-
product
Single Head Component Testers
34XX
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
-
product
HVAC Drives
Our variable frequency drives are designed for HVAC applications, which include air handlers, cooling towers, and pumps, by combining reduced size and cost with advances in performance and quality.
-
product
Test Handler
HA1200
The new HA1200 handler can be linked with a tester to utilize our unique active thermal control technology for testing singulated and/or partially assembled dies. This technology enables testing of powerful high-end SoCs with 100% test coverage. This helps reduce yield loss at final test, thus reducing losses of final multi-die assembled products.
-
product
TestStation Automated Inline Handler | In-Circuit Test Solution
Teradyne’s High-Speed Inline Automated Board Handler with TestStation Multi-Site Test Insert is designed for productivity, fast change-over, and low operating cost. Our in-circuit test solution fits seamlessly into automated production lines to provide “hands-off-lights-out” operation.
-
product
High-Throughput Film Frame Handler
MCT FH-1200
FH-1200™ film frame test handler is designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages. The FH-1200 enables high parallelism testing of post-saw IC devices at ambient temperature. It can accommodate 200 mm and 300 mm wafer rings and custom shapes onto which multiple strips can be mounted. No change kits are required regardless of package size (if same frame is used).
-
product
Automated Lead Frame Testing
Sigma MAG
The Sigma MAG comes with an independent lead frame (un)loader for hands-free bond testing. The magazine handler is compatible with OHT and AGV and allows top and front-loading of multiple types
-
-
product
Automated ICT System
With world-famous in-circuit test technologies and innovations around automated inline handlers, Keysight automated inline ICT solutions are versatile and flexible and provide you:
-
product
Capacitor Leakage Current/IR Meter
Chroma 11200
Chroma Systems Solutions, Inc.
The 11200 Capacitor Leakage Current / IR Meter is mainly used for electrolytic capacitor leakage current testing and aluminum-foil withstand voltage testing (EIAJ RC-2364A). The 11200 can also be used for active voltage checking or leakage current testing of absorber, Zener diode, and Neon lamp etc. With the standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities, the Chroma 11200 can be used for both component evaluation on the production line and for fundamental leakage current or IR testing for bench top applications.
-
product
Test Handlers
Cohu has 50+ years of semiconductor test expertise designing and manufacturing pick-and-place, gravity feed, test-in-strip handlers, MEMS test cells, and turret-based test handling and back-end finishing equipment for ICs, LEDs and discrete components.Our test handlers support a variety of package sizes and device types, including automotive, mobile, power, micro-electromechanical systems (MEMS) and microcontrollers, among others.
-
-
product
Kitless Pick-and-Place Handler
900
Exatron now offers a new breed of Benchtop Pick & Place Handlers: the Model 900 series. The Model 900 is an extremely efficient yet inexpensive PC controlled Pick & Place System
-
product
Film Frame Test Handler
4170-IH
High throughput ・High withstand load, and high thrust table ・Expansion of the strip attachment area ：260(L) X 300(W) [Withinφ300mm for WLCSP]・LOT control by barcode/2D code reader ・Easy device type exchange only test socket and display screen setting・Auto-cleaning function unit is installed to clean the socket at any desired timing.・8/12 inches ring conversion ・S2/S8 regulation compliance・SEMI G85 compliance・SECS/GEM compliance
-
product
Milliohm Meter
16502
Chroma Systems Solutions, Inc.
Basic accuracy : 0.05%Pulsed test current output mode is used to reduce thermal EMFs affection on milliohm measurementDC test current output mode is used to fasten measurement speed for inductive DUTDry-circuit test current output mode (limited Max. 20mV) is used to measure such contact resistances where the maximum open-circuit voltage must be limited to 50mVTemperature correction (TC function) regardless of material or temperatureUseful temperature conversion function for motor/ coil evaluation4 channels R scan with balance check function for fan motor (combined with A165017 option)0.001mΩ~1.9999MΩ wide measurement range with 4½ digits resolutionStandard RS-232 interfaceOptional GPIB & Handler interfaceBin-sorting functionComparator and pass/fail alarming beeper functionLarge LCD display (240 x 64 dot-matrix)Friendly user interface
-
product
ROV Thickness Gauges & Probe Handlers
ROV Thickness Gauges & Probe HandlersCompleting the Cygnus ROV Mountable thickness gauges, a range of ROV Probe Handlers have been developed to offer an engineered probe handling solution. Each probe handler will work with a thickness gauge of the Cygnus ROV Mountable range listed below.
