Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Digital Microscopes
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Our range of products include digi classic digital lcd microscope, digi monozoom i lcd microscope, digi monozoom ii digital microscope, digi zoomstar iii lcd microscope, digi zoomstar iv digital microscope and monozoom e digital microscope.
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Scanning XPS/HAXPES Microprobe
PHI Quantes
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The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
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Desktop Fluorescence Microscope
Nanoimager
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The complete package for super-resolution microscopy
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Electronics
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Flann provides control processors and switch drivers that support all Flanns current range of programmable attenuators, phase changers and waveguide switches
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3D Scanning Software
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Software is a comprehensive component to any advanced metrology system. Combined with laptops and portable equipment, 3D scanning and measurement is now possible virtually anywhere. 3D scanner software plays a critical role in every stage from the creation of a concept design to the manufacturing and inspection of prototypes. Below is a look at some of the Laser Scanner Software and 3D Scanner Software providers and platforms we represent and handle.
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Metallurgical Microscope
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Offering you a complete choice of products which include dg classic trinocular metallurgical microscope, dg victory trinocular metallurgical microscope, dmi classic trinocular metallurgical microscope, dmi excel binocular metallurgical microscope, dmi optima trinocular metallurgical microscope and dmi prime trinocular metallurgical microscope.
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Atomic Force Microscope
Flex-Mount
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Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM.
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Indicators - Electronic
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An electronic device used to read an input value from a measuring device and show a displayed value.
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Line Scan Camera
Linea SWIR
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Teledyne DALSA’s short-wave infrared (SWIR) GigE line scan camera features a cutting-edge InGaAs sensor in a compact package for a wide variety of machine vision applications.This high speed, high resolution camera is the first product in DALSA’s SWIR family. Linea SWIR features a cutting-edge InGaAs sensor in a compact package that is suitable for a wide variety of applications. With exceptional responsivity and low noise, this camera allows customers to see their products like never before. Linea SWIR is available as a 1k resolution camera with highly responsive 12.5 µm pixels, or a 512 resolution camera with larger 25 µm pixels
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Confocal Microscopes
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Our confocal microscopes for top-class biomedical research provide imaging precision for subcellular structures and dynamic processes.
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Electronic Loads
T3EL Series
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The T3EL series is a family of single channel, 200 & 300 Watt Electronic Loads that are ideal for R&D, product validation and Q&A in a bench or automated environment for low to medium power applications starting from 60mA, such as electronic components, batteries, portable chargers and power products. Electronic Loads are typically used to provide a load to the outputs of a power supply, usually capable of dynamic loading, and are fully programmable. Electronic Loads help designers to test electronic power products and ensure quality, reliability, and performance.
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Microscope Photomultiplier Photometers
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HORIBA's microscope photometers are ideal for any lab wishing to quantitate light intensity from a sample on a microscope stage. Initially designed for the most demanding low light level fluorescence kinetics of labeled mammalian cells, these photometers are also just as well suited for mineral analysis or transmission studies.
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Microscopes
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A scientific instrument designed to produce magnified, high-resolution images of objects.
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2D Scanning Unit
intelliSCAN FT
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The intelliSCAN FT is a 2D scanning unit for planar remote laser applications. Fix integrated in the welding machine or attached to a Gantry system, the scan unit ensures fast and precise positioning of the laser spot.
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Fluorescence Microscopes
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PicoQuant offers different solutions for time-resolved confocal microscopy. The available systems include single molecule sensitive microscopes with picosecond temporal resolution and super-resolution imaging capabilities as well as upgrade kits for laser scanning microscopes of all major manufacturers that enable time-resolved applications.
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Modular Infinity Microscope
MIM
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30mm diameter coupling to the I.D. of the C60-TUBE, or with a 50mm coupling on the O.D. of the lens tube.
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Xineos Scanning
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Teledyne DALSA's leadership in CMOS innovation lets our Xineos scanning products deliver three times more sensitivity and five times more signal-to-noise performance than other standard technologies at equal X-ray dose conditions. CMOS image detectors offer numerous advantages including the ability to record smaller image details with higher resolutions – allowing for the diagnostics of medical anomalies at earlier stages, and significantly increasing the probability of early intervention, patient recovery, and reduced treatment costs.
