Test Pattern
Test signals for the calibration and alignment of TV broadcast and reception equipment.
-
Product
Test Pattern Generators
-
Video Test Pattern Generator, Portable Monitor Tester, Test Video Audio Signals, HDMI, DVI, SDI, Component Video, HDCP
-
Product
Bit Error Rate Testing
BERT
-
An invaluable tool for manufacturing, development engineers, and field service engineers*Generate multi-speed, multi-application, and custom test patterns*Verify and validate lowest level connectivity down to 10-12*Support up to 32 ports of testing
-
Product
PATTERN GENERATOR
PG-68
-
The model PG-68 pattern generator generates a wide variety of test signals and patterns for testing, servicing, and adjustment of television, computer monitors, and video equipment.
-
Product
Master Reference Generator
Mentor
-
Precision Time Protocol IEEE-1588 PTP grandmaster• Multiple video and audio formats in one box• Simultaneous 525/625 and HD Tri Level Sync outputs• Highly accurate GPS reference for synchronisation and timecode• Vector web-browser setup and monitoring tool• Redundant PSU option• Add upgrades and options without return to factory• Generates synchronised audio and video• Redundant units with changeover• 4K test pattern ready (future upgrade)
-
Product
Video Generator-Analyzer
VQTS-200
-
VQTS-200 is a self-contained solution, combining:3G-SDI/HDMI/DVI player/recorder - based on AJA Kona LHi cardBuilt-in RAID storage - uncompressed YUV signals in and out, up to 1080p60Visual, instrumental and automated tests using VQL Test Patterns LibrarySophisticated image quality VQMA3 software analyzer - complete quality report in 2 secondsIdeal tool for development labs, software developers and high volume manufacturersEasy-to-use tool, instantly revealing your video camera, codec, scaler, converter or other video device performanceUser-selectable reporting modes:machine-readable file with Pass/Fail marksdetailed multi-page PDF document
-
Product
Test Program Management
TP-M
-
TP-M utilizes TestInsight unique capability to read and analyze a whole test program from flow to every test pattern, timings, levels etc.
-
Product
Multistandard Test Pattern Generator
TRF-950
-
TRF-950 is universal multistandard equipment suitable for analog TV systems and digital video. This generator supports all analog standards (PAL, SECAM, NTSC) and substandards. Digital output offer DV601/656 signal. Generator is installed in low profile case suitable for desktop use as well as for use in Rack 19" stand.
-
Product
Test Solution
Eye-BERT MicroX
-
The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions. The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps. Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information. Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability). With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
-
Product
Camera Link Simulator
CLS-221
-
The CLS-221 Camera Link Simulator is an affordable, high-performance video test pattern generator that supports all video formats including those introduced in the new version 2.1 specification. Fully programmable video timing enables the CLS-221 to mimic the characteristics of almost any camera. New features include enhanced timing performance, bayer color support, and additional video patterns. Control is via an RS-232 port, USB, or frame grabber COM port. The CLS-221 also incorporates the AIA validation test pattern.
-
Product
Memory Diagnostic Utility
MemTest86
-
MemTest86 is the original, free, stand alone memory testing software for x86 computers. MemTest86 boots from a USB flash drive or CD and tests the RAM in your computer for faults using a series of comprehensive algorithms and test patterns.
-
Product
Multi-format Video Generator
LT 4600A
-
The LT 4600A multi-format video generator is a compact, 1U half-rack size SDI video signal generator that supports the triple-rate SDI (3G-SDI/HD-SDI/SD-SDI) format. In addition to test pattern output including color bars and SDI check fields, the LT 4600A is equipped with numerous features such as ID characters, QVGA logo marks, safety area markers, audio embedding, genlock function for external reference input signals, and three analog black signal outputs.
-
Product
DisplayMate Multimedia with Motion Bitmaps Edition
-
DisplayMate Technologies Corporation
DisplayMate Multimedia with Motion Bitmaps Edition includes a Motion Engine that moves a special set of test patterns and test photos to measure and evaluate response time, motion blur and motion artifacts in displays for different speeds, directions, intensities and colors for all monitors, projectors and HDTVs. It has everything in the standard Multimedia Edition including all of its 500+ test patterns up through 3072 x 3072 resolution.
-
Product
Silicon Test & Yield Analysis Solutions
Tessent®
-
The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
-
Product
ICT/FCT-Fixtures (Large IF)
GenRad CK-2-228X
-
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
-
Product
TRF Manager 9
-
Configuration by using a PC, this is one of the major TRF generator attribute. Instruments have factory settings suitable for common applications and contain the most popular test patterns. But many users want to customize the setup or set the instrument according to specificic application requirements. They also may want to adjust parameters, that cannot be accessed by any other way. That is what TRF Manager 9 (optional software pack) can do. And much more! Pattern generators of the TRF-498 and 598 series use a parallel interface for connection with PC. Basic setup can be realized by using Pattern Manager, free software downloadable from our site. For advanced settings there is available TRF Manager 3 software. For more detailed information see the TRF-498 and TRF-598 section, please.
