHz
346CK01
Noise Source
The Keysight 346CK01 is the ideal companion to Keysight´s noise figure solutions when working on high frequency applications. Since it is broadband (1 GHz to 50 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty, which are reflections of the test signals. This is a coaxial noise source with a 2.4 mm coaxial connector. ENR typically 20 dB at 1 GHz, decreasing to typically 7 dB at 50 GHz.
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6.5-Digit Low Noise Power Source, 32 W, 210 V, 3 A, 2-Channel
B2962B
Low Noise Power Source
The Keysight B2961B Series 6.5-digit low noise source power supplies provide a power supply and source solution that meets the difficult measurement challenges researchers, designers, and developers face working on advanced components, circuits, and materials.
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Product
Millimeter-Wave Noise Source, R-band, 26.5 to 40 GHz
R347B
Noise Source
The Keysight R347B noise source covers a 26.5 to 40 GHz frequency range. This waveguide noise source allows you to make accurate and convenient noise figure measurements on millimeter-wave devices. The R347B provides highly precise broadband noise at the input of the system or component under test. The noise figure meter then processes the ON/OFF ratio of noise power present in the system IF, and provides an accurate reading of noise figure and gain. The R347B noise source has remarkable ENR stability over time, which allows longer recalibration cycles and more accurate noise figure measurements.
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Product
Noise Source, 1 GHz up to 40 GHz
346CK40
Noise Source
The Keysight 346CK40 is the ideal companion to Keysight´s noise figure solutions when working on high frequency applications. Since it is broadband (1 GHz to 40 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source greatly reduces measurement uncertainty, which are commonly reflections of the test signals. This is a coaxial noise source with a 2.4 mm coaxial connector. ENR typically 14 dB at 1 GHz, decreasing to 5 dB at 40 GHz (typical).
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Product
SNS Series Noise Source 10 MHz to 18 GHz (ENR 15 dB)
N4001A
Noise Source
The SNS series N4001A noise source is ideal for general purpose use with a low reflection coefficent and a nominal ENR of 15 dB from 10 MHz to 18 GHz.
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Product
Noise Source, 10 MHz to 18 GHz, nominal ENR 15 dB
346B
Noise Source
The Keysight 346B noise source is the ideal companion to Keysight's noise figure solutions. Since it is broadband (10 MHz to 18 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty; reflections of test signals. The 346B's high ENR, low SWR, and variety of connectors make it a general-purpose noise source. Add special option H01 for high ENR (21 dB typical) to measure high noise figure devices, or option H42 for measuring Direct Broadcast Satellite (DBS) low noise block converters.
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Phase Noise Test System
N5511A
Phase Noise Analyzer
The Keysight N5511A phase noise test system (PNTS) lets you measure at the limits of physics with readings down to kT (-177 dBm/Hz). The N5511A PNTS is a replacement for the gold-standard Keysight E5500 phase noise measurement system and is designed to meet the needs of phase noise power users.
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Impact Tester - Impact Testing Machine
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Impact tests are used to measure the resistance to failure of materials to a suddenly applied force. The test measures the impact energy, or the energy absorbed prior to fracture. ToronTech™ offers advanced Impact testing machines to measure that energy through drop weigh tear test and Charpy impact test. We also offer machines for the preparation of specimens for these tests.
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Impact Tools
D914™ Series
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The D914™ Series impact tools provide quality terminations on the first punch, helping to achieve the highest quality possible on network installations. They are the only impact tools that combine torque and impact in one tool. They also include a built-in hook and spudger into the handle. Use the hook to remove wires from any style block or to help trace wires. Use the spudger to remove the cross-connect module from the mounting bracket. Quick and easy blade replacement, and extra blade storage available in the handle.
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Product
Particle Impact Detection System 10
BW-LPD-DAQ4000HD
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This system is capable of vibration testing up to 10 pounds and detecting defects that produce noise, such as loose screws, particles, etc. Right from the start of PIND testing, B&W patented the first MIL-STD compliant system outperforming the competition by over 30% better detection rate as tested by the NBS (now National Institute of Science and Technology) in a well known 1978 study (NBSIR 78-1590 NASA).
