Filter Results By:
Products
Applications
Manufacturers
Probe Systems
use programmable motorized staging to position contacting pin s.
See Also: Probe Stations, Flying Probes
- Applied Instruments, Inc.
product
Return Band Alignment System
6103/6106
Enable a single technician to perform return band alignment with this easy to use return band alignment system for CATV. This system consists of a headend signal level receiver/telemetry transmitter (the HECTER 6103) and a small, field portable, dual-carrier signal generator/telemetry receiver unit (HECTER'S PUP 6106).
-
product
Touch Probes And Vision Systems
HEIDENHAIN offers universal, high-accuracy touch probes for machine tools, enabling exact tool measurement, edge measurement on parts, and more. Proven technologies, such as wear-free optical sensors, collision protection, and integrated cleaning blowers, make these touch probes a dependable asset for tool and part measurement. The vision systems from HEIDENHAIN can also be conveniently deployed to monitor tools for even greater process reliability.
-
product
Central Visibility and Remote Monitoring
Torque Visor
Visor provides central visibility and remote monitoring of multiple probes, plus easy access to a comprehensive log of system events. Operators can retrieve detailed analysis directly on the respective probe, and spot fault trends across services or several geographic regions.
-
product
Manual Fixture Kit With Changeable Cassette, Max number of probes (2N) 1000 units, Max UUT 585 x 250 mm (wxd)
CMK-03
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
-
product
Exchangeable Test Fixture
MA 2111/D/H/S-5/HG
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 10,70 kg
-
product
Structure-borne Probe
T20
The structure-borne ultrasonic probe T20 is used for condition monitoring of machines, systems and processes, given that they generate detectable structure-borne sound in the ultrasonic range. Changes in the sound signals indicate a change in the condition and/or process of the plant. The detection of these changes forms the basis for condition monitoring in predictive maintenance.
-
product
Mobile Optical 3D Measuring System for Online Photogrammetry
PONTOS Live
PONTOS Live is GOM’s tracking system for positioning components, as for a precise alignment on CNC machines or for the adjustment of fixtures. Combined with the GOM Touch Probe, PONTOS Live allows the inspection of areas that are optically difficult to access. Based on the triangulation principle, PONTOS Live analyzes components of different sizes – from a few millimeters up to several meters – point by point and regardless of the material.
-
product
Reference Temperature Sensors
AMETEK Sensors, Test & Calibration
Our reference sensors can be used as your daily working-reference sensors in laboratory or field calibration applications. A large selection of types are available, including; straight, 90 degree angle, 4 mm or 1/4”. The superior design and specifications combined with a long history of reliability and low drift have made the STS probes the working-standard in many EN/IEC 17025 accredited laboratories worldwide. The DLC sensors are a part of our patented Dynamic Load Compensation system.
-
product
Flying Probe Testers
Flying probe test systems require no test fixturing, have few restrictions on board access, and can test boards with virtually unlimited number of nets. These systems also allow developers to complete test programs in a short time.
-
product
Field thermal needle system for thermal resistivity / conductivity measurement
FTN01
Hukseflux Thermal Sensors B.V.
The FTN01 Field Thermal Needle System allows performing fast, on-site measurements of the thermal resistivity or conductivity of soils, in particular around the typical depth of burial of high voltage cables. FTN01 is designed with a focus on robustness and saving time, while still offering sufficient accuracy for typical field measurements. The sensor is a Non-Steady-State Probe (NSSP), TP09, which is mounted at the tip of the Lance LN01. The system is operated using a hand-held Control and Readout Unit CRU01.
-
product
Precise 3D Profilometry
µscan
Using the NanoFocus µscan technology, you can measure up to 100 times faster than with conventional probe systems. Various µscan sensors are available for the different application areas. The optical profilometers of the µscan series are suitable for the fast scanning of surface profiles with precision in the low nanometer range.
-
product
Signal Splitter
The Dynamic Signal Buffered Splitter protects sound and vibration sensor acquisitions from the unwanted effects of a parallel troubleshooting or diagnostic instruments. G Systems Dynamic Signal Buffered Splitter provides buffered and unbuffered outputs connected to the same signal input. Up to 16 sensors, typically accelerometers, proximity probes, microphones, and pressure transducers, may be connected to the 16 signal inputs.
-
product
Manual Fixture Kit With Mass Interconnect Cassette Interface, Max number of probes (2N) 1000 units, Max UUT 335 x 250 mm (wxd)
CMCSK-02-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
-
product
Linear Testfixture for Pylon Mass Interconnected Cassette interface (Cassette Not Included) 6 Positions Blocks, UUT 306 x 248 mm
MG-02-01 Pylon Genrad VG series
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 306 x 248 mm (wxd)• Outer dimensions: 470 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for Mass interconnect changeable cassette• Up to a maximum of 6 interface blocks of 170 signals• All interface blocks can be customized
-
product
Jandel Four Point Probes
Jandel probe heads are manufactured solely by Jandel Engineering Limited and there is one to fit all mountings and systems known to us.