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Imaging Mass Microscope
iMScope QT
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Inheriting the concept of a mass spectrometer equipped with an optical microscope from the iMScope series, the iMScope QT is also Shimadzu's flagship model for MS imaging with a Q-TOF MS(LCMS-9030).
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Scanning Probe Workstations
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BioLogic has over 25 years of experience producing scanning probe electrochemistry instruments. Initially this included a number of single technique instruments, with the first modular scanning electrochemical workstation, the M370, introduced in 2006, under the Uniscan name.Scanning probe electrochemistry has found use in academic and commercial research settings. It is applicable in any field in which bulk electrochemical measurements have been used. Scanning probe electrochemistry has found widespread use in: Corrosion and coatings, Biology, including biosensors and biotechnology, Batteries, fuel cells and photovoltaics, Materials, Catalysis
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Atomic Force Microscope
NX-Hivac
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Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Electronic Loads
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Precise programmable instruments used to safely draw and test direct current (DC) from power sources like batteries, fuel cells, and power supplies.
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Electronic Load
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* Fully programmable, self-contained, air-cooled solid state load.* Patented design is optimized to provide ultra-low impedance operation for fuel cell testing.* Load is compatible with AC impedance or frequency response analyzers.* Interchangeable shunts for precise operation over a wide dynamic range.* Ten built-in cell voltage monitoring inputs optional. Additional voltage monitoring inputs available.* Ethernet Interface for simple configuration and expansion!* Combine with additional Fideris™ Innovator Series™ modules to create a fully-integrated,fully-automated, customized test system.* System-wide control of all Fideris™ Test System Components using FCPower™ Software,LabviewTM, or other programming language.* Integrated hardwired Run/Standby signal.
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RF Electronic Calibration Module (ECal), DC To 13.5 GHz, 4-ports
N4431D
Electronic Calibration Module
The Keysight N4431D RF electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4431D is a precision 4-ports ECal module that supports multiple selection of connectors like Type-N, 3.5 mm, 7-16 and 4.3-10 connectors and can be mixed up to 13.5 GHz. Select either female-female, male-male, or female-male connectors.
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RAPID SCANNING AUTOCORRELATOR/CROSSCORRELATOR
FR-103HP
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The FR-103HP is a compact NL crystal autocorrelator, suitable for moderate and high power lasers (Pav>5mW). It is available with a scan range >60ps (suitable for pulsewidths within 10fs-15ps) and covers a wide range of wavelengths with easily interchangeable plug-in detector modules. The standard FR-103HP provides ‘real-time’ pulsewidth monitoring capability for rep rates down to 1kHz.
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RF Electronic Calibration Module (ECal), DC/300 KHz To 26.5 GHz, 4-ports
N4433D
Electronic Calibration Module
The Keysight N4433D RF electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4433D is a precision 4-ports ECal module that supports selection of 3.5 mm connector and can be mixed up to 26.5 GHz. Select either female-female, male-male, or female-male connectors.
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Atomic Force Microscope
3DM Serirs
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Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
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USB Line Scan Camera
Inexpensive
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Compact USB line scan camera with high sensitivity and resolutions from 2048 to 4096 pixels. The programming interfaces, including drivers, libraries and programming examples, enable the USB line camera to be integrated into your own application. The line scan camera is supported under the following operating systems:*Windows*Linux*Linux ARM 32Bit (Raspberry PI)*Linux ARM 64Bit (NanoPi M4 & NVIDIA Jetson Nano)
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Atomic Force Microscope
AFM Heron
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New, fully motorized AFM HERON (HERO of Nanotechnology) which allows to perfectly align a cantilever, laser and photodiode by just one click on a command button. The scanning settings and landing parameters are also automated that allows to avoid any time consuming adjustment operations, thus leaving more time to researcher for designing the experiment and performing more accurate measurements.