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Product
Low-Noise Filter, 210 V / 3 A
N1298C
Noise Filter
The N1298 Series power source accessories are a collection of low noise filters for the Keysight B2960 Series precision source / measure units (SMUs).
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Pendulum Impact Testers
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Qualitest offers Charpy / Izod Impact Testers with capacities up to 750J meeting and exceeding ASTM E23, ISO, DIN, JIS, standard requirements. The key benefits of this line of top technology models are price competitiveness, extremely high precision and durability, automatic motorized lifting of the pendulum hammer to optimize cycle times, flexibility, efficiency for low/high temperature testing, and much more. Optionally we offer temperature chambers, automated sample handling, centering device, Charpy sample preparation and broaching machines for preparation of notched bar specimens.
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Particle Image Analyzer
DRK-7020
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Shandong Drick Instruments Co., Ltd.
Determine the melting point to detect the purity of crystal material. Mainly used for determination of medicine, dyestuff, spice, and other crystal organic compounds’ melting point. Using photoelectric automatic detection, dot matrix image liquid crystal-display technology, and digital keyboard input. The instrument can measure three samples at the same time and has the initial melting, final weld automatic display, automatic recording of melting curve, automatically determine the melting point of the mean value function. The temperaturesystem uses highly linear platinum resistance as detection elements and PID regulation technology, improved the melting point’s precision and reliability. The instrument establishes communication with PC through the USB or RS232, printing or saving the curve and it uses capillary Pharmacopoeia as sample tube.
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Phase Noise Analyzer and VCO Tester
FSWP
Phase Noise Analyzer
The R&S®FSWP phase noise analyzer and VCO tester features very high sensitivity thanks to extremely low-noise internal sources and cross-correlation. It can measure phase noise and amplitude noise in mere seconds on highly stable sources such as those in radar applications. Additional options such as pulsed signal measurements, residual phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the R&S®FSWP a unique test instrument.
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Hammer Impact Testing
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EDM Modal Hammer Impact Testing provides the necessary features for a single-operator experimental modal test. The Hammer Impact GUI features an intuitive step-by-step process, allowing a user to easily go through the setup and then the testing.
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Advanced Low-Frequency Noise Analyzer
E4727B
Low-Frequency Noise Analyzer
Get a deeper, closer look at low frequency noise with the A-LFNA integrated with WaferPro Express, featuring data analysis, wafer prober control and test suite automation.
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Particle Impact Noise Detector
BW-LPD-D4000
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FREQUENCY: SINE WAVE 27Hz TO 265HzACCELERATION: 0 TO 20G PEAKSHAKER: 100 FORCE LBS 3/4" IN STROKE 75 IN PER/SEC VELOCITYAMPLIFIER: 250 WATTS MINIMUMD.U.T. WEIGHT: 300 GRAMS PRACTICAL LIMIT @ 20G
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Magnetic Particle Inspection
NDT
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DCM Tech offers a comprehensive selection of Magnetic Particle Inspection machines for non-destructive testing (NDT). Easily and quickly detect internal and subsurface damage on critical parts. Contact DCM to speak to your regional Technical Specialist about adding an MPI to your shop.
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Metal Detection
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The Elcometer Metal Detection range includes Valve Box Locators that are rugged and simple to use making them the ideal choice for all location work in all types of terrain.
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Remote Particle Sensors
3718-A And 3719-A
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Kanomax Remote Particle Sensors with analog output are designed to fit into your existing monitoring system, or they can be used as a stand-alone unit to monitor a critical area when connected to an alarm or controller. With two models available, these 2-channel remote particle sensors are capable of Modbus communication via RS485 interface. 0.1 cfm and 1.0 cfm flow rate models are available, along with flexible 4-20mA analog output with the 1.0 cfm unit (only).
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Noise Board
332D-11 VG
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This printed circuit board was designed to original specifications and contains OEM specified parts. This board is required for testing the 332D-11 series gyros. Also contained on board is the Method A type calibration and sample and hold circuits required to perform the calibration of the noise circuits.
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Biological Detection
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Collaborating with government agencies in the USA and UK in the field of biological threat detection, Kromek is working towards the common goal of improving the early detection of biological threats anytime and anywhere, making the world safer and healthier.
