Jitter Analysis
Measure timing changes in a circuit.
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Product
Multi-Layer Analysis for Next Generation PONs
Multi-ONU Emulator
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The NG-PON Xpert multi-layer analyzer is a unique, real-time protocol analyzer for XG-PON1, NG-PON2 and XGS-PON networks and products. The Multi-ONU Emulator introduces a new revolutionary approach for comprehensive testing of an OLT. It enhances the testing with repeatable test scenarios and functionalities that cannot be tested in any other way, including the OLT's ability to handle various ONU models and configurations, error and defect conditions, alarms and traffic loads.
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Product
Data Analysis Software
PV II
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Software to communicate and display data from PQPro™ Power Quality Analyzer.Can connect wirelessly (Bluetooth) to multiple instruments.View real time data numerically, vector diagrams and analog meter format.View downloaded data in graphical form.Multiple graphical pages can be open at the same time.Graphs can be annotated with data boxes and text bubbles.Graphs can be pasted in to Word or Excel files.Export data in CSV format.Export data in PQDIF format.Export section of data file to PV II format.Generate reports with both graphical and tabular data.
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Product
IC Side Channel Analysis
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These probes allow you to couple fast, transient magnetic field, E-field, and current pulses into ICs.
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Product
Spectrum Analysis Up To 125 GHz
S93093B
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The S93093B has all of the capability of the S93090xA spectrum analyzer application with an upper frequency of 125 GHz
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Product
Acoustic Analysis
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Noise is increasingly the subject of new regulations for the protection of human health and safety as well as for improving the environment in general. As well as sound levels, the perceived sound quality of products from washing machines to vehicles is often an important part of the customer buying decision so must be considered during product development. m+p Analyzer for noise and vibration measurement and analysis provides a full range of capability for these applications. Real-time fractional octave filters satisfy all acoustic applications from simple sound pressure, sound power for equipment legislative requirements, intensity mapping to isolate sources to sound quality metrics for product refinement.
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Product
LMK Image Capturing & Analysis Software
LMK LABSOFT
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TechnoTeam Bildverarbeitung GmbH
The LabSoft image capturing and analysis software for the LMK offers a wide functionality for various photometric and colorimetric applications. We are continually expanding the software's functionality by an intensive exchange of experience with our customers. We are also constantly improving the usability of this intuitive software.
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Product
Biochemical Oxygen Demand (BOD) Analysis Systems
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MANTECH has a variety of biochemical oxygen demand (BOD) systems to best suit the needs of your laboratory. Whether you need manual or automated, big or small, simple or complex, MANTECH can create the ideal BOD solution for your laboratory. MANTECH’s Automated BOD analysis systems are robust, come with easy to use software, and provide accurate results that stand the test of time.
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Product
Marine Seismic Systems Analysis Software Suite
Testif-i Marine
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Testif-i Marine is a comprehensive software suite designed specifically to process test data from marine acquisition systems to ensure the integrity of your recorded data.
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Product
Vibration Analysis Software
VibroDesigner
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VibroDesigner software is used for data acquisition, storing and analyzing. Using this software with portable STD-500/510/3300 or stationary CTD3168/2160/2060 units helps to schedule machinery maintenance at a convenient time.
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Product
System for the Analysis and Jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel
SierraNet M328
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The SierraNet M328™ system provides for analysis and jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel data capture and protocol verification for developers & protocol test engineers in LAN, SAN, NAS and other Ethernet and Fibre Channel applications. Available with eight SFP28 FlexPorts™ for maximum configuration and utility, the SierraNet M328 includes an easy to use, customizable software interface, large capture buffers, and the most advanced capture, triggering, impairment and filtering capabilities in the industry.
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Product
Scanning Electron Microscopy (SEM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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Product
Gas Analysis
HPR-20 R&D
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The Hiden HPR-20 R&D specialist gas analysis system is a bench-top mass spectrometer for real time gas analysis of evolved gases and vapours.
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Product
Data Acquisition Analysis SystemWave Stocker
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This is the really useful equipment which our Solution Teamdeveloped using their experience obtained at their customer' s site.Simultaneous measurement by with sampling of max.16 channels is possible, enabling easy waveform analysis. This can be used for versatile tasks as the measurement at the site, inspection and R & D.
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Product
Power System Analysis Software
DSATools
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DSATools™ is a suite of leading-edge power system analysis tools that provides the capabilities for a complete assessment of system security, including all forms of stability. DSATools™ offers a complete toolset for power system planning and operational studies. In addition to rich modeling capabilities and advanced computational methods, the software is packed with useful study tools that enable significant productivity improvements.
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Product
Imaging & Analysis
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Microscopes offered by Buehler generally fall into the categories of stereo microscopes, upright microscopes, or inverted microscopes. Inverted microscopes are commonly referred to as metallurgical microscopes. Microscopes may offer episcopic (reflected light) observation, diascopic (transmitted light) observation, or both possibilities. Illumination may be delivered in bright field mode (BF) or dark field mode (DF), and several techniques such as differential interference contrast (DIC) and polarized light microscopy make use of the nature of light to reveal specific pieces of information when studying materials.
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Product
Controls Systems for Engine Control and Combustion Analysis
NI Powertrain
Analyzer
NI Powertrain Controls systems incorporate the LabVIEW reconfigurable I/O (RIO) architecture to create some of the world’s most flexible and capable combustion analysis and engine control systems. The engine control systems can drive both solenoid and piezoelectric direct injectors, control timing events with 25 ns of precision, and implement novel engine control strategies such as next- and same-cycle control. The combustion analysis systems are available in both portable and higher performance stationary form factors.
