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Near-Field
1) EMF closest to the antenna. 2) Near-field optics.
- LBA Group, Inc
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RF Safety Monitoring
FieldSENSE 60
The fieldSENSE 60 personal RF monitor has a proven track record of durability that works as hard as you do. fieldSENSE 60 is specifically designed with the RF climber in mind. Whether working in the nearfield of a broadcast system or in the far-field of a 5G system, exposure is correctly assessed and a warning is sounded, should the levels approach and exceed the OET65 and Safety Code 6 occupational limits. To ensure the device cannot be dropped off site, connect he device can be attached the included special harness-attachment mechanism. In the event of a warning while the monitor has fallen the buzzer is still within hearing range.
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Hearing Aid Compatibility Automated Test System
MiNi-HAC
Hearing Aid Compatibility (HAC) evaluation of wireless handsets ensures accessibility of these technologies to the hearing impaired. The MiNi-HAC system can be used for the design and development of wireless handsets as well as for evaluation of hearing aids used by the hearing impaired to gain access to mobile wireless technologies. RF Emissions Test - near field measurements of the electric and magnetic fields emitted by a wireless device.
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RGO-2000P Robotic Goniophotometer For Plant Lighting
Hangzhou Everfine Photo-E-Info Co., LTD
RGO-2000P proposed a solution based on the plant lighting requirement to measure and evaluate the spatial light distribution performance of plant lighting based on the limitations of far-field measurement and ILMD near field distribution goniophotometer.
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Seismic Sensor
SmartPhone D
Teledyne Marine Real Time Systems
The highly rugged encapsulated SmartPhone D was designed for use with the SmartSource controller, or SmartPhone D system, for real-time monitoring of near-field signatures.
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Near-Field Probes 100 kHz up to 50 MHz
LF1 set
The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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Near Field Probes 30 MHz up to 3 GHz
RF1 set
The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Versatile AFM Optical Coupling
TRIOS
The TRIOS platform is an advanced research instrument that provides the entry path for researchers in materials science, biology, spectroscopy and photonics. TRIOS is the most versatile optical coupling platform providing three ports for optical spectroscopy measurements with top-down, side (oblique) and inverted accesses to the AFM tip and sample.If you work with opaque and/or transparent samples, either in air or in liquid looking at nanoscale structures and near-field optical properties investigation, the TRIOS platform is the right solution for you. It perfectly combines upright optical, inverted optical, and atomic force microscopies, and unleash all the power of both techniques providing instrument adjustment and measurement automation, high resolution and integration flexibility. Such performance is only available from HORIBA.
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2D Far-Field Analysis of Infrared Emitters
VTC 2400
Instrument Systems Optische Messtechnik GmbH
The VTC 2400 is a high-resolution infrared-camera that was developed specially for 2D-far-field analysis of the radiant intensity distribution of VCSELs and IR emitters. The measurement system consists of a light-permeable screen and a monochrome camera specialized for measurements in the near infrared range.
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Near Field Microprobe E-field 7 MHz to 3 GHz
ICR E150
The near field microprobe is used to measure electric fields at extremely high resolution and sensitivity. The optimal distance to the object being measured is < 1 mm. Due to its small probe head dimension, the probe has to be moved by a manual or automatic positioning system, e.g. Langer-Scanner.
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Near Field Probes 30 MHz - 6 GHz
XF Family
The XF family consists of 4 passive magnetic field probes and 3 passive E field probes designed for measuring magnetic and E-fields in ranges from 30 MHz to 6 GHz during the development phase. Due to their integrated impendance matching the probes are less sensitive in the lower frequency range than the RF type probes.
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Deluxe Near-field Detection Receiver
ANDRE™ Deluxe
The ANDRE is a handheld broadband receiver that detects known, unknown, illegal, disruptive, or interfering transmissions. The ANDRE locates nearby RF, infrared, visible light, carrier current, and other types of transmitters. Quickly and discretely identify threats using the ANDRE Deluxe’s wide range of accessories specifically designed to receive transmissions from 10 kHz up to 12 GHz.
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1050MHz Spectrum Analyzer
SM-5010
Is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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Ultrafast Nearfield Optical Microscope
Femtosecond NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.
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AMIDA VCSEL Tester
AMIDA VCSEL tester can be divided into three parts: LIV measurement system, Near Field measurement system and Far Field measurement system. To achieve the above three measurements, in addition to the necessary optical components and optical instruments, the core technology is to provide fast and stable current pulses to drive the VCSEL laser diode to emit light, and then to test various optical and electrical properties
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Microscope Photoluminescence Spectrometer
Flex One
Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
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Emissions Test System
PC-114
Perform Radiated & Conducted EMI pre-compliance testing at your facility up to 1 GHz. Com-Power PC-114 EMI emissions test system is a ideal solution performing pre-compliance EMC testing from 9 kHz - 1 GHz.. It has essential equipment needed for radiated and conducted EMI emissions measurements. The system includes a spectrum analyzer, antennas, near field probes, a preamplifier, LISN and a non conductive antenna tripod. Pre-compliance testing in EMC is a commonly used term not easy to define. In general, it implies testing done prior to formal testing for legal compliance. Formal legal compliance is performed at a facility designed and equipped with test instrumentation that is fully compliant with the applicable EMC standards. Such facility and instrumentation is capital intensive and can be expensive even to rent and not easily available. Compliance testing is performed per exacting requirements of the Standards and other reference documents adhering to the test methods and last detail. In addition, the test facility may require to be accredited by an accreditation body such as NVLAP, A2LA. Often it is desirable to know prior to compliance testing at such facility, whether a product is close to compliance and also how close. Pre-compliance testing is specially useful for specifications such as FCC, Part 15, EN 55022 or EN 55011 (CISPR 22 or CISPR11). Pre-compliance testing usually means using the full compliance methods but making a few educated compromises in use of site or equipment to reduce costs and testing time. Here are some benefits of pre-compliance testing.
