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MEMS Microphone Test
The market is driving the need for improved voice recognition for security, automobile infotainment control, VoIP, accurate language translation, voice-activated consumer devices and high precision hearing aids. The latest next-generation microphones require highly accurate precision testing with SNR tests up to 78 dB with high parallelism, high UPH, in a high volume production environment.
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Hot Swap, Fault Tolerant, Ultra Reliable Power Supply
Series HSP
The Kepco HSP series provides mission critical power. HSP comprises a group of twelve models, eight 1000 watt power supplies with outputs from 3.3 volts to 125 volts and four 1500 watt power supplies with outputs from 24 volts to 125 volts. All models feature current-sharing for parallel redundant N+1 operation. Models with the or-ing diode, option R, are capable of hot swapping when plugged into Kepco¹s RA 60 series rack adapter. Models with a digital meter, option M, are also available (see photo, right). A mechanical keying scheme allows the user to define which power supply will plug into a specified slot in the housing. Output voltage and current limit settings are adjustable from the panel and may be remotely adjusted.
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Low-Temperature Impact Device
DWC-1
This low-temperature impact device is compliance with standard requirement of IEC60245, IEC60227, IEC60540, GB5013-2008, GB5023-2008 and GBT2951-2008. It’s used to test all kinds of PVC sheathed cable, wire, soft wire and no sheath of parallel soft PVC insulated impact resistance at low temperature. Specification: • Working temperature: -15℃±1℃ • Impact height: 10~200mm adjustable • Length of specimen: 5D~150D • Material: 304 stainless steel • Completion time once: 3~5s • Completion number of units for once: ≥2pcs • Weight: 100/200/300/400/500/600/750/1000/1250/1500g • Low temperature box to match additionally
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Closed-Loop Servohydraulic Test Bench Control System
Closed-loop servohydraulic test bench control system is based on digital devices of ZETSENSOR series with CAN interface. This system has fast response characteristics, high precision, and compact dimensions. The system enables comprehensive control of the servo drive in automated mode in compliance with the set test parameters such as pressure (force), displacement, along with the parallel control of other system parameters such as temperature, pressure, filter plugging, oil pressure, etc.
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Ethernet To Parallel Digital Interfaces
ICS's 8063 Ethernet Digital Interface provides a fully enclosed parallel interface that is suitable for benchtop or rack mount applications.
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6/12/24/36V Conductance Battery Tester
MBT300
Tests 6/12/24V lead acid batteries individually or in parallel and series battery packs. Displays battery or battery pack condition as % available capacity, rated capacity (CCAs), state of charge voltage, and good or replace status. Tests 6/12/24/36V starter and charging systems including starter draw, alternator and regulator output (loaded/unloaded), and diode ripple.
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OD And Light Transmittance Meter
Shenzhen Linshang Technology Co., Ltd.
A series of light transmittance testing instruments provided by Linshang Technology include a light transmittance meter LS116 with a parallel light path design, a optical densitometer LS117 with a diffuse transmission principle, and a split type light transmittance meter LS110 that measures the car front windshield. The light sources used in these light transmittance meters comply with the CIE photopic luminosity function.
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Real-Time Clock (RTC) ICs
ST offers a wide portfolio of real-time clock (RTC) ICs with parallel or serial interface, including ultra-low-power devices and the world’s smallest package with embedded crystal. Our devices offer many value-added features such as supervisory functions that include alarm, battery switchover, and reset as well as special features with time stamp, anti-tamper for secure applications and an integrated audio section.
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Interface
RCNIC-A2PAU4
Abaco Systems' RCNIC-A2PAU4 is a high performance 4-lane PCI Express interface for monitoring, generating or analyzing full-bandwidth AFDX/ARINC 664 protocol traffic. Our exclusive pipeline architecture maximizes packet throughput using parallel controllers and efficient DMA transfers, thereby avoiding the bottlenecks of CPU-based interface solutions.
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SAS (Serial Attached SCSI)
Serial Attached SCSI (SAS) is a data transfer technology designed to move data to and from storage devices such as disk drives, host bus adapters (HBA), and expanders. SAS is a serialized enhancement and replacement to parallel SCSI. Since SAS ratification in 2004, and it’s move to 6Gbps in 2008, Teledyne LeCroy has continued to support and innovate with it’s industry leading protocol analysis and traffic generation capabilities.
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Power Supply QD305 2x30V/5A
*on / off switch output section*two independent adjustable DC output*independent outputs serial and parallel*constant voltage and current*Low ripple and noise*four digit LED displays three*for 16 hours at full load*automatically search out
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Bidirectional AC Source / Sink With Regenerative Power Supply
EAC-4Q-GS
*Single system from 30kVA to 500kVA and in parallel up to 2MVA and more*Galvanic isolation from the network*TFT touch display with simple menu navigation*Emergency stop in the front door*Indicator lights for operating status*Bidirectional current flow, up to 100% of the nominal output power can be fed back into the grid*Output voltage and phase angle adjustable per phase
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Signal Splitter
The Dynamic Signal Buffered Splitter protects sound and vibration sensor acquisitions from the unwanted effects of a parallel troubleshooting or diagnostic instruments. G Systems Dynamic Signal Buffered Splitter provides buffered and unbuffered outputs connected to the same signal input. Up to 16 sensors, typically accelerometers, proximity probes, microphones, and pressure transducers, may be connected to the 16 signal inputs.
