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Product
Memory Test System
T5801
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Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
Memory Testing
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C.C.P. Contact Probes Co., LTD.
Standard and Custom test solutions for RAM, Flash and many other memory chips.
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Product
Memory And Storage
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Intel provides technically advanced products that support every level of computing—from data center workloads to enthusiast usage. Intel® Optane™ memory creates an accelerated bridge between memory and storage. Intel® Solid State Drives (Intel® SSDs) provide storage flexibility, stability, and efficiency.
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Product
Memory Test System
T5851/T5851ES
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The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Programmer Memories VP-598
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Support more than 21 637+ memories . We are official distributor of Wellon products in Poland. Our customers receive 3 years warranty and 72h support.
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Product
Reflective Memory PCIE card
PCIE-5565PIORC
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The PCIE-5565PIORC low profile PCI Express (PCIe) Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM.The local SDRAM provides fast Read access times to stored data. Writes are stored in local SDRAM and broadcast over a high speed fiber-optic data path to other Reflective Memory nodes.
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Product
Memory Interface Chips
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Providing memory bandwidth and capacity to unleash the power of multicore processors
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Product
Memory Test Systems
T5503HS2
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Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Product
Memory Test Software
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Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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Product
DDR4 Pro Memory Test Adapter
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This memory test adapter for the RAMCHECK LX includes an extraordinarily rugged test socket for many thousands of insertion/removal cycles.
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Product
Memory Analysis Software for Logic Analyzers
B4661A
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DDR3, DDR4, DDR5, LPDDR2, LPDDR3, LPDDR4, and LPDDR5 Analysis . The Keysight B4661A memory analysis software offers a suite of options that include the industry’s first protocol compliance violation testing capability across speed changes, a condensed traffic overview for rapid navigation to areas of interest in the logic analyzer trace, powerful performance analysis graphics, and DDR and LPDDR decoders. With the B4661A memory analysis software and a Keysight logic analyzer*, users can monitor DDR/2/3/4/5 or LPDDR2/3/4/5 systems to debug, improve performance, and validate protocol compliance. Powerful traffic overviews, multiple viewing choices, and real-time compliance violation triggering help identify elusive DDR/LPDDR system violations.
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Product
Shared Memory Network XMC Interface
XMC-SMN
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Avionics Interface Technologies
2.125 Gbps Optical loop network - Single-mode and Multi-mode optical interfaces supported - Up to 256 Shared Memory Network nodes supported - Up to 200 MByte/sec sustained data rates - Maximum 500 nS latency between nodes - Network interrupts supported - Software Drivers available for Windows, Linux, LabVIEW Real-Time, and VxWorks
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Product
Ultra-high Performance Solution for Memory Device Test
Magnum EPIC
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Teradyne’s Magnum EPIC is a high-performance test solution for latest generation DRAM devices. These devices are key enablers for technologies like 5G, AI, cloud computing, autonomous vehicles, AR/VR and applications with high definition graphics.
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Product
64 Gbaud High-performance BERT
M8040A
Bit Error Rate Tester (BERT)
The Keysight M8040A is a highly integrated BERT for physical layer characterization and compliance testing. With support for PAM-4 and NRZ signals and data rates up to 64 Gbaud (corresponds to 128 Gbit/s) it covers all flavors of 200 and 400 GbE standards.
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Product
Automated Memory Analyzer
Volatility
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Volatility has become the world’s most widely used memory forensics platform. The project is supported by one of the largest and most active communities in the forensics industry. Volatility also provides a unique platform that enables cutting edge research to be immediately transitioned into the hands of digital investigators. As a result, research built on top of Volatility has appeared at the top academic conferences and Volatility has been used on some of the most critical investigations of the past decade. It has become an indispensible digital investigation tool relied upon by law enforcement, military, academia, and commercial investigators throughout the world.