-
product
Manual Fixture Kit
230355 – CMK-06
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
-
product
Temperature Sensors
TT420
Features • 2-wire, loop-powered 4-20mA analog output • Attachment probe, sensor, and 2-wire 4-20 mA signal conditioner • Compatible with PLCs, meters, and data acquisition systems • No user calibration • TT420Z 1/4" stainless steel probe • TT420S 1/4-28 threaded stud – screws into any 1/4-28 tap • TT420F mounts onto any flat surface • UL listed, Intrinsically Safe (IS) • Class I, (C, D) and Class II, (E, F, G)
-
product
Manual Fixture Kit With Changeable Cassette, Max number of probes (2N) 1000 units, Max UUT 335 x 250 mm (wxd)
CMK-02
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
-
product
Manual Fixture Kit With Mass Interconnect Cassette Interface, Max number of probes (2N) 1000 units, Max UUT 450 x 330 mm (wxd)
CMCSK-07-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
-
product
Tunable Laser Hydrogen Chloride Analyzer
TX-100
Laser HCl analyzer with a probe type optical system which employs direct insert method. TX-100 is suitable for monitoring HCl concentration in incineration plants and the control of HCl removal process in various industries including cement factories and petrochemical plants, etc.
-
product
The Nanoworkbench
In light microscopy it is natural to use toolsets like tweezers, knives, probes and several different measurement tools. Without this many present-day products and methods would not exist. The operators of SEM/FIB-Systems generally work without toolsets, although the wavelength limit of light is no physical boundary. It can be imagined how technology would be pushed when a SEM/FIB Workbench reaches the same degree of practicability and utilization as toolsets for light microscopes. The Nanoworkbench is the first system substituting the eye-hand coordination effectively with nm precision in a SEM/FIB-system. The Nanoworkbench features a set of applications including TEM lamella preparation, nano probing, nano cutting, nano cleaning, force distance measurement, particle sorting and material preparation. Every application supports automated processes so almost no user interaction is needed. Even complex processes can be done within seconds and even by untrained users. Applications can be combined to create new and more complex processes. Expanding the SEM/FIB to a material processing system and a nano-analytical workbench by utilizing the Klocke Nanoworkbench enables new applications in research and production of material research, live sciences, tribology, environmental & forensic research and semiconductor technology.
-
product
Pulsed SMU Systems
AMCAD Engineering has created professional, industry-proven pulsing technology for both pulsed-bias load pull (Pulsed Load Pull, PLP) and 50ohm transistor test applications. Systems come equipped with a mainframe controller which includes integrated power supplies and integrated input pulser with ±25V/200mA capability. The external output pulser module (probes, pulsers) is configured for 120V/30A pulsing.
-
product
Manual Fixture Kit
230371 – CMCSK-02-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
-
product
PCI Express Bus Analyzer / Exerciser / Endpoint
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
-
product
CAMGATE Test Kits
Series 453
LThe GR Series 453 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 453 provides interface compatibility using the GR2270 Style, 12 block interface. This interface accepts the industry standard I/O, power, and coax blocks. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components.
-
product
Device Characterization
Probe systems for device characterization must be particularly flexible because many different measurements often must be performed; DC, IV/CV, Capacitance, HF, 1/f, temperature and more. The modular architecture of the PS4L product line is ideal for these broad requirements.
-
product
Pilot Control Software Suite
The SemiProbe PILOT Control Software Suite semiautomatic and fully automatic probe systems employs the SemiProbe patented Adaptive Architecture. Software modules can be added to the base system as needed. PILOT Control Software consists of a Microsoft Windows-based user interface built on the SemiServer application for communicating to and from the probe system. Individual customer applications can be integrated with PILOT Control Software for a customized system to meet individual needs.
-
product
16 GHz Differential Probe with ProLink Interface
DH16-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
product
Vision Measuring Projector
Sinowon Innovation Metrology Manufacture Ltd.
◆ The lifting system adopts linear guide rail and precision screw drive, which makes the lift drive more comfortable and stable;◆ With precision toothless rod and fast movement locking device, ensure return error is within 2um;◆ High accuracy A optical scale and precision working stage, ensure machine accuracy is within 3+L/200 um;◆ HD zoom lens and HD color digital camera, ensure clear image without distortion;◆ With programmable surface 4-ring 8-division LED cold light and contour LED parallel illumination, it can control the brightness of the 4-ring 8-division independently;◆ With powerful iMeasuring2.1 software system , to enhance the control quality;◆ Optional imported contact probes and 3D measuring software, it can help upgrade the machine to be coordinate measuring machine;◆ Optional FexQMS measurement data analysis and real-time monitor software, enhance process control, reduce material consumption;
-
product
Structure-Borne Sound Probe
T10
The T10 structure-borne sound probe can be used to monitor the condition of machines, systems and processes, provided that they generate detectable structure-borne sound in the ultrasonic range. Changes in the sound signals indicate a change in the condition and/or process of the plant. The detection of these changes forms the basis for condition monitoring in preventive maintenance. The T10 structure-borne sound probe is used when the installation space is very limited or the test specimen must not be loaded with a large sensor mass. The T10 structure-borne sound probe is also suitable for use on non-magnetic surfaces.
-
product
Battery and Alternator Analyser for 12V DC Systems
1176
Checks battery charge level and alternator output level. 880mm of insulated cable with test probe and earth (crocodile) clip. For 12V DC systems only. Display packed.Warning: For testing DC circuits on vehicles within the voltage range only. Not suitable for testing mains supply AC circuits.