-
product
Nano-focus X-ray Inspection System
X-eye NF120
Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
-
product
Fully Automated In-line Test System For LED Light Engines
We are pleased to announce that we have received an order for the supply of a fully automated in-line test system for testing LED light engines from ASD Lighting, based in Rotherham. The solution provided, consists of an in-line handler fitted with a vision system. The camera software is capable of learning the position of all LED’s on a new pcb, thereby reducing the time to introduce a new product. In addition to identifying the location of any missing or faulty LED’s the tester measures the colour temperature of every pcb. An image is taken of faulty units with the location of any missing LED’s identified
-
product
6TL36 Inline Handler
AM304
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
-
product
Sensors And MEMS Test
Easy docking and undocking of the MEMS modules to the standard test handler whether Gravity, Pick and Place or Test in StripTest in the complete tri-temp range for ambient, hot and cold (automotive certified)Easily convertible to other packagesDownscaled stand-alone engineering set-up availableGlobal support by experienced Cohu Field Service and Applications staff
-
product
High Parallel Tri-Temp Pick-and-Place Handler
Delta MATRiX
Cohu’s MATRiX handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.
-
product
Miniature IC Handler
3270
Chroma 3620 is an innovative system handler for high-volume multi-site IC testing, especially for CIS Testing, at the system level.
-
product
Tube-To-Tube Gravity Handler
Rasco SO1000
The SO1000 test handler’s mature design and high reliability it provides excellent cost of test. Highly flexible as a result of a broad range of device kits can be combined with various Sensor and MEMS applications.Featuring a fast plunger with up to four plunger heads for high speed and high throughput with index time down to 500 ms. Available in single, dual, and quad configurations.
-
product
Modular Gravity Handler For Small Devices
Rasco SO2000
Modular designed gravity handler with various input and output possibilities. SO2000 can handle the smallest possible packages for gravity and provides a broad range of Sensor and MEMS applications.
-
product
Slip Line Detection System
YIS 200
The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.
-
product
Package Test Loadboards/DIB
DTS Package Test (DIB) loadboards are designed to specific devices and configured for both hand test and fully automated handler applications. DTS loadboards incorporate any brand of socket or contactor and can be configured for multi-site testing. Designs incorporate all necessary components, connectors, mechanical hardware and stiffeners to provide a complete plug-n-play solution. DTS has a vast database of tester and handler information which allow designs to be started and completed quickly without burdening the customer to supply excessive information. DTS designers are experienced in all device types, including digital, analog, mixed signal and RF devices.
-
product
Benchtop LCR Meter
6365
Test Frequency 10Hz-200kHz. Output Impedance 100Ω. 7.0" TFT, 800×480 color screen. Basic Accuracy ±0.05%. Using Graphical Analysis by PC Link. Support RS-232、Handler、LAN、USB Host 、Handler、GPIB.
-
product
MEMS And Sensor Test Solutions
Modular design based on standard handlers, high parallelism, ambient to automotive tri-temp handling.
-
product
Line Automation Equipment
5000 Series In-line Handler
The Circuit Check 5000 Series In-line Handler is an integrated inline solution that combines automation, fixturing and measurement hardware in addition to other in-line PCBA probe based test stations, while adding a standardized quick change fixture interface. The 5000 series in-line is a unified solution that is software and hardware agnostic, enabling adaptability to a variety of off-the-shelf lower cost ICT, flash and functional test software and hardware.
-
product
Pick And Place Test Handlers
Cohu offers a broad range of IC pick-and-place test handling solutions for the automotive, mobile, and computing markets. Our commitment is to provide world-class innovative products that incorporate thermal, vision and factory 4.0 automation options to meet your existing and future IC handling needs.
-
product
Super Fast Industrial Gang Programmer
448Pro2AP
The Dataman 448Pro2AP is a super fast industrial gang programmer with four independent modules, ISP capabilities and USB 2.0 connectivity• Optimised for use in automated handlers and ATE machines • Over 71,000 devices supported with new devices added monthly • Mechanically stable case design with multiple fixing points • Independent modules supporting concurrent programming • ISP capable using the JTAG interface • Easy to use software compatible with the latest operating systems including Windows 10 • Comprehensive 3 years parts and labor warranty • Free life-time software updates