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Product
Memory Analyzers
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Market drivers in the memory sector have changed. Gone are the days of simply pushing Moore’s Law to ever faster data rates. The memory designs of today and tomorrow must also be smarter than ever before. Today, handheld and wearable computers must draw from a limited battery reserve while serving up fast, responsive, and compelling mobile experiences. Meanwhile the cloud of data centers and server farms that feed us these compelling experiences must continuously grow while simultaneously reducing overhead and environmental impact. These two different markets have the same goals: smarter memory, smarter control systems, and lower power usage.
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Product
Bit Error Rate Tester - PXI
BERT 1001/1005 Series
Tester
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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Product
Single channel Memory Earth Resistivity and IP Meter
SuperSting R1 IP
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The SuperSting R1 IP is a state-of-the-art single-channel portable memory earth resistivity meter with memory storage of readings and user defined measure cycles. It provides the highest accuracy and lowest noise levels in the industry.This new instrument is based on technology developed for the famous SuperSting R8/IP multi-channel instrument.
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Product
Performance Profiler / Memory Leak Detector
GlowCode
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GlowCode is a complete real-time performance and memory profiler for Windows and .NET programmers who develop applications with C++, C#, or any .NET Framework-compliant language. GlowCode helps programmers optimize application performance, with tools to detect memory leaks and resource flaws, isolate performance bottlenecks, profile and tune code, trace real-time program execution, ensure code coverage, isolate boxing errors, identify excessive memory usage, and find hyperactive and loitering objects.
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Product
Memory Products
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The electronic systems we use today require some form of memory for data and software storage. As a leading supplier of high-quality memory products, we offer a broad portfolio of serial EEPROM, serial EERAM, parallel EEPROM, OTP EPROM, serial Flash, parallel Flash, serial SRAM, NVSRAM, and CryptoMemory® security ICs to meet your memory needs. We also offer the industry’s first commercially available serial memory controller for use in high-performance data center computing applications. Our extensive testing protocols have ensured industry-leading robustness and endurance along with best-in-class quality to provide you with reliable products, dependable technical support and a consistent supply of devices throughout your product’s lifecycle.
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Product
Memory Burn-in Tester
B6700 Series
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B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
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Product
8k Frame memory Board
GG-169
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GG-169 is a frame memory board that supports high-speed data transfer and can input and output uncompressed 8K video.With 12G-SDI × 4 lines (up to 8 lines with the use of an optional expansion board) equipped as standard, it achieves real-time output of 8K / 59.94p.
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Product
Memory Test System
T5830/T5830ES
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Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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Product
Shared Memory Network
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Avionics Interface Technologies
AIT's Shared Memory Network (SMN) interface modules provide host systems with an interface to a high speed (2.125 Gbps) optical data network which can be used to share data, in real-time, between multiple distributed systems.
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Product
Automated Coherent Receiver Tester
CoRx Tester.
Receiver Tester
Quantifi Photonics’ CoRx Tester provides automated measurement of key coherent receiver performance parameters. The CoRx Tester is comprised of a pre-configured PXI chassis, a two-channel tunable laser, a polarization controller, and a two-channel Variable Optical Attenuator (VOA) with built-in power meter. Just connect the two optical outputs to your Integrated Coherent Receiver (ICR), connect your ICR to the oscilloscope and let the CoRx Tester software do all the rest.
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Product
Acute 4GS/s 136 Channel Logic Analyzer With 32Gb Memory
Acute LA3136E+
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*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis*32Gb RAM
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Product
Industrial Flash & Memory Solutions
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Advantech provides a full range of industrial storage module, memory module, and embedded I/O module.
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Product
Qualification Tester
LQ404
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Computer Gesteuerte Systeme GmbH
The qualification tester LQ402 is designed to support up to 12 DUTs (Device under Test), for which the loads are installed in separate load boxes. The system consists out of 3 cabinets. One is for the electronic components with the primary measurement devices and the other two hold the 12 load boxes.
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Product
Torque Tester
CD-100M/10M
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Ideal for daily inspection of electric screwdrivers. Use conventional joints. Five channels of pass/fail judgment conditions can be saved, and settings can be made simply by switching channels even if the tightening conditions change. 3 times more durable than the conventional model, even with sudden high torque. disassemble the joint due to excessive unwinding .