-
Product
Pattern Generator
1B-SDI-PTG
-
The 1B-SDI-PTG 3G-HD/SD SDI Pattern Generator - advanced SDI pattern generator with multi-format and multi-pattern support. Supports still and moving video test patterns, and provides a lot of useful features like audio SMPTE-291M. 1B-SDI-PTG Pattern Generator supports up to 8 channels of AES compliant audio with 48KHz sample rate. Multitasking of 1B-SDI-PTG comes from bypassing HDMI input which allows user to use more testing patterns for connected display or use 1B-SDI-PTG as SDI converter with 3G support.
-
Product
Multi-Wafer Test & Burn-in System
FOX-XP
-
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
-
Product
CRPA Test System
-
The Spirent CRPA Test System is a development of Spirent’s GSS9000 Series platform for testing Controlled Reception Pattern Antenna (CRPA) systems with a separate RF output per antenna element. The CRPA Test System generates both GNSS and interference signals. Users can control multiple antenna elements. Null-steering and space/time adaptive CRPA testing are both supported by this comprehensive wavefront approach.
-
Product
AMIDA 2020XP Tester
-
AMIDA 2020XP CIS tester is the latest generation of CMOS image sensor-specific measuring instruments from Metatech. In addition to the original true and accurate measurement, the high-throughput mass production solution designed for the high-throughput inspection of image lens modules and camera lenses has been well received after nearly 20 years of mass production experience. First-class factories at home and abroad import production. AMIDA 2020XP CIS testing machine not only meets the customer's testing time and high output and accuracy requirements. Within the range of functional flexibility, users can customize their measurement requirements according to the definition of various sensors. AMIDA 2020XP CIS tester is a new generation of CMOS Image Sensor dedicated tester, which integrates DC open/short/leakage test, AC Pattern test and image test. It uses 180 Pin high-speed cable to connect to the test end
-
Product
ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1-228X-S (Small IF) / 230514
-
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
-
Product
LCM Panel Tester
27013
-
Chroma 27013 is a portable tester that supports high resolution and large scale LCM with the signals, power supply and test patterns required for LCD module test.
-
Product
ATPG with Embedded Compression
TestKompress
-
TestKompress is an automatic test pattern generation (ATPG) tool that provides the highest quality scan test with the absolute lowest test cost. TestKompress has an industry-proven ATPG engine that applies effective fault models to your entire logic design. Manufacturing test costs are held in check by an award-winning test pattern compression technique called Embedded Deterministic Test (EDT).
-
Product
HOTLink module (SAM)
ARINC 818
-
The HOTLinkTM stand alone module (SAM) is an invaluable tool for HOTLink testing. The SAM can be used as a portable signal converter, splitter, test pattern generator, or continuity tester. The SAM comes standard with an A/C adaptor and is also compatible with A/C 28 VDC.
-
Product
Test Patterns
DisplayMate Multimedia Edition
-
DisplayMate Technologies Corporation
DisplayMate Multimedia Edition is the most advanced and powerful version of DisplayMate ever, with lots of proprietary and highly innovative suites of test patterns for setting up, tuning-up, calibrating, testing, evaluating, diagnosing, and analyzing CRTs, analog and digital LCD, Plasma, DLP, LCoS, and SXRD monitors and projectors, microdisplays, video boards, color printers, TVs and HDTVs, NTSC/PAL Television encoders and decoders, and more.
-
Product
ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2 Medium (Hold Down Gate) / 230156
-
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
-
Product
Sophisticated Audio and Video Test Patterns
VQL
-
VQL Instantly reveals your video display, codec, scaler, converter or other video device performanceVQL test patterns cover all 3 levels of video QA/QC:Instant visual-aural Quality EstimationObjective Measurements of video and audio performanceFully automated (unattended) Quality ControlVQL features:Compatibility with all commonly used software or hardware codecs and media playersVideoQ VQV / VQMA / VQTS / VQDM compatible testsWide range of video frame sizes: from 192x108 to 4096x3072Variety of bit rates up to uncompressed 4:4:4 4K @60 fps, 48 bit per pixelVariety of video and audio formats, color spaces and level schemesAll test patterns remain suitable for accurate measurements even after low bitrate coding, heavy scaling and/or cropping, e.g. after down-conversion for mobile devicesStandard, custom and semi-custom tests for development labs, content processing facilities, CDN systems, software developers and high volume manufacturers
-
Product
ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2-228X (Small IF) / 230540
-
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
-
Product
DFT Validation And Silicon Debug Platform
NEBULA Silicon Debugger
-
NEBULA provides advanced features for performing early validation of DFT infrastructure and ATPG patterns in first silicon. The NEBULA solution directly imports test pattern formats and DFT information from leading EDA vendor tools, such as Synopsys' TetraMAX and Cadence's Encounter Test.
-
Product
ICT/FCT-Fixtures (Small IF)
GenRad CK-1-228X-S
-
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
-
Product
ICT/FCT-Fixtures Max UUT 370 × 300 mm (wxd)
CK-2-228X (Large IF) / 230532
-
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