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NIRONE Sensor S
The NIRONE Sensor S brings material measurements from the laboratory to the field: it is small, mobile, innovative, robust and cost-effective. It is enabling fast and reliable measurements at the near infrared (NIR) spectral range from 1350 to 2450 nm and works even in the most demanding environments. NIRONE Sensor S offers excellent performance fully comparable to the best laboratory instruments in a small package and only a fraction of the cost. It can create new applications for materials analysis by NIR spectroscopy, including
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Plane Wave Converter
PWC200
The R&S®PWC200 Plane Wave Converter is a bidirectional array of 156 wideband Vivaldi antennas placed in the radiating near field of the device under test (DUT). The phased antenna array can form planar waves inside a specified quiet zone within the radiating near field of the 5G massive MIMO base station for realtime radiated power and transceiver measurements (EVM, ACLR, SEM, etc.).
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Imaging Goniometers
Radiant Vision Systems fully-automated goniometric systems are combined with a ProMetric® Imaging Colorimeter or Photometer and specialized software to capture a precise, comprehensive model of a light source’s near-field output.
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Near Field Micro Probe Sets
The near field probe is designed for a high-resolution measurement of electrical near fields.
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Near Field Probes 1GHz - 10 GHz
SX set
The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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USB Magnetometer
MultiDimension Technology Co.,Ltd.
A three-axis digital magnetometer that is intended for the measurement of magnetic fields near the probe tip at frequencies less than 250 Hz.
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High Performance Analog & Mixed Signal Test Solutions
Applicos
Effective mixed-signal test solutions demand know-how and experience. Low level analog signals need to be stimulated and analyzed near fast switching digital logic. Cross talk, magnetic fields, clock jitter, ground noise and non-linearity of components, are just a few of the problems that must be addressed. Applicos knows what it takes to design and produce high quality mixed-signal test solutions. They have been servicing the mixed-signal test industry since 1993 and have established a distinguished reputation for providing our customers with high performance, cost effective solutions. In 2018 we acquired Applicos B.V. to extend our portfolio for the ATE business.
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2D Near-Field Analysis of VCSEL Arrays
VTC 4000
Instrument Systems Optische Messtechnik GmbH
The VTC 4000 near-field camera from Instrument Systems was specially developed for the ultrafast, precise 2D analysis of VCSEL arrays. It enables polarization-controlled characterization of all relevant parameters simultaneously for the single emitters of the array.
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EMC Accessories
Complete your EMC test setup with the essential accessories to compliment the test equipment. Whether it is a LISN (or V-Network) to counteract interference from external power sources on conducted emissions from the device under test, probes to locate the near field sources of radiated emissions, receive and transmit antennas, or tripods for holding antennas in place, the Rohde & Schwarz catalog of EMC accessories provides the additional items you need for EMI and EMS measurements, guaranteed 100% suitable for use with Rohde & Schwarz EMC test equipment.
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NI-5782, 100 MHz Bandwidth Transceiver Adapter Module for FlexRIO
782705-02
The NI‑5782 is ideal for applications that require the acquisition and generation of IF or baseband signals with in-line, real-time processing. You can analyze acquired signals in the PXI FPGA Module for FlexRIO to perform measurements and generate response signals. Application areas include RF modulation and demodulation, channel emulation, bit error rate testing (BERT), signal intelligence, radio frequency identification (RFID) and near-field communication (NFC) test, real-time spectrum analysis, and software defined radio (SDR).
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Scanner Probe
RFS set
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
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Near Field Probe Set
RF100
The RF100 probe set consists of a passive E field probe and H field probe, BNC adaptor and carry case. The output is via a BNC socket. These are general purpose probes which are ideal for use in conjunction with an EMC measuring system. They are sensitive to sources in close proximity, but are insensitive to background signals. This makes them ideal for the identification of emission frequencies in noisy environments... thus making measurements easier and quicker. The proximity requirement also enables sources to be located and the exit route identified.
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Test Fixture, Shielding Effectiveness
EM-2108 | 1.5 GHz – 10 GHz
The EM-2108 is a standard test fixture for evaluation of the electromagnetic shielding effectiveness (SE) of planar materials. The fixture is a section of coaxial transmission line broken to allow the insertion of planar test materials. Although ASTM D4935-10 is currently limited to an upper frequency of 1.5 GHz, the EM-2108 meets and complies fully with both the impedance and SE requirements called out in ASTM test method D4935-10 up to 10 GHz. These results are shown in Figures 1 & 2. The measured data relates to the shielding effectiveness due to a plane wave (far field EM wave) from which near field values for magnetic and electric fields may be inferred.
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Near Field Probes 30 MHz up to 3 GHz
RF6 set
The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Shielding Effectiveness/ Conductivity Test
EM-2107A | 30 MHz – 1.5 GHz
The EM-2107A is a standard test fixture for evaluation of the electromagnetic shielding effectiveness of planar material. The fixture is an enlarged section of coaxial transmission line and complies fully with the requirements of ASTM test method D4935-1. The measured data relates to the shielding effectiveness due to a plane wave (far field EM wave) from which near field values for magnetic and electric fields may be inferred. The EM-2107A is provided with a reference standard test specimen, a dynamic range specimen. Dynamic range of greater than 80dB is achievable, although the cables and other test system components usually establishes the limiting factors.
