UUT
assures a constituent's interoperability in a system.
See Also: Unit Under Test, DUT, System Under Test
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Product
USB JTAG controller
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The small, lightweight design means the XJLink2 can easily be moved to the Unit Under Test (UUT). Advanced features, like their programmable JTAG signal pin position, switchable power supply and auto signal skew, make it easy to connect to a wide range of circuit boards. Simple to install and use due to the USB plug-and-play ability.
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Product
JTAG USB Controller
NetUSB-1149.1/E
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The NetUSB-1149.1/E (4 TAPs) is an advanced USB 2.0 and LAN-based controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The NetUSB-1149.1/E controller supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz.The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT.
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Product
PCI Express Gen 3 Test Backplane
SKU-015-01-PCIe
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PCI Express Backplane was designed to support a variety of modern PCI Express board’s production testing and debugging. The backplane expands the Host computer into four x16 PCI Express slots via 10 ft. CAT7 data and 10-pin flat Power control cables. PCI Express Backplane and UUTs (unit under test – add-in PCI Express board) are powered by a standard ATX power supply connected to the backplane via 24 and 8 pin power connectors located on the backplane.
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Product
Linear Testfixture (Cassette Not Included), UTT 105 x 170 mm
MG-01
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FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (1000N) 650 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 105 x 170 mm (wxd)• Outer dimensions: 254 x 400 x 50 x 140 mm (wxdxh1xh2)• Designed for changeable cassette
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Product
SIGNAL & POWER ISOLATOR
EE301-ISOL
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The EE301-ISOLATOR will completely isolate your electronic loads inputs & outputs signals plus ground returns from the main power input UUT (unit under test)... The module allows you to control the electronic load just as you would with any standard control signal. Input / Output & Power signals are fully isolated up to 350 VDC.
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Product
Averna LAUNCH
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Are you optimizing your time managing your smart data? Averna Launch consolidates all test data from your smart factories and delivers results in both real-time and user-friendly reports. By automatically detecting the unit under test (UUT) Launch runs all required test sequences, predetermined by you.
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Product
Digital and Analog Test Sets
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Our analog and digital automated test system experience covers a wide variety of applicationsfrom multiple path resistance, capacitance, and inductance testing using various Interface Test Adapters (ITA)to inter-connect multiple customer units under test (UUT). Other systems have included: equipment to monitor and record telemetry, digital data streams, and systems that evaluate packet data using a variety of VME, VXI, PXI, and LXI equipment.
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Product
Chassis Controllers and Bus Expanders
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With over 20 different chassis configurations, our Smart PXI chassis product line (3U chassis, 6U chassis, 3U/6U chassis) offers the most features, slot configurations, UUT interface options, system power, and embedded / external controller options in the industry.
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Product
Configurable High-Density Switch Matrix PXI Card
GX6384
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The GX6384 3U PXI multiplexer switch card provides users with the ability to switch and interface tester resources to multiple UUT connections. The card is available in three different configurations, supporting 32 x 2, 32 x 4, and 32 x6 switch configurations.
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Product
Pylon ITA Mount Linear Testfixture Cassette and ITA Frame Not Included, UUT 306 x 248 mm
MG-02 VGR12
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FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with aluminum backpanel for a Genrad VGR12 Pylon frame• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 306 x 248 mm (wxd)• Outer dimensions: 470 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for changeable cassette
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Product
Multiport JTAG Tester
XJQuad
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XJQuad is a 4-port version of the XJLink2 USB-to-JTAG controller targeted at PCB manufacturers. It is supplied with XJRunner software for running XJDeveloper test systems. With a range of special features it is particularly suitable for concurrent/parallel testing on the production line. Each of the four ports has a high-speed interface which can be connected to up to four JTAG chains on each Unit Under Test (UUT).
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Product
RF Shielded Fixture
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A semi-automatic, pneumatically operated fixture with a sliding pressure top provides a very short mechanical cycle-time. The unit is prepared for full, multi-station automatic operation using a centrally placed robot arm for UUT load/unload.
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Product
Pneumatic Bidirectional Vertical Shock Test System
KRD17 series
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KRD17 series pneumatic bidirectional vertical shock test system is the novel designed and developed for large specimens that cannot or are not easy to turn over, especially adopt for battery testing. It can complete vertical upward and downward shock test in one test stand without moving the UUT.
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Product
Combined Map Display Unit & Interface Unit Tester (COMED)
MS 1117
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This system is used to test COMED (Combined Map Electronic Display) IFU cards. This ATE checks the LRU Status and card status and identify faulty component in the individual UUT. On fault, this suggests the possible component failure as diagnostic report, for repairing the cards.
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Product
Customized Test Fixtures
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Test fixture is a device designed to mount a device under test (DUT), equipment under test (EUT) and unit under test (UUT) in place and allow it to be tested by being subjected to controlled electronic test signals and procedures.