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High Performance Strip Handler
Rasco Jaguar
Jaguar is designed for high-volume production testing of ICs on a strip format or in device carrier. It is fully automotive qualified for tri-temperature test and the ideal solution for high parallel testing of small packages at short test times, but also for Power and Sensor devices. Due to the integrated vision alignment and high precision linear motors, Jaguar provides high yield and excellent OEE.
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Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card
GX5296
The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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PCI 24-Bit Digital I/O Cards
PCI-DIO-24D/H
These cards are 24-bit parallel, digital input/output cards designed for use in PCI-Bus computers. The difference between the models is that I/O connections to PCI-DIO24D are via a standard 37-pin D-sub connector while I/O connections to PCI-DIO24H are via a 50-pin connector. The cards are 4.80 inches long (122 mm) and may be installed in any 5V PCI-bus slot in IBM and compatible personal computers.
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Digital LCD Display Drivers
Analog Devices DecDriver® family of digital LCD display drivers helps meet the increasing demand for higher resolution displays in home entertainment and home theater. This portfolio of products offers improved power, enhanced image quality, and lower costs, and has been optimized for a wide range of displays and performance needs. Our digital LCD display drivers operate over the commercial temperature range of 0°C to 85°C and include features such as a flexible digital input format that allow the devices to be used in parallel in high resolution displays.
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20KVA to 200KVA Industrial UPS (3Ø – 3Ø)
NSP Series 20KVA to 200KVA
- Designed for powering critical Industrial and IT systems- DSP controlled IGBT based PWM technology- Design topology enables N+1 parallel redundancy- Industrial grade high speed CAN bus communication- User Friendly Matrix LCD and LED mimic front control and digital monitoring- Fully rated make before break maintenance bypass operation- Optional break-less load transfer via static switch- Low harmonic distortion- High crest factor tolerance and dynamic stability- Lower TCO- Continuous full rated power at ambient as high as 45°C- N+1 Parallel operation of UPS without any common hardware- Advanced Communication Capability (RS485/Modbus/SNMP)- High branch fuse clearing capacity- On-line battery bank test without load disconnection- Compact, elegant, and light weight enclosure- Easy installation with wheels for maneuverability and front bottom terminals
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Miniature 8-channel photon counter
id150 SERIES
Intended for large-volume OEM applications, the id150-1x8 is the only multichannel solid-state single photon detector on the market. It consists of a CMOS silicon chip packaged in a standard TO8-16pin header with a transparent window cap. The chip combines 8 in-line single photon avalanche diodes that can be accessed simultaneously for parallel processing. square in center-to-center A fast active quenching circuit is integrated within each pixel in order to operate each diode in photon counting regime. The chip is mounted on a printed circuit board on top of a single-stage thermoelectric cooler (TEC). A thermistor can be used to measure the temperature of the chip. Only two low power supplies of +5V and -25V are needed for operation in photon counting mode. The fast active quenching circuit leads to a dead time of less than 50ns per channel. An outstanding timing resolution of less than 60ps allows high accuracy measurements.
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In-System Programmer for ARM
MPQ-ARM
Supports Nuvoton M05x and NUC1xx device families Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
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Digital Test Instrumentation
EDigital-Series™
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Standard Capacitor
1409 Series
The elements used in 1409 Standard Capacitors are selected for low dissipation factor and are stabilized by heat cycling. They are housed in cast aluminum cases, along with silica gel which provides continuous desiccation. These cases are sealed with high-temperature wax. A well is provided in the wall of the case for insertion of a dial-type thermometer. Three jack-top binding posts are provided on the top of the case, and removable banana plugs on the bottom, for convenient parallel connection without error
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Parallel Test Systems
Our parallel test systems for research and development are highly flexible in use and easily adaptable to different tasks as well as changing piezoelectric materials and designs.
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Altitude Digitizer Test Set & Simulator
ATS-400
Test & Simulate Altitude Encoder Parallel and Serial I/O all in One Rugged Test Set! The TCI Model ATS-400 is designed to test, display and simulate the output of Altitude Reporting Equipment, which conform to the ICAO Standard for SSR Pressure Altitude Transmission. In accordance with the U.S. National Standards for I.F.F. Mark X (SIF)/Air Traffic Control Radar Beacon System SIF/ATCRBS.
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Exchangeable Test Fixture
MA 2109/D/H/S-5
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 8,50 kg
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IP Parallel HV
High Voltage [up to 30V] IP Compatible card with 48 programmable IO. 40 mA sink. Open collector interface. Interrupt generator on each input channel. Filtered or direct input.
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Test Systems
In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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LCR Meter
*Rs, Rp, Cs, Cp, Ls, Lp, phase angle, Dissipation factor, Quality factor *Auto select series or parallel test mode *Auto select 100Hz/1kHz/10kHz test frequency, 0.5V rms approx. *Calibration
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