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Product
Spectrophotometers, Laboratory And Analysis Systems
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Instruments, accessories and calibration standards for in-situ and ex-situ optical transmission, reflection, absorption, and photoluminescence measurements
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Product
Enhanced Imagery Analysis
RVSAR™
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Textron Systems' RVSAR is an extension for our proven RemoteView™ software and provides capabilities to enhance the clarity of Synthetic-Aperture Radar (SAR) imagery. Users can employ an easy speckle suppression solution, allowing different filters to be applied either on a single page, or multiple polarization images on one page by using with MultiViews.
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Product
On-line FT-NIR Analysis
MATRIX-F
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The advantages of real time, on-line FT-NIR analysis have been well established. However, conventional spectrometers can only be installed close to the process that they are monitoring, which makes the analyzer be exposed to a hostile environment, like drastic temperature changes and exposure to dust and dirt. Furthermore, the instrument needs to be positioned in hard-to-access and often Ex-protected area.
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Product
Finite Element Analysis
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Response Dynamics Vibration Engineering, Inc.
An understanding of structural dynamics is very important to sound Finite Element Analysis (FEA). We have been performing FEA analysis for over 30 years and in most cases we have used experimental data to guide our modeling. While our engineers have had undergraduate and graduate courses in FEA, it is the years of modeling and analysis of existing structures that has taught us the most by forcing a thoughtful analysis of the key structural dynamics and then going though the process of making adjustments to boundary conditions, expanding the dynamics of the model in places, and making simplifications and approximations where possible.
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Product
Inductively Coupled Plasma Spectroscopy (ICP-OES/MS), ICP Analysis Services
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ICP-OES measures the light emitted at element-specific characteristic wavelengths from thermally excited analyte ions . This light emitted is separated and measured in a spectrometer, yielding an intensity measurement that can be converted to an elemental concentration by comparison with calibration standards. ICP-MS (ICP-Mass Spec) measures the masses of the element ions generated by the high temperature argon plasma. The ions created in the plasma are separated by their mass to charge ratios, enabling the identifcation and quantitation of unknown materials. ICP-MS offers extremely high sensitivity (i.e. low detection limits) for a wide range of elements
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Product
Functional/Protocol Debug and Analysis Reference Solution
DDR4
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Highest confidence in measurement accuracy! Industry’s fastest triggering and data capture for DDR4 analysis, test, and debug.
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Product
Spectrum Analysis, Up To 13.5 GHz
S930901B
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The S930901B spectrum analysis adds high-performance microwave spectrum analysis to the PNA family up to 13.5 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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Product
PCIE GEN5 Analysis System
KODIAK
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PCIe Analysis Platform with Embedded Hardware, Calibration-Free SI-Fi™ Probing and Automatic Equalization, Internal SSD Storage, Touchscreen LCD, and Standard PCIe Cabling.
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Product
Room Acoustics Analysis on iOS
RoomScope
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RoomScope turns your iPad, iPhone, or iPod touch into a room acoustics measurement and analysis tool. With RoomScope, you can measure a room impulse response and then calculate reverberation time, early decay time, clarity, and definition, as defined in the ISO 3382 standard. RoomScope also allows you to adjust the Schroeder decay curve integration limits with the touch of your finger and plot the calculated room parameters versus whole or 1/3-octave band center frequency.
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Product
STDF Test Data Analysis Tool
DataView
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DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.
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Product
Secondary Ion Mass Spectrometry (SIMS Analysis)
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Rocky Mountain Laboratories, Inc.
Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.
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Product
NRZ Analysis for Signal Integrity Studio, WavePulser 40iX High-Speed Interconnect Analyzer
WAVEPULSER-SI-STUDIO-NRZ
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Signal Integrity (SI) Studio uses SDA Expert (SDAX) serial data analysis software options to simplify NRZ or PAM serial data jitter, eye diagram, noise and crosstalk measurement and analysis setup.
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Product
Proactive Downstream Spectrum Analysis
SpectraVizion
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SpectraVizion is an innovative, software-based diagnostics tool that leverages new advancements in remote spectrum capture, allowing cable operators to address downstream spectrum impairments proactively, before subscribers call in with service complaints. “Troubleshooting downstream spectrum issues has always been a reactive process for cable operators,” said Arthur Skinner, Vice President of Worldwide Sales for ZCorum. “Often they’re not aware they have an issue until a customer calls, and that’s when they then send a technician to the home with a hand-held meter to start a search for the problem.” SpectraVizion takes the guesswork out of problem identification and location by presenting on a simple dashboard a list of devices that are experiencing common downstream issues like Standing Waves, FM Noise, Suck-outs, Roll-off and Tilt. The tool leverages the spectrum data available from cable modems and set-top boxes that support full band capture, and advanced detection algorithms automatically identify devices experiencing downstream impairments. The operator can click on any device in the list to view a capture of the full spectrum from that day, or up to 30 days in the past.
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Product
Failure Analysis And Magnetic Imaging Services
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Micro Magnetics offers failure analysis services on a contractual basis. We maintain two current density metrology systems at our headquarters in Fall River and can produce maps of current flow in a wide variety of ICs and packages, usually with initial results delivered within 48 hours. Our engineers will work closely with you to understand and interpret the results in order to determine the root cause of the failure.