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Product
Single Bus 75-Channel 2A PCI Fault Insertion Switch
50-190-001
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This PCI fault insertion switch range is available with 75, 64 or 36 channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. The Stimulus/Measurement to UUT path is suitable for supporting CAN and FlexRay bus systems.
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Product
SWB-2811, 8x21, 1 A, Reed Relay Matrix Module for SwitchBlock
781421-11
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8x21, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2811 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
SWB-2834, 8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781420-34
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8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2834 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
Manual Fixture Kit With Mass Interconnect Cassette Interface, Max number of probes (2N) 1000 units, Max UUT 580 x 400 mm (wxd)
CMCSK-04-01
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
SWB-2810, 4x43, 1 A, No Row Access, Reed Relay Matrix Module for SwitchBlock
781421-10
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4x43, 1 A, No Row Access, Reed Matrix Module for SwitchBlock - The SWB‑2810 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
Power Bus
MS 1606
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The PowerBus is used to service printed circuit boards, instruments and systems, which has Micro controller / Microprocessor. The PowerBus has RS232 Communication for PC interface. The PowerBus connects to the UUT through the microprocessor / micro controller socket. The UUTs microprocessor / micro controller is removed from the UUT and it is replaced by the PowerBus. The Power Bus adapts microprocessor specific function as pin layouts, status / control function, interrupt handling, timing and memory and I / O addressability.
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Product
Power Supply Testers
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Qmax Test Technologies Pvt. Ltd.
Power Supply Tester is an integrated package of hardware such as AC/DC Power Sources, DC Loads, Noise Measurement Unit, and DMM etc configured as per user applications, which makes it suitable for testing wide range of Power Supplies and provide economic solution for testing AC/ DC and DC/DC power supplies and converters. The Power Supply Boards that passed in the first level of screening for Go-No Go tests will undergo a second level testing. The second level of testing measures all the key parameters of the power supply such as line regulation, load regulation, efficiency etc and check whether the results are within the mentioned limit, if not declare the UUT (Power Supply Board Under Test) as a failed one.
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Product
Linking Conveyor 765mm
AM307
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The high performance linking conveyor from 6TL is an option for the users of 6TL36 handling technology. The 6TL36 needs a high performance conveyor in the inlet, that is able to synchronize with the conveyor inside the handling system, so that the UUT can be stopped without phisical stopper, to further proceed with the contacting operation.
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Product
GPS/FMS Universal Test Fixture
TA-3000
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This panel was designed to give the avionics shop the capability to test and troubleshoot many of the GPS, GPS/COMM and FMS units on the market today. Breakout jacks are provided for both analog and digital signals that need to be monitored or simulated. A data port update jack is provided as well as Arinc 429 and RS232 loopback switches. Switches for Gillham altitude are provided as well as fuel flow adjustments. An array of annunciators and configuration switches are also provided to verify those outputs and inputs. Optional UUT configuration overlays also availabl
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Product
Automated Testing
IRWindows™5
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IRWindows™5 from Santa Barbara Infrared is an advanced software tool that automates the setup, execution, data collection and results analysis for industry standard performance testing of infrared, visible and laser systems. IRWindows™5 is the most advanced commercially available IR/EO sensor test software package in the industry today. It operates under Windows™ OS and is delivered installed on a high-end PC computer platform with frame grabber(s) selected to support UUT video formats. It is also available as a software only package. IRWindows™5 combined with SBIR target projectors provides test engineers and technicians a turnkey, automated hardware/software solution for full-spectrum sensor testing.
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Product
In-Circuit Tester Integration
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The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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Product
JTAG 3rd Party Controller Support
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Corelis offers support for a variety of devices and instruments from third-parties in an effort to provide existing test platforms comprehensive JTAG test execution with Corelis ScanExpress software products. Supported instruments include National Instruments PXI-655x HSDIO and Teradyne Di-Series modules. Corelis also provides support for JTAG testing with FTDI FT2232 ICs embedded on a unit under test (UUT).
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Product
Cost-Effective ATE System
PRO RACK ATE
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Qmax Test Technologies Pvt. Ltd.
Pro-Rack is a cost effective ATE System, which comes with Modular Structure provision option to improvise and enhance much instrumentation based on the user’s requirements. Basically it is designed to cater to the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FPGA VLSI chips. AC /DC parametric tests enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity ,Tri-state leakage currents, AC parametric measurements such as Input / Output Propagation delay Rise time / Fall time to further enhance fault coverage. Pro-Rack is designed with VPC Mass Interconnect adapter with 16 bit fixture ID interface to the UUT through simple clips and probes or through card edge or through a bed of nail test fixture.
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Product
SWB-2811, 8x21, 1 A, Reed Relay Matrix Module for SwitchBlock
781420-11
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8x21, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2811 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
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The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
